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Nanosurf easyScan 2 AFM Operating Instructions Manual

Atomic force microscope system
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Operating Instructions
easyScan 2 AFM
Version 1.6

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  • Page 1 Operating Instructions easyScan 2 AFM Version 1.6...
  • Page 2 ‘N ’ ANOSURF AND THE ANOSURF OGO ARE TRADEMARKS OF ANOSURF REGIS TERED AND OR OTHERWISE PROTECTED IN VARIOUS COUNTRIES © M AG, S .:BT02089, ANOSURF WITZERLAND...

  • Page 3: Table Of Contents

    Components of the System ..............15 Contents of the Tool set Connectors, Indicators and Controls ...........18 The Scan head The Controller Installing the easyScan 2 AFM Installing the Hardware ................22 Installing the Basic AFM Package Installing the AFM Video Module Installing the Signal Module: S...
  • Page 4 Scan electronics Problems and Solutions Software and Driver problems .............77 No connection to microscope USB Port error Driver problems AFM measurement problems ..............80 Probe Status light blinks red Image quality suddenly deteriorates Nanosurf support .................81 Self help Assistance AFM Theory...
  • Page 5 Scanning Probe Microscopy ..............83 The Nanosurf easyScan 2 AFM............84 The user interface The main window.................87 Operating windows ................88 Measurement document windows ............89 Tool bars....................89 Arranging tool bars Control panels..................90 Arranging control panels Storing and retrieving the workspace Entering values in the control panels Storing and retrieving measurement parameters The User Interface Dialog..............94...
  • Page 6 ABLE OF CONTENTS The Imaging panel................123 Spectroscopy The Spectroscopy bar ...............129 The Spectroscopy panel..............130 Viewing measurement data Charts ....................134 Storing and retrieving the chart arrangement The Chart bar ...................135 The Chart properties dialog Changing the appearance of the 3D view The Color Palette dialog The Data Info panel ................140 Quick Evaluation Tools...
  • Page 8 This manual is divided in two parts, the first part gives instructions on how to set up and use your Nanosurf easyScan 2 AFM system. The second part is a reference for the Nanosurf easyScan 2 Control Software. It applies to software version 1.6.

  • Page 9: The Easyscan 2 Afm

    The Nanosurf easyScan 2 AFM is an atomic force microscope system that can make nanometer scale resolution measurements of topography and sev- eral other properties of a sample. The easyScan 2 AFM system is a modular scanning probe system that can be upgraded to obtain more measurement capabilities.

  • Page 10: Features

    2 AFM HE EASY • TS-150 active vibration isolation table: reduces the sensitivity of the instrument to vibrations in its environment. Features easyScan 2 Controller Electronics Controller size / weight 470x120x80 mm / 2.4 kg Power supply 90 - 240 V~/ 30 W 50/60 Hz Computer interface (Appr.
  • Page 11 Recommended PC hardware Pentium 4/M or AMD Athlon, 256MB RAM, True color > 1024x786 video card, HW Open GL accelerator Computer not included with system. Nanosurf easyScan 2 Signal Module: S Available output signals X-Axis, Y-Axis, Z-Axis, Approach, Tip Volt- age, STM Current or AFM Deflection,...

  • Page 12: Scan Heads

    2 AFM HE EASY Additional analog user out- 2x 16 bit D/A converters, ±10 V puts Synchronisation output 1x TTL: start, end, point sync Additional signal modulation X-Axis, Y-Axis, Z-Axis, Tip Voltage, Excita- inputs tion Free connectors 2x Aux, connection made on user request Modulation range ±10 V, Excitation: ±5 V Additional analog user inputs 2x 16 bit A/D converters, ±10 V...

  • Page 13: Measurement Modes

    EATURES Sample size Unlimited Automatic approach range 5 mm Max. approach speed 0.1 mm/s Alignment of cantilever Automatic adjustment Electrical connection to tip Available Scan head weight 350 g Sample observation optics Dual lens system (top/side view) Optical magnification Top x12 / side x10 View field Top 4x4 mm / side 5x3 mm Sample illumination...
  • Page 14 2 AFM HE EASY AFM Dynamic Module Additional imaging modes Dynamic Force (Intermittent Contact, etc.): Const. Amplitude (Topography), Const. Height (Amplitude) Additional spectroscopy modes Amplitude-Distance Dynamic frequency range 15kHz - 300kHz Dynamic frequency resolution < 0.1Hz The AFM Basic Module is required for using the AFM Dynamic Module. AFM Mode Extension Module Additional imaging modes Phase Contrast, Force Modulation, Spread-...

  • Page 15: Components Of The System

    Controller when it is turned on (section Connectors, Indicators and Controls (p.18)). Components: The easyScan 2 AFM system 1. easyScan 2 Controller with a built in AFM Basic Module, and option- ally with built in AFM Dynamic Module, AFM Mode Extension Mod-...
  • Page 16 2 AFM HE EASY 2. USB cable 3. Mains cable 4. easyScan 2 AFM Scan head(s) with AFM Video Camera (with AFM Video Module) 5. Scan head case 6. Scan head cable 7. Video Camera cable (with AFM Video Module) 8.

  • Page 17: Contents Of The Tool Set

    OMPONENTS OF THE YSTEM Contents of the Tool set The contents of the Tool set depends on the available modules. It may con- tain: Contents of the AFM Tool set 1. Ground cable 2. Protection feet 3. Cantilever tweezers: ACA 103 4.

  • Page 18: Connectors, Indicators And Controls

    HE EASY 12. USB dongle for the Nanosurf Report software (option) Connectors, Indicators and Controls Use this section to find the location of the parts of the easyScan 2 AFM that are referred to in this manual. The Scan head...
  • Page 19 ONNECTORS NDICATORS AND ONTROLS Module lights Scan Head lights Probe Status light Video Out connector Video In (optional) connector (optional) Signal Out connector Signal In Scan head (optional) connector cable connector (optional) Controller Power Serial number S/N: 23-05-001 switch USB outputs (to dongle) USB power light...
  • Page 20 2 AFM HE EASY head lights blink when no scan head can be detected, or when the Control- ler has not been initialised yet. The Module lights Indicate the modules that are built in into the Controller. The module lights blink when the Controller has not been initialised yet. During initial- isation, the Module lights are turned on one after the other.

