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Agilent Technologies EasyEXPERT Manual

Application library reference
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Table of Contents

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Agilent EasyEXPERT
Application Library Reference
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Summary of Contents for Agilent Technologies EasyEXPERT

  • Page 1 Agilent EasyEXPERT Application Library Reference Agilent Technologies...
  • Page 2 Notices © Agilent Technologies, Inc. 2006 - 2013 Manual Part Number contract, Software is delivered and licensed as “Commercial computer soft- No part of this manual may be reproduced B1500-90050 ware” as defined in DFAR 252.227-7014 in any form or by any means (including (June 1995), or as a “commercial item”...
  • Page 3 In This Document Agilent EasyEXPERT software contains the application library which supports the characteristic measurements of CMOS devices, TFT, BJT, diode, resistor, capacitor, varactor, memory, nanotechnology devices such as CNT FET, and so on. The application library includes more than one hundred test definitions. And they are classified into the following categories.
  • Page 4 Required Test Definition definition. Device Parameters Lists the parameters changeable in the Device Parameters area of the EasyEXPERT Application Test screen. Test Parameters Lists the parameters changeable in the Test Parameters area of the EasyEXPERT Application Test screen. Extended Test Parameters Lists the parameters changeable in the dialog box opened by clicking the Extended Setup button.
  • Page 5 Application Library NOTE The application library is a set of test definitions effective for the EasyEXPERT application test execution mode. The application test can be performed by selecting a test definition and setting the test condition for the actual DUT (device under test). And the setup can be saved as the dedicated test setup for the DUT.
  • Page 6 Supported Analyzer and Required Equipment Each test definition (Library) supports the following analyzer, and requires the following accessories, modules, and/or equipment. Category Test definition name Supported analyzer Required equipment and quantity BC Diode Fwd B1500A,4155B/C,4156B/C SMU 2 BC Diode Rev B1500A,4155B/C,4156B/C SMU 2 BVcbo B1500A,4155B/C,4156B/C SMU 2...
  • Page 7 Category Test definition name Supported analyzer Required equipment and quantity Ic-Vc Vb B1500A,4155B/C,4156B/C SMU 4 Ic-Vc Vb[3] B1500A,4155B/C,4156B/C SMU 3 B1500A,4155B/C,4156B/C SMU 4 Re+Rc B1500A,4155B/C,4156B/C SMU 4 B1500A,4155B/C,4156B/C SMU 4 Simple Gummel Plot B1500A,4155B/C,4156B/C SMU 3 Vbe-Le B1500A SMU 4, B2200A/B2201A 1 Vbe-We B1500A SMU 4, B2200A/B2201A 1...

  • Page 8: B1500A,4155B/C,4156B/C Smu

    Category Test definition name Supported analyzer Required equipment and quantity CMOS Vth Const Id B1500A,4155B/C,4156B/C SMU 4 Vth gmMax B1500A,4155B/C,4156B/C SMU 4 Vth gmMax and Id B1500A,4155B/C,4156B/C SMU 4 VthAndCgg-Vg ASU B1500A MFCMU 1, SMU 1, ASU+SMU 2 VthAndCgg-Vg SCUU B1500A MFCMU 1, SMU 3, SCUU 1, GSWU 1 Vth-Lg...
  • Page 9 Category Test definition name Supported analyzer Required equipment and quantity Memory NandFlash2 B1500A SMU 2, ASU+SMU 1, 81110A (2 outputs) 1 WordDisturb(WrittenCell) [SPGU 1, ASU+SMU 3] or  NandFlash3 Endurance B1500A [SPGU 1, SMU 3, 16440A/16445A 2] NandFlash3 IV-Erase-IV B1500A [SPGU 1, SMU 1, ASU+SMU 2] or [SPGU 1, SMU 3, 16440A/16445A 1] NandFlash3 IV-Write-IV...

  • Page 10: B1500A,4155B/C,4156B/C Smu

    Category Test definition name Supported analyzer Required equipment and quantity Memory NorFlash B1500A [SPGU 1, SMU 2, ASU+SMU 2] or DataDisturb(WrittenCell) [SPGU 1, SMU 4, 16440A/16445A 1] MixedSignal BJT Varactor CV Mismatch B1500A MFCMU 1 Diff-R Mismatch B1500A SMU 8 Diode IV Fwd Mismatch B1500A SMU 3...
  • Page 11 Category Test definition name Supported analyzer Required equipment and quantity PwrDevice Id-Vd[3] PwrDevice B1500A SMU 3 Id-Vg pulse[3] PwrDevice B1500A SMU 3 Id-Vg[3] PwrDevice B1500A SMU 3 Vth Const Id[3] PwrDevice B1500A SMU 3 Vth gmMax[3] PwrDevice B1500A SMU 3 Reliability BJT EB RevStress 3devices B1500A...
  • Page 12 Category Test definition name Supported analyzer Required equipment and quantity Reliability TDDB Istress 3devices B1500A SMU 4 TDDB Istress2 3devices B1500A SMU 4 TDDB Istress B1500A SMU 2 TDDB Istress2 B1500A SMU 2 TDDB Vstress 3devices B1500A SMU 4 TDDB Vstress2 3devices B1500A SMU 4 TDDB Vstress...
  • Page 13 Category Test definition name Supported analyzer Required equipment and quantity Structure Ig-Vg Vforce B1500A,4155B/C,4156B/C SMU 2 Interconnect CouplingCap B1500A MFCMU 1 Interconnect OverlapCap B1500A MFCMU 1 Junction BV B1500A,4155B/C,4156B/C SMU 2 Junction DcParam B1500A,4155B/C,4156B/C SMU 2 Junction IV Fwd B1500A,4155B/C,4156B/C SMU 2 Junction IV Rev B1500A,4155B/C,4156B/C SMU 2 QSCV[2]...
  • Page 14 Category Test definition name Supported analyzer Required equipment and quantity WGFMU Fast BTI(ACstress B1500A WGFMU 1, RSU 2 (needs test Id-Sampling) definitions of Fast BTI(DCstress B1500A WGFMU 1, RSU 2 WGFMU Id-Sampling) Utility) Fast BTI(ACstress Id-Vg) B1500A WGFMU 1, RSU 2 Fast BTI(DCstress Id-Vg) B1500A WGFMU 1, RSU 2...
  • Page 15 Category Test definition name Supported analyzer Required equipment and quantity IGBT Ic(off)-Vce B1505A SMU 2 Ic-Vce B1505A [HCSMU 1 and SMU 1] or SMU 2 Ic-Vge B1505A [HCSMU 1 and SMU 1] or SMU 2 Vce(sat) B1505A [HCSMU 1 and SMU 1] or SMU 2 Vth Vge(off) B1505A [HCSMU 1 and SMU 1] or SMU 2...
