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Polar Instruments T4000 Operator's Manual

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Polar Instruments Ltd.
Garenne Park
St. Sampson
Guernsey
Channel Islands
GY2 4AF
England
http://www.polar.co.uk
Fax: +44 (0)1481 252476
Email: mail@polar.co.uk
MAN 138-9803
T4000
OPERATOR
MANUAL

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  • Page 1 Polar Instruments Ltd. T4000 Garenne Park St. Sampson OPERATOR Guernsey Channel Islands MANUAL GY2 4AF England http://www.polar.co.uk Fax: +44 (0)1481 252476 Email: mail@polar.co.uk MAN 138-9803...
  • Page 2 Copyright Polar Instruments Ltd. 1995 Portions Copyright Genus Microprogramming, Inc. 1988–1991 Microsoft and MS-DOS are registered trademarks of Microsoft Corporation IBM is the registered trademark of International Business Machines Corporation.
  • Page 3 T4000 FAULT LOCATOR OPERATOR MANUAL WARRANTY Subject to the conditions set out below we warrant that the goods will be free from defects in material and workmanship for a period of 12 months from the date of invoice. The above warranties given by us are subject to the following conditions:-...
  • Page 4 T4000 OPERATOR MANUAL DECLARATIONS European Community Directive Conformance Statement This product conforms to all applicable EC Council Directives, including: EC Council Directive 89/336/EEC on the approximation of the laws of the Member States relating to electromagnetic compatibility. EC Council Directive 73/23/EEC on the harmonisation of the laws of the Member States relating to electrical equipment designed for use within certain voltage limits.
  • Page 5 SAFETY SAFETY WARNING The LIVE and NEUTRAL lines on this unit are BOTH fused. This unit contains no user-serviceable parts. When the unit is connected to its supply, the opening of covers or removal of panels is likely to expose dangerous voltages. To maintain operator safety, do not operate the unit unless the enclosure is complete and securely assembled.
  • Page 6 To change the line voltage settings refer the instrument to a skilled electronics technician. Instructions for changing the line voltage settings are contained in the Service Manual published by Polar Instruments. T4000 OPERATION This manual contains instructions and warnings which must be observed by the user to ensure safe operation.
  • Page 7 SPECIFICATIONS SPECIFICATIONS MODEL T4040 T4080 T4000,T4128 Test Channels Program and Test Live 2 x 20 2 x 40 2 x 64 Test Ranges Junction 500µA Logic 150mA High Test Frequencies 90Hz All modes All modes All modes Medium 500Hz All modes...
  • Page 8 T4000 OPERATOR MANUAL ENVIRONMENTAL OPERATING CONDITIONS The instrument is designed for indoor use only under the following environmental conditions: Altitude Up to 2000m Temperature +5°C to +40°C ambient Relative humidity RH 80% maximum at 31°C — derate linearly to 50% at 40°C...
  • Page 9 ACC110, ACC111 Pulse Generator leads ACC112 Operator manual MAN138 16 way test clips and cables (T4128/T4000 x 2, T4040/T4080 x 1) ACC107 40 way test clips and cables (T4128/T4000 x 2, T4040/T4080 x 1) ACC106 Foot Pedal ACC124 RS-232 interface cable...
  • Page 10 Connecting the T4000 to a power supply, installation of software and preparation for use. DEVICE TESTING Information about the different ways in which the facilities of the T4000 can be used and how to test devices. UTILITIES Customising the T4000 operating environment – defining user access rights, specifying the PC communication ports and installing the printer driver program.
  • Page 11 SECTION 3 – INSTALLATION AND SETUP ............3-1 3.1 Unpacking ....................3-1 3.2 Connecting to a power supply ..............3-1 3.3 Installing the T4000 software..............3-2 Backing up the installation diskettes ............3-2 3.4 Connecting the computer to the T4000 ............3-3 3.5 Running the program.................. 3-3...
  • Page 12 4.12 Testing Bus-connected devices.............. 4-28 SECTION 5 – UTILITIES ..................5-1 THE UTILITIES MENU ..................... 5-1 5.1 Setting up the T4000 control program environment ........5-1 5.2 Specifying the serial communication port ........... 5-2 5.3 Installing the Graphics driver ..............5-2 5.4 System Security..................
  • Page 13 6.14 The Pins – Manual option – setting the number of pins manually ..6-16 Using the Foot Pedal ................6-17 Beep mode....................6-17 SECTION 7 – PROGRAMMING THE T4000............7-1 7.1 Program – compiling and editing test programs ......... 7-1 Test program size ................... 7-1 Organising test program storage ............