  • Page 21: Installing The Easyscan 2 Afm

    ONNECTORS NDICATORS AND ONTROLS Installing the easyScan 2 AFM The following sections describe the installation of the easyScan 2 AFM. IMPORTANT To make high quality measurements, the following precautions must be taken to keep equipment clean: • Never touch the cantilever tips, the cantilevers (figure...

  • Page 22: Installing The Hardware

    2 AFM NSTALLING THE EASY Installing the Hardware WARNING LASER RADIATION (650nm) DO NOT STARE INTO THE BEAM OR VIEW DIRECTLY WITH OPTICAL INSTRUMENTS (MAGNIFIERS) CLASS 2M LASER PRODUCT As a consequence: • Always close the DropStop before inspecting or mounting a cantilever or the inspecting the alignment chip, especially when using optical instru- ments (magnifiers) for the inspection.

  • Page 23: Installing The Basic Afm Package

    If the vibration isolation of your table is insufficient for your measurement purposes, an optional active vibration isolation table is available. easyScan 2 AFM system: System with Sample stage, Micrometre Translation Stage, AFM Video Module and Signal module: A Installing the Basic AFM Package...

  • Page 24: Installing The Afm Video Module

    Controller (figure The easyScan 2 Controller). In case of an upgrade, the Controller must be sent in to your local Nanosurf distributor for mounting the Signal Module: S electronics in the Controller. Installing the Signal Module: A...

  • Page 25: Storing The Instrument

    - Turn off the instrument as described in section Finishing (p.58), and remove all cables. - Pack all components as shown in figure Packing. Packing: The easyScan 2 AFM system packed in the Instrument Case...

  • Page 26: Installing The Software

    Now continue the normal installation procedure. - Click the ‘Full Installation of Nanosurf easyScan 2’ button. The installation program will now start installing all components of the Nanosurf easyScan 2 AFM: The hardware drivers, the easyScan 2 software and DirectX 9.

  • Page 27: Step 1 - Installation Of Hardware Drivers

    - Follow the instructions given by the setup program. Step 1 - Installation of hardware drivers The Nanosurf hardware needs instrument drivers for the USB hub, the USB interface and the Video Frame grabber in the video module for the easyScan 2 AFM.
  • Page 28 2 AFM NSTALLING THE EASY If you have already installed the control software for a Nanosurf Scanning Probe Microscope on this computer, it is possible that nothing will happen, because the drivers are installed already. If this is the case, click OK in the Step 1 Dialog.
  • Page 29 NSTALLING THE OFTWARE USB Serial Port After the High Speed Serial Converter is installed, the operating system finds the ‘USB Serial Port’, it asks what to do: - Click the ‘Next’ button or the default choice in all other dialogs. Click the default choice in all other dialogs.The USB Serial Port is now installed.
  • Page 30 (20 seconds or more), please be patient. If you have already installed the control software for a Nanosurf Scanning Probe Microscope on this computer, it is possible that nothing will happen, because the drivers are installed already. If this is the case, click OK in the...
  • Page 31 NSTALLING THE OFTWARE Once the computer has detected the new devices, it will display the Dialog ‘Found New Hardware’. The following devices can be installed, depending on the configuration of your controller: • Standard-USB-hub • USB <-> serial interface • USB Serial Port •...
  • Page 32 2 AFM NSTALLING THE EASY USB Serial Port After the High Speed Serial Converter is installed, the operating system finds the ‘USB Serial Port’, it asks what to do: - Select 'No not this time' - Click ‘Next’ - Select ‘Install the software automatically (Recommended)’ - Click ‘Next’...

  • Page 33: Step 2 - Installation Of The Easyscan 2 Software

    - Start the Setup program again (by double-clicking the installation CD in windows Explorer) - Click the ‘Full Installation of Nanosurf easyScan 2’ button. The installation procedure should now continue with STEP 2. If the instal- lation procedure does not continue, perhaps you have not waited for the message ‘ready to use’, or something else went wrong during the installation...

  • Page 34: Step 3 - Installation Of Directx 9

    2 AFM NSTALLING THE EASY The setup program will ask for the directory in which the easyScan 2 soft- ware is to be installed. - Install the software in the proposed directory. IMPORTANT The easyScan 2 Installation CD contains calibration information (.hed files) specific to your instrument, therefore you should keep (a backup copy of ) the CD delivered with the instrument.
  • Page 35 NSTALLING THE OFTWARE - Insert the easyScan 2 Installation CD into the CD drive of the computer. - If the setup program has started automatically, click ‘Exit’. - Connect the USB cable to the easyScan 2 Controller. The red USB power light on the Controller should now light up, and the PC should now automatically detect the ‘USB Device’, and asks what to do to install the ‘USB Video Adapter’.

  • Page 36: Preparing For Measurement

    This chapter describes actions that you perform on a day-to-day basis as a preparation for your measurements, when the instrument has already been set up according to the instructions in chapter Installing the easyScan 2 AFM (p.21). These steps are changing the cantilever, selecting a sample stage, and preparing the sample.

  • Page 37: Installing The Cantilever

    NSTALLING THE CANTILEVER Installing the cantilever To maximise ease of use, the Nanosurf easyScan 2 AFM is designed so that the cantilever can be installed and removed without having to readjust the cantilever deflection detection system. This is possible because an align- ment system is used that consists of an alignment chip and matching grooves in the back side of the cantilever chip.

  • Page 38: Inserting The Cantilever In The Scan Head

    REPARING FOR EASUREMENT Sample illumination Cantilever Photodetector Laser Alignment chip Cantilever holder spring Hole for cantilever insertion tool Cantilever deflection detection system operating mode; the more flexible, long CONTR cantilever is generally used for the static operating mode. When you change to a different cantilever type: - Select the cantilever type using the ‘Mounted cantilever’...
  • Page 39 NSTALLING THE CANTILEVER The built-in top view and side view lenses for observing the tip-sample approach have optical filters that block back-reflected laser radiation. This makes viewing the cantilever with the top and side view lenses safe. Older Scan heads may contain lasers with 850 nm wavelength infrared light, and lower optical power.
  • Page 40 REPARING FOR EASUREMENT easyScan 2 controllerThe laser beam is now blocked by the DropStop. As a consequence, the Probe Status light on the easyScan 2 controller will now blink red. - Place the cantilever insertion tool (figure Contents of the AFM Tool set (p.17), 5) into the hole behind the alignment chip (figure Mounting the cantilever, top left).