  • Page 16 NOTE Note 1 These test definitions belong to the categories PMIC, PowerMOSFET, and SiC. NOTE Note 2 This test definition belongs to the categories IGBT, MISCAP, PMIC, PowerMOSFET, and SiC.
  • Page 18 Collector resistance (including Emitter resistance, flyback method, 4-terminal) (A.01.20) 35. Re: Emitter resistance (flyback method, 4-terminal) (A.01.20) 36. Simple Gummel Plot: Evaluation of Gummel characteristics (Vce=const) (A.01.10) 37. Vbe-Le: hfe,Vbe-Le characteristics (A.01.20) 38. Vbe-We: hfe,Vbe-Le characteristics (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 19 IbPerArea=Ibase/Lb/Wb [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LOG) Y2 axis: Collector current Icollector (LINEAR) Y3 axis: Base current Ibase (LOG) Y4 axis: Base current Ibase (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 20 CollectorMinRng: Minimum range for the collector current measurement [Measurement Parameters] Collector current Icollector Base current Ibase [User Function] IcPerArea=Icollector/Lb/Wb IbPerArea=Ibase/Lb/Wb [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LOG) Y2 axis: Base current Ibase (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 21 X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LOG) Y2 axis: Base current Ibase (LOG) [Parameters Display Area] Base-Collector junction breakdown voltage BVcbo [Auto Analysis] Line1: Vertical line through Y1 data at Icollector=Ic@BVcbo Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 22 X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LOG) Y2 axis: Emitter current Iemitter (LOG) [Parameters Display Area] Emitter-Collector junction breakdown voltage BVcei [Auto Analysis] Line1: Vertical line through Y1 data at Icollector=Ic@BVcei Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 23 X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LOG) Y2 axis: Emitter current Iemitter (LOG) [Parameters Display Area] Emitter-Collector junction breakdown voltage BVceo [Auto Analysis] Line1: Vertical line through Y1 data at Icollector=Ic@BVceo Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 24 X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Emitter current Iemitter (LOG) Y2 axis: Base current Ibase (LOG) [Parameters Display Area] Emitter-Base junction breakdown voltage BVebo [Auto Analysis] Line1: Vertical line through Y1 data at Iemitter=Ie@BVebo Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 25 IsubsPerArea=Isubs/Lc/Wc [X-Y Plot] X axis: Substrate voltage Vsubs (LINEAR) Y1 axis: Substrate current Isubs (LINEAR) Y2 axis: Substrate current Isubs (LOG) Y3 axis: Collector current Icollector (LINEAR) Y4 axis: Collector current Icollector (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 26 [Measurement Parameters] Substrate current Isubs Collector current Icollector [User Function] IcPerArea=Icollector/Lc/Wc IsubsPerArea=Isubs/Lc/Wc [X-Y Plot] X axis: Substrate voltage Vsubs (LINEAR) Y1 axis: Substrate current Isubs (LOG) Y2 axis: Collector current Icollector (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 1-10...
  • Page 27 G_Max: Maximum transconductance value for graph Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Frequency Frequency=Freq Dissipation factor D=G/(2*PI*Freq*Cp) Agilent EasyEXPERT Application Library Reference, Edition 8 1-11...
  • Page 28 [Test Output: List Display] Frequency FreqList Base-Collector capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Collector voltage VcList Agilent EasyEXPERT Application Library Reference, Edition 8 1-12...
  • Page 29 VcbStop: DC bias stop voltage VcbStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Agilent EasyEXPERT Application Library Reference, Edition 8 1-13...
  • Page 30 Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta [Parameter Display Area] Zero bias capacitance Cj0 [Auto Analysis] Line1: Horizontal line through Y1 data at Vcb=0 Agilent EasyEXPERT Application Library Reference, Edition 8 1-14...
  • Page 31 VebStart: DC bias start voltage VebStop: DC bias stop voltage VebStep: DC bias step voltage [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) Veb=Vemitter CtePerArea=Cp/Le/We Agilent EasyEXPERT Application Library Reference, Edition 8 1-15...
  • Page 32 Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta [Parameter Display Area] Zero bias capacitance Cj0 [Auto Analysis] Line1: Horizontal line through Y1 data at Veb=0 Agilent EasyEXPERT Application Library Reference, Edition 8 1-16...
  • Page 33 VscStop: DC bias stop voltage VscStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Agilent EasyEXPERT Application Library Reference, Edition 8 1-17...
  • Page 34 Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta [Parameter Display Area] Zero bias capacitance Cj0 [Auto Analysis] Line1: Horizontal line through Y1 data at Vsub(=Vsc)=0 Agilent EasyEXPERT Application Library Reference, Edition 8 1-18...
  • Page 35 [X-Y Plot] X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Emitter current Iemitter (LINEAR) Y2 axis: Emitter current Iemitter (LOG) Y3 axis: Base current Ibase (LINEAR) Y4 axis: Base current Ibase (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 1-19...
  • Page 36 [Measurement Parameters] Emitter current Iemitter Base current Ibase [User Function] IePerArea=Iemitter/Le/We IbPerArea=Ibase/Le/We [X-Y Plot] X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Emitter current Iemitter (LOG) Y2 axis: Base current Ibase (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 1-20...
  • Page 37 [Extended Test Parameters] Ve: Emitter voltage HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We [X-Y Plot] X axis: Base voltage Vbase (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-21...
  • Page 38 [Extended Test Parameters] Ve: Emitter voltage HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We [X-Y Plot] X axis: Base voltage Vbase (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-22...
  • Page 39 X axis: Base voltage Vbase (LINEAR) Y1 axis: Base current Ibase (LOG) Y2 axis: Collector current Icollector (LOG) Y3 axis: Current amplification factor hfe (LINEAR) [Parameters Display Area] Current amplification factor maximum value hfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 1-23...
  • Page 40 X axis: Base voltage Vbase (LINEAR) Y1 axis: Base current Ibase (LOG) Y2 axis: Collector current Icollector (LOG) Y3 axis: Current amplification factor hfe (LINEAR) [Parameters Display Area] Current amplification factor maximum value hfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 1-24...
  • Page 41 Vb: Base voltage Vc: Collector voltage HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We [X-Y Plot] X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-25...
  • Page 42 Vb: Base voltage Vc: Collector voltage HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We [X-Y Plot] X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-26...
  • Page 43 X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Base current Ibase (LOG) Y2 axis: Collector current Icollector (LOG) Y3 axis: Current amplification factor hfe (LINEAR) [Parameters Display Area] Current amplification factor maximum value hfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 1-27...