  • Page 14 T4000 OPERATOR MANUAL Range – Specifying voltage ranges ............7-6 Pulser – Setting the Pulse Generator (T4128 only) ....... 7-6 Signal Processing ..................7-7 Filter – mathematically processing signatures ........7-7 Step Rate – Controlling the range and pin switching rate ...... 7-7 7.6 User Instructions –...
  • Page 15 Export – copying the datalog to a file........... 8-10 SECTION 9 – FILE MANAGEMENT ..............9-1 T4000 FILE MANAGEMENT ..................9-1 9.1 Copy test program – Copying test programs ..........9-1 9.2 Delete test program – Removing test programs ......... 9-2 9.3 Backup test program –...
  • Page 16 T4000 OPERATOR MANUAL APPENDIX C – TEST PROGRAM STORAGE ............C-1 APPENDIX D – T4000 SERIES PIN NUMBERING FORMATS ......D-1 T4040 PIN NUMBERING FORMAT................D-1 T4040 Live Mode....................D-2 T4040 Program And Test Modes ..............D-3 T4080 PIN NUMBERING FORMAT................D-5 T4080 Live Mode....................D-6 T4080 Program And Test Modes ..............D-8 T4128 PIN NUMBERING FORMAT................D-10...
  • Page 17 The T4000 Fault Locator provides a fast and efficient means of testing components, either in isolation or in circuit. The T4000 is designed to run under the control of an IBM PC or compatible host computer. Safe, low power drive voltages are applied to components to produce an "impedance signature"...
  • Page 18 T4000 OPERATOR MANUAL 1.3 PC Control The T4000 program provides the T4000 with the facility to operate under the control of an IBM PC (or compatible) host computer. The program provides an integrated environment for writing test programs, digitising, viewing and storing device signatures, managing program files and controlling system security.
  • Page 19 COM socket. Channel A and B probes. The T4000 is supplied with a pair of DVM style probes which are connected to the A and B sockets. The Channel A and B probes are connected in parallel with the Scanner inputs to facilitate checking for open circuit clip connection —...
  • Page 20 T4000 OPERATOR MANUAL When the T4000 is set to Probes the 40 and 26-way connectors are isolated and input to the T4000 is from the probes only. This will be of use where low-capacitance tests are being made as the stray capacitance from the Scanner is disconnected from the input.
  • Page 21 Pair of test clips (red and black) Pair of Pulse Generator test clips (blue) Pair of 16-way IC test clips and cables (T4128/T4000 only) Pair of 40-way IC test clips and cables (T4128/T4000 only) 16-way IC test clips and cables (T4040/T4080)
  • Page 22 Insert the working diskette in the diskette drive and type A: or B: as required and press <Enter>to make the drive current. Type Install and press <Enter>. The installation program will create the T4000 directory and file structure and copy the T4000 files onto the hard disk.
  • Page 23 Running the program To start the program, ensure the C:\> command prompt is displayed and type T4040, T4080 or T4128 (for both T4128 and T4000) as appropriate and press <Enter> – the T4000 Main menu is displayed. The Main menu The T4000 is designed for operation via a logically structured menu system.
  • Page 24 T4000 OPERATOR MANUAL Using the on-line help The T4000 program provides help screens containing brief summaries of the functions available on the displayed screen. Press the <F1> key to obtain help; use the <PgUp> and <PgDn> keys to scroll through the help screens until the desired function summary is displayed.
  • Page 25 SECTION 4 – DEVICE TESTING IMPEDANCE SIGNATURES Impedance signatures are graphs of current against voltage, plotted on a scale which has its origin at the centre of the display screen. Positive voltages and currents are displayed in the upper right quadrant on the display. Negative voltages and currents are displayed in the lower left quadrant (see Figure 4-1 Display X and Y Axis).
  • Page 26 T4000 OPERATOR MANUAL Signature shapes The following sections explain the characteristic shapes of signatures. Normally, the fastest diagnosis is made by comparing two signatures. There is often no need to analyse the shape of the signature in detail. PASSIVE COMPONENTS R, L, C 4.1 Resistors...
  • Page 27 DEVICE TESTING Figure 4-0Z2 2K Resistor Logic Range Low Frequency. Figure 4-0Z3 10K Resistor High Range Low Frequency Figure 4-0Z4 270K Resistor High Range Low Frequency...
  • Page 28 T4000 OPERATOR MANUAL 4.2 Capacitors and Inductors Due to their energy storage characteristics, reactive components produce a phase shift between voltage and current flow. This is displayed as a circular or elliptical signature. Figures 4-5, 4-6 and 4-7 show typical signatures for three capacitors.
  • Page 29 DEVICE TESTING Figure 4-0Z7 82pF Capacitor High Range High Frequency Figure 4-0Z8 47uF Capacitor Low Range Low Frequency Faulty capacitor Resistive Figure 4-0Z9 47uF Capacitor Low Range Low Frequency Good component...
