Sony ICD-SX700 Service Manual page 13

3. Loop test
Execute the DSP LOOP BACK.
Test Key SWITCH
Sound vol- [VOL +], The sound volume can be adjusted
1
ume test [VOL –] (Default value is 20.)
Press the [.HOLD] switch to ON
Recording for MANUAL mode.
[ . ], [ > ]
2
level test The recording level can be adjusted
(Default value is 30.)
Muting test can be set to "ON" or
3 Muting test [DIVIDE/ ]
"OFF".
"ON" or "OFF" of the switch can be
Directivity [DIRECTNL]
set the directivity of the microphone.
Setting of
recording OFF: AUTO
[.HOLD]
4
AUTO/ ON: MANUAL
MANUAL
AUTO ([.HOLD] SW:OFF):
(OFF: Sensitivity H, ON: Sensitiv-
Sensitivity/ [NOISE ity L)
5
Limitter CUT] MANUAL ([.HOLD] SW:ON):
(OFF: Limitter OFF, ON: Limitter
ON)
Selection
of the Press the [.HOLD] switch to ON
external [DPC] for MANUAL mode.
6
micro- OFF: MIC IN, ON: AUDIO IN
phone
• Press the [ /MENU] button to return to the test mode
screen.
4. ExtMic Cal
• The external microphone R and L channels level difference
is calibrated.
• Press the [ ] button to start calibration.
Nx
• Press the [ ] button to return to the test mode screen.
x
5. SetMic Cal
• The internal microphone R and L channels level difference
is calibrated.
• Press the [ ] button to start calibration.
Nx
• Press the [ ] button to return to the test mode screen.
x
6. Beep test
• Beep sound of 1.3 kHz is output.
• Press the [ ] button to start outputting and press the [
Nx
button to stop.
• Press the [ /MENU] button to return to the test mode
screen.
7. LCD Contrast test
• Adjust the LCD contrast.
Default value is 10.
• Adjust the LCD contrast using the [
• Press the [ /MENU] button to return to the test mode
screen.
ICD-SX700/SX700D/SX800/SX800D/SX900
Description
]
x
]/[ ] button.
> .
8. Cluster Num test
• This is the cluster number display to be used for engineering
design.
• Press the [ ] button to return the test mode screen.
x
9. RTC Interrupt test
• Perform the self test of the RTC.
• Press the [ ] button to return to the test mode screen.
x
10. Battery test
• The detected A/D value of the battery remaining power is
checked.
• Press the [ ] or [ /MENU] button to return to the test
x
mode screen.
11. Batt Cnt test
• The present A/D value of the center of the battery remaining
is checked.
• When the battery is not connected, NG is display.
• Press the [ ] or [ /MENU] button to return to the test
x
mode screen.
12. Batt AC2 test
• The present A/D value of the side of VBatAC x2 on the error
amplifi ed circuit (IC1603 output) is checked.
• Press the [ ] or [ /MENU] button to return to the test
x
mode screen.
13. Batt AB4 test
• The present A/D value of the side of VBatAB x4 on the error
amplifi ed circuit (IC1603 output) is checked.
• Press the [ ] or [ /MENU] button to return to the test
x
mode screen.
* : 12, 13 items, refer to following fi g.
Q1664
C x2SIDE
VBatBC
x4SIDE
Q1663
B
VBatAC
VBatAB
A
14. VBUS test
• The present value of the VBUS is checked.
If it is connected, OK is display.
• Press the [ ] or [ /MENU] button to return to the test
x
mode screen.
15. Sleep test
• Sleep is tested.
Note: When <Sleep> is selected, the machine enter the sleep mode.
To exit the sleep mode, turn off the power, by removing the bat-
teries and reenter the test mode.
16. App Log Out test
• This is the app log out to be used for engineering design.
• Press the [ ] button to return the test mode screen.
x
17. Log Output test
• This is the log output to be used for engineering design.
Note: Not used.
• Press the [ ] button to return to the test mode screen.
x
IC1001
IC1603
ADIN7
ErrorAmp
(VBAT_ERR)
ADIN8
(VBAT_CNT)
70k
ADIN1
(VCCVBAT)
110k
13