  • Page 44 X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Base current Ibase (LOG) Y2 axis: Collector current Icollector (LOG) Y3 axis: Current amplification factor hfe (LINEAR) [Parameters Display Area] Current amplification factor maximum value hfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 1-28...
  • Page 45 X axis: Collector current Icollector (LOG) Y1 axis: Current amplification factor hfe (LINEAR) [Parameters Display Area] Current amplification factor maximum value hfeMax Collector current at hfeMax Ic@hfeMax [Auto Analysis] Line1: Vertical line through Y1 data at hfe=hfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 1-29...
  • Page 46 X axis: Collector current Icollector (LOG) Y1 axis: Current amplification factor hfe (LINEAR) [Parameters Display Area] Current amplification factor maximum value hfeMax Collector current at hfeMax Ic@hfeMax [Auto Analysis] Line1: Vertical line through Y1 data at hfe=hfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 1-30...
  • Page 47 SubsMinRng: Minimum range for the substrate current measurement [Measurement Parameters] Collector current Icollector Base voltage Vbase Substrate current Isubs [User Function] IbPerArea=Ibase/Le/We IcPerArea=Icollector/Le/We hfe=Icollector/Ibase VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-31...
  • Page 48 CollectorMinRng: Minimum range for the collector current measurement [Measurement Parameters] Collector current Icollector Base voltage Vbase [User Function] IbPerArea=Ibase/Le/We IcPerArea=Icollector/Le/We hfe=Icollector/Ibase VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-32...
  • Page 49 VbLimit: Base voltage compliance HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-33...
  • Page 50 VbLimit: Base voltage compliance HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-34...
  • Page 51 BaseValue: Pulse base value HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-35...
  • Page 52 BaseValue: Pulse base value HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Collector current Icollector [User Function] IcPerArea=Icollector/Le/We VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-36...
  • Page 53 SubsMinRng: Minimum range for the substrate current measurement [Measurement Parameters] Collector current Icollector Base current Ibase [User Function] IbPerArea=Ibase/Le/We IcPerArea=Icollector/Le/We hfe=Icollector/Ibase VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-37...
  • Page 54 BaseMinRng: Minimum range for the base current measurement [Measurement Parameters] Collector current Icollector Base current Ibase [User Function] IbPerArea=Ibase/Le/We IcPerArea=Icollector/Le/We hfe=Icollector/Ibase VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-38...
  • Page 55 [Measurement Parameters] Base voltage Vbase Collector voltage Vcollector [User Function] Rb=(Vbase-Vcollector)/Ibase Inv_Ibase=1/Ibase [X-Y Plot] X axis: Inversed Base current Inv_Ibase (LINEAR) Y1 axis: Base resistance Re (LINEAR) Y2 axis: Base current Ibase (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-39...
  • Page 56 Collector voltage Vcollector [User Function] IePerArea=Iemitter/Le/We IbPerArea=Ibase/Le/We IsPerArea=Isubs/Le/We Rc_Re=diff(Vcollector,Icollector) [X-Y Plot] X axis: Collector current Icollector (LINEAR) Y1 axis: Collector voltage Vcollector (LINEAR) Y2 axis: Combined resistance of Collector resistance and Emitter resistance Agilent EasyEXPERT Application Library Reference, Edition 8 1-40...
  • Page 57 Base current per emitter unit area IbPerArea=Ibase/Le/We Substrate current per emitter unit area IsPerArea=Isubs/Le/We Emitter resistance Re=diff(Vcollector,Ibase) [X-Y Plot] X axis: Base current Ibase (LINEAR) Y1 axis: Collector voltage Vcollector (LINEAR) Y2 axis: Emitter resistance Re (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 1-41...
  • Page 58 Currents flowing in base and collector terminals are measured while the synchronized voltages sweep. [Plot Display] Collector and base currents in log scale, as well as the current amplification factor (Beta) in linear scale, are plotted versus base voltage on the linear horizontal axis. Agilent EasyEXPERT Application Library Reference, Edition 8 1-42...
  • Page 59 [Device Under Test] Bipolar transistor, 4 terminals [Required Modules and Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with measurement cables and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 60 Y1 axis: Current amplification factor at Ic@hfe Ic@hfeList (LINEAR) Y2 axis: Emitter voltage at Ie@Vbe Ie@VbeList (LINEAR) [Test Output: List Display] Emitter length (Le size) LeList Current amplification factor Ic@hfeList Emitter voltage Ie@VbeList Agilent EasyEXPERT Application Library Reference, Edition 8 1-44...
  • Page 61 [Device Under Test] Bipolar transistor, 4 terminals [Required Modules and Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 62 Y1 axis: Current amplification factor at Ic@hfe Ic@hfeList (LINEAR) Y2 axis: Emitter voltage at Ie@Vbe Ie@VbeList (LINEAR) [Test Output: List Display] Emitter width (We size) WeList Current amplification factor Ic@hfeList Emitter voltage Ie@VbeList Agilent EasyEXPERT Application Library Reference, Edition 8 1-46...
  • Page 63 CMOS...
  • Page 64 29. Vth gmMax: Linear region Vth (A.01.20) 30. VthAndCgg-Vg ASU: Cgg-Vg, Id-Vg, using ASU (A.01.20) 31. VthAndCgg-Vg SCUU: Cgg-Vg, Id-Vg, using SCUU (A.01.20) 32. Vth-Lg: Vth-Lg characteristics (A.01.20) 33. Vth-Wg: Vth-Wg characteristics (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 65 For the source terminal, the SMU current compliance is set to Is@BVdss*1.1. [User Function] Source current per unit gate width IsourcePerWg=Isource/Wg Drain current per unit gate width IdrainPerWg=Idrain/Wg [Analysis Function] BVdss=@L1X (X intercept of Line1) [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 66 Y2 axis: Source current Isource (LOG) [List Display] Gate current Igate Substrate current Isubs [Parameters Display Area] Breakdown voltage between source and drain BVdss [Auto Analysis] Line1: Vertical line through Y2 data at Isource=Is@BVdss Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 67 Y1 axis: Source current Isource (LOG) Y2 axis: Gate current Igate (LOG) [List Display] Substrate current Isubs [Parameters Display Area] Breakdown voltage between gate and source BVgso [Auto Analysis] Line1: Vertical line through Y1 data at Isource=Is@BVgso Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 68 Source: SMU connected to Source terminal (constant voltage output) [Extended Test Parameters] Vs: Source voltage IsLimit: Source current compliance HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance cp Conductance g [User Function] PI=3.141592653589 d=g/(2*PI*FREQ*cp) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 69 Y2 axis: Conductance G (LINEAR) [Test Output: List Display] Oscillator level OSCLEVEL Parallel capacitance Cp Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Th Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 70 Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph Vs: Voltage for Source terminal IsLimit: Source current compliance [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 71 [Test Output: List Display] Frequency FreqList Gate-Substrate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Substrate voltage VsubsList Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 72 VgsStep: DC bias step voltage Source: SMU connected to Source terminal (constant voltage output) [Extended Test Parameters] IsLimit: Source current compliance HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G Agilent EasyEXPERT Application Library Reference, Edition 8 2-10...
