Advertisement
Section 20
20.1 Failure Detection
Semiconductor circuits can be considered to be almost free from defective semiconductors and/or
performance deterioration except when there are design and inspection errors, or external and human
induced causes. Generally, the causes of comparably frequent failures include line disconnection due
to humidity of the high resistor, failure of the variable resistor as well as contact failures of switches and
relays.
In addition to faulty parts, faulty adjustments (especially faulty tuning) or faulty maintenance (especially
faulty cable contact) occasionally make up causes of failures; thus, it is effective to reinspect or
readjust these items.
20.1.1 About alerts
Failures can be detected from alerts.
For details on alerts, please refer to "Appendix A, Alert List."
20.1.2 Alert description
For a description of alerts to be displayed, please refer to "Appendix A, Alert List."
20.1.3 S-57/63 chart related error message list
For more information about error messages that are displayed when the S-57/63 charts are imported
and updated on the ECDIS, please refer to "Reference Data 1: Notes on Alert Information of the
S-57/63 Charts" in the Instruction Manual provided separately from charts.
20.1.4 ARCS chart related error message list
For more information about error messages that are displayed when the ARCS charts are displayed on
the ECDIS, please refer to "Reference Data 2: Notes on Alert Information of the ARCS Charts" in the
Instruction Manual provided separately from charts.
Failures and After-Sale
Services
20-1
Section 20 Failures and After-Sale Services
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
25
26
27
Advertisement
