Diode Test - Fluke 8808A Datasheet

Frequency
Gate Time...................................................................131 ms
Measurement Method .............................................AC-coupled input using the ac voltage measurement function.
Settling Considerations..........................................When measuring frequency after a dc offset voltage change, errors
Measurement Considerations ...............................To minimize measurement errors, shield inputs from external noise
Range
100 mV to
750 V [1,2]
Notes:
[1] Input > 100 mV
[2] Limited to 8* 10
Continuity
Continuity Threshold ..............................................20
Test Currents ............................................................1 mA
Response Time ........................................................100 samples/sec with audible tone
Rate.......................................................... Fast
Maxiumum Reading....................................199.99
Resolution............... ..................................0.01

Diode Test

Response Time .........................................................100 samples/sec with audible tone
Rate..........................................................Fast
Maxiumum Reading....................................1.9999 V
Resolution.................... .............................0.1 mV
6 Fluke Corporation 8808A
Frequency
23 °C ± 5 °C
20 Hz – 2 kHz 0.01 + 0.002
2 kHz – 20 kHz 0.01 + 0.002
20 kHz – 200 kHz 0.01 + 0.002
200 kHz – 1 MHz 0.01 + 0.004
7 V Hz
may occur. For the most accurate measurement, wait up to 1 second to
allow input blocking RC time constant to settle.
when measuring low voltage, low frequency signals.
Accuracy
Accuracy
90 days
23 °C ± 5 °C
0.01 + 0.003
0.01 + 0.003
0.01 + 0.003
0.01 + 0.006
Fluke 8808A Digital Multimeter Extended Specifications
Temperature
Coefficient/°C
1 year
Outside 18 – 28 °C
0.002 + 0.001
0.002 + 0.001
0.002 + 0.001
0.002 + 0.002
Fluke Corporation 7