  • Page 73 [Test Output: List Display] Gate voltage VgList Gate-Substrate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Agilent EasyEXPERT Application Library Reference, Edition 8 2-11...
  • Page 74 Source: SMU connected to Source terminal (constant voltage output) [Extended Test Parameters] Vs: Source voltage IsLimit: Source current compliance HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Agilent EasyEXPERT Application Library Reference, Edition 8 2-12...
  • Page 75 [Test Output: List Display] Gate voltage VgList Gate-Substrate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Agilent EasyEXPERT Application Library Reference, Edition 8 2-13...
  • Page 76 G_Min: Minimum transconductance value for graph G_Max: Maximum transconductance value for graph Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Agilent EasyEXPERT Application Library Reference, Edition 8 2-14...
  • Page 77 [Test Output: List Display] Frequency FreqList Gate-Channel capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Source voltage VsourceList Agilent EasyEXPERT Application Library Reference, Edition 8 2-15...
  • Page 78 VbsStop: Substrate stop voltage (secondary sweep) VbsStep: Substrate step voltage (secondary sweep) IsubsLimit: Substrate current compliance [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G Agilent EasyEXPERT Application Library Reference, Edition 8 2-16...
  • Page 79 [Test Output: List Display] Gate voltage VgList Channel-Substrate voltage VbsList Gate-Channel capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Agilent EasyEXPERT Application Library Reference, Edition 8 2-17...
  • Page 80 Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Frequency Frequency=Freq Dissipation factor D=G/(2*PI*Freq*Cp) Parallel resistance Rp=1/G Series capacitance Cs=(1+D^2)*Cp Agilent EasyEXPERT Application Library Reference, Edition 8 2-18...
  • Page 81 [Test Output: List Display] Frequency FreqList Gate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Substrate voltage VsubsList Agilent EasyEXPERT Application Library Reference, Edition 8 2-19...
  • Page 82 Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Frequency Frequency=Freq Dissipation factor D=G/(2*PI*Freq*Cp) Parallel resistance Rp=1/G Agilent EasyEXPERT Application Library Reference, Edition 8 2-20...
  • Page 83 [Test Output: List Display] Frequency FreqList Gate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Substrate voltage VsubsList Agilent EasyEXPERT Application Library Reference, Edition 8 2-21...
  • Page 84 VgsStop: DC bias stop voltage VgsStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Dissipation factor D [User Function] Vgs=-Vsubs [Display Setup: X-Y Graph] Agilent EasyEXPERT Application Library Reference, Edition 8 2-22...
  • Page 85 Y3 axis: Gate capacitance (parallel capacitance) Cp_FREQ2 (LINEAR) [Test Output: List Display] Gate voltage VGS Gate capacitance (parallel capacitance) Cgg Gate capacitance (parallel capacitance) Cp_FREQ1 Gate capacitance (parallel capacitance) Cp_FREQ2 Dissipation factor D_FREQ1 Dissipation factor D_FREQ2 Agilent EasyEXPERT Application Library Reference, Edition 8 2-23...
  • Page 86 VgsStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 Dval=Gval/(2*PI*FREQ*Cpval) Rpval=1/Gval Csval=(1+Dval^2)*Cpval Xval=-1/(2*PI*FREQ*Csval) Rsval=Dval*abs(Xval) Zval=sqrt(Rsval^2+Xval^2) Thetaval=atan(Xval/Rsval) Vgateval=-Vsubs Agilent EasyEXPERT Application Library Reference, Edition 8 2-24...
  • Page 87 Y2 axis: Conductance Gval (LINEAR) [List Display] Gate voltage Vgateval Gate capacitance (parallel capacitance) Cpval Conductance Gval Series capacitance Csval Series resistance Rsval Parallel resistance Rpval Dissipation factor Dval Reactance Xval Impedance Zval Phase Thetaval Agilent EasyEXPERT Application Library Reference, Edition 8 2-25...
  • Page 88 VA=Rds*abs(Idrain)-abs(Vdrain) [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain resistance Rds (LOG) Y3 axis: Early voltage VA (LINEAR) [List Display] Drain conductance gds Agilent EasyEXPERT Application Library Reference, Edition 8 2-26...
  • Page 89 [User Function] IdrainPerWg: Drain current per unit gate width IdrainPerWg=Idrain/Wg [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Drain current per unit gate width IdrainPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-27...
  • Page 90 [User Function] IdrainPerWg: Drain current per unit gate width IdrainPerWg=Idrain/Wg [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Drain current per unit gate width IdrainPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-28...
  • Page 91 [User Function] IdrainPerWg: Drain current per unit gate width IdrainPerWg=Idrain/Wg [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Drain current per unit gate width IdrainPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-29...
  • Page 92 [User Function] IdrainPerWg: Drain current per unit gate width IdrainPerWg=Idrain/Wg [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Drain current per unit gate width IdrainPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-30...
  • Page 93 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Transconductance gm (LINEAR) [List Display] Drain current per unit gate width IdrainPerWg Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-31...
  • Page 94 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Transconductance gm (LINEAR) [List Display] Drain current per unit gate width IdrainPerWg Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-32...
  • Page 95 IsubsPerWg: Substrate current per unit gate width IsubsPerWg=Isubs/Wg gm: Transconductance gm=diff(Idrain,Vgate) gmPerWg: Transconductance per unit gate width gmPerWg=diff(IdrainPerWg,Vgate) [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 2-33...
  • Page 96 Y3 axis: Substrate current Isubs (LINEAR) Y4 axis: Substrate current Isubs (LOG) [List Display] Drain current per unit gate width IdrainPerWg Substrate current per unit gate width IsubsPerWg Transconductance gm Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-34...
  • Page 97 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain current Idrain (LOG) [List Display] Drain current per unit gate width IdrainPerWg Transconductance gm Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 2-35...
  • Page 98 Slope=1/diff(lgt(Idrain),Vgate) SlopeMin=min(abs(Slope)) [Analysis Function] Ion=@L1Y1 (Y1 intercept of Line1) Ioff=@L2Y1 (Y1 intercept of Line2) [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LOG) Y2 axis: Slope (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 2-36...
