TAKAYA APT-9411 Series Operator's Manual
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TAKAYA APT-9411 Series Operator's Manual

Ic open test system cs-9500
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Operator's Guide
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Operator's Guide
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  • Page 1 IC open test s s s s ystem IC open test ystem CS CS- - - - 9 9 9 9 5 5 5 5 00 IC open test IC open test ystem ystem Operator’s Guide Operator’s Guide Operator’s Guide Operator’s Guide TAKAYA...

  • Page 3: Preface

    Preface The IC Open test system CS-9500, one of exclusive options for Takaya Fixtureless Tester APT-9411 Series, enables to detect unsoldered IC leads of QFP, SOJ, so on while contacting the independently moving sensor probes on the IC’s package. This Operator’s guide covers the functions, programming, operation, maintenance and specifications of the IC Open Test system CS-9500.

  • Page 4: Introduction

    Introduction Operation keys and SW (1) All operation keys on the keyboard are begirt by [ ] mark such like [ Enter ] key, [ SP ] key. (2) All SWs on the operation panel are also displayed like [ TEST START ]. (3) If some plural keys need to be depressed in order, they are combined with “...

  • Page 5: Safety Precautions

    Safety precautions Since this section summarizes the precautions to be observed to operate the IC Open Test system CS-9500 in safety, be sure to read it before operation. All instructions below are very important! Do not attempt to install and/or use the product unless you could understand any of them.

  • Page 7: General

    This section provides fundamental information on the IC Open Test system CS-9500. Outline With this optional system built-in, the Takaya APT-9411CE Series (hereafter “Tester”) enables to detect unsoldered IC leads of QFP, SOJ, so on while contacting the independently moving sensor probes on the IC’s package.

  • Page 8: Antenna Drive Unit & Sensor Probe Installation

    Antenna drive unit & Sensor probe installation The antenna drive unit that includes the sensor probe is installed on the Z2 axis and the Z3 axis. Contact position of Sensor probe and probe As shown in Fig.3 below, the sensor probe which is equipped with a round sensor plate (diameter φ5mm) on the top steps on IC package where is nearby each IC lead to be measured.

  • Page 9: Programming Ic Open Steps

    Programming IC Open Steps The tester allows easy programming of IC Open test as well. The user can use a CCD camera to directly input the XY coordinates where the sensor probe contacts or outsource the creation of test program to CAD data converters. Inputting the XY coordinates of all four corners on the IC package as well as the number of the IC leads, the tester can automatically create the XY coordinates for the sensor probes to contact.

  • Page 10: Test Speed

    Test speed The test speed depends largely on travel distance of the test probes and the IC lead pitches. Let’s say for instance that we test a QFP with 0.65mm pitch while directly contacting the IC lead pads. In this case, we can estimate max.

  • Page 11: Test Data Programming

    § § § § 2 Test Data programming This section describes the procedure for preparing a program of the IC open test. Initial setup The sensor probe to probe offset must be adjusted carefully by the following operation. The tester requires this initial setup by the user at the time of first using the IC open test system and each time the sensor probe (also the sensor probe base) is replaced by new one.
  • Page 12 Use the keypad arrow keys to drive the 3Z arm and set the probe on any reference point on the horizontal line or any Via hole on your PC board. After the position was determined, press [Enter] SW to enter the X,Y coordinates. 8.
  • Page 13 11. The sensor probe moves to the Machine reference point automatically while displaying the following window on the screen. 12. Ensure that the sensor probe is at the center of the Machine reference point and click on [OK] button. If the sensor probe has some deviations, click on [Cancel] button and repeat the same operation from Process 4.
  • Page 14 16. The JOG window is displayed on the screen. 17. Use the keypad arrow keys to drive the 2Z arm and set the front side of the sensor plate for the X,Y coordinates assigned by Probe (2Z). After the position was determined, press [Enter] SW to enter the X,Y coordinates.

  • Page 15: Automatic Generation Of Ic Open Test

    Automatic generation of IC open test The tester offers two options to manage the XY coordinates in your test programs. One method is so-called “Teaching system” that utilizes the solder lands and the to test the UUT. Another electrodes one is so-called “Point system” that utilizes any test point from each circuit patterns. Those coordinate management systems are user-selectable on the Coordinates Management window in Data mode.
  • Page 16 Step List window Select Auto. Generation function from the Menubar. (Tool > Auto. Generation) It displays the pop-up message “Use board ref. point and aux. ref. point for alignment?” on the screen. Click on [Yes] button. It displays the pop-up message “Press [TEST START] SW” on the screen. Press [TEST START] SW on the operation panel.
  • Page 17 It proceeds to the next window where you can specify a preferable generation style. Fill ‘IC open test only’ radio button and click on [Next] button. It proceeds to the next window where you can specify a preferable generation pitch. Fill ‘Regular pitch’...
  • Page 18 It proceeds to the next window where you can input the XY coordinates for the IC leads you specified at Process #13. Drive the camera to enter the X,Y coordinates of the IC lead #1, 8, 9, 16, 17, 24, 25 and 32 in order and click on [OK] button.
  • Page 19 Upper left corner Upper right corner Lower left corner Lower right corner Front side Drive the camera to enter the X,Y coordinates at the four corners of the IC package and click on [OK] button. The IC Open test steps are generated on the list automatically. In case that the GND points for IC open test were set up incorrectly, otherwise when probe access was limited, IC open test steps may be not generated so that they are converted to normal VF measurement steps (‘Pin to GND’)

