Tonghui TH2829 Series Manuals

Tonghui TH2829 Series Manuals

Manuals and User Guides for Tonghui TH2829 Series. We have 1 Tonghui TH2829 Series manual available for free PDF download: Operation Manual

Tonghui TH2829 Series Operation Manual

Tonghui TH2829 Series Operation Manual (223 pages)

Brand: Tonghui | Category: Measuring Instruments | Size: 2 MB

Table of Contents

Table of Contents
2
Chapter 1 Out of Box Audit

10
- To Inspect the Package
  10
- Power Connection
  10
- Fuse
  10
- Environment
  11
- Use of Test Fixture
  11
- Warm-Up
  11
- Other Features
  12
Chapter 2 Introduction

13
- Introduction to Front Panel
  13
- Introduction to Rear Panel
  15
- Introduction to Display Zone
  16
- Main Menu Keys and Corresponding Displayed
  17
- Disp]
  17
- Setup]
  17
- System]
  18
- Basic Operation
  18
- Start the Instrument
  19
Chapter 3 Introduction to [DISP]

20
- Meas Display
  20
- Test Function
  21
- Test Range
  23
- Test Frequency
  23
- Test Level
  24
- DC Bias
  25
- Test Speed
  26
- Tools
  26
- Save LCR Test Result by U Disk
  27
- Bin No. Disp
  28
- Comparator Function
  29
- Bin Count Disp
  29
- Param
  30
- Nom
  30
- Bin
  30
- High/Low
  31
- Count
  31
- Aux
  31
- Out
  31
- List Sweep Disp
  31
- Sweep Mode
  32
- FREQ (Hz)
  33
- Cp[F] D[ ]
  33
- CMP (Compare)
  33
- Trace Sweep
  33
- Format
  34
- Scale
  34
- Read
  34
- Trace
  35
- Points
  35
- Trigger
  35
- Save Csv & Save as
  35
- Meas Setup
  36
- Trigger Mode
  38
- Auto Level Control Function
  38
- Bias Current Isolation Function
  39
- Average
  40
- Level Monitor Function
  40
- Delay Time
  41
- Output Impedance
  41
- Deviation Test Function
  41
- Correction
  42
- Open
  44
- Short
  45
- Load
  47
- Load Correction Test Function
  48
- Cable Length Selection
  48
- Limit Table
  49
- Swap Parameter
  49
- Limit Modes of Compare Function
  50
- Set Nominal Value of Tolerance Mode
  51
- Comparator Function ON/OFF
  51
- Auxiliary bin ON/OFF
  52
- High/Low
  52
- List Sweep Setup
  53
- Mode
  54
- Test Parameter
  54
- Sweep Parameter Setup
  55
- Trace Sweep Setup
  55
- Function
  56
- Level
  56
- DC Bias
  56
- Trace
  57
- Range
  57
- Scale
  57
- Frequency
  57
- Speed
  57
- Format
  57
- Trigger
  57
- Mode
  57
- Start Delay
  58
- Point
  58
- Step Delay
  58
- Maximum and Minimum
  58
- Start
  58
- End
  58
- Coordination Range Settiing
  58
Chapter 4 [SYSTEM] and <FILE MANAGE

60
- System Setup
  60
- Main Func
  60
- On Beepers
  61
- Pass Beep
  61
- Fail Beep
  61
- Language
  62
- Theme
  62
- Pass Word
  62
- BUS MODE (Reserved Function)
  63
- GPIB ADDR (Reserved Function)
  63
- Talk Only
  64
- Bias Src
  64
- Baud Rate
  65
- Data/Time
  65
- Lcr <File Manage
  65
- Setup File for Single-Group Component (*.STA)
  66
- U-Disk Manage Performance
  67
- Operation Steps for File Management
  68
Chapter 5 Execute LCR Operation and some Examples

70
Chapter 6 Transformer Single-Machine Test

80
- Circuit for Transformer Single-Machine Test
  80
- Some Parameters of Transformer
  80
- Transformer Single Test Circuit and TURN Test
  80
- Transformer Leakage Inductance Test
  81
- Capacitance Test between Windings of Transformer
  81
- Transformer Measure Setup
  82
- Delay
  83
- Bias
  83
- Mode
  83
- Setting TURN Test Conditions
  84
- Setting Lx Test Conditions
  84
- Setting DCR Test Conditions
  85
- Test Frequency, Voltage and Switch
  85
- Trans Limit Setup
  85
- Lmt Mode
  86
- Parameter Column
  86
- Trans Meas Disp
  87
- Transformer Judge Display
  87
- Save Transformer Single-Group Test Result by U Disk
  88
Chapter 7 Transformer Auto Scanning Test

