HP 4262A Operating And Service Manual page 43

Model 4262A
Section
III
Figure 3-7
CAUTION
NEVER APPLY AN EXTERNAL DC BIAS
OVER +40V.
4. Connect Semiconductor device to test lead or to fixture. To obtain reliable meas¬
urement results, observe the following:
Note
a. It is impossible to measure junction capaci¬
tance when bias current flows through sample.
b. If lead length of device allows, it is recom¬
mended that the device be connected directly
to UNKNOWN terminals.
5. Read displayed values. Loss factor of the sample will be simultaneously displayed
on DQ DISPLAY.
Note
When using manual trigger, press HOLD/MAN¬
UAL button. Each time the button is pressed,
the instrument is triggered. When measuring
multiple samples whose values are about the
same, it is recommended that the LCR RANGE
be set to MANUAL and that the range be held.
Figure 3-8. Semiconductor Device Measurement (Sheet 2 of 2).
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