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Agilent Technologies PN 8510-16 Product Note page 9

Controlling test port output power flatness

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Using test port 1 calibrations on test port 2
Figure 3. Corrected test port power using port 1 flatness correction on port 1
(channel 1) and port 2 (channel 2)
1. Test sets with option 003 (high forward dynamic range) cannot be used because
the reverse transmission dynamic range is degraded.
Flatness corrections in fixture or wafer-probing
environments
9

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