  • Page 41: Installing The Sample

    Installing the sample Preparing the Sample The easyScan 2 AFM can be used to examine any material with a surface roughness that does not exceed the height range of the scanning tip. Nev- ertheless the choice and preparation of the surface can influence the surface- tip interaction.

  • Page 42: Nanosurf Samples

    Delicate samples can be cleaned in an ultrasound bath. Nanosurf Samples Nanosurf delivers various optional samples that are usually packed in the AFM Tool kit. These samples are described here. The description of the AFM Extended Sample kit is included in the Extended Sample kit.
  • Page 43 NSTALLING THE SAMPLE a silicon substrate. It has a period of 10 µm and a square height of approx- imately 100 nm. size: 5 mm x 5 mm material: silicon oxide on silicon structure: square array of square hills of silicon oxide hills on silicon Grid period: 10 µm, approx.

  • Page 44: Stand-Alone Measurements

    REPARING FOR EASUREMENT size: 5 mm x 5 mm material: silicon thickness: appr. 320 µm CD-ROM piece Sample for demonstrating the AFM imaging. The CD sample is a piece from a CD, without any coating applied to it. material: Polycarbonate structure: 100 nm deep pits, arranged in tracks spaces 1.6 µm apart.

  • Page 45: The Sample Stage

    (figure Contents of the AFM Tool set (p.17), 7). easyScan 2 AFM Scan head on the Sample Stage Mounting a sample onto the sample holder The simplest way to mount the sample onto the sample holder: ®...
  • Page 46 REPARING FOR EASUREMENT Sample mounted onto the sample holder It is recommended to always connect the sample holder to the ground con- nector on the scan head using the ground cable (figure Contents of the AFM Tool set (p.17), 1). CAUTION Avoid touching the cantilever when placing the sample holder under the Scan head.

  • Page 47: A First Measurement

    UNNING THE MICROSCOPE SIMULATION A First Measurement In this chapter, step by step instructions are given as to how to operate the microscope and make a simple measurement. More detailed explanations of the software and the system are given in further chapters of this manual. Running the microscope simulation You can start the easyScan 2 software without having the microscope con- nected to your computer in order to explore the easyScan 2 system (meas-...

  • Page 48: Preparing The Instrument

    - If you have the AFM Dynamic Module, install an NCLR type cantilever, otherwise install an CONTR type cantilever. - Install one of the samples from the Nanosurf AFM Basic sample kit or Calibration sample kit. Preferably install the 10 µm Calibration grid when using a 70µm or 110µm scan head and the 660 nm Calibration grid...
  • Page 49 REPARING THE INSTRUMENT ing it with the Tab key. • The value of an activated parameter can be increased and decreased using the up and down arrow keys on the keyboard. The new value is automat- ically used after one second. •...

  • Page 50: Approaching The Sample

    IRST EASUREMENT Approaching the sample To start measuring, the tip must come within a fraction of a nanometer of the sample without touching it with too much force. To achieve this, a very careful and sensitive approach of the cantilever is required. This delicate operation is carried out in three steps: Manual coarse approach, manual approach using the approach stage, and the automatic final approach.

  • Page 51: Manual Coarse Approach

    PPROACHING THE SAMPLE The side view should look like figure Side view of the cantilever after manual coarse approach. You can use the cantilever as a ruler to judge distances in the views of the integrated optics. Side view of the cantilever after manual coarse approach Manual Coarse approach In this step, the sample surface is brought within the range of the fine approach stage.

  • Page 52: Automatic Final Approach

    IRST EASUREMENT grated optics. The tip should not come closer to the sample than a few times the cantilever width. (figure View of the cantilever after manual approach, left). View of the cantilever after manual approach: left: side view, right: top view - Whilst observing the tip sample distance, click and hold until the tip is close enough to the sample.
  • Page 53 PPROACHING THE SAMPLE - If you are operating in Static Force mode, select a CONTR type canti- lever. In dynamic mode, the instrument will automatically determine the vibra- tion frequency used in the dynamic mode. To do this, it uses a measurement of the cantilever vibration amplitude as a function of excitation frequency.

  • Page 54: Starting A Measurement

    IRST EASUREMENT Now check that the set point and the feedback speed are set properly: - Click in the Navigator to open the Z-Controller panel. For Dynamic Force mode: - Set ‘Set point’ to 50-70%. For Static Force mode: - Set ‘Set point’ to 10-20nN. - Set ‘Loop gain’...

  • Page 55: Selecting A Measurement Area

    ELECTING A MEASUREMENT AREA Reminder Measurements on the micrometer/nanometer scale are very sensitive. Direct light, fast movements causing air flow and temperature variations near the Scan head can influence and disturb the measurement. When the measurement contains large disturbances, or no two scan lines are similar, stop measuring and reduce or eliminate the disturbances: - Click and follow the instructions of the chapter...
  • Page 56 IRST EASUREMENT displayed. Select an interesting region by drawing a square with the mouse pointer: - Click on one corner of the region using the left mouse button, and keep the button pressed. - Drag the mouse to the other corner of the region, and then release it. The size and the position of the square are shown in the Tool result panel.

  • Page 57: Storing The Measurement

    - Select the menu ‘File>Save as...’. Select the folder and name where you would like to store the measurement. The stored measurements can now be loaded with the easyScan 2 AFM software or the optional Nanosurf Report and Nanosurf Analysis software packages for later viewing, analysis and printing.

  • Page 58: Finishing

    IRST EASUREMENT - Click in the Navigator. The Report software will now start, open the currently selected measure- ment in the report software, and evaluate it with the default template. IMPORTANT After a fresh installation of the Report software, the Report software has to have run at least one time before you can automatically start it from the easyScan 2 software.
  • Page 59 INISHING IMPORTANT Always store the scan head with an (old) cantilever installed. This will pre- vent dust from gathering on the alignment chip, and protect the alignment chip against damage.

