Smart Trip - Seagate Nytro XF1230-1A0240 Product Manual

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Table 16 SMART Attributes (continued)
ID
241
242
245
250
6.3

SMART Trip

SMART trip (threshold exceeded condition) indicates impending degradation or fault condition. The host can issue a
SMART return status command (B0h/DAh) to communicate the reliability status of the drive. The threshold-exceeded
condition is also checked during drive self tests.
Seagate Nytro XF1230 SATA SSD Product Manual, Rev. H
Attribute ID
Lifetime Writes From The Host in GB
Lifetime Reads From The Host in GB
SSD Life Left
Total Number of NAND Read Retries
Description
Track the number of user data in GB written by the
host
Track the number of user data in GB read by the host
Indicates the approximate SSD life left, in terms of
program/erase cycles or Flash blocks currently
available for use.
Indicates the total number of NAND read retires.
SMART Support
20