Seagate Nytro 4350 Manual

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Introduction

The Seagate Nytro 4350 SSD is a fast, dependable storage solution for boot applications or read-intensive workloads in data centers. The Seagate Nytro 4350 SSD offers PCIe Gen 4 x 4 interface with NVMe protocol support in a small M.2 form factor.

Table 1 The Nytro 4350 SSD Features

Specifications

Models and Capacity

Table 2 Models and Capacity

NOTE
About capacity:

• Sector Size: 512 Bytes
• User-addressable LBA count = (97696368) + (1953504 x (Desired Capacity in Gb-50.0)). From International Disk Drive Equipment and Materials Association (IDEMA) (LBA1-03_standard.doc)

Performance

Table 3 Random and Sequential Read and Write Performance

NOTE
About performance:

• Performance can vary based on the SSD's firmware version, system hardware, and configuration.
• Performance is measured with the following conditions
  1. Sustained Sequential: FIO, full-range, QD=32
  2. Sustained Random: FIO, full-range, QD=32, 8 workers

Latency

Table 4 QD1 4KB Random Average Latency

NOTE
About latency:

• Performance can differ according to flash configuration and platform.
• Units are in microseconds.

Quality of Service

Table 5 Quality of Service (QoS)

NOTE
About QoS:

• QoS is measured with the following conditions
  FIO test: 4KB transfer size, QD=1 or 32 on 4KB random read and write workload on whole LBA range of SSD performance on steady state and all background operations run normally.
• According to random 4KB QD=1 and 32 workloads, the result of QoS is the maximum round-trip time which is taken for 99.0% and 99.99% of commands to host.
• QoS can vary based on SSD's firmware version, system hardware and configuration.

Supply Voltage

Table 6 Supply Voltage

NOTE
Minimum Off Time is the time between power being removed from the SSD (Vcc<100 mW) and power being reapplied to the SSD.

Power Consumption

Table 7 Power Consumption

NOTE
About power consumption:

• The measured power voltage is 3.3 V.
• Power consumption is measured during the sequential/random read and write performed by FIO on Linux.
• Power Consumption can vary based on SSD's firmware version, system hardware and configuration.

Environmental Conditions

Table 8 Temperature, Humidity, Shock

NOTE
Temperature is measured without condensation.
Operating mode temperature is measured by temperature sensor, SMART Attribute C2h.
Airflow is suggested. Airflow allows the device to be operated at the appropriate temperature for each component during heavy workloads environments.

NOTE
Shock and vibration results assume that the SSD is mounted securely with the input vibration applied to the SSD mounting. These specifications do not cover connection issues that may result from testing at this level. The measured specification is in root mean square (RMS) form.

• Non-operating shock. The limits of non-operating shock applies to all conditions of handling and transportation. This includes both isolated SSD and integrated SSDs. Shock may be applied in the X-, Y-, or Z-axis.
• Non-operating vibration. The limits of non-operating vibration shall apply to all conditions of handling and transportation. This includes both isolated SSD and integrated SSDs. Vibration may be applied in the X-, Y-, or Z-axis.

Reliability and Endurance

Table 9 Reliability and Endurance

NOTE
About endurance:

• The SSD achieves the specified MTBF in an operational environment that complies with the operational temperature range specified in this manual. Operating temperatures are measured by temperature sensor, SMART Attribute ID C2h.
• Endurance rating valid for SSD Life Remaining > 1% (SMART E7h>1).
• Endurance is characterized while running JEDEC enterprise workload (JESD219).

Dimensions and Weight

Table 10 Dimensions and Weight

See Figures 1-3.

Pin and Signal Descriptions

Table 11 Pin Descriptions

SMART Support

The Nytro 4350 SSD supports the SMART command set.