90
- Introduction to Scan Test Function
  90
- Install and Connect the Scanning Test System
  90
- Upper Panel of Scanning Box
  91
- Lower Panel of Scanning Box
  93
- HANDLER Interface
  93
- Timing Diagram of HANDLER Signal
  93
- Example of Transformer
  94
- Distribution and Connection Diagram for HANDLER
  94
- Transformer ID
  95
- Clear Ram
  95
- Transformer Pin Label
  96
- Autotrig Delay
  96
- Handler Mode
  97
- Save Log Mode
  98
- COPY PINOFFSET and COPY A=>ALL
  99
- Pass Disp Time
  100
- Pass Disp Size
  101
- Command Extrig
  101
- Minus Dev
  102
- Scan Disp Font
  102
- Ext Reset Func
  102
- SCAN PAGE from and SCAN
  102
- Rescan if Fail
  103
- Save Log as
  104
- DC Bias Factor
  104
- Hdl Val ID Time
  105
- Relay Act Time
  105
- Transformer ID
  106
- Primary Nums
  106
- Secondary Nums
  106
- Rescan Interval
  106
- Scan Disp Mode
  107
- Fail Rescan
  107
- Dcr Meas Delay
  107
- Dcr over Delay
  107
- Ibias on Delay
  108
- Ignore Nom
  108
- Trigger Delay
  108
- Cylinder Ctrl
  108
- Allocate Pin to Fixture
  109
- Pin to Fixture
  109
- Hflx
  109
- Pin Setup
  110
- Series Pin Short Setup
  111
- Parallel Pin Short Setup
  112
- Trans Test Condition
  113
- Frequency, Voltage, Switch and Scanning Sequence
  113
- Setting TURN Test Conditions
  114
- Setting Lx Test Conditions
  117
- Setting Lk Test Conditions
  121
- Setting CX Test Conditions
  122
- Setting Zx Test Conditions
  123
- Setting ACR Test Conditions
  125
- Setting DCR Test Conditions
  126
- Setting PS Test Conditions
  127
- Setting BL Test Conditions
  128
- Setting LED Test Conditions
  129
- Trans Scan Test
  131
- Display Zone
  131
- Function Keys
  132
- PRI Page-Turning Function
  133
- Lk Pin Disp
  134
- BAL Display
  135
- File Manage
  135
- Operation Steps for File Manage
  136
- Stored Files of TH2829AX-24
  138
- Compatibility of Stored Files
  139
- Transformer Deviation-Deduction
  139
- Save Scan Test Results by U Disk
  141
- Statistic Page of Transformer Scan Test
  142
- Reset Statistic Count Value
  142
- Focus Scan
  143
- Frequently Asked Questions and Answers in Transformer Scan Test
  144
- High and Low Limits
  144
- Measurement Item Loss
  144
- Measurement Interruption
  145
- Poor DCR Accuracy
  145
- Poor Lk Accuracy
  145
- Inaccurate TURN
  145
- Unstable TURN
  146
- Difference between the First and the Second Lx
  146
- Poor Stability of CX and Zx Open Test Data
  146
- DCR and PS Open Cannot Reach Infinite Large
  146
- User-Made Test Fixture
  146
- Use TH1801-EXT2A-OUT to Make Test Fixture
  147
- Example of Using TH1801-EXT11A(5.0)-B Pin Signal
  148
- Scan Test Interface Board
  148
- Self-Check Function of Scanner Relay
  149
- Operation Steps for Scan Self-Check
  149
- Displayed Information on Screen
  150
- Detection Method for Relay Short
  151
Chapter 8 Performance and Test

152
- Test Function
  152
- Parameter and Symbol
  152
- Test Combination
  152
- Mathematical Operation
  152
- Equivalent Mode
  152
- Range
  152
- Trigger
  152
- Delay Time
  153
- Connection Modes of Test Terminals
  153
- Test Speed (Frequency>=10Khz)
  153
- Average
  153
- Display Digit
  153
- Test Signal
  153
- Test Signal Frequency
  153
- Signal Mode
  154
- Test Signal Level
  154
- Output Impedance
  154
- Monitor for Test Signal Level
  154
- Maximum Measurement Display Range
  154
- DC Bias Voltage Source
  155
- Diode Test
  155
- Measurement Accuracy
  155
- Z│,│Y│, L, C, R, X, G, B Accuracies
  155
- D Accuracy
  156
- Q Accuracy
  156
- Θ Accuracy
  156
- G Accuracy
  156
- Rp Accuracy
  157
- Rs Accuracy
  157
- Accuracy Factor
  157
- DCR Accuracy
  161
- Lk Accuracy
  161
- Turns to Ratio Accuracy
  161
- Safety Requirement
  162
- Insulation Resistance
  162
- Insulation Intensity
  162
- Leakage Current
  162
- Electromagnetic Compatibility
  162
- Performance Test
  162
- Working Condition
  162
- The Used Instruments and Devices
  163
- Function Check
  163
- Test Signal Level
  163
- Frequency
  164
- Measurement Accuracy
  164
- Accuracy of C and D
  164
- Accuracy of L
  164
- Accuracy of Z
  164
- Accuracy of DCR
  165
Chapter 9 Command Reference

166
- Subsystem Commands for TH2829X
  166
- Display Subsystem Commands
  166
- Frequency Subsystem Commands
  169
- Voltage Subsystem Commands
  169
- Current Subsystem Commands
  170
- Amplitude Subsystem Commands
  170
- Output Resistor Subsystem Commands
  170
- Output Subsystem Commands
  171
- BIAS Subsystem Commands
  172
- Function Subsystem Commands
  173
- LIST Subsystem Commands
  177
- Aperture Subsystem Commands
  181
- Trigger Subsystem Commands
  182
- Fetch? Subsystem Commands
  183
- Correction Subsystem Commands
  186
- Comparator Subsystem Commands
  191
- Mass Memory Subsystem Commands
  196
- TRAN Subsystem Commands
  196
- GPIB Common Commands
  205
Chapter 10 Description for Handler

209
- Technology Description
  209
- Operation Description
  209

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