  • Page 30 T4000 OPERATOR MANUAL Tables 4-3 and 4-4 show the ranges of capacitors and inductors covered by each combination of frequency and drive voltage. Frequency Range High Logic 300nF – 6uF 56nF – 1uF 15nF – 300nF 6uF – 100uF 1uF – 20uF 300nF –...
  • Page 31 DEVICE TESTING Figure 4-0Z10 Ferrite transformer Primary winding Low Range High Frequency Figure 4-0Z11 Ferrite Transformer Primary winding Low Range High Frequency Shorted turn...
  • Page 32 T4000 OPERATOR MANUAL SEMICONDUCTORS 4.3 Diodes, LEDs and Zeners When forward biased, a diode exhibits a low resistance and a voltage drop of approximately 0.6V. This produces a signature that is an almost vertical trace close to the Y axis (see Figure 4-12).
  • Page 33 DEVICE TESTING Figure 4-0Z12 Signal diode Logic Range Low Frequency Figure 4-0Z13 8.2V Zener diode Med Range Low Frequency...
  • Page 34 T4000 OPERATOR MANUAL 4.4 Transistors A transistor contains two semiconductor junctions connected "back-to-back" (one between base and collector, the other between base and emitter). Figures 4-14 – 4-16 show typical signatures for an NPN transistor (in which the collector and emitter are N-type material and the base P-type).
  • Page 35 DEVICE TESTING Figure 4-0Z14 NPN Transistor base-emitter Med Range Low Frequency Figure 4-0Z15 NPN Transistor base-collector Med Range Low Frequency Figure 4-0Z16 NPN Transistor emitter-collector Med Range Low Frequency 4-11...
  • Page 36 T4000 OPERATOR MANUAL Three Terminal Testing of Transistors A functional test may be carried out by driving the transistor base to verify that this controls conduction between the collector and emitter. The following procedure applies to an NPN transistor. The meaningful part of the signature appears in the upper right quadrant of the display;...
  • Page 37 DEVICE TESTING Figure 4-17 NPN Transistor Low Range Low Frequency collector-emitter Pulser Mode DC– to base Figure 4-18 PNP Transistor Logic Range Med Frequency collector-emitter Pulser Mode P1– to base 4-13...
  • Page 38 T4000 OPERATOR MANUAL 4.5 Junction Field Effect Transistors (JFETs) The junction field effect transistor (JFET) consists of a bar of semiconductor material (the "channel") and a region doped with material of the opposite semiconductor type to the channel (the "gate").
  • Page 39 DEVICE TESTING Figure 4-19 Junction FET Logic Range Low Frequency drain-source Pulser Mode DC+ to gate 4-15...
  • Page 40 T4000 OPERATOR MANUAL 4.6 MOSFETS CAUTION: Observe static precautions whenever handling MOSFETs. Use Logic range for testing (or Low for power MOSFETs). Do not use Med or High ranges. MOSFETs are field effect transistors in which the gate is insulated from the channel.
  • Page 41 DEVICE TESTING Three Terminal Testing of Opto Isolators The conduction of the output transistor is controlled by light emitted by the input LED. This stimulates the creation of charge carriers in the transistor, causing it to conduct. The opto isolator operation may be tested by driving the input LED using the Pulse Generator, and displaying the signature of the output transistor.
  • Page 42 T4000 OPERATOR MANUAL 4.8 SCRs An SCR can be regarded as a diode with an additional control terminal (the "gate"). Connect the anode to Channel A, cathode to COM and the gate to one of the Pulse outputs. Select Low range, Low frequency, Pulser Mode DC+. Set Level to 0.
  • Page 43 DEVICE TESTING 4.9 Triacs A Triac is similar to an SCR, except that it conducts in both directions, and can be triggered by either positive or negative gate current. Connect the MT2 terminal to Channel A, MT1 to COM and the gate to one of the Pulse outputs.
  • Page 44 T4000 OPERATOR MANUAL Figure 4-23 Triac Signature INTEGRATED CIRCUITS The Logic and Junction ranges and Low frequency are recommended for use when testing ICs. All integrated circuits can be tested by probing pairs of terminals. Most ICs tested in this way display signatures similar to diodes or Zener diodes.
  • Page 45 DEVICE TESTING Figure 4-0Z24 74LS00 Logic Range Low Frequency Input to ground Figure 4-0Z25 74LS00 Logic Range Low Frequency Output to ground Figure 4-0Z26 74LS00 Logic Range Low Frequency Vcc to ground 4-21...
  • Page 46 T4000 OPERATOR MANUAL Figure 4-0Z27 74HC02 Logic Range Low Frequency Input to ground Figure 4-0Z28 74HC02 Logic Range Low Frequency Output to ground Figure 4-0Z29 74HC02 Logic Range Low Frequency Vcc to ground 4-22...
