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Polar Instruments T1000A Operator's Manual

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Polar Instruments Ltd.
Garenne Park
T1000A
Rue de la Cache
St. Sampson
OPERATOR
Guernsey
Channel Islands
MANUAL
GY2 4AF
England
Fax: +44 (0)1481 52476
MAN 148-9603

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Summary of Contents for Polar Instruments T1000A

  • Page 1 Polar Instruments Ltd. Garenne Park T1000A Rue de la Cache St. Sampson OPERATOR Guernsey Channel Islands MANUAL GY2 4AF England Fax: +44 (0)1481 52476 MAN 148-9603...

  • Page 3: Declarations

    POLAR INSTRUMENTS LTD and not having been altered in any way or subject to misuse, negligence or damage, and not having been repaired or attempted to be repaired by any other than POLAR INSTRUMENTS LTD or its authorized distributors.

  • Page 4: Electromagnetic Compatibility

    T1000A OPERATOR MANUAL ELECTROMAGNETIC COMPATIBILITY European Community Directive Conformance Statement This product is in conformity with the protection requirements of EC Council Directive 89/336/EEC on the approximation of the laws of the Member States relating to electromagnetic compatibility. A declaration of conformity with the requirements of the Directive has been signed by...

  • Page 5: Safety

    SAFETY SAFETY WARNING The LIVE and NEUTRAL lines on this unit are BOTH fused. This unit contains no user-serviceable parts. When the unit is connected to its supply, the opening of covers or removal of panels is likely to expose dangerous voltages. To maintain operator safety, do not operate the unit unless the enclosure is complete and securely assembled.

  • Page 6: Power Supply

    Retain these instructions for later use. The T1000A is designed for use indoors in an electrical workshop environment at a stable work station comprising a bench or similar work surface.

  • Page 7: Environmental Operating Conditions

    SPECIFICATIONS Open Circuit Voltage Short Circuit Current ASA Test Ranges Junction 500µA Logic 150mA Hi-Cap (1Hz fixed) 150mA Low-Cap (2kHz fixed) 20µA ASA Test Frequencies 95Hz Medium 500Hz High 2kHz Curve Tracing Collector drive Peak Voltage Peak Current 10mA maximum 100mA maximum +/–...

  • Page 8: Accessories

    T1000A OPERATOR MANUAL 230V ± 10%, 115V ± 10% or 100V ± 10% at 50/60Hz, 20VA. Physical characteristics (excluding accessories) Dimensions 300 mm (11.8 in.) wide 120 mm (4.7 in.) high 275 mm (10.8 in.) deep Weight 2 kg (4.4 lb.)
  • Page 9 Connecting the T1000A to a power supply. ASA DEVICE TESTING Information about the different ways in which the ASA facilities of the T1000A can be used and how to test devices. ASA SEMICONDUCTOR TESTING Describes methods of testing signal diodes, zener diodes, LEDs and transistors in circuit.

  • Page 10: Table Of Contents

    Standard Accessories....................vi SYMBOLS ........................vi SECTION 1 – INTRODUCTION................... 1-1 THE T1000A FAULT LOCATOR ................1-1 1-1 Introduction to the T1000A ................1-1 1-2 Areas of application..................1-1 1-3 Analog Signature Analysis................1-1 1-4 The T1000A transistor curve tracer..............1-2 SECTION 2 –...
  • Page 11 SECTION 3 – INSTALLATION AND SET-UP ............. 3-1 PREPARATION FOR USE ..................3-1 3-1 Unpacking ....................... 3-1 3-2 Connecting the T1000A to a power supply ............. 3-1 3-3 Connecting the T1000A to an oscilloscope ............. 3-2 3-4 Connecting the test cables ................3-3 Single Channel Applications ................
  • Page 12 T1000A OPERATOR MANUAL SECTION 7 – SIMPLE MAINTENANCE AND CLEANING ......... 7-1 Fault diagnosis ...................... 7-1 Cleaning ........................ 7-1 Technical Support....................7-1 USER GUIDE (FRENCH) USER GUIDE (GERMAN) USER GUIDE (ITALIAN)

  • Page 13: Section 1 - Introduction

    THE T1000A FAULT LOCATOR 1-1 Introduction to the T1000A The T1000A Fault Locator and Curve Tracer provides a fast and efficient means of testing components, either in isolation or in circuit. All testing is done with power disconnected from the circuit, so there is no risk to the user and components under test cannot be damaged.