  • Page 20: Practical Operation In Point System

    Practical operation in Point system The IC open test is automatically created by using the Auto. Generation function available on Step Edit/List menu. (Tool > Step Edit/Step List > Auto. Generation) Undermentioned is a practical example to make IC Open test steps. (Ex.2) How to program test steps only for the IC below Preparation Coordinates Management system (Tool >...
  • Page 21 It displays the pop-up message “Use board ref. point and aux. ref. point for alignment?”on the screen. Click on [Yes] button. It displays the pop-up message “Press [TEST START] SW” on the screen. Press [TEST START] SW on the operation panel. Align the inclination and/scale of the PC board by manually centering the camera target on the board reference point and auxiliary reference point(s) or automatically using the image processing unit (option).
  • Page 22 Fill ‘IC open test only’ radio button and click on [Next] button. It proceeds to the next window where you can specify information on the IC lead number. Type “8, 9, 16, 17, 24, 25, 32” from the keyboard and click on [Next] button. It proceeds to the next window where you can specify GND pin number.
  • Page 23 Node number Type the Node number for each IC leads from the keyboard and click on [OK] button. Drive the camera to enter the X,Y coordinates of the IC lead #1, 8, 9, 16, 17, 24, 25 and 32 in order and click on [OK] button.
  • Page 24 Upper left corner Upper right corner Lower left corner Lower right corner Front side Drive the camera to enter the X,Y coordinates at the four corners of the IC package and click on [OK] button. The IC Open test steps are generated on the list automatically. Prior to generate IC open test steps, you are recommended to fill “Use Auxiliary Reference Point(s)”...

  • Page 25: Reference Value Input & Examination

    Reference Value Input & Examination The important part begins here as you will need to input and examine the reference value for IC open test correctly. Reference Value Input Like usual test steps, use Reference value input window to input the reference value for the IC open test.
  • Page 26 Pass/Fail judgment The IC open test is judged PASS when it was measured within the tolerance (±30%) of the reference value which you learned from good sample board(s). The tolerance is assigned to ±30% automatically during the automatic reference input. However, the reference value for IC open test may vary significantly depending on the IC components under test and/or due to the effect of the substrate, which occasionally causes misjudgment even though the tester is in good condition.
  • Page 27 The display goes back to the Change Step Data window. Click on [ Execute ] button. Unmeasurable condition As for the unmeasurable cases which were described in a previous chapter, the Function (FC) column is automatically substituted by "JP" at the time of the automatic reference value input. In addition, when either [Auto.

  • Page 28: Data Conversion

    Data conversion Electric test of the IC components ( i.e. conventional Pin to GND steps ) can be easily converted into the IC open test -- and vice versa. How to convert electric test to IC open test (Plural steps) The procedure of converting more than one electric test in series into the IC open test is outlined below.
  • Page 29 It displays the pop-up message “Is it irregular pitch?” on the screen. Click on [No] button. It displays the following window on the screen. Enter X,Y coordinates for two GND points at the left-bottom side and at the right-top side of the PC board and click on [OK] button. It displays the following window on the screen.
  • Page 30 How to convert IC open test to electric test (Plural steps) The procedure of converting more than one IC open test in series into the electric test is outlined below. Select either Step Edit or Step List from the Menubar. It displays the Step Edit window or the Step List window.
  • Page 31 How to convert electric test to IC open test (One step only) The procedure of converting one electric test into the IC open test is outlined below. Select Review Step Data from the Menubar. (Test > Review Step Data) Fill the box “Evaluation of reference value” in the Examination Mode menu (2). Use the input box (1) to specify the step number of the step to be converted into the IC open test.
  • Page 32 Assign ‘LD-CN’ to the Measure Mode box. It displays the pop-up message “Do you use the bottom sensor probe?” on the screen. Click on [No] button. It displays the following window on the screen. Enter X,Y coordinates for two GND points at the left-bottom side and at the right-top side of the PC board and click on [OK] button.
  • Page 33 It displays the following window on the screen. Enter the X,Y coordinates and the top position of the Sensor probe. Then, click on [OK] button. The display goes back to the Step data review window. Assign ‘30’ to both +% edit box and -% edit box.
  • Page 34 How to convert IC open test to electric test (One step only) The procedure of converting one IC open test into the electric test is outlined below. Select Review Step Data from the Menubar. (Test > Review Step Data) Fill the box “Evaluation of reference value” in the Examination Mode menu (2). Use the input box (1) to specify the step number of the step to be converted into the electric test.
  • Page 35 Assign ‘DC-CC’ to the Measure Mode box. Assign ‘50’ to both +% edit box and -% edit box. Click on [Auto Input] button to learn the reference value. Hit [0] key to save the reference value. Now the original step changed to regular electric test. - 29 -...
  • Page 36 Lowest position of Sensor probe Sensor probe’s stroke (the lowest position) for 2Z and 3Z axis is step by step changeable at “PL” column displayed in Step List menu. Also they are changeable in the block on Change step data window (Tool >...
  • Page 37 Top position of Sensor probe The top position of the Sensor probe is managed by “H / M / L” in the same manner as the probe. The distance upward from the board surface is preset to 40.0mm(H), 16.4mm(M) and 6.4mm(L). If the top position was lowered than the default (H), the rising time of the probe and the Sensor probe shorten, so that the test time is reduced.

