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Solver PRO
Scanning Probe Microscope
Atomic Force Acoustic Microscopy
Instruction Manual
22 April 2010
Copyright © NT-MDT
Web Page:
http://www.ntmdt.com
General Information:
spm@ntmdt.ru
Technical Support:
support@ntmdt.ru
NT-MDT Co., building 100,
Zelenograd, 124482, Moscow, Russia
Tel.: +7-499-735-77-77
Fax: +7-499-735-64-10
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Summary of Contents for NT-MDT Solver PRO
- Page 1 Solver PRO Scanning Probe Microscope Atomic Force Acoustic Microscopy Instruction Manual 22 April 2010 Copyright © NT-MDT Web Page: http://www.ntmdt.com General Information: spm@ntmdt.ru Technical Support: support@ntmdt.ru NT-MDT Co., building 100, Zelenograd, 124482, Moscow, Russia Tel.: +7-499-735-77-77 Fax: +7-499-735-64-10...
- Page 2 Read me First! Observe safety measures for operation with devices containing sources of laser radiation. Do not stare into the beam. A label warning about the presence of laser radiation is attached to the measuring head (Fig. 1), laser sources. Fig.
- Page 3 User’s documentation set The following manuals are included into the user’s documentation set: − Instruction Manual – is the guidance for the preparation of the instrument and other equipment for operation on various techniques of Scanning Probe Microscopy. The contents of the user’s documentation set may differ in dependence on the delivery set of the instrument.
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Page 4: Table Of Contents
Atomic Force Acoustic Microscopy SPM Solver PRO. Instruction Manual. Atomic Force Acoustic Microscopy Table of Contents 1. PREPARATION OF THE INSTRUMENT FOR OPERATION............5 1.1..................6 LTRASOUND RANSDUCER NSTALLATION 1.2.......................... 6 IXING THE AMPLE 1.3........................7 HOOSING THE ROBE 2. -
Page 5: Preparation Of The Instrument For Operation
Chapter 1. Preparation of the Instrument for Operation SPM Solver PRO. Instruction Manual. Atomic Force Acoustic Microscopy 1. Preparation of the Instrument for Operation The instrument preparation procedure is specified in section “Instrument preparation for AFM modes” (see Performing Measurements, chapter 3). The list of the basic operations is... -
Page 6: Ultrasound Transducer Installation
Atomic Force Acoustic Microscopy 1.1. Ultrasound Transducer Installation 1. Unbend the spring supports and mount the ultrasound transducer in the positioning device of the approach unit with the rounded part of the transducer base facing the user, see Fig. 1-1. a) ultrasound transducer b) ultrasound transducer mounted in the positioning device... -
Page 7: Choosing The Probe
Chapter 1. Preparation of the Instrument for Operation 3. Put the sample on the transducer. Slightly pressing the sample with tweezers make several short movements along the transducer surface to ensure optimal spread of the honey and better contact between the surfaces. After completing the manipulations described above it is strongly recommended to wait for some time (about one hour) before starting the measurements. -
Page 8: Conducting The Measurements
Atomic Force Acoustic Microscopy 2. Performing Measurements The user is supposed to have detailed knowledge of the contact and semicontact mode AFM (see Performing Measurements, chapter 3) before conducting the AFAM measurements. In AFAM method the phase, the amplitude or the frequency of the cantilever bending oscillations is measured near the contact resonance frequency simultaneously with recording the topography map by the contact technique. - Page 9 Chapter 2. Performing Measurements Fig. 2-2 c. In the control panel of tab make the following changes (Fig. 2-3): Resonance - In drop-down list select Response signal - Set the range ( … ) to include several cantilever resonance frequencies. From The second and third resonance frequencies are related to the first one as =6.22 and f...
- Page 10 Atomic Force Acoustic Microscopy Fig. 2-4. Frequency response of the cantilever oscillations amplitude in the frequency range below 55 kHz Fig. 2-5. Frequency response of the cantilever oscillations amplitude in the frequency range above 55 kHz...
- Page 11 Chapter 2. Performing Measurements 6. In the range chosen determine the contact resonance frequency of the cantilever AFAM AFAM …). For that: 1 a. Turn on the feedback ( button is pressed in). b. Open the instrument block scheme with the button in the Additional Scheme Operations Panel.
- Page 12 Atomic Force Acoustic Microscopy 7. Adjust the amplitude of the generator output signal ( parameter) and the Amplitude lock-in amplifier gain ( parameter) so that the maximum of signal is within Gain the range of 5-10 nA and the resonance peak is symmetrical. If the peak is tilted or truncated shall be decreased.
- Page 13 Chapter 2. Performing Measurements 9. Set the working frequency of the generator accounting for the entity to be recorded (phase, amplitude, or frequency). - When recording amplitude change: set the value of the piezodriver working frequency ( parameter) at one of the resonance peak slopes. In case of Frequency the right slope lighter region would correspond to larger cantilever response signal and, consequently, to greater sample stiffness since the resonance peak shifts...
- Page 14 Atomic Force Acoustic Microscopy 12. Switch to tab. Scan Now the procedure branches out to account for the recorded entity (phase, amplitude, or frequency). For recording the frequency change, select the AFAM mode. Skip this step if the phase change or the amplitude change are recorded. a.
- Page 15 Chapter 2. Performing Measurements Scanning 1. Select scan area and set scanning. 2. For recording the frequency change, set a moderate scanning speed for the feedback to 0.5 kHz. follow phase changes. The recommended scanline rate is Frequency 3. Start scanning by clicking button.
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Page 16: Finishing The Operation
Atomic Force Acoustic Microscopy 3. Finishing the Operation 1. Rise the probe 2-3 mm above the sample. 2. Turn off the feedback ( button is not pressed in). 3. Turn off the SPM controller. 4. Turn off the Vibration Isolation System. 5.
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