Mar.2001
ERROR MESSAGE
In usual function, when problems occur is the test mode function, the
following letters appear.
Err cause: Error in test items other than the device check
E.0
cause:4M Flash ROM device error
(Solder, pattern and device defection, and device mistake of the
4MB FLASH ROM IC)
E.1
8M Flash ROM device error
(Solder, pattern and device defection, and device mistake of the
8MB FLASH ROM IC)
E.2
CPU RAM error
(CPU IC device defection)
E.3
DRAM error
(Solder, device and pattern defection of DRAM IC)
E.5
DSP read/write error
E.6
DSP IRAM error
E.7
DSP ERAM error
E.8
DSP error
(Solder and pattern defection around the DSP IC and EFFECT RAM
IC. Solder and pattern defection between the DSPIC and CPU IC.
Device defection of DSP IC or EFFECT RAM IC.)
E.9
Card Not Formated
E.10
Card Not Protected
E.11
No Sample Data
E.12
No Pattern Data
E.13
Card Read error
E.14
Data Memory Write error
SP-303
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