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Polar Instruments TD8000 Operator's Manual

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Polar Instruments Ltd.
Garenne Park
St. Sampson
Guernsey
Channel Islands
GY2 4AF
ENGLAND
http://www.polar.co.uk
Fax: +44 (0)1481 252476
Email: mail@polar.co.uk
MAN 144–9803
TD8000
OPERATOR
MANUAL

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  • Page 1 TD8000 Polar Instruments Ltd. Garenne Park OPERATOR St. Sampson Guernsey MANUAL Channel Islands GY2 4AF ENGLAND http://www.polar.co.uk Fax: +44 (0)1481 252476 Email: mail@polar.co.uk MAN 144–9803...
  • Page 2 Copyright Polar Instruments Ltd. 1996 Portions Copyright Genus Microprogramming, Inc. 1988–1991 LHA Copyright © Haruyasu Yoshizaki 1988 – 1991 Microsoft and MS-DOS are registered trademarks of Microsoft Corporation IBM is the registered trademark of International Business Machines Corporation.

  • Page 3: Warranty

    TD8000 FAULT LOCATOR OPERATOR MANUAL WARRANTY Subject to the conditions set out below we warrant that the goods will be free from defects in material and workmanship for a period of 12 months from the date of invoice. The above warranties given by us are subject to the following conditions:-...

  • Page 4: Declarations

    EC Council Directive 73/23/EEC on the harmonisation of the laws of the Member States relating to electrical equipment designed for use within certain voltage limits. A declaration of conformity with the requirements of these Directives has been signed by: POLAR INSTRUMENTS (UK) LTD 11 College Place London Road...

  • Page 5: Safety

    TD8000 OPERATOR MANUAL SAFETY WARNING The LIVE and NEUTRAL lines on this unit are BOTH fused. This unit contains no user-serviceable parts. When the unit is connected to its supply, the opening of covers or removal of panels is likely to expose dangerous voltages. To maintain operator safety, do not operate the unit unless the enclosure is complete and securely assembled.

  • Page 6: Power Supply

    To change the line voltage settings refer the instrument to a skilled electronics technician. Instructions for changing the line voltage settings are contained in the Service Manual published by Polar Instruments. TD8000 OPERATION This manual contains instructions and warnings which must be observed by the user to ensure safe operation.
  • Page 7 TD8000 OPERATOR MANUAL 500µA Test Ranges Junction Logic 150mA High Test Frequencies Low 90Hz 500Hz Medium 2kHz High Live modes Manual, Auto, Cycle 0 – ±5V variable level Pulse Generator DC, Pulse mode 1, Pulse width variable Pulse mode 2...

  • Page 8: Environmental Operating Conditions

    SPECIFICATIONS ENVIRONMENTAL OPERATING CONDITIONS The instrument is designed for indoor use only under the following environmental conditions: Altitude Up to 2000m Temperature +5°C to +40°C ambient Relative humidity RH 80% maximum at 31°C — derate linearly to 50% at 40°C Mains borne transients As defined by Installation Category II (Overvoltage Category II) in IEC664...

  • Page 9: Accessories

    TD8000 OPERATOR MANUAL ACCESSORIES Standard Accessories Probe set MMP159 Pair of Red and Black Test leads ACC110, ACC111 Pair of Pulse Generator leads ACC112 User Supply lead set ACC151 Pair of 16 way test clips and cables ACC107 Pair of 40 way test clips and cables...

  • Page 10: Guide To The Manual

    PC communication ports and installing the printer driver program. ASA DEVICE TESTING Discussion of Analog Signature Analysis and the different ways in which the ASA facilities of the TD8000 can be used to test devices. ICT DEVICE TESTING Description of In Circuit Functional Testing and testing devices using ICT techniques.

  • Page 11: Table Of Contents

    3.3 Installing the TD8000 software..................... 3-2 Backing up the installation diskettes ....................3-2 Installing the TD8000 software to run under Microsoft Windows: ..........3-3 Installing Printer Drivers on a PC using Microsoft Windows ............3-3 3.4 Connecting the computer to the TD8000 ..................3-4...
  • Page 12 The Main menu ..........................3-4 Using the on-line help......................... 3-5 3.6 System Utilities ..........................3-5 Setting up the TD8000 control program environment ..............3-5 3.7 Specifying the serial communication port..................3-6 3.8 Installing the Graphics driver......................3-6 3.9 System Security..........................3-7 Setting passwords ..........................
  • Page 13 Changing the Step Rate ......................5-27 SECTION 6 – LIVE MODE ........................6-1 6.1 ASA testing in Live mode ......................6-1 6.2 TD8000 test facilities ........................6-2 The TD8000 pulse generator ......................6-2 The TD8000 Scanner ........................6-2 6.3 Testing two terminal devices ......................6-3 Connecting the test cables ......................
  • Page 14 6.14 The Pins – Manual option — setting the number of pins manually .......... 6-13 Using the Foot Pedal ........................6-14 Beep mode ........................... 6-14 SECTION 7 – PROGRAMMING THE TD8000..................7-1 7.1 Program — compiling and editing test programs ................. 7-1 Organising test program storage....................7-1 7.2 File —...
  • Page 15 TD8000 OPERATOR MANUAL Global — altering the Tolerance for all devices................7-10 7.9 Search — locating devices in the device list ................7-10 7.10 Move — rearranging the device list..................7-10 7.11 Print — prints a test program ....................7-11 7.12 Asa —...
  • Page 16 APPENDIX D – TD8000 SERIES PIN NUMBERING FORMATS ............D-1 TD8000 LIVE MODE ..........................D-2 Pin numbering on the TD8000 connectors (40-pin DIP and SIP formats) ........D-2 TD8000 LIVE MODE ..........................D-4 Pin numbering on the TD8000 connectors (64-pin DIP and SIP formats) ........D-4 TD8000 PROGRAM/TEST MODES .....................
  • Page 17 TD8000 OPERATOR MANUAL Hints: ..............................E-4 Testing a board..........................E-5 Loading a Test File.........................E-5 Testing a Component........................E-5 Hints ..............................E-6 APPENDIX F.............................. F-1 SMD PROBES ............................F-1 Pin numbering ............................ F-1 Using the probe ..........................F-1 Replacing pins............................ F-1 To replace a damaged pin ......................... F-2...

