Technical data of CPU 31xC
6.6 Technical data of the integrated I/O
Technical data
Permitted potential difference
between M
and M
•
ANA
Insulation test voltage
Analog value generation
Resolution (including overdrive)
Conversion time (per channel)
Settling time
with resistive load
•
With capacitive load
•
With inductive load
•
Interference suppression, error limits
Crosstalk between the outputs
Operational error limits (across the temperature range, in relation to output
range)
Voltage/current
•
Basic error limit (operational limit at 25 °C, in relation to output range)
Voltage/current
•
Temperature error (in relation to output range)
Linearity error (in relation to output range)
Repeat accuracy (in transient state at 25 °C, in relation to output range)
Output ripple; bandwidth 0 to 50 kHz (in relation to output range)
Status, interrupts, diagnostics
Interrupts
Diagnostics functions
Actuator selection data
Output range (rated values)
Voltage
•
Current
•
Load resistance (within output rating)
For voltage outputs
•
Capacitive load
–
For current outputs
•
Inductive load
–
6-54
(U
)
internal
ISO
75 VDC / 60 VAC
600 VDC
11 bits + signed bit
1 ms
0,6 ms
1,0 ms
0.5 ms
> 60 dB
± 1 %
± 0,7 %
± 0.01 %/K
± 0,15 %
± 0,06 %
± 0,1 %
no interrupts when operated as standard
•
I/O
For using technological functions, please
•
Technological Functions
refer to the
Manual.
no diagnostics when operated as
•
standard I/O
For using technological functions, please
•
Technological Functions
refer to the
Manual.
± 10 V
0 V to 10 V
± 20 mA
0 mA to 20 mA
4 mA to 20 mA
min. 1 kΩ
max. 0.1 μF
max. 300 Ω
0.1 mH
CPU 31xC and CPU 31x, Technical data
Manual, Edition 08/2004, A5E00105475-05