  • Page 47 DEVICE TESTING Figure 4-0Z30 4017 Logic Range Low Frequency Input to ground Figure 4-0Z31 4017 Logic Range Low Frequency Output to ground Figure 4-0Z32 4017 Logic Range Low Frequency Vcc to ground 4-23...
  • Page 48 T4000 OPERATOR MANUAL An example of a defect in an IC is shown in Figures 4-34 and 4-35. Figure 4-34 shows the signature between input and ground of a good IC type 7650 tested in circuit. Figure 4-35 shows the signature of a defective 7650 in the same circuit, where the input protection diode has become leaky.
  • Page 49 DEVICE TESTING 4.11 Testing Devices in Circuit When testing a component in circuit, the signature is a composite of that device and other components in parallel. This is most often the case when diagnosing faults in service. The characteristic signature at any probing point in a circuit is unique for that circuit. Using channels A and B to display the signatures of a suspect circuit and that of a good circuit is the best way to identify a fault.
  • Page 50 T4000 OPERATOR MANUAL Figure 4-37 Signature at secondary winding good circuit Figure 4-38 Signature at secondary winding D3 short circuit 4-26...
  • Page 51 DEVICE TESTING Figure 4-38 shows the effect on the signature in Figure 4-37 when one diode (D3) develops a short circuit. During the positive half cycle of the drive voltage (right quadrant) the signature is effectively that of diode D1. The remaining components are short circuited by D3. During the negative half cycle (left quadrant) the signature is a composite of two current paths, one through the transformer secondary, the other through the short circuited D3, C1 and D2.
  • Page 52 T4000 OPERATOR MANUAL 4.12 Testing Bus-connected devices When a number of devices are connected together on a common bus, the signatures on the bus lines may be compared to look for differences. Lines on the same bus will usually have similar signatures (eg all data lines will be similar to each other). If one line has a different signature from other lines on the same bus, this suggests that a device on that bus is faulty.
  • Page 53 To specify which of the host's ports will be used to transfer data and commands, select the set T4000 com port option – the system displays the current communication port and prompts for a new port number:...
  • Page 54 – they will be set by the T4000 control program. Installing the Graphics driver The T4000 incorporates the facility to display device signatures on screen and produce hard copies if a suitable printer is attached to the host computer. To produce hard copies of signatures, it will be necessary to install the correct graphics driver;...
  • Page 55 UTILITIES When a driver is selected, the T4000 program will insert the associated command into one of the host system's start up files (the "autoexec.bat" file.) To load the driver into memory, press the Control, Alt and Del keys simultaneously to "reboot" the host computer.
  • Page 56 Loop compensation The T4000 provides the facility to compensate for capacitance in the Scanner system and test clips: Remove the clips from the device under test and select Loop compensation; the T4000 performs an automatic loop compensation routine to "null out" the effects of the capacitance of the test clips. This will minimise the effects of capacitance within the measurement system on displayed signatures.
  • Page 57 SECTION 6 – LIVE MODE T4000 Live mode In this section we examine the functions and discuss the manual operation of the T4000 – in the next section we discuss the programmed operation of the T4000 and write test programs to perform complex and repetitive operations automatically.
  • Page 58 In the Sip and Dip modes the T4000 Scanner can rapidly compare the signatures on the pins of a pair of ICs, automatically determining the number of pins on the ICs and displaying test results and signatures for each pin in order of error or pin number on the screen of the host computer.
  • Page 59 PC screen. The T4000 is able to sequentially scan each pin of the IC under test, applying the test stimuli set by the Voltage and Frequency ranges, and compare the signatures with the signatures of a known good device.
  • Page 60 From the Main menu select Live then select Options to specify the test format and tolerance – the Options window is displayed: Figure 6-2 The Options window The T4000 format, voltage and frequency settings are stored between sessions, so the settings displayed will be those from the previous session. Defining test conditions To specify test conditions, highlight the desired option (Format, Tolerance, etc.) using the up and down...
  • Page 61 LIVE MODE The Tolerance option – Setting the comparison threshold The Tolerance option allows the user to alter the sensitivity of the signature comparison. Tolerance is specified as a percentage value. The Tolerance setting will allow percentage values from 1 – 99% to be specified. Lower values represent a more exacting comparison, higher values will allow greater differences in signatures.
  • Page 62 20V to 50V range, and diode leakage. Note: The Junction range is available on the T4128 and T4000 only. Only one drive voltage can be selected at a time. Use the Display hot key or the left and right cursor keys to select the drive voltage to provide meaningful signatures (this will usually mean choosing the range which produces maximum deflection).
  • Page 63 LIVE MODE Selecting the Frequency range The operator can select the most suitable test frequency, Low, Med, or High with the Frequency hot key. Signature shapes The signature produced by a pure resistance is an inclined straight line whose slope (gradient) is dependent on the value of resistance.