  • Page 99 Ion: on current (drain current at Vg=VgStop) Ioff: off current (drain current at Vg=0) [Auto Analysis] Line1: Horizontal line through the Y1 data at Vgate=Vd(=VgStop) Line2: Horizontal line through the Y1 data at Vgate=0 Marker: Point of Slope=SlopeMin Agilent EasyEXPERT Application Library Reference, Edition 8 2-37...
  • Page 100 [Measurement Parameters] Substrate current Isubs [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Substrate current Isubs (LOG) [List Display] Gate voltage Vgate Substrate current Isubs Drain current Idrain Gate current Igate Agilent EasyEXPERT Application Library Reference, Edition 8 2-38...
  • Page 101 VCompSinkSMU: Voltage compliance of SMU for QSCV smart operation Cmin: Minimum capacitance value for graph Cmax: Maximum capacitance value for graph IgMin: Minimum leakage current value for graph IgMax: Maximum leakage current value for graph [Measurement parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 2-39...
  • Page 102 Leakage current IgLeak [X-Y Graph] X axis: Gate Voltage Vg (LINEAR) Y1 axis: Capacitance C (LINEAR) Y2 axis: Leakage current Ig (LINEAR) [List Display] Gate voltage Vg Capacitance C Leakage current Ig Agilent EasyEXPERT Application Library Reference, Edition 8 2-40...
  • Page 103 Integ_C: Integration time for the capacitance measurement Integ_L: Integration time for the leakage current measurement HoldTime: Hold time DelayTime: Delay time [Extended Test Parameters] StepDelay: Step delay time [Measurement parameters] Capacitance C [List Display] Capacitance C Agilent EasyEXPERT Application Library Reference, Edition 8 2-41...
  • Page 104 Gate voltage (Vgs) sweeps in accordance with the test parameter setting. Gate capacitances are measured with Cp-G model applied while the bias voltage sweeps. [Plot Display] Measured gate capacitances in linear scale are plotted versus substrate voltage on the linear horizontal axis. Agilent EasyEXPERT Application Library Reference, Edition 8 2-42...
  • Page 105 Measured drain currents and transconductance in linear scale are plotted versus gate voltage on the linear horizontal axis. Maximum transconductance value (Gmmax) and threshold voltage (Vth) are extracted from the measurement data, then displayed in the parameters display area. Agilent EasyEXPERT Application Library Reference, Edition 8 2-43...
  • Page 106 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain current Idrain (LOG) [List Display] Transconductance gm [Parameters Display Area] Threshold voltage Vth [Auto Analysis] Line1: Vertical line for Y1 at Idrain=Id@Vth Agilent EasyEXPERT Application Library Reference, Edition 8 2-44...
  • Page 107 [User Function] gm=diff(Idrain,Vgate) [Analysis Function] gmMax=max(gm) Von=@L1X (X intercept of Line1) Vth=Von-Vd/2 Vth is given by the following formula. Vth=Vg(gmMax)-Id(gmMax)/gmMax Vd/2 is necessary to compensate the secondary term of Vd in theory. Agilent EasyEXPERT Application Library Reference, Edition 8 2-45...
  • Page 108 Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Transconductance gm (LINEAR) Y3 axis: Drain current Idrain (LOG) [Parameters Display Area] Threshold voltage Vth Maximum gm value gmMax [Auto Analysis] Line1: Tangent line for Y1 at gm=gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 2-46...
  • Page 109 VgsBiasStop: Cgg-Vg measurement stop voltage VgsBiasStep: Cgg-Vg measurement step voltage OscLevel: Cgg-Vg measurement signal level FREQ: Cgg-Vg measurement frequency VgsStartDC: Id-Vg measurement start voltage VgsStopDC: Id-Vg measurement stop voltage VgsStepDC: Id-Vg measurement step voltage Agilent EasyEXPERT Application Library Reference, Edition 8 2-47...
  • Page 110 [Id-Vg: User Function] gm=delta(Idrain)/delta(Vgate) gmMax=max(gm) [Id-Vg: Analysis Function] Vth=@L1X (X intercept of Line1) [Id-Vg: X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Transconductance gm (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 2-48...
  • Page 111 2 CMOS [Id-Vg: List Display] Gate current Igate [Id-Vg: Parameters Display Area] Maximum gm value gmMax Threshold voltage Vth [Id-Vg: Auto Analysis] Line1: Tangent line for Y1 at gm=gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 2-49...
  • Page 112 VgsBiasStop: Cgg-Vg measurement stop voltage VgsBiasStep: Cgg-Vg measurement step voltage OscLevel: Cgg-Vg measurement signal level FREQ: Cgg-Vg measurement frequency VgsStartDC: Id-Vg measurement start voltage VgsStopDC: Id-Vg measurement stop voltage VgsStepDC: Id-Vg measurement step voltage Agilent EasyEXPERT Application Library Reference, Edition 8 2-50...
  • Page 113 [Id-Vg: Analysis Function] Vth=@L1X (X intercept of Line1) [Id-Vg: X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Transconductance gm (LINEAR) [Id-Vg: List Display] Agilent EasyEXPERT Application Library Reference, Edition 8 2-51...
  • Page 114 2 CMOS Gate current Igate [Id-Vg: Parameters Display Area] Maximum gm value gmMax Threshold voltage Vth [Id-Vg: Auto Analysis] Line1: Tangent line for Y1 at gm=gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 2-52...
  • Page 115 [Device Under Test] MOSFET, 4 terminals [Required Modules and Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 116 X axis: Gate length LgList (LINEAR) Y1 axis: Threshold voltage VthList (LINEAR) Y2 axis: Maximum transconductance value gmMaxList (LINEAR) [Test Output: List Display] Gate length LgList Threshold voltage VthList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 2-54...
  • Page 117 [Device Under Test] MOSFET, 4 terminals [Required Modules and Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 118 X axis: Gate width WgList (LINEAR) Y1 axis: Threshold voltage VthList (LINEAR) Y2 axis: Maximum transconductance value gmMaxList (LINEAR) [Test Output: List Display] Gate width WgList Threshold voltage VthList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 2-56...
  • Page 119 Discrete...
