Table 5.19 Selective Self-Test Log Data Structure - Fujitsu MHV2060AT Product Manual

Interface

Table 5.19 Selective self-test log data structure

Offset
00h, 01h
Data Structure Revision Number
02h...09h
Test Span 1
0Ah...11h
12h...19h
Test Span 2
1Ah...21h
22h...29h
Test Span 3
2Ah...31h
32h...39h
Test Span 4
3Ah...41h
42h...49h
Test Span 5
4Ah...51h
52h...151h Reserved
152h...1EBh Vender Unique
1Ech...1F3h Current LBA under test
1F4h...1F5h Current Span under test
1F6h...1F7h Feature Flags
1F8h
1F9h Vender Unique
1FAh, 1FBh
1FCh, 1FDh
Selective Self-test pending time [min]
1FEh, 1FFh
Check sum
• Test span
Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.
Current LBA under test
•
As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.
• Current span under test
As the self-test progress, the device shall modify this value to contain the test span
number currently being tested.
5-56
Description
Starting LBA
Ending LBA
Starting LBA
Ending LBA
Starting LBA
Ending LBA
Starting LBA
Ending LBA
Starting LBA
Ending LBA
Offline Execution Flag
Selective Offline Scan Number
Reserved
Initial
01h, 00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h...00h
00h
00h
00h, 00h
00h, 00h
00h, FFh
C141-E218