Acer B223W Service Manual page 33

D. Reliability test items
Test Item
High temperature storage
Low temperature storage
High temperature & high
humidity operation
High temperature operation
Low temperature operation
Thermal Shock
(non-operation)
Electrostatic discharge (ESD)
(non-operation)
Vibration
(non-operation)
Mechanical Shock
(non-operation)
MTBF Demonstration
Note1:
Pass: Normal display image with no obvious non-uniformity and no line defect. Partial
transformation of the module parts should be ignored.
Fail: No display image, obvious non-uniformity, or line defects.
Note2:
Evaluation should be tested after storage at room temperature for one hour.
Note 3
: The MTBF (exclude the CCFL ) calculation is based on the assumption that the failure rate
distribution meets the Exponential Model.
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TO ANY OTHER FORMS WITHOUT PRIOR WRITTEN PERMISSION FROM INNOLUX DISPLAY CORPORATION.
Test Condition
60°C, 240Hrs
-25°C, 240Hrs
40°C, 90%RH, 240Hrs
(No condensation)
50°C, 240Hrs
0°C, 240Hrs
-20°C~60°C
1Hr, 10mins, 1Hr, 100cycles
Contact:+/-8kV, 150pF(330ohms),
25 times/1 point, 1 time/1 sec
Air discharge:+/-15kV, 150pF(330ohms),
25 times/1 point, 1 time/1 sec
Vibration level : 1.5G
Bandwidth : 10-300Hz
Waveform : sine wave,
sweep rate : 10min
30 min for each direction X, Y, Z
(1.5 Hrs in total)
Shock level : 50G, 11ms
Waveform : Half sine wave
Direction : ±X, ±Y, ±Z
One time each direction
40,000 hours with confidence level 90%
SP EC NO. M T 2 2 0W W 0 1 V. 0
PAG E : 18/23
Judgment
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 2
Note 1 Note 3
Remark