  • Page 18: Section 1 - Introduction

    THE TD8000 FAULT LOCATOR The TD8000 Fault Locator provides a fast and efficient means of testing electrical components, either in isolation or in circuit. The TD8000 is designed to run under the control of an IBM PC or compatible host computer.

  • Page 19: Areas Of Application

    The TD8000 software includes a comprehensive database of digital integrated circuits in general use throughout the electronics industry. Logical high and low “guard” voltages are provided on the TD8000 front panel to enable isolation of bus- connected devices. The ICT software is able to detect and display connected pins and to display a logic timing diagram showing the status of the pins during testing.

  • Page 20: Section 2 - General Description

    The TD8000 component database includes a wide range of digital devices (from differing logic families) ranging from simple gates to microprocessors. The TD8000 is able to “learn” the circuit configuration of a device in a known good circuit and use the device/configuration as reference. Device pins that are permanently at logical high or low (e.g.

  • Page 21: Controls And Connectors

    COM socket. Channel A and B probes. The TD8000 is supplied with a pair of DVM style probes which are connected to the A and B sockets. The Channel A and B probes are connected in parallel with the Scanner inputs to facilitate checking for open circuit clip connection —...

  • Page 22: The Td8000 Rear Panel

    ICT 5V power supply Use the +5V ICT power supply to apply power to a board or device undergoing ICT testing. The TD8000 +5V ICT power supply applies power only for the duration of the test. ICT guard voltages The TD8000 provides ICT logical high (5V) and low (0V) guard voltages for isolating bus-connected digital devices during testing.

  • Page 23: Section 3 - Installation And Setup

    Note: If the instrument has been shipped or stored in a cold environment, allow the instrument to reach the temperature of its new location before applying power. 3.2 Connecting the TD8000 to a power supply Refer to the voltage label on the rear panel of the instrument and make sure that the marked rating is suitable for the local mains power supply.

  • Page 24: Installing The Td8000 Software

    Use the MS-DOS diskcopy command to make working copies of the installation diskettes. See the PC/MS-DOS operating system manual for details. Insert the TD8000 Program diskette in the diskette drive and type A: or B: as required and press <Enter>to make the drive current.

  • Page 25: Installing The Td8000 Software To Run Under Microsoft Windows

    INSTALLATION AND SETUP Installing the TD8000 software to run under Microsoft Windows: • Ensure the TD8000 software is installed under MS-DOS as described above. • Start Microsoft Windows and select the appropriate program group for the Polar software. (The Applications group is recommended.) •...

  • Page 26: Connecting The Computer To The Td8000

    Connect the cable between the host computer's serial port and the connector on the rear of the TD8000. Ensure the connections are secure. Power up the TD8000 and the host computer. Refer to Section 3.7 for details of how to specify which of the PC’s COM ports is connected to the TD8000.

  • Page 27: Using The On-Line Help

    Press the <Esc> key to exit from the help screen. 3.6 System Utilities The Utilities menu is provided to allow users customise the TD8000 operating environment. From the Utilities menu the TD8000 programmer can: • Define passwords and operator access rights •...

  • Page 28: Specifying The Serial Communication Port

    TD8000 control program. 3.8 Installing the Graphics driver The TD8000 incorporates the facility to display device signatures on screen and produce hard copies if a suitable printer is attached to the host computer. To produce hard copies of signatures, it will be necessary to install the correct graphics driver;...

  • Page 29: System Security

    <F9> key to clear the whole entry. When the correct number is displayed press <Enter>. When a driver is selected, the TD8000 program will insert the associated command into one of the host system's start up files (the "autoexec.bat" file.) See Section 3.3 if installing the graphics driver on to a machine running Microsoft...

  • Page 30: Setting Passwords

    TD8000 OPERATOR MANUAL Once the password has been entered, the system will remain Unlocked until the PC is rebooted or the Restrict Access function is used (see below). Select Security — the main Security menu is displayed: Set new password...

  • Page 31: Loop Compensation

    3.12 Exiting the TD8000 program At the end of a test or programming session, select the eXit to dos option, either from the Main menu or from the Utilities menu to terminate the current TD8000 session and exit to the PC/MS-DOS operating system.

  • Page 32: Section 4 - Asa Device Testing

    SECTION 4 – ASA DEVICE TESTING ASA DEVICE TESTING Using the Analog Signature Analysis method, safe, low power drive voltages are applied to components to produce "impedance signatures" on the PC screen. Impedance signatures are graphs of current against voltage, plotted on a scale which has its origin at the centre of the display screen.

  • Page 33: Signature Shapes

    TD8000 OPERATOR MANUAL Signature shapes The following sections explain the characteristic shapes of signatures. Normally, the fastest diagnosis is made by comparing two signatures. There is often no need to analyse the shape of the signature in detail. ASA TESTING – PASSIVE COMPONENTS R, L, C 4.1 Resistors...
  • Page 34 ASA TESTING – PASSIVE COMPONENTS R, L, C Figure 4-2 2K Resistor Logic Range Low Frequency. Figure 4-3 270K Resistor High Range Low Frequency Figure 4-4 10K Resistor High Range Low Frequency...