SMART IDs
The following table lists SMART IDs and Descriptions.
Table 12 SMART Attributes (Log Identifier 02h)

NOTE
(Optional) Contextual information for Log Identifier 02h:

• Critical Warning [Byte 0]. This field indicates critical warnings for the state of the controller.
  Bit#0: Available spare is below threshold
  Bit#1: Temperature exceeded threshold or below an under temperature threshold
  Bit#2: Reliability is degraded due to excessive media or internal errors
  Bit#3: Media is placed in read only mode
  BIt#4: Volatile memory backup device has failed
  Bit#5 - Bit#7: Reserved
• Available Spare [Byte 3]. This value (percentage) = 100* [(total reserved VB - consumed VB caused by early, later bad)/ total reserved VB]
• Percentage Used [Byte 5]. This value (percentage) = 100* (total VB erase count/ PE cycle for total VB).

Feature Details

Flash Management

Error Correction Code

Flash memory cells deteriorate with use. This can generate random bit errors in the stored data. The Nytro 4350 SSD applies the LDPC ECC algorithm to detect and correct errors occur during read process, to make sure the SSD reads correctly, and to protect data from corruption.

Wear Leveling

NAND flash devices can undergo only a limited number of program/erase cycles. Commonly, the SSD does not use areas of the flash media evenly. If the SSD updates some areas more frequently than others, this reduces the lifetime of the device. Wear Leveling extends the life of the NAND Flash by evenly distributing write and erase cycles across the media.
Seagate's advanced Wear Leveling algorithm spreads the flash usage throughout the whole flash media area. Implementing dynamic and static Wear Leveling algorithms improves the life expectancy of the NAND flash.

Bad Block Management

Bad blocks do not function properly and they can contain more invalid bits. This can make stored data unstable and bad block reliability is not guaranteed. Blocks identified and marked as bad by the manufacturer are called "Early Bad Blocks". Bad blocks that develop during the lifespan of the Flash are called "Later Bad Blocks". Seagate's bad block management algorithm detects the factory-produced bad blocks and manages bad blocks that appear with use. This practice prevents the drive from storing data in bad blocks and improves data reliability

TRIM

The TRIM feature improves the read/write performance and speed of SSDs. SSDs cannot overwrite existing data, so the available space becomes smaller with each data block use. The TRIM command runs within the operating system to tell the SSD which data blocks can be removed permanently because they are no longer in use. The SSD erases these unused data blocks.

SMART

SMART, stands for Self-Monitoring, Analysis, and Reporting Technology. SMART is an open standard that allows an SSD to automatically detect its health and report potential failures. When SMART records a failure, users can replace the SSD to prevent unexpected outage or data loss. SMART can also inform users of impending failures while there is still time to copy data to another device.

Over Provisioning

Over Provisioning (OP) preserves an additional area beyond user capacity in an SSD, which is not visible to users and cannot be used by them. OP improves performance and IOPS (Input/Output Operations per Second) by providing the controller additional space to manage P/E cycles. OP enhances the reliability and endurance as well. Moreover, the write amplification of the SSD becomes lower when the controller writes data to the flash.

Firmware Upgrade

Firmware provides a set of instructions on how the device communicates with the host. Firmware upgrades are typically available with added features, fixed compatibility issues, and improved read/write performance.

Thermal Throttling

Thermal throttling prevents components in an SSD from over-heating during read and write operations. The Nytro 4350 SSD design provides an on-die and on-board thermal sensor. With this accuracy, firmware can apply different levels of throttling to protect efficiently and proactively through the SMART reading.

Table 13 Current version: Thermal Throttling 2.0

Multiple Namespaces

An NVMe namespace is a quantity of non-volatile memory (NVM) that can be formatted into logical blocks.
Namespaces are used when a storage virtual machine is configured with the NVMe protocol. Nytro 4350 SSD supports up to 16 namespaces for greater deployment flexibility.

Garbage Collection

Garbage collection allocates and releases memory to accelerate the read/write processing and improve performance. When there is less available space, the SSD slows down the read/write processing and implements garbage collection to release memory.

Advanced Device Security Features

Secure Erase

Secure Erase is a standard NVMe format command and it writes all of "0x00" to fully wipe all the data on hard drives and SSDs. When this command issues, the SSD controller erases its storage blocks and returns to its factory default settings.

Physical Presence SID

TCG defines Physical Presence SID (PSID) as a 32-character string. PSID reverses the SSD to its manufacturing setting when the SSD is set through TCG Pyrite (non-SED). The PSID code is printed on the SSD label. PSID erases all data when reverting the SSD to manufacturing settings.