  • Page 14: The T1000A Transistor Curve Tracer

    “family of curves”, allowing the technician to verify the operation of the transistor under test. The inclusion of two channels in the T1000A allows the user to compare the behaviour of two devices simultaneously. Viewing two sets of curves on the screen enables transistor matching to be easily accomplished.

  • Page 15: Section 2 - General Description

    SECTION 2 – GENERAL DESCRIPTION PRINCIPLES OF OPERATION 2-1 Controls, connectors and probes The T1000A front panel CURVE TRACE section Channel A and B transistor test sockets — arranged to accommodate bipolar junction and field effect transistors. Two channels are included to allow device comparison.

  • Page 16: Producing Signatures

    T1000A OPERATOR MANUAL 2-2 Producing signatures The T1000A applies an alternating voltage to a component or circuit and displays the resulting current versus voltage display on an oscilloscope CRT screen. The voltage applied across the component is displayed horizontally, the current through the component is displayed vertically, so the resulting V/I graph represents the resistance, or impedance, of the component.

  • Page 17: The T1000A Equivalent Circuit

    , and the component under test by a simple impedance, Z (Figure 2-2). Figure 2-2 T1000A equivalent circuit The T1000A contains circuits which measure the voltage across, and the current through, the component to be tested and outputs a display on an attached oscilloscope.

  • Page 18: Producing Transistor Curves

    Base current step amplitude may also be varied from the front panel, allowing the T1000A to test a wide range of transistors from small signal devices to power transistors. The front panel transistor sockets are arranged for convenient insertion of different case styles.

  • Page 19: Section 3 - Installation And Set-Up

    Note: If the instrument has been shipped or stored in a cold environment, allow the instrument to reach the temperature of its new location before applying power. 3-2 Connecting the T1000A to a power supply Refer to the voltage label on the rear panel of the instrument and make sure that the marked rating is suitable for the local mains power supply.

  • Page 20: Connecting The T1000A To An Oscilloscope

    Caution: The oscilloscope CRT phosphor could be burnt if the intensity is set too high and the same display is left on the screen for several hours. 5. Connect the X and Y outputs on the T1000A to the X and Y inputs on the oscilloscope via the BNC cables provided.

  • Page 21: Connecting The Test Cables

    INSTALLATION AND SET-UP 3-4 Connecting the test cables Single Channel Applications With the Red probe connected to the Channel A (or Channel B) socket, and the Black probe to the COM socket connect the probes across the device. When checking a signature at a node in a circuit it will often be appropriate to connect the COM probe to a convenient ground point.

  • Page 22: Section 4 - Asa Device Testing

    SECTION 4 – ASA DEVICE TESTING TESTING COMPONENTS Using the Analog Signature Analysis method, safe, low power drive voltages are applied to components to produce "impedance signatures" on the oscilloscope screen. Impedance signatures are graphs of current against voltage, plotted on a scale which has its origin at the centre of the screen.

  • Page 23: Asa Techniques

    T1000A OPERATOR MANUAL All signatures are contained within the diamond shaped area formed by the “load lines” joining the ends of the marked axes. 4-1 ASA techniques The most effective way to use ASA is by comparison with a known good or reference board.

  • Page 24: Typical Faults

    TESTING COMPONENTS Typical faults It is worth keeping in mind that faults are not confined to the "high technology" areas of the board. Most faults will be in the "low technology" sections, e.g. intermittent connections, "dry" solder joints, reversed diodes. For instance, the following faults are equally likely: an open circuit relay coil, a broken trace on a printed circuit board,...

  • Page 25: Testing Resistors

    T1000A OPERATOR MANUAL 4-2 Testing resistors The signature produced by a pure resistance is an inclined straight line whose slope (gradient) is dependent on the value of resistance. Testing resistors is performed by connecting the probes across the device and observing the slope of the displayed signature.
  • Page 26 TESTING COMPONENTS Figure 4-2 2K Resistor Logic Range Low Frequency. Figure 4-3 10K Resistor Med Range Low Frequency Figure 4-4 270K Resistor Med Range Low Frequency...