  • Page 60: Improving Measurement Quality

    MPROVING MEASUREMENT QUALITY Improving measurement quality Removing interfering signals Interfering signals can be recognised because they have a fixed frequency, usually a multiple of the local mains frequency (50 or 60 Hz) throughout the image. Thus, they are manifested by straight lines that run throughout the image.

  • Page 61: Judging Measurement Quality

    UDGING MEASUREMENT QUALITY Electrical interference Electrical interference may be caused by interference in the electronics, or by electrostatic forces acting between the tip and the sample. Try the fol- lowing in order to reduce the influence of electrical interference: - Connect the instrument to the mains power supply using sockets with line filters and surge protection.

  • Page 62: Adjusting The Measurement Plane

    MPROVING MEASUREMENT QUALITY • images in the color map charts consist of uncorrelated lines only. • images appear blurred. - First follow the suggestions in section Image quality suddenly deteriorates (p.81). If these do not help, the cantilever should be changed. If all peaks in the image have the same, usually triangular shape, the tip is no longer sharp and has to be replaced.
  • Page 63 DJUSTING THE MEASUREMENT PLANE Maladjusted slope: measurement with improperly set X*-slope 'Rotation' angle Measurement plane 'Y-Slope' angle Image area 'X-Slope' angle Scanner XY-plane Z, Z* Slope: Sample’s and measurement orientation before slope adjustment Ideally, the XY-plane of the scanner has already been correctly aligned with the sample plane using the three Levelling screws on the Scan head.
  • Page 64 MPROVING MEASUREMENT QUALITY To find the correct values, use the following procedure: - Open the User interface dialog via the menu ‘Options/Config user inter- face, and select one of these modes. The slope correction is only available with the Standard level and the Advanced level user interface mode. - Measure the slope in the Line graph using the angle tool (section Measure Angle...

  • Page 65: Measurement Modes

    TATIC ORCE Measurement modes This chapter instructs you on how to use the Dynamic Force, Static Force, Phase contrast, the Force Modulation, and Spreading Resistance modes. If you are unfamiliar with the Atomic Force Microscopy Technique, it is rec- ommended to first read the chapter AFM Theory (p.83).

  • Page 66: Dynamic Force

    EASUREMENT MODES Both the Force Modulation mode and the Spreading Resistance mode are an extension of the Static Force mode. The procedure for a first Static Force mode measurement is basically the procedure described for the Dynamic Force mode in chapter A First Meas- urement (p.47).

  • Page 67: Phase Contrast

    This section gives a brief description of how to operate the easyScan 2 AFM in phase contrast mode. For a more detailed description of the parameters that you can set, refer to section Operating mode panel (p.95).

  • Page 68: Phase Measurement

    EASUREMENT MODES - Ensure that you have selected the ‘Standard level’ or ‘Advanced level’ user interface mode in the User Interface dialog. - Click ‘Reference phase’: in the Operating mode panel. If you do not want to automatically set the reference phase: - In the Operating mode panel, deactivate Reference phase: ‘Auto set’.

  • Page 69: Force Modulation

    This section gives a brief description of how to operate the easyScan 2 AFM in force modula- tion mode. For a more detailed description of the parameters that you can...

  • Page 70: Spreading Resistance

    This section gives a brief description of how to operate the easyScan 2 AFM in Spreading Resistance mode. For a more detailed description of the...
  • Page 71 PREADING ESISTANCE For best results, the sample should be electrically isolated except for the connection mentioned above. - Select a cantilever: CDT-NCLR should be used for samples where a high force is needed to penetrate a surface oxide layer. CONT-PtIr cantilevers can be used on delicate samples. The applied volt- age should be small, because high currents may cause the conducting layer on the tip to evaporate.

  • Page 72: The Signal Modules

    IGNAL ODULES The Signal Modules The Signal Modules consist of both electronics modules that are built into the easyScan 2 controller and a break-out Connector that is externally attached to the controller. The Signal Modules can be used for monitoring the signals (Signal Module: S) and adding functionality to the easyScan 2 system (Signal Module: A).

  • Page 73: Signal Module: A

    IGNAL ODULE Signal name Function Amplitude The measured cantilever vibration amplitude. Phase The measured cantilever vibration phase. The phase is affected by the Reference Phase Mode Property setting of the Phase Contrast Mode. Monitor Signals The calibration of the monitor signals can be found by looking up the sig- nal calibration in the Scan Head Calibration Dialog, reached via the menu ‘Options>Config Scan Head...’.
  • Page 74 Excitation InputThe input voltage is either added to the normal Excitation voltage, or only the Excitation Input signal is passed on to the Cantilever Excitation piezo. The second option will be described in more detail in a future manual version (refer to the Nanosurf Web-site). Signal Module: A Signals...

  • Page 75: Using The User Inputs And Outputs

    IGNAL ODULE Signal name Function User 1 Input An analog input that can be used to record the signal from external instruments in Imaging and Spectroscopy meas- urements. User 2 Input An analog input that can be used to record the signal from external instruments in Imaging and Spectroscopy meas- urements.

  • Page 76: Maintenance

    AINTENANCE Maintenance To ensure fault free operation of the microscope the following instructions for maintenance have to be followed. Scan head It is very important to keep the sample holder and the open part of the scanner clean. If exposed to moisture (high humidity), corrosion will occur. - Clean the alignment chip by blowing away dust using dry, oil free air or a soft brush.

  • Page 77: Problems And Solutions

    The problems described here can occur during normal operation of the microscope. If the suggested course of action does not solve the problem, or the problem is not described here, refer to the section Nanosurf support (p.81). Software and Driver problems...

  • Page 78: Driver Problems

    2 controller. In order to solve driver problems: - Check for driver updates on the Nanosurf Support web site. - Insert the installation CD for your instrument.
  • Page 79 OFTWARE AND RIVER PROBLEMS Device manager: The drivers that may be installed on your system when your controller is connected to the computer.

