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4.10 SIM Card Interface Trouble
TEST POINT
TP1
CIRCUIT
NECTOR
N.A. resistor (R246)
R249
SIM_DATA
TP2
Copyright © 2008 LG Electronics. Inc. All right reserved.
Only for training and service purposes
Figure 4.10
2V85_VSIM
TP1
R243
15K
4
C5
5
C6
0
6
C7
10
GND4
9
GND3
C222
NA
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4. TROUBLE SHOOTING
2V85_VSIM
J200
1
C1
2
C2
3
C3
7
GND1
8
GND2
C221
C223
220n
NA
J200
TP2
SIM_RST
SIM_CLK
C224
1000p
LGE Internal Use Only
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