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TYPICAL PART FAILURES, CAUSES, AND SYMPTOMS
PARTS
Semiconductors
(IC, FET, TR)
MOS FET
MOS IC
Crystal
fi1
Crystal
ter
Resistor
Potentiometer
Capacitor
Variable capacitor
Trimmer capacitor
Coils
Switch
Relay
CAUSE OF TROUBLE
High supply voltage
Open circuit
Excessive drive
High temperature
Static electricity
Shock
High temperature
Excessive power
Aging
High temperature
Excessive power
·
Shock
Excess voltage
High temperature
Excess power
Ratings exceeded
Dust between plates
Shock, forced rotation
Ratings exceeded
Variation
Ratings exceeded
Aging
Ratings exceeded
Humidity
3-29
SYMPTOMS
Short or open circuit
Output decreases to 1 /2 at 80° C
Internal noise
Instability
Total failure
Crystal destroyed
Frequency drift
Filter bandpass change
Component burned
Value changed
Open circuit
Component burned
Open circuit
Noise
Unsmooth rotation
Shorted
Leakage
Open/ decreased capacitance
Shorted
Leakage
Unsmooth rotation
Open or short circuit
Leakage or shorted turns
Detuned
Poor contact
Unsmooth operation
Open circuit
Poor con tact
Noise
Coil open
SERVICING
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