  • Page 80: Afm Measurement Problems

    • USB Video Adapter: Video Module version 1 • USB Composite device, USB 2.0 A/V Converter, USB EMP Audio Device: Video Module version 2 • HID-compliant device, USB Human Interface Device: Nanosurf Analy- sis/SPIP • Aladdin HASP key, Aladdin USB key: Nanosurf Report...

  • Page 81: Image Quality Suddenly Deteriorates

    Approach panel. Nanosurf support Self help The fastest way to solve a problem is often to solve it yourself. If the previ- ously suggested actions did not help, or the problem is not described here, refer to the Nanosurf support pages:...

  • Page 82: Assistance

    (lap-/desktop), operating system, software version etc. • Original Nanosurf image data (.nid) files that show the problem, rather than bitmap screen shots, because these files contain all the settings that were used to make them.

  • Page 83: Afm Theory

    ICROSCOPY AFM Theory Scanning Probe Microscopy The easyScan 2 AFM is an atomic force microscope, which is part of the family of scanning probe microscopes. When the first scanning probe microscope, the scanning tunneling microscope (STM), it became possible to look into the fascinating world of atoms. The STM was developed by Gerd Binnig and Heinrich Rohrer in the early 80’s at the IBM research...

  • Page 84: The Nanosurf Easyscan 2 Afm

    The Nanosurf easyScan 2 AFM The easyScan 2 AFM is an AFM that can be used in both static and dynamic operating modes. The AFM cantilever is a micro fabricated canti- Control...
  • Page 85 2 AFM ANOSURF EASY Cantilever: 228 µm long micro-fabricated silicon cantilever with integrated tip In dynamic operating modes, the cantilever is excited using a piezo element. This piezo is oscillated with a fixed amplitude at an operating frequency close to the free resonance frequency of the cantilever. The repulsive force acting on the tip will increase the resonance frequency of the cantilever.
  • Page 86 AFM T HEORY Scanner coordinate system...

  • Page 87: The User Interface

    This chapter explains the general concepts of the user interface that controls the functions of the easyScan 2 software. These functions are: • Setting up the Nanosurf easyScan 2 AFM hardware, • moving toward the measurement position, • performing measurements, •...

  • Page 88: Operating Windows

    HE USER INTERFACE Navigator Main menu Tool bar Panel Operating window Status bar The main window • Several tool bars that are used to issue commands. • Several control panels that are used to set measurement parameters. • The Navigator that is used to quickly select between the most often used operating windows and panels.

  • Page 89: Measurement Document Windows

    EASUREMENT DOCUMENT WINDOWS • Imaging window: generating images of the sample (chapter Imaging (p.120)). • Spectroscopy window: measuring various ‘A as a function of B’ curves at certain sample locations, such as force-distance curves, or current-voltage curves (chapter Spectroscopy (p.128)). Measurement document windows The Measurement document windows visually represent previously made measurements.

  • Page 90: Control Panels

    HE USER INTERFACE To move a docked tool bar, use the mouse cursor to drag its handle on the left side of the tool bar. When the mouse cursor is over the handle, the cursor changes to a four pointed arrow. To un-dock a docked tool bar, double click its handle, or drag the handle outside the area reserved for tool bars on the sides of its associated window.

  • Page 91: Arranging Control Panels

    ONTROL PANELS Arranging control panels The control panels have several features that allow you to arrange them in a way that is most efficient for your application. A control panel associated with the main window is opened and brought on top of the other windows by clicking on its icon in the navigator.

  • Page 92: Entering Values In The Control Panels

    HE USER INTERFACE Entering values in the control panels To change a parameter in any panel, use on of the following methods: • Activate the parameter by clicking it with the mouse pointer, or by select- ing it with the Tab key. •...

  • Page 93: Storing And Retrieving Measurement Parameters

    ONTROL PANELS tion limits or timing limits. The desired value is automatically changed to the nearest possible value. Storing and retrieving measurement parameters All measurement parameters are stored in a configuration file with the extension ‘.par’. When the easyScan 2 software is started, default values are loaded from a file that is selected in the Controller Configuration Dialog (section The Controller Configuration dialog...

  • Page 94: The User Interface Dialog

    HE USER INTERFACE The User Interface Dialog The User Interface dialog is opened via the menu ‘Options>Config User Interface...’ Program Skin Select the look of the easyScan 2 software you are most comfortable with. All screen-shots in this manual were made with the Windows XP skin. User Interface Mode Determines the number of parameters displayed in the various panels: Easy level...

  • Page 95: Hardware Setup

    PERATING MODE PANEL Hardware setup Some changes to the hardware setup must be made during the operation of the microscope. Other changes are generally only made when the hardware is changed. The Operating mode panel and the Z-Controller panel are used to change the hardware setup during the operation of the instrument.

  • Page 96: Stm Mode

    ARDWARE SETUP The signals measured with each of the operating modes are listed in table Operating modes and measured signals. Note that the names of the signals can be changed in the ‘Scan Head Calibration’ dialog. Operating mode Signals measured Static force Topography, Cantilever deflection(, User Input 1, User Input 2)

  • Page 97: Static Force Mode

    PERATING MODE PANEL User Input/Output (Standard, Advanced) See the description under Static Force mode. Static Force mode In the static force mode, the Operating Mode and User Input sections are available. Operating mode (Easy, Standard, Advanced) Mounted cantilever (Easy, Standard, Advanced) The mounted cantilever type.

  • Page 98: The User Signal Editor

    ARDWARE SETUP User Output 1, 2 The output value of the user output. Config... Opens the User Signal Editor dialog. The User Signal Editor The User Signal Editor dialog is used for editing the calibration of the User input signal. It can be reached through the User Input/Output section of the Operating Mode Panel.

  • Page 99: Dynamic Force Mode

    PERATING MODE PANEL Dynamic Force mode In addition to the same Operating mode and the User Input section as in the static operating mode, two sections of parameters may be available, depending on the user interface mode. The dynamic force mode parameters can either be set manually or deter- mined using an automatic search procedure.
  • Page 100 ARDWARE SETUP tion strength is adjusted so that this vibration amplitude is reached. Vibration frequency (Standard, Advanced) The frequency at which the cantilever vibrates during the measurement. This frequency can automatically be set as described at the start of this sec- tion.