  • Page 35: Capacitors And Inductors

    TD8000 OPERATOR MANUAL 4.2 Capacitors and Inductors Due to their energy storage characteristics, reactive components produce a phase shift between voltage and current flow. This is displayed as a circular or elliptical signature. Figures 4-5, 4-6 and 4-7 show typical signatures for three capacitors.
  • Page 36 ASA TESTING – PASSIVE COMPONENTS R, L, C Figure 4-7 82pF Capacitor High Range High Frequency Figure 4-8 47uF Capacitor Low Range Low Frequency Faulty capacitor Resistive Figure 4-9 47uF Capacitor Low Range Low Frequency Good component...
  • Page 37 TD8000 OPERATOR MANUAL Tables 4-3 and 4-4 show the ranges of capacitors and inductors covered by each combination of frequency and drive voltage. Frequency Range High Logic 300nF – 6uF 56nF – 1uF 15nF – 300nF 6uF – 100uF 1uF – 20uF 300nF –...
  • Page 38 ASA TESTING – PASSIVE COMPONENTS R, L, C Figure 4-10 Ferrite transformer Primary winding Low Range High Frequency Figure 4-11 Ferrite Transformer Primary winding Low Range High Frequency Shorted turn...

  • Page 39: Asa Testing - Semiconductors

    TD8000 OPERATOR MANUAL ASA TESTING – SEMICONDUCTORS 4.3 Diodes, LEDs and Zeners When forward biased, a diode exhibits a low resistance and a voltage drop of approximately 0.6V. This produces a signature that is an almost vertical trace close to the Y axis (see Figure 4-12).
  • Page 40 ASA TESTING – SEMICONDUCTORS Figure 4-12 Signal diode Logic Range Low Frequency Figure 4-13 8.2V Zener diode Med Range Low Frequency...

  • Page 41: Transistors

    TD8000 OPERATOR MANUAL 4.4 Transistors A transistor contains two semiconductor junctions connected "back-to-back" (one between base and collector, the other between base and emitter). Figures 4-14 – 4-16 show typical signatures for an NPN transistor (in which the collector and emitter are N-type material and the base P-type).
  • Page 42 ASA TESTING – SEMICONDUCTORS Figure 4-14 NPN Transistor base-emitter Med Range Low Frequency Figure 4-15 NPN Transistor base-collector Med Range Low Frequency Figure 4-16 NPN Transistor emitter-collector Med Range Low Frequency 4-11...

  • Page 43: Three Terminal Testing Of Transistors

    TD8000 OPERATOR MANUAL Three Terminal Testing of Transistors A functional test may be carried out by driving the transistor base to verify that this controls conduction between the collector and emitter. The following procedure applies to an NPN transistor. The meaningful part of the signature appears in the upper right quadrant of the display;...
  • Page 44 ASA TESTING – SEMICONDUCTORS Figure 4-17 NPN Transistor Low Range Low Frequency collector-emitter Pulser Mode DC– to base Figure 4-18 PNP Transistor Logic Range Med Frequency collector-emitter Pulser Mode P1– to base 4-13...

  • Page 45: Junction Field Effect Transistors (Jfets)

    TD8000 OPERATOR MANUAL 4.5 Junction Field Effect Transistors (JFETs) The junction field effect transistor (JFET) consists of a bar of semiconductor material (the "channel") and a region doped with material of the opposite semiconductor type to the channel (the "gate"). The gate forms a diode junction with each end of the channel (the "source"...

  • Page 46: Mosfets

    ASA TESTING – SEMICONDUCTORS 4.6 MOSFETS CAUTION: Observe static precautions whenever handling MOSFETs. Use Logic range for testing (or Low for power MOSFETs). Do not use Med or High ranges. MOSFETs are field effect transistors in which the gate is insulated from the channel. The gate-drain and gate-source tests will usually produce an open-circuit signature, although some MOSFETs have a protection diode between the gate and source.

  • Page 47: Opto Isolators

    TD8000 OPERATOR MANUAL 4.7 Opto Isolators An opto isolator consists of an input LED and an electrically isolated output transistor (with base unconnected). The input diode can be checked like a conventional diode. The signature of the output transistor (i.e. its collector-emitter characteristic) will be either a horizontal line (open-circuit) or similar to Figure 4-16.

  • Page 48: Scrs

    ASA TESTING – SEMICONDUCTORS 4.8 SCRs An SCR can be regarded as a diode with an additional control terminal (the "gate"). Connect the anode to Channel A, cathode to COM and the gate to one of the Pulse outputs. Select Low range, Low frequency, Pulser Mode DC+. Set Level to 0. The signature produced is a horizontal line, indicating no conduction.

  • Page 49: Triacs

    TD8000 OPERATOR MANUAL 4.9 Triacs A Triac is similar to an SCR, except that it conducts in both directions, and can be triggered by either positive or negative gate current. Connect the MT2 terminal to Channel A, MT1 to COM and the gate to one of the Pulse outputs.

  • Page 50: Asa Testing - Integrated Circuits

    ASA TESTING – INTEGRATED CIRCUITS Figure 4-23 Triac Signature ASA TESTING – INTEGRATED CIRCUITS 4.10 Integrated Circuits The Logic and Junction ranges and Low frequency are recommended for use when testing ICs. All integrated circuits can be tested by probing pairs of terminals. Most ICs tested in this way display signatures similar to diodes or Zener diodes.
  • Page 51 TD8000 OPERATOR MANUAL Figure 4-24 74LS00 Logic Range Low Frequency Input to ground Figure 4-25 74LS00 Logic Range Low Frequency Vcc to ground Figure 4-26 74LS00 Logic Range Low Frequency Output to ground 4-20...
  • Page 52 ASA TESTING – INTEGRATED CIRCUITS Figure 4-27 74HC02 Logic Range Low Frequency Vcc to ground Figure 4-28 74HC02 Logic Range Low Frequency Input to ground Figure 4-29 74HC02 Logic Range Low Frequency Output to ground 4-21...
  • Page 53 TD8000 OPERATOR MANUAL Figure 4-30 4017 Logic Range Low Frequency Input to ground Figure 4-31 4017 Logic Range Low Frequency Output to ground Figure 4-32 4017 Logic Range Low Frequency Vcc to ground 4-22...
  • Page 54 ASA TESTING – INTEGRATED CIRCUITS An example of a defect in an IC is shown in Figures 4-33 and 4-34. Figure 4-33 shows the signature between input and ground of a good IC type 7650 tested in circuit. Figure 4-34 shows the signature of a defective 7650 in the same circuit, where the input protection diode has become leaky.