  • Page 27: Testing Capacitors

    T1000A OPERATOR MANUAL 4-3 Testing capacitors Due to their energy storage characteristics, reactive components produce a phase shift between voltage and current flow. This is displayed as a circular or elliptical signature. See Figure 4-5. Signature of a good capacitor...

  • Page 28: Choosing Capacitor Testing Ranges

    TESTING COMPONENTS Choosing capacitor testing ranges Capacitor signature shapes can vary between a virtually horizontal line for low values of capacitance through the range of ellipse shapes (including a circle) to a line that is almost vertical for high capacitance values. Using the higher frequency ranges will cause greater vertical deflection and make subtle differences in signatures easier to detect.

  • Page 29: Leakage Current In Capacitors

    (R is effectively open circuit). The T1000A causes current to flow through both the capacitance and the parallel resistance. The resulting signature will be the sum of the resistive and capacitive components – Figure 4-9.

  • Page 30: Capacitors In Circuit

    TESTING COMPONENTS Figure Signature of a "leaky" capacitor Note the tilt in the ellipse. This is due to resistive current in the capacitor and indicates a faulty capacitor. In general, if the leakage current in a capacitor is significant compared with the capacitive current, the elliptical signature will be tilted.

  • Page 31: Inductors

    T1000A OPERATOR MANUAL 4-4 Inductors Inductive reactance is dependent on the inductance value of the coil and the frequency of the applied voltage, not the "ohmic" resistance of the coil. The magnitude of the current flowing depends on: 1. The inductance of the coil 2.
  • Page 32 TESTING COMPONENTS Figure 4-10 shows the signature of a ferrite transformer primary winding with the test voltage range set Low and test frequency set High . This demonstrates the effect of a significant value of resistance causing the inductive ellipse to be tilted. Figure 4-11 shows a similar (defective) transformer with a shorted turn.

  • Page 33: Section 5 - Asa Semiconductor Testing

    SECTION 5 – ASA SEMICONDUCTOR TESTING USING ASA TO TEST SEMICONDUCTORS 5-1 Diodes, LEDs and Zeners When forward biased, a diode exhibits a low resistance and a voltage drop of approximately 0.6V. This produces a signature that is an almost vertical trace close to the Y axis (see Figure 5-1).
  • Page 34 T1000A OPERATOR MANUAL Figure 5-1 Signal diode Logic Range Low Frequency Figure 5-2 8.2V Zener diode Med Range Low Frequency...

  • Page 35: Testing Transistors In Circuit

    The T1000A incorporates a CURVE TRACE section in order to test bipolar junction transistors and field effect transistors. In many fault finding situations however it may not be possible or practicable to remove the device from circuit. The T1000A can still be used to test transistors as described in this section.
  • Page 36 T1000A OPERATOR MANUAL Figure 5-3 NPN Transistor base-emitter Med Range Low Frequency Figure 5-4 NPN Transistor base-collector Med Range Low Frequency Figure 5-5 NPN Transistor emitter-collector Med Range Low Frequency...

  • Page 37: Field Effect Transistors (Fets)

    TESTING SEMICONDUCTORS 5-3 Field Effect Transistors (FETs) Junction FETs (JFETs) The junction field effect transistor (JFET) consists of a bar of semiconductor material (the “channel”) and a region doped with material of the opposite semiconductor type to the channel (the “gate”). The gate forms a diode junction with each end of the channel (the “source”...
  • Page 38 T1000A OPERATOR MANUAL Figure 5-6 74LS00 Logic Range Low Frequency Input to ground Figure 5-7 74LS00 Logic Range Low Frequency Output to ground Figure 5-8 74LS00 Logic Range Low Frequency Vcc to ground...
  • Page 39 TESTING SEMICONDUCTORS Figure 5-9 74HC02 Logic Range Low Frequency Input to ground Figure 5-10 74HC02 Logic Range Low Frequency Output to ground Figure 5-11 74HC02 Logic Range Low Frequency Vcc to ground...
  • Page 40 T1000A OPERATOR MANUAL Figure 5-12 4017 Logic Range Low Frequency Input to ground Figure 5-13 4017 Logic Range Low Frequency Output to ground Figure 5-14 4017 Logic Range Low Frequency Vcc to ground...
  • Page 41 TESTING SEMICONDUCTORS An example of a defect in an IC is shown in Figures 5-15 and 5-16. Figure 5-15 shows the signature between input and ground of a good IC type 7650 tested in circuit. Figure 5-16 shows the signature of a defective 7650 in the same circuit, where the input protection diode has become leaky.