  • Page 38: Maintenance

    § § § § 3 Maintenance This section describes a short guidance how to do maintenance and troubleshooting on the sensor probes. Maintenance of Sensor Probe Base CS8000-S21 The Sensor probe base CS8000-S21 is a small round plate locates on the top of the Sensor probe and is absolutely consumable and needs to be replaced periodically.

  • Page 39: Sensor Probe Inspection

    Click on “Set sensor probe’s life limit” button. The cursor moves in the box “Sensor probe’s Life Limit”. Specify the stroke number and hit [Enter] key on the keyboard. Click on [OK] button. The Sensor Probe tab is closed. The Sensor probe’s stroke count is saved automatically when your test data is saved in the disk and also when the system application is closed.

  • Page 40: Troubleshooting

    Troubleshooting When the IC open test is judged as unmeasurable or measures lower, the Sensor probe is considered to be unable to function normally. In addition, there may be other causes as indicated in List 2. Please check one by one carefully to find the root cause. Possible cause 1 Countermeasure Readjust Sensor probe to probe offset.
  • Page 41 Click on [Probe 3] button on the screen. It displays “Press [TEST START] SW”. Press [TEST START] SW. The Probe 3 moves to the front side. The pop-up window below appears on the screen. Open the Safety cover. Disconnect a connecting cable of the Sensor probe. Then unscrew the hex-head screw and remove the Sensor probe.
  • Page 42 Hook the connecting cable on the Cable holder (Mini-clamp). Cable holder (Mini-clamp) Sensor probe Close the Safety cover. Press [RESET] SW. Click on [Continue] button. Click on [Close] button. It displays “Press [TEST STOP] SW”. Press [TEST STOP] SW. Adjust Probe menu is closed. All operation is finished.

  • Page 43: Replacing Sensor Probe Base Cs8000-S21

    Replacing Sensor probe base CS8000-S21 The procedure below shows the way of replacing the Sensor probe base CS800-S21. 1) Operate the same procedures 1 ~ 8 as the Sensor probe CS9000-A24 to remove the Sensor probe. 2) Pull the CS8000-S21 straight out of the Sensor probe. センサプローブ...

  • Page 44: Underside Ic Open Test System

    SU9122 (22mm × 22mm) Sensor & cable SU9132 (32mm × 32mm) Control cable 1 TAKAYA LS-441-01A (TVX-11~TVX-21) Control cable 2 TAKAYA LS-441-02A (TVX-11~TVX-21) Connection cable TAKAYA LS-461-01A (TVX-21 ~ Tray) Cable holding magnet CH02 (4) (5) (1) (3) - 38 -...

  • Page 45: Installation Area

    Installation area Fig.1 below shows the area where the bottom sensor plates are placeable directly on the Tray. 500mm 400mm 基板受けレール PCB Clamper [Fig.1] Installation area (APT-9411) (Note) Shaded portion is prohibited the bottom sensors from being placed. Height limitation The IC package where the bottom sensor plate can contact should be max.12mm height from the substrate.
  • Page 46 Data mode > Bottom tools Click on the Bottom sensors tab and check the box “Use Bottom sensors”. Bottom sensor Configure both “Number of Bottom sensors” and “Bottom sensors restricted area”. Click on the Configure the position of Bottom tools button on the screen. The Bottom Reference Point window appears on the display.
  • Page 47 Press [TEST START] SW, and it displays the JOG window below. Put the target marker over the Bottom reference point where is visible from the top as well (ex. through-hole) and press [ENTER] SW on the operation panel. The display goes back to the Bottom Reference Point window.
  • Page 48 12) Click on [Next] button, and it displays the next window. Flip the PC board over in Y-direction to specify the Bottom reference point from the top side. 13) Press [TEST START] SW, and it displays the JOG window below. Put the target marker over the Bottom reference point and press [ENTER] SW on the operation panel.
  • Page 49 Data mode > Bottom tools 4) Click on the Verify the position of Bottom tools button on the screen. 5) It displays Bottom set check window. Bottom set check 5) Press [TEST START] SW, and it displays the JOG window below. Put the target marker over the Bottom reference point and press [ENTER] SW on the operation panel.

