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Related Manuals for Nikon Eclipse L200A
Summary of Contents for Nikon Eclipse L200A
- Page 1 Automated IC Inspection Microscope L200A Automated IC Inspection Microscope...
- Page 2 The next generation in automated IC inspection microscopy Standardized, contamination-free inspections The Eclipse L200A has scored major To minimize the chance of advances in the standardization of contamination, the L200A's aperture inspection and safeguards against control and other major operations Option keys contamination.
- Page 3 Confocal Of course, the L200A can be configured with The L200A's programming feature eliminates this process. Local Nikon's NWL-860 series of wafer loaders and You just select the settings-such as observation method, RS232C (Binary) manual or motorized scanning stages to...
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Page 4: System Diagram
0.42 hand movement, allowing you to concentrate on the * A nosepiece adapter is needed to use these objectives. Nikon's renowned CFI60 optics are the fusion of CF design inspection process. System Diagram and infinity optics. These new optics feature longer working distances and high N.A.'s. -
Page 5: Dimensional Diagram
Parale Mitsui Bldg., 8, Higashida-cho, Kawasaki-ku, P.O. Box 222, 1170 AE Badhoevedorp, The Netherlands 1300 Walt Whitman Road, Melville, N.Y. 11747-3064, U.S.A. Kawasaki, Kanagawa 210-0005, Japan phone: +31-20-44-96-222 fax: +31-20-44-96-298 phone: +1-631-547-8500; +1-800-52-NIKON (within the U.S.A.only) fax: +1-631-547-0306 phone: +81-44-223-2175 fax: +81-44-223-2182 http://www.nikon-instruments.com/ http://www.nikonusa.com/ http://www.ave.nikon.co.jp/inst/ NIKON FRANCE S.A.