Agilent Technologies 1168/9A User Manual page 89

Differential and single-ended probes
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Step 8. Attach the Fine Wire
ZIF tip Onto the Board
1168/9A Probes User's Guide
The probe head should already be attached to the positioner
arm (which is secured to the micropositioner). Push the Fine
Wire ZIF tip onto the probe head and close the latch to lock
them together. The picture below does not show the probe
head inside the positioner arm. It is meant to show you
what the latch looks like when it is closed.
Figure 56
ZIF Tip Latch in Closed Position
The procedure described below is for probing the underside
of ICs and describes a specific use- scenario. There may be
other possible ways to use this probe tip. The following
steps require a probing station and a high- powered
microscope.
NOTE
Do not turn on your DUT until you have landed both wires and confirmed
they are not touching, as described below.
In order to prepare the IC for probing, you first need to
chemically etch a large trench out of the IC. Within the
trench, create at least two wells (target well and ground
well) to the targeted metal layers. These wells should be
approximately 15 x 15 microns and 10 microns deep. These
wells keep the probe tip from slipping across the surface as
they give a place for the wires to anchor. You may need to
create many wells depending on the number of targets you
Using Probe Heads
Using N2884A Fine-Wire ZIF tips
This is what the
latch looks like
when it is in the
closed position
2
89

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