  • Page 50: Program Creation

    7) The camera moves over the XY coordinates of the bottom sensor plate-1 and Bottom Check window appears on the screen. Open the safety cover and install the bottom sensor plate-1 on the position where the cross-hair mark on the bottom sensor plate-1 fits with the target marker. After that, close the safety cover and press [RESET] SW and [TEST START] SW on the operation panel.
  • Page 51 Preparation Coordinates Management system (Tool > Mode setting > Data Mode) should be specified to Teaching system in advance. 1） Select either Step Edit or Step List from Menubar. 2） It displays the Step Edit window or the Step List window. Step List window 3）...
  • Page 52 11） It proceeds to the next window where you can specify a preferable generation function. Fill ‘IC automatic generation’ radio button and click on [Next] button. 12） It proceeds to the next window where you can specify a preferable generation style. Fill ‘IC open test only’...
  • Page 53 16） It proceeds to the next window where you can input the XY coordinates for the IC leads you specified at Process #14. Drive the camera to enter the X,Y coordinates of the IC lead #1, 8, 9, 16, 17, 24, 25 and 32 in order and click on [OK] button. 7 Ground pin ○...
  • Page 54 Programming operation in Point system We explain the programming operation with complete descriptions. (Ex.2) How to program the bottom IC open test for the following IC 7 Ground pin 7 Ground pin Bottom side (Populated side) Top side Preparation Coordinates Management system (Tool > Mode setting > Data Mode) should be specified to Point system in advance.
  • Page 55 9) It displays the Auto. Generation window. 10) Type “Parts name’, ‘Comment’ and ‘location’ from the keyboard. Then click on [Next] button. 11) It proceeds to the next window where you can specify a preferable generation function. Fill ‘IC automatic generation’ radio button and click on [Next] button. 12) It proceeds to the next window where you can specify a preferable generation style.
  • Page 56 15) It proceeds to the next window where you can input the Pin numbers for the IC leads you specified at Process #13. After entered the Pin numbers (#1, 8, 9, 16, 17, 24, 25 and 32), click on [OK] button.

  • Page 57: Reference Value Input

    Reference Value Input Refer to Reference Value Input on Page 19. Reference Value Examination Refer to Reference Value Examination on Page 19. Data conversion Electric test of the IC components ( i.e. conventional Pin to GND steps ) can be easily converted into the bottom IC open test -- and vice versa.
  • Page 58 8) Press [TEST START] SW on the operation panel. 9) Align the inclination and/scale of the PC board by manually centering the camera target on the board reference point and auxiliary reference point(s) or automatically using the image processing unit (option). 10) It displays the pop-up message “Do you use the bottom sensor probe?”...
  • Page 59 5） It displays the pop-up message “Do you convert regular generation?”on the screen. Click on [Yes] button. 6） The electric test steps are generated on the list automatically. Make sure that you enter the reference value after the data conversion. - 53 -...

  • Page 60: Maintenance

    Maintenance Refer to §3 Maintenance. Replacement of bottom sensor plate Be sure to close your active job before you start replacing the bottom sensor plate. The active job is suspended with an error as soon as the safety cover is open.
  • Page 61 Bottom sensor plate Set screw Bottom sensor unit 6） Plug the bottom sensor cables in the interface connectors as they were. Interface connector The interface connector is equipped with a locking mechanism. Push the bottom sensor connector into the interface connector until it is locked tightly. Unless the bottom sensor cable is fixed, this may effect the IC open test.

  • Page 62: Table Of Contents

    Table of Contents Preface........................i Introduction ........................ ii Operation keys and SW ..................... ii Safety symbols......................ii Safety precautions ....................iii §1 General ........................1 Outline........................1 CS-9500 Hardware ....................1 Hardware location ...................... 1 Measuring principle....................1 Antenna drive unit & Sensor probe installation ............2 Contact position of Sensor probe and probe..............
  • Page 63 APT-9411 IC open test system CS-9500 Operator’s guide VOL.3 TAKAYA Corporation Issued on: April, 2011 Made in Japan...

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