National Instruments DAQPad-1200 User Manual page 97

Index
dynamic characteristics
analog input specifications, A-3
analog output specifications, A-5
E
EEPROM storage of calibration data, 5-1
equipment, optional, 1-4
event-counting application, 3-28
with external switch gating (figure), 3-28
EXTCONV* signal
description (table), 3-3
maximum voltage input rating, 3-27
timing connections, 3-23
EXTTRIG signal
data acquisition timing, 3-23
description (table), 3-3
maximum voltage input rating, 3-27
EXTUPDATE* signal
data acquisition timing, 3-26
description (table), 3-3
maximum voltage input rating, 3-27
updating DAC output (figure), 3-27
F
floating signal sources
differential connections, 3-8
purpose and use, 3-6
single-ended connections (RSE
configuration), 3-11
frequency measurement, 3-29
general-purpose timing signal
connections, 3-29
frequently asked questions, E-1
G
GATB0 signal (table), 3-3
GATB1 signal (table), 3-4
GATB2 signal (table), 3-4
DAQCard-1200 User Manual
GATE signals
general-purpose timing signal
connections, 3-27
timing requirements signals (figure), 3-31
general-purpose timing signal connections
See also data acquisition timing
connections
event-counting, 3-28
frequency measurement, 3-29
GATE, CLK, and OUT signals, 3-27
pins, 3-22
pulse generation, 3-28
pulsewidth measurement, 3-29
square wave generation, 3-28
time-lapse measurement, 3-29
timing requirements for GATE, CLK, and
OUT signals (figure), 3-31
ground-referenced signal sources
differential connections, 3-10
purpose and use, 3-6
recommended input configurations
(table), 3-7
single-ended connections (NRSE
configuration), 3-12
H
help
technical support, E-1
I
I/O connector
exceeding maximum ratings
(caution), 3-1
pin assignments (figure), 3-2
IBF signal (table), 3-18
input configurations
differential connection
considerations, 3-7
I-4 ni.com