  • Page 101: Phase Contrast Mode

    PERATING MODE PANEL Step frequency (Advanced) The difference between two frequency points at which the cantilever vibra- tion amplitude is measured during the coarse search. If the increment is large, the search takes less time. When however the increment is too large, there is a risk that the resonance frequency may not be found.

  • Page 102: Force Modulation Mode

    ARDWARE SETUP be automatically set so that the phase signal is zero. When ‘Auto set’ is ena- bled the phase reference is automatically set after finishing the approach. Clicking starts the automatic setting immediately. Force Modulation mode In addition to the parameters in the Static Force operating mode, two addi- tional parameters are available.
  • Page 103 ONTROLLER ANEL P-Gain I-Gain Error Control Signal Error Range (Tip Current, Signal Deflection, Topography Amplitude, ...) 1..16x D-Gain Set point Z- Controller of 70% is used, the Z-Controller will move the tip closer to the sample until the vibration amplitude has decreased to 70% of the vibration amplitude far away from the sample.
  • Page 104 ARDWARE SETUP to the topography measurement. D-Gain (Advanced) The strength of the Z-Controller reaction that is proportional to the deriv- ative of the error signal. Increasing the D-Gain decreases fast changes in the error signal, but also amplifies high frequency noise. The D-Gain is only available in the ‘Standard PID’...

  • Page 105: Cantilever Types Configuration

    ANTILEVER TYPES CONFIGURATION tion, the bandwidth of the Topography measurement is adapted to the number of measured points per sec- ond. The adaptive PI controller reduces noise in the measurement. However, topography changes that happen faster than the time between two meas- ured points are also lost.

  • Page 106: The Cantilever Browser Dialog

    ARDWARE SETUP The cantilever browser dialog The cantilever browser dialog is opened via the menu ‘Options>Config Cantilever Types...’. The cantilever browser allows the editing and creation of cantilever types. Opens the cantilever editor dialog for a new cantilever type. You can create new cantilever types that are not defined in the default configuration.

  • Page 107: The Cantilever Editor Dialog

    CAN HEAD CONFIGURATION The cantilever editor dialog The following properties of a cantilever type are entered in this dialog: Name of cantilever The name of the cantilever type. This name appears in the cantilever browser and the Cantilever type drop-down in the Operating Mode Panel. Spring constant The (nominal) spring constant of this cantilever type.

  • Page 108: The Scan Head Calibration Editor

    ARDWARE SETUP Load... Loads a different scan head configuration file. Save as... Saves the current scan head configuration under another name. Edit... Edit the currently loaded scan head configuration using the scan head cali- bration dialog. Always save a backup of the Scan head configuration by clicking ‘Save As...’.
  • Page 109 CAN HEAD CONFIGURATION Scan Axis, Maximum scan ranges X/Y/Z-Axis Range The calibration values of each of the scanner axes. The calibration values are given as the maximum motion range of the scanner (when Overscan is set to 0%). Opens the scan axis correction dialog (see next section). Scan Axis, Axis Orthogonality The X- and Y-Axes of the scanner are generally not perfectly orthogonal, and their orientation with respect to the AFM housing may vary.

  • Page 110: The Scan Axis Correction Dialog

    This dialog can be used to multiply the scan axis calibration factor by a correction coefficient that has been determined by evaluating the measure- ment of a calibration gird, for example using SPIP/Nanosurf Analysis. Scan axis correction The Scan range is multiplied with this number when the ‘Set’-Button is clicked.
  • Page 111 The configuration of the easyScan 2 controller’s internal video capture device. The default configuration should normally not be changed. This feature is only available when the video camera is installed. Microscope Firmware Click the Update button to install firmware updates that you receive from Nanosurf support.

  • Page 112: The Edit Access Codes Dialog

    ARDWARE SETUP The Edit Access Codes Dialog The Edit Access Codes Dialog is used to enter the access code for software modules. At the moment, the only software module is the scripting inter- face. The dialog is accessed via the menu entry ‘Options>Config Access Codes...’...

  • Page 113: The About Dialog

    BOUT DIALOG In the simulation, many functions of the microscope are performed on a mathematically generated surface. Thus, the software functionality and working methods of the microscope can be practised. The About dialog The About dialog displays various information that may be useful for diag- nostics when you have problems with your instrument.
  • Page 114 • contact information for getting more support. When the microscope simulation is active, the about dialog displays the serial number ‘000-00-000’ is displayed. The Nanosurf Web site and con- tact address for information and software updates are also displayed here.

  • Page 115: Positioning

    PPROACH PANEL Positioning The Positioning window contains all the software tools for positioning the tip with respect to the sample: • The Approach panel • The Video panel (with the Video Module) • The Video display (with the Video Module) Click in the Navigator to open the Positioning window.
  • Page 116 OSITIONING Approach (Easy, Standard, Advanced) Status Displays the current status of the approach stage. Increases the tip-sample distance at maximum speed until the button is released. Decreases the tip-sample distance at maximum speed until the button is released. Increases the tip-sample distance with the settings given in the Approach Options.
  • Page 117 This can be due to play in the approach stage, which is caused by a change in the initial load of the approach stage bearings. Contact your local Nanosurf representative if this seems to be the case.

  • Page 118: The Video Panel

    OSITIONING - Click Approach The Tip-Position setting can not be used with STM scan heads, which is due to the different approach motor used in the STM. Stop button Stop the adjustment of the height Appr. speed (Standard, Advanced) The speed of the motor during the automatic approach and withdraw. When an STM scan head is used, the Approach speed changes the Step size of the approach motor, the step frequency is determined by the speed of the feedback loop.
  • Page 119 IDEO PANEL Video source The video source section determines which video signal is currently dis- played. Switches the video display to the top view. Switches the video to the side view. Saves the currently displayed image to a JPEG file that is selected using a Save file as...

  • Page 120: Imaging

    MAGING Imaging The imaging window Imaging measurements of the sample are controlled using the Imaging win- dow. The Imaging window can be opened by clicking in the navigator. The Imaging window contains the Imaging bar, with commands that con- trol the imaging processes, and the Imaging panel, with parameters that determine how the imaging is done.

