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SanDisk uSSD 5000
2.5
System Reliability
Specification
Data Reliability
Data integrity after power loss
Bad blocks
Wear-leveling
2.5.1 MTTF
The reliability figure of merit most often used for electronic equipment is Mean
Time To Failure (MTTF). SanDisk estimates MTTF using a prediction
methodology based on reliability data for the individual components in
SanDisk products.
Component data comes from several sources: device life tests, failure analysis
of earlier equipment, device physics, and field returns.
SanDisk uses following methods to predict reliability:
•
Telcordia Special Report SR-332, Reliability Prediction Procedure for
Electronic Equipment (RPP).
•
British Telecom Industry HRD5, Handbook of Reliability Data for
Electronic Components used in Telecommunication System.
Table
6
summarizes
configurations. The analysis was performed using a RAM Commander™ failure
rate prediction.
•
Failure Rate: The total number of failures within an item population,
divided by the total number of life units expended by that population,
during a particular measurement interval under stated condition.
•
Mean Time To Failures (MTTF): A basic measure of reliability for
repairable items: The mean number of life units during which all parts of
the item perform within their specified limits, during a particular
measurement interval under stated conditions.
Product
1GB, 2GB, 4GB
8GB
© 2007 SanDisk® Corporation
Table 5: Reliability
Parameters
Error detection / error correction based on
BCH algorithm
Data is guaranteed after power loss
Transparent bad block management
Dynamic and Static Wear-leveling
the
MTTF
prediction
Table 6: uSSD MTTF
Condition
Telcordia SR-332, GB, 25°C
Telcordia SR-332, GB, 25°C
8
results
for
various
MTTF (Hours)
4M
3M
Product Manual
uSSD
August 2007
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