Resume Clear; Patch Data Rewriting When Nonvolatile Memory Was Replaced - Sony MZ-R500PC Service Manual

• Overall CD and MO adjustment items
1. Overall CD adjustment items
Item No.
312
313 CD electrical offset adjustment
314
321 CD tracking error gain adjustment
328 CD TWPP gain adjustment
324
CD tracking error offset adjustment
332
336 CD ABCD gain adjustment
344 CD focus gain adjustment
345 CD tracking gain adjustment
521
CD two-axis sensitivity adjustment
522
2. Overall MO adjustment items
Item No.
112
113
MO electrical offset adjustment
114
118
221 Low reflective CD tracking error gain adjustment
224
Low reflective CD tracking error offset adjustment
232
236 Low reflective CD ABCD level adjustment
244 Low reflective CD focus gain adjustment
245 Low reflective CD tracking gain adjustment
121 MO tracking error gain adjustment
122 MO TON offset adjustment
134 MO TWPP gain adjustment
131
MO double speed read TWPP offset adjustment
132
136 MO ABCD gain adjustment
144 MO focus gain adjustment
145 MO tracking gain adjustment
434 MO write TWPP gain adjustment
431 MO write TWPP offset adjustment
432 MO tracking error offset adjustment
436 MO write ABCD gain adjustment
445 MO write tracking gain adjustment
411 MO normal speed read TWPP offset adjustment
412 MO tracking error offset adjustment
448 20 sec full recording
Description
Description

5-9. Resume Clear

Perform the Resume clear when all adjustments completed.
• Resume Clear Setting Method
1. Select the manual mode of the test mode, and set item number
043 (see page 13).
This set LCD display
0 4 3
2. Press the X key.
This set LCD display
0 43
0 43
3. Press the key to return to the test mode (display check
x
mode).
5-10. Patch Data Rewriting When Nonvolatile
Memory was Replaced
When the microcomputer in this set is replaced with a different
version of microcomputer, it is needed to initialize the modified
program data in the nonvolatile memory and write specific modi-
fied data for the new version in the memory.
If the microcomputer is replaced with a different version, the patch
data should be rewritten as performed when the nonvolatile memory
is replaced.
For a version where the method to write patch data is not described,
the modified data should be initialized as specified below:
• Initial set of modified data
1. Select the manual mode of the test mode, and set item number
022 (see page 13).
This set LCD display
0 2 2
[ENTER]
2. Press the key and set the address & adjusted value
display (see page 14).
This set LCD display
0 22
CC: Adjusted value
3. Press the X key to initialize the patch data.
(The modified data writing is over, if the adjusted value changes
to DD.)
This set LCD display
0 22
DD: Adjusted value
MZ-R500/R500PC
Resume
Res
Resume clear complete
ResClr
PatClr
SCC
SDD
23