Fujitsu MHU2100AT Product Manual page 120

Interface
Table 5.7 Features Register values (subcommands) and functions (2 of 3)
Features Resister
X'D5' SMART READ LOG:
A device which receives this sub-command asserts the BSY bit, then reads
the log sector specified in the SN register. Next, it clears the BSY bit and
transmits the log sector to the host computer.
* See Table 5.16 concerning the SMART error log data format.
X'D6' SMART WRITE LOG:
A device which receives this sub-command asserts the BSY bit and when it
has prepared to receive data from the host computer, it sets DRQ and clears
the BSY bit. Next, it receives data from the host computer and writes the
specified log sector in the SN register.
* The host can write any desired data in the host vendor log.
X'D8' SMART ENABLE OPERATIONS:
This subcommand enables the failure prediction feature. The setting is
maintained even when the device is turned off and then on.
When the device receives this subcommand, it asserts the BSY bit, enables
the failure prediction feature, then clears the BSY bit.
X'D9' SMART DISABLE OPERATIONS:
This subcommand disables the failure prediction feature. The setting is
maintained even when the device is turned off and then on.
When the device receives this subcommand, it asserts the BSY bit, disables
the failure prediction feature, then clears the BSY bit.
5-44
SN: SC: Log sector
00h: 01h: SMART log directory
01h: 01h: SMART summary error log
02h: 33h: SMART comprehensive error log
06h: 01h: SMART self-test log
09h: 01h: SMART selective self-test log
80h-9Fh: 01h-10h: Host vendor log
See Table 5.18 concerning the SMART self-test log data format.
See Table 5.19 concerning the SMART selective self-test log data
format.
SN: SC: Log sector
09h: 01h: SMART selective self-test log
80h-9Fh: 01h-10h Host vendor log
Function
C141-E202-01EN