  • Page 120 Bipolar transistor Ic-Vc characteristics (A.01.20) Diode IV Fwd: Diode forward bias characteristics (A.01.20) Diode IV Rev: Diode reverse bias characteristics (A.01.20) FET Id-Vd: MOSFET Id-Vd characteristics (A.01.20) FET Id-Vg : MOSFET Id-Vg characteristics (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 121 [User Function] Emitter current per unit area of Emitter IePerArea Base current per unit area of Emitter IbPerArea Collector current per unit area of Emitter IcPerArea [Parameters Display Area] hfe maximum value hfemax Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 122 Base current Ibase [User Function] hfe=Icollector/Ibase VA=Icollector*diff(Vcollector,Icollector)-Vcollector [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) [User Function] Current amplifier factor hfe Early voltage VA [List Display] Base current Ibase Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 123 AnodeMinRng: Minimum range for the anode current measurement [Measurement Parameters] Anode current Ianode [X-Y Plot] X axis: Anode voltage Vanode (LINEAR) Y1 axis: Anode current Ianode (LINEAR) Y2 axis: Anode current Ianode (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 124 HoldTime: Hold time DelayTime: Delay time AnodeMinRng: Minimum range for the anode current measurement [Measurement Parameters] Anode current Ianode [X-Y Plot] X axis: Anode voltage Vanode (LINEAR) Y1 axis: Anode current Ianode (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 125 HoldTime: Hold time DelayTime: Delay time DrainMinRng: Minimum range for the drain current measurement [Measurement Parameters] Drain current Idrain [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 126 Drain current Idrain [User Function] gm: Transconductance gm=diff(Idrain,Vgate) [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain current Idrain (LOG) Y3 axis: Transconductance gm (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 127 GenericTest...
  • Page 128 4 GenericTest Generic C-f C-f characteristics of capacitor (2 terminals) (A.03.00) Generic C-t C-t characteristics of capacitor (2 terminals) (A.03.00) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 129 G_Max: Maximum transconductance value for graph Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement parameters] Susceptance B Conductance G DC bias monitor data DcMon AC level monitor data AcMon Frequency Freq [User Function] Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 130 Conductance G DC bias voltage Vbias Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta DC bias monitor data DcMon AC level monitor data AcMon Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 131 Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph InitialVoltage: Initial voltage before Vbase [Measurement parameters] Susceptance B Conductance G DC bias monitor data DcMon AC level monitor data AcMon [User Function] Circular constant PI=3.141592653589 Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 132 Parallel capacitance Cp Conductance G Frequency Freq Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta DC bias monitor data DcMon AC level monitor data AcMon Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 133 MCSMU_IV...
  • Page 134 5 MCSMU_IV 1. Id-Vds MCSMU: Id-Vds characteristics, SMU Pulse (A.05.50_2013.04.10.1) 2. Id-Vgs MCSMU: Id-Vgs characteristics, MCSMU Pulse (A.05.50_2013.04.10.1) 3. Id-Vgs MCSMU 2-stage: Id-Vgs characteristics, MCSMU Pulse (A.05.50_2013.04.10.1) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 135 MeasurementTime: Measurement time [Extended Test Parameters] HoldTime: Hold time PulseAvgCnt: Pulse averaging count GatePulseBase: Gate pulse base voltage IgLimit: Gate current compliance DrainPulseBase: Drain pulse base voltage IdZero: Y axis (Id) minimum value Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 136 For Scale=LOG10, LOG25, or LOG50: X axis: Drain voltage Vdrain (LOG) Y axis: Drain current Idrain (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 137 MeasurementTime: Measurement time [Extended Test Parameters] HoldTime: Hold time PulseAvgCnt: Pulse averaging count GatePulseBase: Gate pulse base voltage IgLimit: Gate current compliance DrainPulseBase: Drain pulse base voltage YAxisIdMin: Y axis (Log Idrain) minimum value Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 138 Y3 axis：Drain current Idrain (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Forward transconductance gfs [Parameter Display Area] Temperature Ta=Temp Maximum value of forward transconductance gfsMax Threshold voltage Vth Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 139 Subs: SMU connected to Subs terminal, constant voltage output Vsubs: Constant voltage for Subs terminal PulsePeriodMode: Pulse period mode (AUTO or MANUAL) ManualPulsePeriod: Manual pulse period MeasurementTime: Measurement time MeasurementTime2:Measurement time for lower current measurement Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 140 Y3 axis：Drain current Idrain (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Forward transconductance gfs [Parameter Display Area] Temperature Ta=Temp Maximum value of forward transconductance gfsMax Threshold voltage Vth Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 141 Memory...
  • Page 142 NOR flash memory cell word disturb test after Erase (A.03.10) NorFlash WordDisturb(WrittenCell): NOR flash memory cell word disturb test after Write (A.03.10) NorFlash DataDisturb(ErasedCell): NOR flash memory cell data disturb test after Erase (A.03.10) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 143 6 Memory NorFlash DataDisturb(WrittenCell): NOR flash memory cell data disturb test after Write (A.03.10) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 144 VcfStop: DC bias stop voltage VcfStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 145 Control Gate to Floating Gate capacitance (parallel capacitance) Cp Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Series capacitance per cell CsPerCell Parallel capacitance per cell CpPerCell Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 146 VfbStop: DC bias stop voltage VfbStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 147 Floating Gate-Substrate capacitance (parallel capacitance) Cp Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Series capacitance per cell CsPerCell Parallel capacitance per cell CpPerCell Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 148 VcsStop: DC bias stop voltage VcsStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 149 Gate capacitance (parallel capacitance) Cp Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Series capacitance per cell CsPerCell Parallel capacitance per cell CpPerCell Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 150 When some device is destroyed during write/erase, a desired voltage may not be applied to other devices. [Required Modules and Accessories] Agilent B2200A or B2201A switching matrix 1 unit Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit GPIB cable Connect 81110A, B2200A/B2201A and B1500A with measurement cables and GPIB cables.
  • Page 151 [X-Y Plot for Vth Acquisition after Erase Operation] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LOG) [List Display] [List Display for Vth Acquisition after Write Operation] Gate voltage Vgate Drain current Idrain Agilent EasyEXPERT Application Library Reference, Edition 8 6-11...
  • Page 152 Vth value after erase operation on device 1 Dev1_VthErasedList Vth value after erase operation on device 2 Dev2_VthErasedList Vth value after erase operation on device 3 Dev3_VthErasedList [Test Setup Details] Refer to "NandFlash2 IV-Write-IV" and "NandFlash2 IV-Erase-IV." Agilent EasyEXPERT Application Library Reference, Edition 8 6-12...
  • Page 153 Open the Floating Gate, and connect the other terminals to the ASU3 Output. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 3 sets (ASU1, ASU2, and ASU3) ASU1 connections: Output: Control Gate, SMU: HRSMU, AUX: PGU1...
  • Page 154 X axis: Number of write/erase operation (LOG) Y1 axis: Threshold voltage after write VthWrittenList (LINEAR) Y2 axis: Threshold voltage after erase VthErasedList (LINEAR) [Test Setup Details] See NandFlash2 IV-Write-IV and NandFlash2 IV-Erase-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-14...