Sanitize

The Sanitize feature uses the Format NVM command to provide an alternative to the existing secure erase capabilities. This feature provides robust data security by making sure the user data from the SSD media, caches, and the Controller Memory Buffer are erased by the block erase operations, overwriting or destroying the encryption key. The following table shows the types of Sanitize Operations supported.

Table 14 Sanitize Operations

NOTE
Sanitize Overwrite command erases all data on the disk beyond all feasible effort to recover. Completion takes at least one hour per terabyte per pass. The number of passes is drive-selectable. The NVMe spec default is 16 passes. Contact Seagate Support for more detailed information.

SSD Lifetime Management

Drive Writes per Day (DWPD) The Total Bytes Written (TBW) specification of an SSD calculates how many times you can write the user capacity of an SSD per day over the warranty period (or a different number of years), based on the JEDEC workload used to specify the TBW.
DWPD = (TBW of an SSD x 1024) / (Warranty days x SSD size in GB)

TBW measures the lifespan of the SSD. This measurement represents the amount of data written to the device. To calculate the TBW of an SSD, use the following equation:
TBW = [(NAND Endurance) x (SSD Capacity)] / [WAF]

NAND Endurance: NAND endurance refers to the P/E (Program/Erase) cycle of a NAND flash.

SSD Capacity: The SSD capacity is the specific capacity in total of an SSD.

WAF: Write Amplification Factor (WAF) is a numerical value. This value represents the ratio between the amount of data that an SSD controller needs to write and the amount of data that the host's flash controller writes. A WAF, near 1, guarantees better endurance and lower frequency of data written to flash memory.
TBW in this document is based on the JEDEC 218/219 workload.

Media Wear Indicator

The SMART attribute byte index [5], Percentage Used, reports the Actual Life Indicator. Replace the SSD when this number reaches 100%.

Read Only Mode

(End of Life)
When program/erase cycles age the SSD, media wear-out can cause increasing numbers of bad blocks. When the number of usable good blocks is less than the threshold (5%, SMART attribute log ID 02h Byte4), the SSD notifies the host through an AER event and Critical Warning to enter Read Only Mode to prevent further data corruption. When this happens, replace the SSD immediately.

Adaptive Approach to Performance Tuning

Predict and Fetch

When the Host tries to read data from the SSD, the SSD performs only one read action after receiving one command. However, the Nytro 4350 SSD applies Predict and Fetch to improve the read speed. When the host issues sequential read commands to the SSD, the SSD expects that the following are also read commands. Therefore, before receiving the next command, flash has prepared the data. This accelerates data processing time, and the host needs less wait time to receive data.

Throughput

Based on the available space of the SSD, the Nytro 4350 SSD regulates the read/write speed and manages the performance of throughput. When the SSD has more space, the firmware continuously performs read/write actions. When the SSD has less available space, it slows down the read/write processing and implements garbage collection to release memory.

Installation Precautions

Handling Precautions

There are a lot of components assembled on a single SSD device. Please handle the drive with careespecially when it has any WLCSP (Wafer Level Chip Scale Packaging) components such as PMIC, thermal sensor or load switch. WLCSP is one of the packaging technologies that is widely adopted for making smaller footprints, but any bumps or scratches may damage those ultrasmall parts so gentle handling is strongly recommended.

DO NOT DROP SSD
INSTALL SSD WITH CARE
STORE SSD IN A PROPER PACKAGE

Assembly Precautions

M Key M.2 SSD (Figure 1) is only compatible to M Key (Figure 2) socket. As shown in Use Case 2, misuse may cause severe damages to SSD including burn-out.

Seagate Technology LLC
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ASIA/PACIFIC
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EUROPE, MIDDLE EAST AND AFRICA
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Documents / Resources

References

• Product Support | Seagate US
• Software and Firmware Downloads | Seagate US
• Contact Us | Seagate US
• Warranty & Replacements | Seagate US
• Contact Us | Seagate US
• Seagate Partners | Seagate US

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