  • Page 55: Asa Testing - Testing Devices In Circuit

    TD8000 OPERATOR MANUAL ASA TESTING – TESTING DEVICES IN CIRCUIT 4.11 Testing Devices in Circuit When testing a component in circuit, the signature is a composite of that device and other components in parallel. This is most often the case when diagnosing faults in service.
  • Page 56 ASA TESTING – TESTING DEVICES IN CIRCUIT Figure 4-36 Signature at secondary winding good circuit Figure 4-37 Signature at secondary winding D3 short circuit 4-25...
  • Page 57 TD8000 OPERATOR MANUAL Figure 4-37 shows the effect on the signature in Figure 4-36 when one diode (D3) develops a short circuit. During the positive half cycle of the drive voltage (right quadrant) the signature is effectively that of diode D1. The remaining components are short circuited by D3.

  • Page 58: Testing Bus-Connected Devices

    /CE (Chip Enable) or /OE (Output Enable). This provides a method for looking at the ICs individually. Instead of connecting the TD8000's COM input to Vcc or ground, connect it to the defective bus line. Probe each of the devices' /OE or /CE pins, looking for a device whose signature differs from other similar devices.

  • Page 59: Section 5 - Ict Device Testing

    A wide range of logic elements can be tested using ICT (for example, using ICT the TD8000 can easily check that a logic gate operates in accordance with its truth table or that a counter or shift register correctly responds to a known number of clocks).

  • Page 60: Testing Devices Out Of Circuit

    (if known) to perform a test. In an ICT test the TD8000 automatically applies power to the device for the duration of the test and compares the logical function of the device under test with the corresponding “ideal”...

  • Page 61: The Td8000 Device Library

    Figure 5-1 Backdriving gates preceding the device under test The TD8000 is able to source or sink currents up to 500mA through the test clip in order to force the input of an integrated circuit into a defined state. The backdriving current forces the outputs of preceding gates into a logic high or low, regardless of their quiescent state.

  • Page 62: Td8000 Driver Development Software

    TD8000 OPERATOR MANUAL TD8000 Driver Development Software The TD8000 Driver Development Software provides an interactive environment for developing device models and requires only a basic knowledge of common programming techniques and device behaviour. Using the Driver Development Software the programmer can quickly develop programs to check a wide variety of devices, ranging from simple gates to sophisticated microprocessors.

  • Page 63: Ict Testing - Digital Ics Out Of Circuit

    Connect the test clip over the device to be tested — ensure that the brown connection of the ribbon cable is connected to pin 1 of the device. Alternatively, use the ZIF test fixture ACC145. To test a device out of circuit, ensure that the TD8000 Main menu is displayed: Test Program...
  • Page 64 TD8000 OPERATOR MANUAL Figure 5-3 Out of circuit test main screen If the device type is known select Device and enter the device type number in the Device box (see Figure 5-4) — it is not necessary to include the device family type (LS, AS, ALS, etc.)

  • Page 65: The Two-Stage Ict Test

    ICT TESTING – DIGITAL ICS OUT OF CIRCUIT Press <Enter> to confirm the device type and test the device — the TD8000 recalls the device test program, applies power to the device for the duration of the test and performs the test. The TD8000 displays the test result, PASS or FAIL along with the device pin assignment diagram.

  • Page 66: The Pin Connection Diagram

    TD8000 OPERATOR MANUAL Figure 5-5 shows the View screen of a PASS result. The pin connection diagram The pin connection diagram displays the number and status of each pin with its associated signal function, stuck pins (Vcc and ground pins are normally shown as stuck high and low respectively) and connections between pins.
  • Page 67 ICT TESTING – DIGITAL ICS OUT OF CIRCUIT Device pin numbers are shown on the left of the Logic Diagram. Use the up and down cursor keys to scroll through device pin waveforms. Device tests are shown along the top of the diagram — if the device test incorporates a large number of test points use the left and right cursor keys to scroll through program tests.

  • Page 68: Loop - Performing Tests Continuously

    In the Pins box type the number of pins on the device (16, 20, etc.) and press <Enter>. The TD8000 will test the logical operation of the device, compare the functional pattern with its database and print a list of all devices with matching functional patterns.

  • Page 69: Learning And Testing Devices

    TD8000 Device Library and compares the behaviour of the device with the expected behaviour pattern in the Library. When testing devices soldered into a circuit the operator first uses the TD8000 to learn how the device operates when driven and loaded in a good circuit.

  • Page 70: Creating A Test Program

    TD8000 OPERATOR MANUAL Creating a test program File — creating a new program To create a program, select the File command — the File command opens at the current list of programs in the program directory. Type the new program name in the filename box (See Section 7 for details of file naming conventions) and press <Enter>...

  • Page 71: Defining The Device And Test Type

    Enter the device type (e.g., 74LS00, 74138, etc.) in the Type: field; up to 13 characters may be used to specify the device type. Press <Enter> or cursor keys to move to the next field — the TD8000 searches for a matching entry in its component database. Provided the device type is a digital device and a match is found the device description is displayed in the ICT Settings box.

  • Page 72: Specifying The Logic Voltage Thresholds

    TD8000 OPERATOR MANUAL Specifying the logic voltage thresholds The TD8000 allows the user to select the logic voltage thresholds to be used during an ICT test. The Ttl and Cmos options provide predefined values for the HIGH and LOW logic levels.

  • Page 73: Preventing Instability Problems

    If this message is displayed try re-learning the device or using a different step rate. Preventing instability problems Use the supplied cables to supply power from the TD8000 to the board under test — using thin cables to supply power may result in voltage drop along the cable (particularly if heavy currents are drawn) and may cause instability or unreliable results.

  • Page 74: The Pin Connection Diagram

    TD8000 OPERATOR MANUAL the device. This mode may be of use when debugging ICT tests. The ICT View screen displays a pin connection diagram of the selected integrated circuit type along with a timing diagram portraying the pins’ status during test. Figure 5-7 shows the ICT View...

