JDS Uniphase Module-E 10G Introduction

COMMUNICATIONS TEST & MEASUREMENT SOLUTIONS
All major operators view 10 Gigabit Ethernet (10GigE) as the key enabling technology in
today's market and are implementing it in their networks as LAN, WAN, or in combina-
tion with OTN.
The major challenge of manufacturers is to provide interface cards with capabilities for
multiple technologies. They need to verify the ports against various standards, such as
IEEE and ITU-T, to ensure that all of the network layers are interacting properly. As Eth-
ernet behavior changes from "best effort" to "carrier grade", comprehensive testing is
required.
The Module-E 10G for JDSU's ONT-503/506/512 addresses the needs of R&D and SVT
labs by providing all of the necessary functionality for testing layers 1 up to 3 of 10GigE
LAN and WAN networks optical at different wavelengths and with electrical interfaces.
For these applications Module-E provides all necessary technologies LAN, WAN, FC,
SONET/SDH, OTN and has stressed eye and jitter on its roadmap.
Introducing
Module-E 10G
within
ONT-503/506/512
R&D and Compliance Testing
• Built-in switchable and XFP
optics and high output electrical
interface
• Unframed BERT at 9.95, 10.0,
10.3, 10.5, 10.66, 10.7, 11.05,
11.1, 11.27, 11.32 Gb/s
• SONET/SDH framed signals with
HO mappings
• SONET/SDH MultiChannel
(192xSTS-1, 64xAU-3/-4)
• OTN at 10.7, 11.05, 11.1, 11.27,
11.32 Gb/s with FEC stress
testing
• ONT Wrapper/de-wrapper
testing
• 10GigE LAN/WAN BERT and L2/
L3 traffic
• 10G Fiber Channel BERT
• 256 MAC/IP Flows with 256
independent filters
• 10 mixed VLAN / MPLS tags
• Enhanced Ethernet frames VPLS,
MAC-in-MAC
• QoS, service disruption, packet
jitter, BERT per flow
• Stressed eye testing
• Jitter/wander testing
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