HP Compaq 8100 Elite Series Quickspecs page 21

QuickSpecs
Technical Specifications
SMART Technology (Self-Monitoring,
Analysis and Reporting Technology)
SMART I – Drive Failure Prediction
SMART II – Off-Line Data Collection
SMART III – Off-Line Read Scanning with
Defect Reallocation
SMART IV – End-to-End CRC for hard
drives
The system expands on the Self-Monitoring, Analysis, and Reporting Technology
(SMART), a continuously running systems diagnostic that alerts the user to certain types
of failures
Allows hard drives to monitor their own health and to raise flags if imminent failures
were predicted
Predicts failures before they occur. Tracks fault prediction and failure indication
parameters such as re-allocated sector count, spin retry count, calibration retry count
By avoiding actual hard drive failures, SMART hard drives act as "insurance" against
unplanned user downtime and potential data loss from hard drive failure
IOEDC: I/O Error Detection Circuitry
Detects errors in Read/Write buffers on HDD cache RAM
Interface in F10 setup provides confirmation of SMART IV support.
DA - 13524 North America — Version 26 — September 30, 2011
HP Compaq 8100 Elite Series HP Compaq 8100 Elite Series HP Compaq 8100 Elite Series HP Compaq 8100 Elite Series
Page 21