  • Page 155 Open the Floating Gate. And connect the other terminals to the ASU2 Output. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 2 sets (ASU1 and ASU2) ASU1 connections: Output: Drain, SMU: HRSMU, AUX: PGU1...
  • Page 156 Y1 axis: Drain current before Erase operation IdInitialList (LOG) Y2 axis: Drain current after Erase operation IdErasedList (LOG) [Test Output: Parameters] Threshold voltage before Erase operation VthInitial Threshold voltage after Erase operation VthErased Agilent EasyEXPERT Application Library Reference, Edition 8 6-16...
  • Page 157 Connect the Control Gate to the ASU Output, and the Drain to a SMU. Open the Floating Gate. And connect the other terminals to a SMU. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 1 set ASU connections: Output: Control Gate, SMU: HRSMU, AUX: PGU1...
  • Page 158 Y1 axis: Drain current before Write operation IdInitialList (LOG) Y2 axis: Drain current after Write operation IdWrittenList (LOG) [Test Output: Parameters] Threshold voltage before Write operation VthInitial Threshold voltage after Write operation VthWritten Agilent EasyEXPERT Application Library Reference, Edition 8 6-18...
  • Page 159 Open the Floating Gate, and connect the other terminals to the PGU2 output terminal. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 2 sets (ASU1 and ASU2) ASU1 connections: Output: Source and Substrate, SMU: HRSMU, AUX: PGU1...
  • Page 160 PgAdd: GPIB address of pulse generator NoOfPulse: Number of output pulses for the erase operation [Test Output: X-Y Graph] X axis: Time TimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Setup Details] See NandFlash2 IV-Erase-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-20...
  • Page 161 Connect the Control Gate to the ASU Output, and the Drain to a SMU. Open the Floating Gate, and connect the other terminals to a SMU. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 1 set ASU connections: Output: Control Gate, SMU: HRSMU, AUX: PGU1...
  • Page 162 BaseValue: Write pulse base value NoOfPulse: Number of output pulses for the write operation [Test Output: X-Y Graph] X axis: Time TimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Setup Details] See NandFlash2 IV-Write-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-22...
  • Page 163 Open the Floating Gate, and connect the other terminals to the ASU1 Output. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 2 sets (ASU1 and ASU2) ASU1 connections: Output: Source and Substrate, SMU: HRSMU, AUX: PGU1...
  • Page 164 Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated erasing pulse width EraseTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 6-24...
  • Page 165 Connect the Control Gate to the ASU Output, and the Drain to a SMU. Open the Floating Gate, and connect the other terminals to a SMU. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 1 set ASU connections: Output: Control Gate, SMU: HRSMU, AUX: PGU1...
  • Page 166 Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated writing pulse width WriteTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 6-26...
  • Page 167 Open the Floating Gate, and connect the other terminals to the ASU3 Output. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 3 sets (ASU1, ASU2, and ASU3) ASU1 connections: Output: Control Gate, SMU: HRSMU, AUX: PGU1...
  • Page 168 [Analysis Function] Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated stress time StressTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 6-28...
  • Page 169 Connect the Control Gate to the ASU Output, and the Drain to a SMU. Open the Floating Gate, and connect the other terminals to a SMU. [Required Modules and Accessories] Agilent 81110A pulse generator (2-output, PGU1 and PGU2) 1 unit HRSMU/ASU 1 set ASU connections: Output: Control Gate, SMU: HRSMU, AUX: PGU1...
  • Page 170 [Analysis Function] Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated stress time StressTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 6-30...
  • Page 171 EraseTrailingTime: Erase pulse trailing edge transition time Verase: Erase pulse output level MeasTiming: Timing to perform Vth measurement [Extended Test Parameters] Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time Agilent EasyEXPERT Application Library Reference, Edition 8 6-31...
  • Page 172 Number of write/erase cycles CycleList Threshold voltage after write VthWrittenList Threshold voltage after erase VthErasedList [Test Setup Details] See NandFlash3 IV-Write-IV and NandFlash3 IV-Erase-IV. TotalWriteAndEraseCycles should be 10, 100, 1000, 10000, 100000, or 1000000. Agilent EasyEXPERT Application Library Reference, Edition 8 6-32...
  • Page 173 Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Erase pulse base value NoOfPulse: Number of output pulses for the erase operation DrainMinRng: Minimum range of drain current measurement Agilent EasyEXPERT Application Library Reference, Edition 8 6-33...
  • Page 174 [Test Output: List Display] Gate voltage VgateList Drain current before Erase operation IdInitialList Drain current after Erase operation IdErasedList [Test Output: Parameters] Threshold voltage before Erase operation VthInitial Threshold voltage after Erase operation VthErased Agilent EasyEXPERT Application Library Reference, Edition 8 6-34...
  • Page 175 Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Write pulse base value NoOfPulse: Number of output pulses for the write operation DrainMinRng: Minimum range of drain current measurement Agilent EasyEXPERT Application Library Reference, Edition 8 6-35...
  • Page 176 [Test Output: List Display] Gate voltage VgateList Drain current before Write operation IdInitialList Drain current after Write operation IdWrittenList [Test Output: Parameters] Threshold voltage before Write operation VthInitial Threshold voltage after Write operation VthWritten Agilent EasyEXPERT Application Library Reference, Edition 8 6-36...
  • Page 177 IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Erase pulse base value NoOfPulse: Number of output pulses for the erase operation DrainMinRng: Minimum range of drain current measurement [Measurement Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 6-37...
  • Page 178 Drain current Idrain [Test Output: X-Y Graph] X axis: Time TimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Time TimeList Threshold voltage VthList [Test Setup Details] See NandFlash3 IV-Erase-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-38...
  • Page 179 IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Write pulse base value NoOfPulse: Number of output pulses for the write operation DrainMinRng: Minimum range of drain current measurement [Measurement Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 6-39...
  • Page 180 Drain current Idrain [Test Output: X-Y Graph] X axis: Time TimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Time TimeList Threshold voltage VthList [Test Setup Details] See NandFlash3 IV-Write-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-40...
  • Page 181 LeadingTime: Pulse leading edge transition time TrailingTime: Pulse trailing edge transition time [Extended Test Parameters] Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Erase pulse base value Agilent EasyEXPERT Application Library Reference, Edition 8 6-41...
  • Page 182 Drain current Idrain [Test Output: X-Y Graph] X axis: Accumulated erasing pulse width EraseTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated erasing pulse width EraseTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-42...
  • Page 183 Vwrite: Write pulse output level LeadingTime: Pulse leading edge transition time TrailingTime: Pulse trailing edge transition time [Extended Test Parameters] Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time Agilent EasyEXPERT Application Library Reference, Edition 8 6-43...
