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DE-01728 Bannewitz
LANGER
mail@langer-emv.de
EMV-Technik
www.langer-emv.com
4 Intended Use
The ICS 105 is a 4-axis positioning system. It uses probes of Langer EMV-Technik GmbH for IC
tests and measurements. Following Probes, among others, are supported:
- ICR near-field micro probes
- passive near-field probes
- and ICI L-EFT sources
Depending on the used probe type decoupled fields of the test IC can be measured or
interferences can be injected.
The probes can be moved across the X-, Y- and Z-axis and rotated along the Z-axis. The
distance between the test IC and the probe tip can be visually checked with the DM-CAM digital
microscope camera. The ICS 105 is controlled by the ChipScan-Scanner Software via
computer.
Fields of Application (a selection):
Surface scans over test ICs in accordance with IEC61967-3
Volume scans over test ICs
PIN scans
Side channel analysis / fault injection
ICS 105 IC Scanner set
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