  • Page 75: Confirmed Links

    ICT TESTING – DIGITAL ICS IN CIRCUIT Confirmed links Confirmed links refer to pins which are connected on the reference board. Link lines are displayed in blue, yellow, cyan or purple. If the number of links exceeds four, the connected pins are shown using a symbol: A(white) = Confirmed link Logic diagram The reference data is shown in green.

  • Page 76: Testing The Device

    5.6 Testing the device ICT testing Connect the test clip between channel A of the TD8000 and the device to be tested. To test the learnt device choose Test from the main menu. The TD8000 displays the device parameter screen last accessed. The device list screen includes four sections: •...

  • Page 77: The Pin Connection Diagram

    ICT TESTING – DIGITAL ICS IN CIRCUIT Figure 5-9 PASS result showing confirmed pin status and correct logic functions The pin connection diagram The pin connection diagram displays the number of each pin with its associated signal function label (e.g. CLK, VCC, GND, etc.) stuck pins and connected pins. Connected pins (links) Three types of links are detected and displayed by the ICT test process: Confirmed links —...

  • Page 78: Stuck Pins

    The logic diagram graphically displays the logic level of every device pin at each "tested" step in the device's test program. The TD8000 logic diagram displays logic levels as High, Low, Tristate or Don't Care. The operator can see at a glance the stimulating signals on the device inputs and the resulting logic levels on the device outputs at every step in the device test program.
  • Page 79 Figure 5-10 illustrates the pin connection and logic diagram of a FAIL test. The TD8000 has detected a missing link between pins 4 and 5 of the device. Pins behaving correctly are displayed in green — pins displaying errors are shown in red for easy identification.

  • Page 80: Logic Levels In The Logic Diagram

    Figure 5-11 NAND gate with pins 1 and 2 tied together used as an inverter In Figure 5-11 pins 1 and 2 of U1A are tied together — during a test the TD8000 will attempt to check that the device functions in accordance with the truth table for a NAND gate.

  • Page 81: Initialising Devices

    If a device cannot be initialised test results may be unpredictable: • If, for example, the RESET lines of a counter have been hard wired the TD8000 will be unable to correctly initialise the counter. • Some microprocessors contain internal free-running clocks which cannot...

  • Page 82: Disabling Bus Buffers

    It will, however, in many situations be impossible to remove or disable devices. The TD8000 therefore makes logical high and low guard voltages (+5V and 0V) available at its front panel to enable users to disable components in the vicinity of the device under test.

  • Page 83: Disabling Memory Devices

    Chip Enable signal lines in address decoding circuits (sometimes whole blocks can be disabled via a single line). The TD8000 applies guard voltages to selected devices during testing to disable the device outputs and prevent bus contention. Bus contention occurs when more than one device attempts to place data on the bus at a given time.

  • Page 84: Viewing Ict Data

    Note: Use the supplied cables to supply power from the TD8000 to the board under test — using thin cables to supply power may result in voltage drop along the cable (particularly if heavy currents are drawn) and may cause instability or unreliable results.

  • Page 85: Changing The Step Rate

    ICT TESTING – DIGITAL ICS IN CIRCUIT On some circuit boards, narrow power supply tracks may cause stability problems. If device stability proves difficult, try injecting supply voltages close to the device under test. Changing the Step Rate The Step Rate function controls the delay prior to each “tested” step during the ICT test.

  • Page 86: Section 6 - Live Mode

    SECTION 6 – LIVE MODE 6.1 ASA testing in Live mode In this section we use the TD8000 in Live mode to test devices using ASA techniques — in the next section we discuss the programmed operation of the TD8000 and combine ASA and ICT techniques in test programs to perform complex and repetitive operations automatically.

  • Page 87: Td8000 Test Facilities

    PC screen. The TD8000 is able to sequentially scan each pin of the IC under test, applying the test stimuli set by the Voltage and Frequency ranges, and compare the signatures with the signatures of a known good device.

  • Page 88: Options - Specifying The Test Parameters

    From the Main menu select Live then select Options to specify the test format and tolerance — the Options window is displayed: Figure 6-2 The Options window The TD8000 format, voltage and frequency settings are stored between sessions, so the settings displayed will be those from the previous session. Defining test conditions To specify test conditions, highlight the desired option (Format, Tolerance, etc.)

  • Page 89: Asa Test Formats

    — for single in-line packages or surface mounted device probes — for dual in-line packages In the Sip and Dip modes the TD8000 Scanner can rapidly compare the signatures on the pins of a pair of ICs, automatically determining the number of pins on the ICs and displaying test results and signatures for each pin in order of error or pin number on the screen of the host computer.

  • Page 90: Selecting The Voltage Range

    Drive voltages and frequencies may be defined manually or automatically. Manual selection Press the Mode hot key (the M key) until Manual mode is selected. The TD8000 provides a range of current limited drive voltages. Only one drive voltage can be...

  • Page 91: Selecting The Frequency Range

    TD8000 OPERATOR MANUAL 6.8 Selecting the Frequency range The operator can select the most suitable test frequency, Low, Med, or High with the Frequency hot key. Signature shapes The signature produced by a pure resistance is an inclined straight line whose slope (gradient) is dependent on the value of resistance.

  • Page 92: Auto Mode

    Display hot key). Selecting a Display range automatically returns the Live mode to Manual. Cycle mode Select Cycle mode — the TD8000 will cycle through the specified test voltage ranges. 6.10 The Step Rate option In certain circuit configurations, high capacitance values may result in charging times...

  • Page 93: Testing Three Terminal Devices

    The Pulser Mode options in the Options window control the operation of the TD8000 Pulse Generator and allow the operator to carry out a wide range of tests on three terminal devices. The level of the pulser can be adjusted on the LIVE screen...
  • Page 94 LIVE MODE The Pulser Mode options are summarised in the table below: Mode Function Selects a + DC voltage output. The level is adjusted with the Level control. DC– Selects a – DC voltage output. The level is adjusted with the Level control.
  • Page 95 TD8000 OPERATOR MANUAL Only one mode DC, PULSE 1 or PULSE 2 can be selected at any one time. SECTION 4 — ASA DEVICE TESTING discusses three terminal device testing. Figure 6-4a Pulser 1 Output Figure 6-4b Pulser 2 Output...

