Table of Contents
Advertisement
Operation
*RST
:TRIGger:SEQuence:COUNt:AUTO
ON"
:SCAN
<list>
:INIT
The
first
command
resets
the
mainframe
to
a default
scan
configuration.
The
second
command
automatical-
ly sets
the
channel count
to
the
number
of
channels
in
the
scan
list,
the
third
command
defines the
scan
list,
and
the fourth
command
takes the
Model
7001 out of
the
idle
state.
The
following
program wiU perform
a single
scan
through
all
40 channels
of
a multiplexer card
installed
in
slot
1:
10
OUTPUT
707; "'^RST"
20
OUTPUT
707; ":trig:seq:coun:auto
on"
30
OUTPUT
707; ":scan
(@
l!l!l:l!4!10)"
40
OUTPUT
707;
":init"
50
END
Line
10
Selects
a
default
configuration
for
the
scan.
Line 20
Sets
channel count
to
the
scan-Hst-length.
Line 30
Defines
the
scan
list.
Line 40
Take
the
Model
7001
out
of
the
idle
state.
The
scan
is
configured
to
start
as
soon
as
this
command
is
executed.
When
the
above
program
is
run, the
scan
will
be
com-
pleted
in
approximately
240msec (3msec
delay
for
each
relay close
and
a
3msec
delay
for
each
open),
which
is
too
fast to
view from
the front panel.
An
additional
re-
lay
delay can
be
added
to
the
program
to
slow
down
the
scan
for
viewing.
The program
is
modified
by
add-
ing
line
25
to
slow
down
the
scan.
Also,
Line 5
is
added
to
the
begmning
of the
program
to
ensure
that
all
chan-
nels are
open
before the scan
is
started.
5
OUTPUT
707;
":open
all"
10
OUTPUT
707;
"*RST"
20
OUTPUT
707; ":trig:seq:coxm:auto
on"
25
OUTPUT
707;
":trig:del
0.25"
30
OUTPUT
707; "iscan
(@
1!1!1:1!4!10)"
40
OUTPUT
707;
":INTT"
50
END
Line 5
Opens
all
channels.
Line 25
Sets
a 1/4 second delay
after
each channel
closes.
4.4
Matrix switching examples
Some
applications
to
test
thick film
resistor
networks
and
transistors are
provided
in the
following para-
graphs.
These
applications are
intended
to
demon-
strate
the
versatility
of
using
the matrix
card
in
test
systems.
4,4.1
Thick
film resistor
network
testing
A
dedicated matrix
system
for
testing thick
film
resis-
tor
networks
is
shown
in
Figure
4-4.
This particular
system provides
two
different
methods
to
check
thick
films;
four-wire
resistance
measurements,
and
voltage
measurements
using
an
appHed
voltage.
The system
shown
in
Figure
4-4
tests
two
4-element
thick
films,
but can be
expanded
to
test
more by
simply
using
additional
Model
7012 matrix
cards.
The
Model
7001
will
accommodate two
matrix
cards.
Daisy-chain-
in six
Model
7001s
expands
the
system
to
12
matrix
cards
allowing 24 four-element
thick films
to
be
tested.
4-5
Advertisement
Table of Contents