  • Page 64 T4000 OPERATOR MANUAL Auto mode Select Auto mode by pressing the Mode hot key until Auto is highlighted – the T4000 automatically selects one of the available voltage ranges to produce a meaningful display. Test Ranges – Specifying the test voltage ranges The voltage ranges available to the Auto and Cycle modes are defined via the Test Ranges option.
  • Page 65 – reduce the Step Rate percentage value to offset the effect of circuit capacitance. The optimum switching rate may be found by experiment. Setting the rate to 0% will cause the T4000 to single step on each pin of the device during Learn and Test.
  • Page 66 T4000 OPERATOR MANUAL The Pulser Mode options are summarised in the table below: Mode Function Selects a + DC voltage output. The level is adjusted with the Level control. DC– Selects a – DC voltage output. The level is adjusted with the Level control.
  • Page 67 IC signatures. 6.12 The T4000 Scanner The T4000 Scanner provides the facility for rapid scanning of signatures on all pins of an IC under test. The Scanner is automatically selected when the Sip or Dip options are selected from the Format menu.
  • Page 68 T4000 OPERATOR MANUAL Connecting IC test clips 16 pin and 40 pin IC test clips are provided to connect channels A and B of the Scanner to the ICs under test. Connect the IC test clips to the polarised connectors A and B. The multi-way connectors must be used in conjunction with the return path provided by the COM socket.
  • Page 69 Press the <Esc> key to save the selected options. Select Test – the T4000 runs the test using the parameters specified in the Options window. The Scanner first detects the number of pins on the device (on the T4128 and T4000 it also checks for short circuits between the pins and common) then acquires the signatures on each IC pin sequentially starting at pin 1.
  • Page 70 T4000 OPERATOR MANUAL When the Test function is completed, the outcome of the test is displayed in Test Results window. For a successful test (i.e. if all signatures have matched at the end of testing) the window will look similar to the example below:...
  • Page 71 The Test function successively displays the signature of each pin of the IC, at a rate set by the Step Rate control. If Auto range is selected, the T4000 auto-ranges (automatically selecting the drive range for the most meaningful display) on each pin and the resulting signature is displayed.
  • Page 72 (e.g. when pin 1 of an IC is unconnected, where there are a large number of unused connections on an edge-connector or when testing a cable harness for short circuits). The T4000 will fail to register a connection to pin 1 so the program will display the message: ABORT – No device found In these cases it is necessary to manually set the number of pins on a device before each scan.
  • Page 73 The foot pedal duplicates the <Enter> key Beep mode The T4000 incorporates the facility to sound an audible warning when the deviation between two signatures under comparison exceeds a specified value. This feature enables the operator to probe the devices under test without looking away from the circuit module.
  • Page 74 The T4000 program provides facilities whereby good device signatures may be stored for reference and viewed and the signatures of devices under test may be sorted and viewed in device pin order or in descending order of error.
  • Page 75 DOS they must be treated as sets. 2. All test program directories are sub-directories of T4xxx\PROGRAMS, where T4xxx represents T4040, T4080 or T4128 (for both T4128 and T4000). All sub directories for test program storage must be created within the PROGRAMS sub directory.
  • Page 76 *END* mark.) Name – Specifying an extended program file name The T4000 program allows test programs to be given qualifying or descriptive names in addition to the program name assigned in the File option.
  • Page 77 Enter the device type (e.g., 74LS00, tantalum cap, etc.) in the Type: field; up to 13 characters may be used to specify the device type. Specifying the T4000 settings Test conditions for the device under test (voltage ranges, frequency, etc.) are specified in the T4000 Settings box.
  • Page 78 PROGRAMMING THE T4000 Package – defining the device configuration The T4000 is able to accommodate a wide range of component types from simple two- terminal devices to multi-pin ICs; the device configuration is defined in the PACKAGE field – highlight the PACKAGE field to specify the configuration of the part to be tested –...
  • Page 79 Pulser – Setting the Pulse Generator (T4128/T4000 only) The Pulse Generator incorporated with the T4128/T4000 will be found useful for testing many types of 3-terminal devices (e.g. SCRs, triacs, opto-isolators). See SECTION 4 – DEVICE TESTING for a discussion of Pulser applications.
  • Page 80 FILTER function allows signatures stored during acquisition to be mathematically processed by the T4000 program to reduce the effect of spurious oscillation or device breakdown. Highlight the FILTER field; the function can be toggled On and Off with the <O> key.
  • Page 81 T4000 OPERATOR MANUAL When editing is complete, press the <Esc> key. The system will prompt the user to save the changes made, or leave the file unchanged. Edit – modifying device parameters To modify the test parameters of a device, highlight the device with the cursor keys and select the Edit option –...
