Huawei ME909s Series Hardware Manual page 56

Lte mini pcie module
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HUAWEI ME909s Series LTE Mini PCIe Module
Hardware Guide
Item
Shock test
Drop test
Life
High temperature
operating life
High temperature
& high humidity
Issue 02 (2016-09-07)
Test Condition
Half-sine wave shock
Peak acceleration: 30
Grms
Shock duration: 11 ms
Operation mode:
working with service
connected
Test duration: 6 axial
directions. 3 shocks
for each axial
direction.
1.0 m in height. Drop
the module on the
marble terrace with
one surface facing
downwards. Six
surfaces should be
tested.
Operation mode: no
power, no package
Temperature: 75º C
Operation mode:
working with service
connected
Test duration: 168 h,
336 h, 500 h for
inspection point
High temperature:
85º C
Humidity: 85%
Operation mode:
powered on and no
working
Test duration: 168 h,
336 h, 500 h for
inspection point
Huawei Proprietary and Confidential
Copyright © Huawei Technologies Co., Ltd.
Electrical and Reliability Features
Standard
Sample size
JESD-B1
3 pcs/group
04-C
IEC60068
3 pcs/group
-2-32
JESD22-
50 pcs/group
A108-B
JESD22-
50 pcs/group
A110-B
Results
Visual inspection: ok
Function test: ok
RF specification: ok
Visual inspection: ok
Function test: ok
RF specification: ok
Visual inspection: ok
Function test: ok
RF specification: ok
Visual inspection: ok
Function test: ok
RF specification: ok
Cross section: ok
56

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