Notes On Memory Ics; Notes On Interface Ics - abi Professional ChipMaster Compact Operator's Manual

43.8.
Note 5: The 4532 32k DRAM is in fact a partially non-functional 64k
DRAM. Four types exist, manufactured by OKI and TI who each supply
two types. The type numbers 45321 and 45322 are used for OKI types,
and 45323 and 45324 are used for TI types. The first number in each
case is for the low array version, and the second number for the high
array version. See the IC data sheets for further details.
Note 6: The ROM/EPROM tests perform a blank check and checksum
on the IC, and display the contents of the first 16 locations. These tests
cannot confirm the integrity of an IC, or identify it in SEARCH mode,
since they have no knowledge of the intended contents of the EPROM.
Please be patient when testing EPROMs in this way - some of the larger
ICs take a long time to read.
43.9.
Note 7: The MOS version of this IC is internally dynamic, and the test
may FAIL after a prolonged LOOP test. The CMOS version, however, is
completely static.
Note 8: The 8742 EPROM version of this IC must have the erase
window covered otherwise the test may FAIL.
Note 9: These ICs should be tested in FAIL LOOP mode for best
results.
Note 10: This IC should only be tested in SINGLE MODE with a 1uF
decoupling CAPACITOR connected across the supply and ground pins
29 and 20 of the ZIF socket (IC pins 18 and 9) due to its high supply
current requirement.
Note 11: This IC requires a 1uF decoupling CAPACITOR to be
connected across the supply and ground pins 10 and 31 of the ZIF
socket due to its high supply current requirement.
Note 13: The 8251 IC is a 4 line to 10 line decoder and should not be
confused with the Intel 8251 USART which cannot be tested with the
ChipMaster Compact.
ChipMaster Compact Digital IC Tester

notes on memory ICs

notes on interface ICs

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