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6.2
SMART Attributes
The Nytro XF1230 supports the SMART attributes shown in the following table.
Table 16 SMART Attributes
ID
1
5
9
12
174
175
176
177
178
179
180
181
182
183
184
187
188
189
190
194
195
199
201
204
231
234
Seagate Nytro XF1230 SATA SSD Product Manual, Rev. H
Attribute ID
Raw Read Error Rate
Retired Block count
Power on hours
Power Cycle Count
Unexpected Power Loss Count
Program Fail Count (Worst Case
Component per die)
Erase Fail Count (Worst Case
Component per die)
Endurance Limit Met
Used Reserved Block Count (Worst
Case Component)
Used Reserved Block Count (SSD Total)
End to End Error Detection / Correction
Rate
Program Fail Count
Erase Fail Count
SATA Downshift Count
End to End Error Detection Count
Reported Uncorrectable Errors
Command Timeout Count
SSD Health Flags
SATA Error Counter
Temperature (Celsius)
ECC On the Fly Rate
Ultra DMA CRC Error Count
Read Error Rate
Soft ECC Correction Rate
SSD Life Left (%)
Lifetime NAND programs in GB
Description
Rate of hardware read errors that occurred when
reading data from a device
Count of number of blocks that have been
reallocated, excluding pending sectors
The time accumulated while the power is on and
operating
Count of number of Power Cycles, excluding power
mode commands
Number of Issue on Unexpected Power Loss
Maximum number of Program Error Events per die
Maximum number of Erase Error Events per die
Indicates the number of NAND wear
Number of used reserved blocks
Number of used reserved blocks in SSD
Number of error detection of the data path between
host and NAND in SSD during last power-on
Number of Error Events on Program (Lifetime)
Number of Error Events on Erase (Lifetime)
Number of times that SATA interface speed reduced
Number of error detection of the data path between
host and NAND in SSD of lifetime
Uncorrectable Error Count
Number of total uncompleted commands
Indicates PLP health status and Thermal Throttling
status
Number of encountered SATA error
Temperature of the SSD
Hardware read error rate that occurred when reading
data
Number of Ultra DMA CRC error count (Lifetime)
Number of soft read errors (Count of UECC Error)
Count of errors corrected by software ECC[citation
needed]
Indicates the approximate SSD life left, in terms of
program/erase cycles or Flash blocks currently
available for use.
Lifetime NAND programs in GB
SMART Support
19
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