  • Page 82 To Learn a device, with all test parameters defined for the device, connect the test leads between the T4000 and the device to be learnt, highlight the device in the device list and select Learn. The T4000 acquires the device signatures using the specified test parameters and saves them to the hard disk of the host computer.
  • Page 83 View – displaying device signatures The View function allows the programmer to inspect the reference signatures of the learnt device. Select View – the T4000 displays the stored reference signatures. Viewing the signatures Each screen is able to display up to eight signatures from a device. When viewing a multi-pin device, use the cursor keys to keys to scroll through the pin signatures: <Home>...
  • Page 84 Zoom – displaying magnified signatures On occasions users may find it helpful to inspect signatures in greater detail than that provided by the normal View resolution. The T4000 control program provides the operator with the facility to view magnified signatures via the Zoom function.
  • Page 85 Program option. 8.1 File – recalling a program Select File – the T4000 displays the test program files in the current program directory. Highlight the test program to be run and press <Enter> – the program device list is displayed.
  • Page 86 Ensure the attached printer is switched on and On-line if printouts are required. Connect the test leads between channel A of the T4000 and the device to be tested (ensure the COM connections between the device and the T4000 are correctly made) and select Test by pressing the <T>...
  • Page 87 TEST Analysis After the T4000 has tested a device the Status box is renamed Analysis. If the test fails, then the T4000 analyses the signatures to try to filter out the effects of vendor- differences. The same device obtained from different vendors may have different analog signatures (e.g.
  • Page 88 T4000 OPERATOR MANUAL 8.5 Tolerance – changing the test comparison sensitivity Tolerance enables the user to change the Tolerance to a new value, which will apply to all tests. The Tolerance values stored in the test program will be ignored (but are not altered).
  • Page 89 Zoom – displaying magnified signatures On occasions users may find it helpful to inspect signatures in greater detail than that provided by the normal View resolution. The T4000 control program provides the operator with the facility to view magnified signatures via the Zoom function.
  • Page 90 T4000 OPERATOR MANUAL Live – displaying a real-time signature Live displays a signature in real-time, by continuously acquiring the signature and displaying it on the PC screen. Ensure the device signature to be viewed is displayed on screen. Select Live – the top left signature is shown with a highlighted border; use the editing keys to select one of the signatures: <Home>...
  • Page 91 TEST Shorts – displaying the Shorts data for a device Selecting Shorts will display the Shorts data for the device. View displays both reference and acquired signatures; the Shorts data will indicate the differences between the stored data and the device under test. Device pins that match the reference are shown as a PASS in white, pins exhibiting a short circuit are shown as a FAIL in red, open circuit pins are shown as a FAIL in yellow.
  • Page 92 T4000 OPERATOR MANUAL 8.8 Printmode The T4000 control program incorporates the facility to produce on-line printing of the results of a device test. The Printmode option allows users to specify the conditions under which results are printed. Selecting the Printmode option cycles through the alternative printing modes: PRINT Off –...
  • Page 93 TEST 8.10 Datalog – datalogging results The datalog stores the results of testing devices on the board. When pressing Clear to start testing a new board, the user has the option of logging test results (if Datalogging is enabled). To avoid logging incorrect data, the user can edit the results prior to logging by pressing the F2 key (which sets all tested devices to PASS) then successively highlighting the device(s) that actually failed and using the F3 key to set their status to FAIL.
  • Page 94 T4000 OPERATOR MANUAL Sample printout Export – copying the datalog to a file Export copies the contents of the datalog to a file for use by database packages, etc. The log will be copied to the file <filename.LOG> in the directory \T4xxx\DATALOG\, where filename is the name of the test program.
  • Page 95 SECTION 9 – FILE MANAGEMENT T4000 FILE MANAGEMENT Selecting the T4000 File Management menu enables users to copy and delete test programs, back up test programs to floppy disk for archiving, restore archived programs and create directories for test program storage.
  • Page 96 T4000 OPERATOR MANUAL Selecting a file called MAINBRD1 and typing MAINBRD2 at the cursor will create a new file called MAINBRD2 identical to MAINBRD1. If the target file already exists the Copy function will overwrite (and destroy) the target file.
  • Page 97 Archiving to diskette The T4000 File management provides programmers with the facility to back up test programs to diskette for security or archiving. Ensure that a formatted diskette is inserted in the diskette drive slot before selecting programs for backing up.
  • Page 98 9.4 Backup destination – Specifying the destination for program archiving When installed, the T4000 program is configured to select the A diskette drive as the destination for program backup. This can be changed (e.g. to the B diskette drive) using the bacKup destination option.
