Dynamic Characteristics - National Instruments NI 783xR User Manual

Reconfigurable i/o devices for pci/pxi/compactpci bus computers
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Appendix A
Specifications
Nominal Range (V)
Positive
Negative
Full
Full
Scale
Scale
10.0
–10.0
Note: Accuracies are valid for measurements following an internal calibration. Measurement accuracies are listed for
operational temperatures within
temperature. Temp drift applies only if ambient is greater than
NI 783xR User Manual
Maximum working voltage
(signal + common mode) ........................Inputs should remain
Overvoltage protection ...........................±42 V
Data transfers ..........................................Interrupts, programmed I/O
Accuracy Information
% of Reading
24
Offset
Hours
1 Year
(µV)
0.0496
0.0507
2542
±
1 °C of internal calibration temperature and
DC Transfer Characteristics
INL..........................................................±3 LSB typ, ±6 LSB max
DNL ........................................................–1.0 to +2.0 LSB max
No missing codes resolution...................16 bits typ, 15 bits min
CMRR, DC to 60 Hz ..............................86 dB

Dynamic Characteristics

Bandwidth
Small signal (–3 dB)........................650 kHz
Large signal (1% THD) ...................55 kHz
System noise ...........................................1.8 LSB
Absolute Accuracy
Noise +
Quantization
(µV)
Single
Point
Averaged
1779
165
±
±
10 °C of previous external calibration.
A-2
within ±12 V of ground
Absolute
Resolution (µV)
Accuracy
Temp
at Full
Drift
Scale
Single
±
(%/°C)
(
mV)
Point
0.0005
7.78
2170
10 °C of external or factory-calibration
rms
(including quantization)
Relative
Accuracy
Averaged
217
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