Localization Through Global Changes To The Unit Under Test - LANGER EMV-Technik ESA1 User Manual

Development system - disturbance emission
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LANGER
DE-01728 Bannewitz
mail@langer-emv.de
EMV-Technik
www.langer-emv.com
3) Fast and easy handling of spectrum analyzers / frequency generators
All the important device settings can conveniently be carried out with the ChipScan-ESA software
and all supported spectrum analyzers can be controlled via a uniform operator interface.
Figure 19 Spectrum Analyzer Setup
In addition, the device settings can also be stored in configuration files and reloaded. This prevents
any operating errors which may occur in measurement logs.
ChipScan-ESA automatically recognizes all (see list of supported devices
connected to the PC irrespective of the interface used (RS232, GPIB, VXI) even if several
measuring instruments are connected simultaneously. The recognized devices can also be stored
in configuration files and reloaded.

3.3 Localization through global changes to the unit under test

The unit under test often allows you to locate the emission sources by changing the measurement
set-up. These include
a) geometrical changes:
- Changing the distance between the unit under test and ground plate.
- Use sheet steel to simulate neighboring modules or housings.
- Plugging in and removing cables, changing the cable length and position.
- Eliminating individual RF sources by disconnecting individual modules, partial shielding or by
using ferrite magnets.
b) changes to the operating procedure:
- Using another software or program or program section.
- Observing the spectrum when the program is running up.
- Switching off individual sections of the unit under test.
- Operating the unit under test under permanent reset conditions – only the clock line is
maintained.
1
https://www.langer-emv.com/en/product/software/25/cs-esa-set-chipscan-esa-software-cd-
rom/163#Manual05
- 13 -
ESA1
1
) measuring instruments

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