  • Page 96: Testing Integrated Circuits

    IC signatures. 6.12 The TD8000 Scanner The TD8000 Scanner provides the facility for rapid scanning of signatures on all pins of an IC under test. The Scanner is automatically selected when the Sip or Dip options are selected from the Format menu.

  • Page 97: Testing Ics

    Press the <Esc> key to save the selected options. Select Asa — the TD8000 runs the test using the parameters specified in the Options window. The Scanner first detects the number of pins on the device (on the T4128 it also checks for short circuits between the pins and common) then acquires the signatures on each IC pin sequentially starting at pin 1.

  • Page 98: Manually Scrolling Through The Ic Pins

    The TD8000 will fail to register a connection to pin 1 so the program will display the message: ABORT – No device found In these cases it is necessary to manually set the number of pins on a device before each scan.

  • Page 99: Using The Foot Pedal

    The foot pedal duplicates the <Enter> key Beep mode The TD8000 incorporates the facility to sound an audible warning when the deviation between two signatures under comparison exceeds a specified value. This feature enables the operator to probe the devices under test while maintaining visual contact with the circuit module.

  • Page 100: Section 7 - Programming The Td8000

    Organising test program storage Test programs are stored in "directories". A "default" directory (named TESTPROG) is created by the system. This default directory will be used by the TD8000 to store test programs. Users can create other sub directories in which to group related programs. If more than one directory exists, only one may be active (the "working directory") at any...

  • Page 101: File - Loading Or Creating A Test Program

    — functions which are unavailable are shown in grey When the Program option is selected, the TD8000 recalls the most recently used program (or an empty program named UNTITLED if no programs have been created).

  • Page 102: Name - Specifying An Extended Program File Name

    (for a new file the device list will be empty except for the *END* mark.) 7.3 Name — Specifying an extended program file name The TD8000 program allows test programs to be given qualifying or descriptive names in addition to the program name assigned in the File option.

  • Page 103: Defining The Device And Test Type

    Press <Enter> or move to the next field — the TD8000 examines the device type entry and searches for a matching entry in its component database. If the device type is a digital device and a match is found the device description is displayed in the ICT Settings box.

  • Page 104: Ref: - Specifying The Circuit Reference

    PROGRAMMING THE TD8000 To specify a dummy device, type "DUMMYnn" in the device Type: field (where nn is the number of pins) and a Connectivity Test will be performed without a functional test. Note: all dummy devices assume Vcc at pin nn and Ground at pin nn/2.

  • Page 105: Step Rate

    ASA Settings box. Package — defining the device configuration The TD8000 is able to accommodate a wide range of component types from simple two-terminal devices to multi-pin ICs; the device configuration is defined in the PACKAGE field — highlight the PACKAGE field to specify the configuration of the part to be tested —...

  • Page 106: Pins - Specifying The Number Of Pins

    Single in-line packages 1 – 128 Probes Note: For dual in-line package devices the TD8000 will accept even numbers only. Select Pins (press the P key) and enter the number of pins on the device. Invalid entries will be ignored.

  • Page 107: Shorts - Testing For Short Circuits Between Pins And Common

    Shorts — Testing for short circuits between pins and Common With this option specified, the TD8000 will check for short circuit conditions between pins and Common. Highlight the SHORTS field; pressing the <O> key toggles the SHORTS function On and Off.

  • Page 108: The Notebook File

    There may be occasions, however, when it proves impossible to completely eliminate oscillation or instability in a device; the FILTER function allows signatures stored during acquisition to be mathematically processed by the TD8000 program to reduce the effect of spurious oscillation or device breakdown.

  • Page 109: Global - Altering The Tolerance For All Devices

    TD8000 OPERATOR MANUAL session the test parameter screen will open with the parameters of the device in the Insert Template. Global — altering the Tolerance for all devices Global provides a convenient way to change all the Tolerance values in a test program to a single new value.

  • Page 110: Asa - Acquiring Reference Asa Signatures

    To learn a device, with all test parameters defined for the device, connect the test leads between the TD8000 and the device to be learnt, highlight the device in the device list and select Asa for ASA functions. The TD8000 acquires the device signatures using the specified test parameters and saves them to the hard disk of the host computer.

  • Page 111: View - Viewing Asa Signatures

    Select Ict for ICT operations — the logic function of the device is tested using the displayed logic levels and step rate, and verified for stability. If the device performs correctly on each “pass” the device is regarded as stable. The TD8000 displays the message: Learnt device stable.

  • Page 112: View - Viewing Ict Data

    PROGRAMMING THE TD8000 Learnt device stable. If the device fails a logical test during the verification process, the TD8000 records the number of pins regarded as unstable and displays a warning message: *** Warning *** Learnt device unstable. Try re-learning the device or using a different step rate — refer to Section 5 Testing digital ICs in circuit View —...

  • Page 113: Zoom - Displaying Magnified Signatures

    On occasions users may find it helpful to inspect signatures in greater detail than that provided by the normal View resolution. The TD8000 control program provides the operator with the facility to view magnified signatures via the Zoom function. Ensure the device signature to be magnified is displayed on screen. Select Zoom —...

  • Page 114: Viewing Ict Data

    PROGRAMMING THE TD8000 Use the cursor keys and the <Home> and <End> keys if necessary to see all of the information in the Shorts window. Press <Esc> to close the Shorts data window. Viewing ICT data The ICT View screen displays a pin connection diagram of the selected integrated circuit type along with a timing diagram portraying the pins’...