  • Page 99 Program directories (i.e. directories created within the T4xxx\PROGRAMS directory) may be removed using the Erase directory function. The T4000 will only allow empty directories (i.e. directories containing no files) to be removed – if a directory which is to be removed contains files, all the files must be deleted prior to removing the directory (use the Delete test program function to delete program files.) The system will issue an error message if the user attempts to remove a...
  • Page 100 SECTION 10 – SIMPLE MAINTENANCE AND CLEANING WARNING This instrument should only be serviced by a qualified electronics technician. Refer all servicing to qualified service personnel. Polar Instruments publishes a T4000 Service Manual to assist the service technician. 10.1 Calibration requirements To maintain the calibration of the instrument it is recommended that its Calibration/Adjustment Procedure is carried out at intervals not exceeding 12 months.
  • Page 101 T4000. When a channel is unconnected, its normal signature is a horizontal line. If its protection fuse has blown, then a vertical (short-circuit) signature will be displayed.
  • Page 102 Alternatively, a cloth lightly moistened with alcohol (ethanol or methylated spirit) or isopropyl alcohol (IPA) may be used. Do not spray cleaners directly onto the instrument. 10.6 Technical Support For technical support contact your local Polar Instruments distributor or Polar Instruments. 10-3...
  • Page 103 11.2 Starting the T4128 MDA program In this section we describe only the functions that differ from the standard T4000 functions (discussed in their associated sections). For full details of system functions and the principles of Analog Signature Analysis refer to the relevant section.
  • Page 104 T4000 OPERATOR MANUAL At the DOS command prompt type T4MDA and press <Enter> — the T4128MDA Main menu is displayed. Test Program File Management Utilities Live eXit to dos Figure 11-1 T4128MDA Main Menu Interface cables For convenient connection to a test fixture the T4128MDA is supplied with pairs of 40- way and 26-way IDC cables.
  • Page 105 T4128MDA Systems requiring more than 128 channels If a program requires more 128 channels, a single test program can still be used, but it will be necessary for the operator to switch the connection from the T4128MDA to the appropriate bank of nodes. By entering a User Comment (e.g.
  • Page 106 T4000 OPERATOR MANUAL 11.5 Live mode Live mode allows the user to view the signature of a specific scanner channel in real time. From the Main Menu select Live mode — the Live screen is displayed: Figure 11-2 The Live Screen...
  • Page 107 T4128MDA Use the up and down arrow keys to manually step through each node in sequence. To select a specific node select Goto and type the number of the node. Press the Display, left and right arrow keys and the Frequency key to display the signatures of the node under test on different voltage and frequency ranges.
  • Page 108 Use the set Result port option to specify which of the host’s serial communication ports will be used as the channel for PASS/FAIL signals. Select the Utilities option — the Utilities menu is displayed: Security set T4000 com port Graphics driver Diagnostics Loop compensation...
  • Page 109 T4128MDA Select the set Result port option — the system displays the current communication port and prompts for a new port number: current result port – COM1 enter port # (0 – NONE) or 1 – 4_ Specify a new communication port if necessary — the system will enable the selected port and return to the Utilities menu.
  • Page 110 T4000 PIN NUMBERING FORMATS...
  • Page 111 T4000 OPERATOR MANUAL T4128 PIN NUMBERING FORMAT The format of the pin numbering of the T4128's Scanner inputs depends on whether the T4128 is being used in Live or Test Program mode, the package type selected and the number of pins on the device under test.
  • Page 112 T4128 PIN NUMBERING FORMAT D-11...
  • Page 113 T4000 OPERATOR MANUAL Pin numbering on the T4128 connectors (64-pin DIP and SIP formats) The illustrations opposite show the Live mode T4128 Scanner connector formats for 64-pin DIP and SIP devices. D-12...
  • Page 114 T4128 PIN NUMBERING FORMAT D-13...
  • Page 115 T4000 OPERATOR MANUAL T4128 Program/Test Modes Pin numbering on the T4128 connectors (40-pin DIP and SIP formats) The illustrations opposite show the Program/Test mode T4128 Scanner connector formats for 40-pin DIP and SIP devices. D-14...
  • Page 116 T4128 PIN NUMBERING FORMAT D-15...
  • Page 117 T4000 OPERATOR MANUAL Pin numbering on the T4128 connectors (64-pin DIP and SIP formats) The illustrations opposite show the Program/Test mode T4128 Scanner connector formats for 64-pin DIP and SIP devices. D-16...
  • Page 118 T4128 PIN NUMBERING FORMAT D-17...
  • Page 119 T4000 OPERATOR MANUAL Pin numbering on the T4128 connectors (128-pin DIP and SIP formats) The illustrations opposite show the Program/Test mode T4128 Scanner connector formats for 128-pin DIP and SIP devices. D-18...
  • Page 120 T4128 PIN NUMBERING FORMAT D-19...
