System Window; Z Noise; Z High Voltage Gain; Xyz Calibration - AFM Workshop TT-AFM User Manual

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3.2.3. System Window
The "System" window includes functions that are used for
optimizing the TT-AFM. ':
3.2.3.1. Z Noise
Resolution in an AFM depends critically upon the noise in
the Z direction. This function permits measuring the
system's Z noise under the same conditions used for
measuring images. However, the probe is not scanned
while making the Z noise measurements.
3.2.3.2. Z High Voltage Gain
The high-voltage amplifier that drives the Z ceramic in the
xyz scanner can have 14 gains. This function allows
reducing the Z gain of the high-voltage amplifier. Reducing
the gain reduces the dynamic range of the ceramic, but
reduces the noise floor of the instrument.
3.2.3.3.
Xyz
Calibration
When scanning a standard test pattern, the values in this
sub-window are changed. Appendix C explains how to
calibrate the TT-AFM.
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Note: Changing the calibration values will change
, the scale on images measured with the TT-AFM.
• Only change the values when calibrating with a
reference sample.
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