  • Page 42: Testing Devices In Circuit

    T1000A OPERATOR MANUAL 5-5 Testing Devices in Circuit When testing a component in circuit, the signature is a composite of that device and other components in parallel. This is most often the case when diagnosing faults in service. The characteristic signature at any probing point in a circuit is unique for that circuit.
  • Page 43 TESTING SEMICONDUCTORS Figure 5-18 Signature at secondary winding good circuit Figure 5-19 shows the effect on the signature in Figure 5-18 when one diode (D3) develops a short circuit. During the positive half cycle of the drive voltage (right quadrant) the signature is effectively that of diode D1.
  • Page 44 T1000A OPERATOR MANUAL Figure 5-20 shows the effect of superimposing two signatures to aid comparison diagnosis. Note: When comparing the signatures of two circuits ensure that both circuits are connected to COM at the equivalent circuit points. Figure 5-20 7650 in circuit...

  • Page 45: Testing Bus-Connected Devices

    /CE (Chip Enable) or /OE (Output Enable). This provides a method for looking at the ICs individually. Instead of connecting the T1000A's COM input to Vcc or ground, connect it to the defective bus line. Probe each of the devices' /OE or /CE pins, looking for a device whose signature differs from other similar devices.

  • Page 46: Section 6 - The Curve Tracer

    ) for a field effect transistor. The inclusion of two channels in the T1000A allows the user to compare the behaviour of two devices simultaneously. This will be especially useful if the device type is unknown. In addition, the facility to view two sets of curves on the screen enables transistor matching to be easily accomplished.
  • Page 47 Base current step amplitude may be varied and maximum collector current selected via the front panel, allowing the T1000A to test or match a wide range of transistors from small signal devices to power transistors. For example, devices can be easily matched for current gain (β), saturation voltage or output resistance.
  • Page 48 THE CURVE TRACER Figure 6-1 NPN Transistor + I (current) STEPS + 10mA DRIVE Step Amplitude mid-range Figure 6-2 NPN Transistor + I (current) STEPS + 10mA DRIVE Step Amplitude set clockwise...

  • Page 49: Field Effect Transistors (Fets)

    6-2 Field Effect Transistors (FETs) Junction field effect transistors The T1000A tests field effect transistors in a manner similar to bipolar junction transistors. The T1000A allows the operator to specify gate-source voltage drive steps of both polarities so the curve tracer is suitable for both n-channel and p-channel field effect transistors.

  • Page 50: Metal-Oxide Field Effect Transistors

    THE CURVE TRACER Metal-oxide field effect transistors CAUTION: Observe static precautions whenever handling MOSFETs. Testing MOSFETs with the CURVE TRACER MOSFETs are field effect transistors in which the gate is insulated from the channel. As in a JFET, source-drain conduction is controlled by the gate-source voltage. However, MOSFETs are available that operate in either "enhancement"...
  • Page 51 T1000A OPERATOR MANUAL Table 6-1 summarises transistor types and test settings: TRANSISTOR TYPE STEPS DRIVE 10mA – – 10mA JFET N-CHANNEL – 10mA JFET P-CHANNEL – 10mA MOSFET N-CHANNEL ENHANCEMENT MODE 10mA MOSFET P-CHANNEL DEPLETION MODE 10mA MOSFET P-CHANNEL ENHANCEMENT MODE –...
  • Page 52 Cleaning Clean the T1000A with a cloth lightly moistened with water with a small amount of mild detergent. Alternatively, a cloth lightly moistened with alcohol (ethanol or methylated spirit) or isopropyl alcohol (IPA) may be used.

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