  • Page 115: Stuck Pins

    TD8000 OPERATOR MANUAL Stuck pins Pins marked by a cyan ∆ symbol are stuck high Pins marked by a purple ∇ symbol are stuck low Confirmed links Confirmed links refer to pins which are connected on the reference board. Link lines are displayed in blue, yellow, cyan or purple. If the number of links...

  • Page 116: Section 8 - Test

    Program option. 8.1 File — recalling a program Select File — the TD8000 displays the test program files in the current program directory. Highlight the test program to be run and press <Enter> — the program device list is displayed.

  • Page 117: Asa Testing

    Ensure the attached printer is switched on and On-line if printouts are required. ASA testing Connect the test leads between channel A of the TD8000 and the device to be tested (ensure the COM connections between the device and the TD8000 are correctly made) and select Asa by pressing the <A>...

  • Page 118: Ict Testing

    Select Notebook to review or make changes to the Notebook file. ICT testing Connect the test clip between channel A of the TD8000 and the device to be tested and select Ict via the <I> or <Enter> key or the foot pedal.

  • Page 119: View - Examining The Acquired Signatures

    TD8000 OPERATOR MANUAL Device List are updated accordingly — it is not necessary to retest the board to determine the effect of changing the Tolerance. Pressing <Esc> when prompted for the Tolerance will restore the original values from the test program.

  • Page 120: Zoom - Displaying Magnified Signatures

    Zoom — displaying magnified signatures On occasions users may find it helpful to inspect signatures in greater detail than that provided by the normal View resolution. The TD8000 control program provides the operator with the facility to view magnified signatures via the Zoom function.

  • Page 121: Shorts - Displaying The Shorts Data For A Device

    TD8000 OPERATOR MANUAL Page Select Page to print the signatures displayed on screen or All to print all signatures for the selected device. If All is selected, pressing the <Esc> key will terminate printing at the end of the current page of eight signatures. See the attached sample printout.
  • Page 122 RUNNING TEST PROGRAMS Figure 8-1 Test View screen The logic diagram shows the status of each pin at each "tested" step in the device's test program. Reference data is shown in green. Levels are shown as High, Low, Tristate or Don't Care. Differences between acquired and reference data are shown in red.

  • Page 123: Connected Pins (Links)

    TD8000 OPERATOR MANUAL The pin connection diagram displays the number of each pin with its associated signal function, stuck pins and links between pins detected by the ICT test. Connected pins (links) Three types of links are detected and displayed by the ICT test process: Confirmed links —...

  • Page 124: Report - Printing Test Results

    Deviation. Shorts test failures are listed first. A partial Report is shown below: Sample Report ************************************************************** Polar TD8000 — Test Report DMS Circuit Boards Date : Wed Feb 14 1996 Time : 10:00 BOARDNAME — Interface Board Total Devices on Board –...

  • Page 125: Printmode

    TD8000 OPERATOR MANUAL 8.9 Printmode The TD8000 control program incorporates the facility to produce on-line printing of the results of a device test. The Printmode option allows users to specify the conditions under which results are printed. Selecting the Printmode option cycles through the alternative printing modes: PRINT Off —...

  • Page 126: Initialise

    Export copies the contents of the datalog to a file for use by database packages, etc. The log will be copied to the file <filename.LOG> in the directory \TD8000\DATALOG\, where filename is the name of the test program. The current contents of the file will be overwritten.

  • Page 127: Section 9 - File Management

    SECTION 9 – FILE MANAGEMENT MANAGING TD8000 PROGRAM FILES Selecting the TD8000 File Management menu enables users to copy and delete test programs, back up test programs to floppy disk for archiving, restore archived programs and create directories for test program storage.

  • Page 128: Delete Test Program - Removing Test Programs

    TD8000 OPERATOR MANUAL Selecting a file called MAINBRD1 and typing MAINBRD2 at the cursor will create a new file called MAINBRD2 identical to MAINBRD1. If the target file already exists the Copy function will overwrite (and destroy) the target file.

  • Page 129: Backup Test Program - Backing Up Programs And Data

    Archiving to diskette The TD8000 File management provides programmers with the facility to back up test programs to diskette for security or archiving. Ensure that a formatted diskette is inserted in the diskette drive slot before selecting programs for backing up.

  • Page 130: Backup Destination - Specifying The Destination For Program Archiving

    TD8000 OPERATOR MANUAL 9.4 Backup destination — Specifying the destination for program archiving When installed, the TD8000 program is configured to select the A diskette drive as the destination for program backup. This can be changed (e.g. to the B diskette drive) using the bacKup destination option.

  • Page 131: Erase Directory - Removing Program Directories

    Program directories (i.e. directories created within the TD8000\PROGRAMS directory) may be removed using the Erase directory function. The TD8000 will only allow empty directories (i.e. directories containing no files) to be removed — if a directory which is to be removed contains files, all the files must be deleted prior to removing the directory (use the Delete test program function to delete program files.) The system will issue an error message if the user attempts to...

  • Page 132: Section 10 - Maintenance And Cleaning

    SECTION 10 – MAINTENANCE AND CLEANING WARNING This instrument should only be serviced by a qualified electronics technician. Refer all servicing to qualified service personnel. Polar Instruments publishes a TD8000 Service Manual to assist the service technician. 10.1 Calibration requirements...

  • Page 133: Cleaning

    Alternatively, a cloth lightly moistened with alcohol (ethanol or methylated spirit) or isopropyl alcohol (IPA) may be used. Do not spray cleaners directly onto the instrument. 10.6 Technical Support For technical support contact your local Polar Instruments distributor or Polar Instruments. 10-2...

  • Page 134: Introduction And Index

    APPENDIX A — EXAMPLES OF ANALOG SIGNATURES INTRODUCTION AND INDEX The following pages have been produced from a selection of components and include comparisons of integrated circuits from different vendors. Signatures produced in your circuits may not appear exactly similar to these examples since manufacturers can change their processes (which could alter the signatures).
  • Page 135 APPENDIX B The ASA Comparison Algorithm For comparison , the signatures are sampled over n points. In the TD8000 n is fixed at 100. The Deviation D is defined as: ∑ D = 1/n | Va n – Vb n | x k% where Va 1 , Va 2 ..Va n represent the amplitude of channel A, i.e.