  • Page 121: The Imaging Bar

    HE IMAGING BAR The imaging bar starts a measurement and then changes to . Clicking aborts the measurement as soon as the current scan line is finished. After clicking the measurement stops when the current measurement has finished. Starts a single measurement or changes the scanning direction of the meas- urement in progress.
  • Page 122 MAGING it can be resized by dragging one of its corners, and moved to the desired position by dragging its centre point. A double click with the left mouse button in the chart, or clicking the Zoom button in the Tool Results panel, modifies the parameters Scan range, X-, Y-Offset in the Imaging window accordingly.

  • Page 123: The Imaging Panel

    MAGING PANEL Offset’ and ‘Y-Offset’ to zero. Transfers the current measurement data to the spectroscopy window. If a measurement is in progress, it is interrupted. It is advisable to use complete the current measurement before starting the spectroscopy meas- urement. Captures the measurement currently displayed in the ‘Imaging window’...
  • Page 124 MAGING 'Rotation' angle Measurement plane 'Y-Slope' angle Image area 'X-Slope' angle Scanner XY-plane Z, Z* Coordinate systems Height (Advanced) The image size in Y* direction. When the Check-box is active, the image Height is always identical to the Image width. Points / Line (Easy, Standard, Advanced) The number of measured data points per line.
  • Page 125 MAGING PANEL Rotation (Easy, Standard, Advanced) The angle between the X-direction of the scanner and the X* direction of the measurement (figure Coordinate systems). Imaging Options (Standard, Advanced) The reference plane for the image can be aligned to the surface of the sam- ple using the slope parameters (figure Coordinate systems).
  • Page 126 MAGING increased relative to the Image width. Ref. Z-Plane (Advanced) The height of the reference plane. This height reference is used when the Z-Controller output is cleared, and when the Z-position is not modulated relative to the current surface position during spectroscopy measurements. Imaging Modes (Advanced) Scan mode The Y* direction in which the data is acquired and displayed:...
  • Page 127 Microscopy, refer to technical note TN00031 Magnetic Force Microscopy, which can be downloaded from the support section of the Nanosurf web site at www.nanosurf.com. Rel. Tip-Pos The distance by which the Tip is moved towards the sample from the posi- tion that corresponds to the set point.

  • Page 128: Spectroscopy

    User output channel (when the Signal Module: A is installed). Note that you must electrically connect the sample to the ground connector on the easyScan 2 AFM AFM scan head to apply a tip-sample voltage difference. The measured parameter can be any available input channel.

  • Page 129: The Spectroscopy Bar

    PECTROSCOPY BAR 3. A spectroscopic measurement is recorded. 4. The Z-Controller is turned on again. 5. The tip is moved to the next point on the line in the XY-plane. Steps 2.-5. are repeated for each points on the line. Spectroscopic measurement sequences are controlled using the Spectros- copy window.

  • Page 130: The Spectroscopy Panel

    PECTROSCOPY copy panel. When selecting a line, clicking the chart once creates a line from the clicked position to the centre of the image. Captures the measurement currently displayed in the Spectroscopy window in a measurement document, and displays it in a separate window. is clicked during the measurement, a copy is generated when the measurement in progress is finished.
  • Page 131 PECTROSCOPY PANEL Relative to current value (Standard, Advanced) When active, the Start and the End values are added to the value the mod- ulated output had before starting the modulation. When the Tip Potential is modulated, the current value is the Tip voltage set in the Z-Controller panel.
  • Page 132 PECTROSCOPY tions are discarded during averaging. Input range check (Standard, Advanced) In order to prevent tip damage due to too high tip-sample interaction, the settings below ‘Input range check’ define a safe range of tip-sample interea- cion. When the interaction signal (Deflection in static modes, Amplitude in dynamic modes, Current in STM mode) leaves this safe range, the meas- urement is aborted.
  • Page 133 PECTROSCOPY PANEL ment. Sets the XY-coordinates of the starting point of the line in a spectroscopy measurement sequence. X-Pos to Y-Pos to (Easy, Standard, Advanced) The XY-coordinates of the end-point of the line in a -spectroscopy measurement sequence. The from and to coordinates are more conveniently chosen using the tools in the Spectroscopy bar.

  • Page 134: Viewing Measurement Data

    IEWING MEASUREMENT DATA Viewing measurement data Measurement data are displayed in charts. Charts are used in Measurement document windows, the Imaging window and the Spectroscopy window. The measurement settings are displayed in the Data Info panel. Charts A Chart is a graphical representation of the measured data, and additional elements that give information about the chart itself (figure Elements of a Chart).

  • Page 135: Storing And Retrieving The Chart Arrangement

    HART BAR Storing and retrieving the chart arrangement The chart arrangement of the Imaging and Spectroscopy windows is stored in a configuration file with the extension ‘.chart’. When the easyScan 2 software is started, a default arrangement is loaded from a file that is selected in the Controller Configuration dialog (section The Controller Configuration dialog...
  • Page 136 IEWING MEASUREMENT DATA the scanner are displayed in red. The displayed line is selected by dragging the Line selection arrow in a Color map or Shaded map chart (figure Elements of a Chart (p.134)). Color map data is encoded in a color scale 3D view data is shown as a 3-dimensional representation in a parallel perspective, see...

  • Page 137: The Chart Properties Dialog

    HART BAR Mean fit the mean value of each line of data points is calculated and then subtracted. Line fit the best fit line for each line of data points is calculated and then subtracted. Derived data the difference between two successive data points (derivative) is calculated.

  • Page 138: Changing The Appearance Of The 3D View

    IEWING MEASUREMENT DATA Auto set When active, the chart scale is automatically set to optimally fit the meas- urement data, as it is being acquired. Clicking has the same effect as clicking the Optimise Chart range button. Chart size Size The size of the chart in pixels.

  • Page 139: The Color Palette Dialog

    HART BAR Light source height (0°-90°)‘Shift’+‘Ctrl’-key + mouse up/down The lowest height of 0° corresponds to ‘sunset’ lighting, the highest height corresponds to mid-day lighting at the equator. The Chart Properties “Span” and “Center” can be used to cut off high and or low features of the surface.

