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Circuit Description
Command No.
(OP, AB, RB)
76(D5, 3, 0)
T_WRITE_RSSI_I
77(D7, 0, 3)
T_READ_TEMP_I
78(D8, 0, 3)
T_READ_HDET_I
79(D9, 1, 0)
T_BUZZER_ON_I
80(DA, 0, 0)
T_BUZZER_OFF_I
81(E3, 0, 0)
T_VOC_PCMLPON_I
82(E4, 0, 0)
T_VOC_PCMLPOFF_I
85(E7, 0, 0)
T_SPEAKER_ON_I
86(E8, 0, 0)
T_SPEAKER_OFF_I
87(E9, 0, 0)
T_AMPS_LOOP_TEST_I
88(EA, 0, 0)
T_TRK_ADJ_I
89(EB, 0, 0)
T_CD_TRK_ADJ_I
90(F0, 4, 0)
T_HW_CHANFLAT_I
91(F1, 4, 0)
T_SW_CHANFLAT_I
92(F2, 3, 0)
T_AMPS_TX_PWR_2_I
93(F3, 3, 0)
T_AMPS_TX_PWR_3_I
95(F4, 4, 0)
T_PCS_HW_CHANFLAT_I
96(F5, 4, 0)
T_PCS_SW_CHANFLAT_I
97(F6, 4, 0)
T_PCS_CH_CHANFLAT_I
98(F7, 4, 0)
T_PCS_CH_MAX_MIN_I
100(FF, 4, 0)
T_MAX_I
1) The AB (Input Argument Byte Number) values of these commands are used only in the manual test. In
automatic test mode, the AB is regarded as 0.
2) You can assign the value for these commands. If the AB value is assigned without argument, the test is
achieved with the value stored in EEPROM.
3) After you get a desired test value by performing these commands, if you want to save the value into
EEPROM, use T-SAVE-VAL-I command to store the test value into the corresponding position.
*OP: Operation Command Number
AB: Input Argument Byte Number
RB: Return Byte Number
*SAT 32, 33 are not operating in MSM2 CHIP test
*46 command is required in Rx, and Tx path test at AMPS mode.
6-16
Signal. Name
3)
2)
3)
2)3
)
2)3)
Description
Writes RSSI.
Read Temp.
Read High Detect.
Buzzer On at DTMF 0 key.
Buzzer Off.
Play a PCM LOOP BACK.
Play off a PCM LOOP BACK.
Turn on the speaker path.
Turn off the speaker path.
Play a PCM AMPS loopback.
RM TRK_LO_ADJ control.
CDMA TRK _LO_ADJ control.
HW flatness channel.
SW flatness channel.
Setting the volume for Power Level.
Adjust the channel flatness of AMPS.
PCS HW flatness channel
PCS SW flatness channel.
PCS channel flatness adjust.
Edge channel Max.Min power code.
Samsung Electronics
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