Agilent Technologies 86060C Product Overview page 6

Applications
86060C
Lightwave
8153
Switch
LW Multimeter
with Dual Source
and Power Sensor
Figure 10. Insertion loss as a function of temperature
A well-implemented automat-
ed test system can help reduce
manufacturing costs. A wide
range of measurements can be
performed and recorded much
more rapidly, eliminating the
need to manually reset oper-
ating conditions. Automated
systems can be implemented
to reduce the necessary oper-
ator skill level and amount of
training required. They can
also reduce the time spent
recording, recovering, and
publishing test results.
Increasing measurement
throughput by greatly reducing
time per test, a single auto-
mated test system can do the
work of several manual stations,
thereby reducing both cost
per test and the total capital
investment required for the
test.
Environmental Test
Environmental Chamber
DUTs
Reference Channels
Qualification testing can be
very expensive, with the addi-
tional cost of operating an
environmental chamber on
top of tying up lots of test
equipment for long periods to
test multiple devices. Figure 10
shows an automated environ-
mental test system using two
86060C Lightwave Switches
and an 8153 Lightwave Multi-
meter with the 81554SM Dual
Laser Source module and the
81532A Power Sensor module.
83438A Opt. 009
Erbium ASE Source
11896A
Polarization Controller
86140B Optical
Spectrum Analyzer
86120C
Multi-Wavelength Meter
Figure 11. Eight channel WDM/router test setup
6
Multiple devices are connect-
ed for the test (for example,
isolators, patchcords, or atten-
86060C
uators). Insertion loss is mea-
Lightwave
sured versus temperature.
Switch
Reference channels are used
for system calibration and to
compensate for system drift.
This system could be expand-
ed to test return loss versus
temperature with the addition
of a coupler and a reflectance
standard. This test system can
also be set up using a single
86062C switch with two layers.
Multi-port device testing can
complicate manufacturing
test. Flexible lightwave switch
configurations provide a ver-
satile building block for test
systems design. Figure 11 shows
an eight channel WDM/router
test setup which uses a multi-
layered 86062C switch with
three switching modules. The
Agilent 11896A Polarization
Controller allows the devices
under test to be tested for
amplitude and wavelength
8164A
Tunable Laser Source
1 x 2
Layer
1 x 12
Layer
Reference
2 x 48
Layer
86062C
3 Layer Switch
8 Channel
WDM DUT #1
8 Channel
WDM DUT #2
8 Channel
WDM DUT #3
8 Channel
WDM DUT #5