  • Page 140: The Data Info Panel

    IEWING MEASUREMENT DATA entering a number or by clicking a color in the color bar. Look Up Table A user definable palette (with max. 256 color entries) can be selected. This palette is stored in a ‘.lut’ file that contains an ASCII table with RGB color values. A dif- ferent look up table can be selected by clicking the ‘Browse...’...

  • Page 141: Quick Evaluation Tools

    The easyScan 2 software has several tools that allow quick evaluation of a measurement while it is being acquired. This helps find optimal measure- ment settings. For more elaborate evaluations, the optional Nanosurf Anal- ysis or the Nanosurf Report software package can be used (section Creating a report (p.153)).
  • Page 142 UICK VALUATION OOLS Measure Length Starts measuring the distance and signal difference between two points. The measurement results are displayed in the Tool Results panel. The two points are defined by drawing a double arrow. The first point is defined by the mouse cursor position where the left mouse button is clicked, the second point by the position where the button is released.
  • Page 143 OOLS BAR Measure Angle Starts measuring the angle between features in the measurement. The meas- urement result is displayed in the Tool Results panel. In Line graph-type displays, this tool can only be used when the signal displays height data. The angle is measured by drawing two meeting lines in the chart.
  • Page 144 UICK VALUATION OOLS line’s end point markers or the corner mark; it can be moved by dragging the line’s centre markers. Create Cross Section Displays and can create a new measurement document containing a line cross-section of a Color map or Line View display. The line is displayed in the Tool Results panel.
  • Page 145 OOLS BAR Cut Out Area Creates a new measurement document containing a subsection of an exist- ing measurement. The size and area of the area is displayed in the Tool Results panel. One corner of the area is defined by the mouse cursor position where the left mouse button is clicked, the opposite corner by the position where the button is released.
  • Page 146 UICK VALUATION OOLS Calculate Area Roughness Calculates certain roughness parameters of an area. The calculated values are displayed in the Tool Results panel. The parameters are calculated as follows: The Roughness Average, S The Mean Value, S The Root Mean Square, S Σ...
  • Page 147 OOLS BAR The area is selected in the same way as with the Cut out Area tool. The calculated parameters are stored in the measurement document when the ‘Store’ button in the Tool Results panel is clicked. The Area Roughness tool can be used to determine the mean height differ- ence between two plateaus with more accuracy than with the ‘Measure Dis- tance’...
  • Page 148 UICK VALUATION OOLS Correct Background: left: uncorrected image, the end points of the lines have been moved to points that should have the same height; right: corrected image is done with in the same way as the angle tool. The selected points are the end points of the two connected lines.
  • Page 149 OOLS BAR Correct scan line levels: left: uncorrected image with a line through points that should be at the same height; right: corrected image Glitch Filter: left: unfiltered image with some glitches where the tip lost contact with the sample; right: corrected image implemented as a Median filter on a 3x3 pixel matrix.
  • Page 150 UICK VALUATION OOLS Noise Filter: left: unfiltered image of AFM measurement on HOPG; right: filtered image implemented as a convolution with a 3x3 pixel Gaussian kernel function. To apply the filter, activate the color map chart that is to be filtered, then click the Noise Filter button in the Tools bar.

  • Page 151: Storing Measurements And Further Data Processing

    Open Opens a dialog for opening Nanosurf ‘.nid’ or ‘.ezd’ (easyScan 1) files. The same dialog is opened using the menu ‘File>Open...’. It is possible to select more than one file at the same time by using the ‘Shift’ and ‘Ctrl’ keys.
  • Page 152 TORING MEASUREMENTS AND FURTHER DATA PROCESSING Windows Bitmap (.bmp) A Windows Bitmap image is suitable for including in documents, e.g. word or image processing software. The exact image as seen on the computer screen will be saved in the file (‘screen shot’). Data file 16Bit (.dat) A binary data file can be processed in image processing software.

  • Page 153: Creating A Report

    Data Info panel. Creating a report The Nanosurf Report software package offers a powerful and extensive set of analysis functions. Complex analyses can be created interactively, and then displayed and printed in visually appealing reports. These reports can then be used as templates to apply the same analysis to another measure- ment.

  • Page 154: The Report Menu

    The Report generator configuration dialog is used to configure the behav- iour of the Navigator Icon and the Report menu. For an in depth introduc- tion to the Nanosurf Report software, refer to the Introduction section of the Nanosurf Report on-line help.

  • Page 155: The Report Generator Configuration Dialog

    REATING A REPORT The Report generator configuration dialog The Report generator configuration dialog is used to configure the behav- iour of the Navigator Icon and the Report menu. It is opened using the menu ‘Options>Config Report...’. Navigation bar Determines what happens when the icon is clicked.

  • Page 156: Automating Measurement Tasks

    UTOMATING MEASUREMENT TASKS Automating measurement tasks The Nanosurf easyScan 2 AFM Scripting Interface is an optional compo- nent for automating measurement tasks. It offers several possibilities to automate measurement tasks: • Create scripts inside the easyScan 2 software. • Create external software that controls the easyScan 2 software.

  • Page 157: The Script Editor

    CRIPT DITOR Other entries All scripts in the script directory are displayed below the Run From File menu entry. Selecting one of these entries starts the corresponding script. The example script ‘Show Remain Scantime’, which is installed in the default installation, should normally be listed here. The Script Editor The easyScan 2 software has an simple integrated Script Editor that allows editing, running, loading and saving scripts.

  • Page 158: The Script Configuration Dialog

    UTOMATING MEASUREMENT TASKS The Script Configuration Dialog The Script Configuration Dialog allows you to set the search path for the scripts that are displayed in the Script menu. The dialog is accessed via the menu entry ‘Options>Config script...’.
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  • Page 162: Quick Reference

    Quick Reference Control Panels Print preview... Approach Print Setup Save Data Info Save as... Imaging Operating Mode Workspace Spectroscopy Options Tool Results Check Scan Head Config Access Codes... Video Config Cantilever Types Z-Controller Config Color Palette Dialogs Config Controller About Config Report Cantilever Browser Config Scan Head...
  • Page 163 Window Operating windows Imaging Positioning Report Spectroscopy...

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