  • Page 121 APPENDIX A — EXAMPLES OF ANALOG SIGNATURES INTRODUCTION AND INDEX The following pages have been produced from a selection of components and include comparisons of integrated circuits from different vendors. Signatures produced in your circuits may not appear exactly similar to these examples since manufacturers can change their processes (which could alter the signatures).
  • Page 122 APPENDIX C – TEST PROGRAM STORAGE The approximate amount of memory required to store the test parameters and signatures is displayed on the Edit screen (for a single device) and the Program screen (for a complete program.) If it is desired to calculate the memory requirements, the following formula may be used: ∑...
  • Page 123 APPENDIX D – T4000 SERIES PIN NUMBERING FORMATS This appendix includes Scanner input pin numbering details for the T4040, T4080 and T4128/T4000 instruments – refer to the T4040, T4080 or T4128/T4000 sections as appropriate. T4040 PIN NUMBERING FORMAT The format of the pin numbering of the T4040's Scanner inputs depends on whether the T4040 is being used in Live or Test Program mode, the package type selected and the number of pins on the device under test.
  • Page 124 T4000 OPERATOR MANUAL T4040 Live Mode Pin numbering on the T4040 connectors (20-pin DIP format) This format is suitable when testing DIP ICs, e.g. when using DIP IC Test Clips. The example below shows the format for 20 pin DIPs.
  • Page 125 T4040 PIN NUMBERING FORMAT T4040 Program And Test Modes Pin numbering on the T4040 connectors (40-pin DIP format) This format is suitable when testing DIP ICs, e.g. when using DIP IC Test Clips. The example below shows the format for 40 pin DIPs. The connectors are viewed from the front of the instrument.
  • Page 126 T4000 OPERATOR MANUAL...
  • Page 127 T4080 PIN NUMBERING FORMAT T4080 PIN NUMBERING FORMAT The format of the pin numbering of the T4080's Scanner inputs depends on whether the T4080 is being used in Live or Test Program mode, the package type selected and the number of pins on the device under test. All illustrations show the instrument viewed from the front.
  • Page 128 T4000 OPERATOR MANUAL T4080 Live Mode Pin numbering on the T4080 connectors (40-pin DIP format) This format is suitable when testing DIP ICs, e.g. when using DIP IC Test Clips. The example below shows the format for 40 pin DIPs.
  • Page 129 T4080 PIN NUMBERING FORMAT Pin numbering on the T4080 connectors (20-pin DIP format) This format is suitable when testing DIP ICs, e.g. when using DIP IC Test Clips. The example below shows the format for 20 pin DIPs. The connectors are viewed from the front of the instrument. Fig D-7.
  • Page 130 T4000 OPERATOR MANUAL T4080 Program And Test Modes Pin numbering on the T4080 connectors (40-pin DIP format) This format is suitable when testing DIP ICs, e.g. when using DIP IC Test Clips. The example below shows the format for 40 pin DIPs.
  • Page 131 T4080 PIN NUMBERING FORMAT Pin numbering on the T4080 connectors (80-pin DIP format) This format is suitable when testing DIP ICs, e.g. when using DIP IC Test Clips. The example below shows the format for 80 pin DIPs. The connectors are viewed from the front of the instrument. Fig D-11.
  • Page 132 APPENDIX E – T4000 PROGRAMMING EXAMPLE. RUNNING THE T4000 CONTROL PROGRAM. This appendix is included to help the new user to write and run a simple T4000 test program. The example is written around the NCL Disk Controller demo board, but a board of your choice may be substituted if preferred.
  • Page 133 7. To add the first component to the file select the Insert hotkey. The control program will enter the program Edit mode. Note: The initial T4000 Settings (i.e. device test parameters) on this screen are provided by default as a starting point, any alterations are easily made by selecting the appropriate field with the up or down cursor keys and using hotkeys to turn selections On or Off.
  • Page 134 Check the RS232 cable is connected to the T4000 and the PC, and plug the foot pedal into the jack on the rear of the T4000.
  • Page 135 T4000 OPERATOR MANUAL 14. Select Verify. This will continuously acquire signatures and compare them with the signatures just saved. Since both sets of signatures are for the same device, the variations between them should be very small (0–2%). If significant differences are detected this would suggest instability of the signatures, or charging effects - see "Hints".
  • Page 136 The T4000 is now ready to begin testing. Press Instructions to display the Instructions file associated with this test program. Testing a Component. 4. Set the T4000 to REMOTE mode (press the key at the bottom right of the instrument.) Check the foot pedal is plugged in.
  • Page 137 Warning Communication Aborted any key to continue Check the cable between PC and T4000. Check the COM port setting (see SECTION 5 – UTILITIES.) If the test fails and Shorts test, or 1 or more pins fail: View the signatures; the worst error will be displayed first.