  • Page 136: File Translators

    APPENDIX C FILE TRANSLATORS Polar T6000 to T4XXX file translator (TRAN.EXE). V1:0 This small command line program converts existing T6000 files to the file format required by the T4XXX series of instruments. The file translation program WILL NOT alter the 'original' T6000 files. However we strongly recommend that users keep backup copies of all test programs at all times.

  • Page 137: Polar T4Xxx To Td8000 File Translator (Td8Tran.exe). V1:0

    For example, to translate the T4000 file 'NCL_DISK' to the new TD8000 format type the following at the DOS prompt: TD8TRAN \T4XXX\PROGRAMS\TESTPROG\ \TD8000\PROGRAMS\TESTPROG\ NCL_DISK Note that if you wish to convert T6000 test programs into the TD8000 format you will have to first convert them to the T4XXX format.

  • Page 138: Polar Td8000 To T4Xxx File Translator (Td4Tran.exe). V1:0

    To invoke the translator from the DOS command prompt use the following format: TD4TRAN <SOURCE FILE PATH> <TARGET FILE PATH> <FILENAME> For example, to translate the TD8000 file 'NCL_DISK' to the T4XXX format type the following at the DOS prompt: TD4TRAN \TD8000\PROGRAMS\TESTPROG\ \T4XXX\PROGRAMS\TESTPROG\ NCL_DISK.

  • Page 139: Appendix D - Td8000 Series Pin Numbering Formats

    The position of pin #1 is always the same (in the upper right corner when the instrument is viewed from the front). Live mode for the TD8000 is a dual-channel mode. In Live mode Channels A and B can accommodate up to 64 pins each.

  • Page 140: Td8000 Live Mode

    TD8000 OPERATOR MANUAL TD8000 LIVE MODE Pin numbering on the TD8000 connectors (40-pin DIP and SIP formats) The illustrations opposite show the Live mode TD8000 Scanner connector formats for 40-pin DIP and SIP devices.
  • Page 141 TD8000 LIVE MODE...

  • Page 142: Td8000 Live Mode

    TD8000 OPERATOR MANUAL TD8000 LIVE MODE Pin numbering on the TD8000 connectors (64-pin DIP and SIP formats) The illustrations opposite show the Live mode TD8000 Scanner connector formats for 64-pin DIP and SIP devices.
  • Page 143 TD8000 LIVE MODE...

  • Page 144: Td8000 Program/Test Modes

    TD8000 OPERATOR MANUAL TD8000 PROGRAM/TEST MODES Pin numbering on the TD8000 connectors (40-pin DIP and SIP formats) The illustrations opposite show the Program/Test mode TD8000 Scanner connector formats for 40-pin DIP and SIP devices.
  • Page 145 TD8000 PROGRAM/TEST MODES...

  • Page 146: Td8000 Program/Test Modes

    TD8000 OPERATOR MANUAL TD8000 PROGRAM/TEST MODES Pin numbering on the TD8000 connectors (64-pin DIP and SIP formats) The illustrations opposite show the Program/Test mode TD8000 Scanner connector formats for 64-pin DIP and SIP devices.
  • Page 147 TD8000 PROGRAM/TEST MODES...

  • Page 148: Td8000 Program/Test Modes

    TD8000 OPERATOR MANUAL TD8000 PROGRAM/TEST MODES Pin numbering on the TD8000 connectors (128-pin DIP and SIP formats) The illustrations opposite show the Program/Test mode TD8000 Scanner connector formats for 128-pin DIP and SIP devices. D-10...
  • Page 149 TD8000 PROGRAM/TEST MODES D-11...

  • Page 150: Appendix E - Td8000 Programming Example

    APPENDIX E – TD8000 PROGRAMMING EXAMPLE. Running the TD8000 Control Program. This appendix is included to help the new user to write and run a simple TD8000 test program. The example is written around the NCL Disk Controller demo board, but a board of your choice may be substituted if preferred.

  • Page 151: Inserting A Component

    7. To add the first component to the file select the InseRt hotkey. The control program will enter the program Edit mode. Note: The initial TD8000 ASA Settings (i.e. ASA device test parameters) on this screen are provided by default as a starting point; any alterations are easily made by selecting the appropriate field with the up or down cursor keys and using hotkeys to turn selections On or Off.

  • Page 152: Learning Signatures

    Check the RS232 cable is connected to the TD8000 and the PC, and plug the foot pedal into the jack on the rear of the TD8000.

  • Page 153: Specifying An Ict Test

    Highlight the 74HC04 in the device list and select Ict to learn the device. As for the ASA example, select View to examine the test data – the TD8000 displays the 7404 pin connection and timing diagrams – use the cursor keys to scroll through the device pins.

  • Page 154: Testing A Board

    The top line of the screen should now display: Polar TD8000 NCL_DISK Demo Disk Controller. The TD8000 is now ready to begin testing. Press Notebook to display the file containing notes and instructions associated with this test program. Testing a Component.

  • Page 155: Hints

    Warning Communication Aborted any key to continue Check the cable between PC and TD8000. Check the COM port setting (see SECTION 3 – INSTALLATION AND SET UP.) If the test fails and Shorts test, or 1 or more pins fail: View the signatures –...

  • Page 156: Smd Probes

    Pin #1 on the SMD Probe is indicated by a dot on the probe head and the red stripe on the cable. Remember when using the probe that the pin number reported by the TD8000 refers to the probe. If pin #1 of the probe is not connected to pin #1 of the device under test, the user must add an appropriate offset to the number displayed to obtain the correct IC number.
  • Page 157 TD8000 OPERATOR MANUAL comb. However, it is not a problem if either stays attached to the probe head. Note: the T132 does not have a comb 2. The spring-pin is mounted in a fixed receptacle. Grip the pin close to where it exits the receptacle, using a pair of pliers.

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