  • Page 184 Drain current Idrain [Test Output: X-Y Graph] X axis: Accumulated writing pulse width WriteTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated writing pulse width WriteTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-44...
  • Page 185 Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Erase pulse base value NoOfPulse: Number of output pulses for the erase operation DrainMinRng: Minimum range of drain current measurement Agilent EasyEXPERT Application Library Reference, Edition 8 6-45...
  • Page 186 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated erasing pulse width EraseTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated erasing pulse width EraseTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-46...
  • Page 187 Vs: Source voltage IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time BaseValue: Write pulse base value NoOfPulse: Number of output pulses for the erase operation DrainMinRng: Minimum range of drain current measurement Agilent EasyEXPERT Application Library Reference, Edition 8 6-47...
  • Page 188 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated writing pulse width WriteTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) [Test Output: List Display] Accumulated writing pulse width WriteTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-48...
  • Page 189 WriteDrainTrailingTime: Drain write pulse trailing edge transition time ErasePeriod: Erase pulse period EraseGateDelay: Gate erase pulse delay EraseGateWidth: Gate erase pulse width EraseGateVerase: Gate erase pulse output level EraseGateLeadingTime: Gate erase pulse leading edge transition time Agilent EasyEXPERT Application Library Reference, Edition 8 6-49...
  • Page 190 Number of write/erase cycles CycleList Threshold voltage after write VthWrittenList Threshold voltage after erase VthErasedList [Test Setup Details] See NorFlash IV-Write-IV and NorFlash IV-Erase-IV. TotalWriteAndEraseCycles should be 10, 100, 1000, 10000, 100000, or 1000000. Agilent EasyEXPERT Application Library Reference, Edition 8 6-50...
  • Page 191 SourceVerase: Source erase pulse output level SourceLeadingTime: Source pulse leading edge transition time SourceTrailingTime: Source pulse trailing edge transition time [Extended Test Parameters] Vs: Source voltage Vsubs: Substrate voltage IgLimit: Gate current compliance Agilent EasyEXPERT Application Library Reference, Edition 8 6-51...
  • Page 192 [Test Output: List Display] Gate voltage VgateList Drain current before Erase operation IdInitialList Drain current after Erase operation IdErasedList [Test Output: Parameters] Threshold voltage before Erase operation VthInitial Threshold voltage after Erase operation VthErased Agilent EasyEXPERT Application Library Reference, Edition 8 6-52...
  • Page 193 DrainVwrite: Drain write pulse output level DrainLeadingTime: Drain pulse leading edge transition time DrainTrailingTime: Drain pulse trailing edge transition time [Extended Test Parameters] Vs: Source voltage Vsubs: Substrate voltage IgLimit: Gate current compliance Agilent EasyEXPERT Application Library Reference, Edition 8 6-53...
  • Page 194 [Test Output: List Display] Gate voltage VgateList Drain current before Write operation IdInitialList Drain current after Write operation IdWrittenList [Test Output: Parameters] Threshold voltage before Write operation VthInitial Threshold voltage after Write operation VthWritten Agilent EasyEXPERT Application Library Reference, Edition 8 6-54...
  • Page 195 SourceTrailingTime: Source pulse trailing edge transition time TotalRetentionTime: Time to continue the test. 10 to 10000 seconds. MeasTiming: Timing to perform Vth measurement [Extended Test Parameters] Vs: Source voltage Vsubs: Substrate voltage Agilent EasyEXPERT Application Library Reference, Edition 8 6-55...
  • Page 196 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Time TimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Time TimeList Threshold voltage VthList [Test Setup Details] See NorFlash IV-Erase-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-56...
  • Page 197 DrainTrailingTime: Drain pulse trailing edge transition time TotalRetentionTime: Time to continue the test. 10 to 10000 seconds. MeasTiming: Timing to perform Vth measurement [Extended Test Parameters] Vs: Source voltage Vsubs: Substrate voltage Agilent EasyEXPERT Application Library Reference, Edition 8 6-57...
  • Page 198 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Time TimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Time TimeList Threshold voltage VthList [Test Setup Details] See NorFlash IV-Write-IV. Agilent EasyEXPERT Application Library Reference, Edition 8 6-58...
  • Page 199 SourceWidth: List of source erase pulse width StopPulseWidth: Source erase pulse width to stop testing SourceVerase: Source erase pulse output level SourceLeadingTime: Source pulse leading edge transition time SourceTrailingTime: Source pulse trailing edge transition time Agilent EasyEXPERT Application Library Reference, Edition 8 6-59...
  • Page 200 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated erasing pulse width EraseTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated erasing pulse width EraseTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-60...
  • Page 201 DrainWidth: List of drain write pulse width StopPulseWidth: Drain write pulse width to stop testing DrainVwrite: Drain write pulse output level DrainLeadingTime: Drain pulse leading edge transition time DrainTrailingTime: Drain pulse trailing edge transition time Agilent EasyEXPERT Application Library Reference, Edition 8 6-61...
  • Page 202 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated writing pulse width WriteTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated writing pulse width WriteTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-62...
  • Page 203 SourceVerase: Source erase pulse output level SourceLeadingTime: Source pulse leading edge transition time SourceTrailingTime: Source pulse trailing edge transition time TotalStressTime: Total accumulated stress time CheckNoOfTimes: Number of Vth measurement operation [Extended Test Parameters] Vs: Source voltage Agilent EasyEXPERT Application Library Reference, Edition 8 6-63...
  • Page 204 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated erasing pulse width EraseTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated erasing pulse width EraseTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-64...
  • Page 205 DrainVwrite: Drain write pulse output level DrainLeadingTime: Drain pulse leading edge transition time DrainTrailingTime: Drain pulse trailing edge transition time TotalStressTime: Total accumulated stress time CheckNoOfTimes: Number of Vth measurement operation [Extended Test Parameters] Vs: Source voltage Agilent EasyEXPERT Application Library Reference, Edition 8 6-65...
  • Page 206 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated writing pulse width WriteTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) [Test Output: List Display] Accumulated writing pulse width WriteTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-66...
  • Page 207 SourceLeadingTime: Source pulse leading edge transition time SourceTrailingTime: Source pulse trailing edge transition time DrainDelay: Drain stress pulse delay DrainLeadingTime: Drain pulse leading edge transition time DrainTrailingTime: Drain pulse trailing edge transition time TotalStressTime: Total accumulated stress time Agilent EasyEXPERT Application Library Reference, Edition 8 6-67...
  • Page 208 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated erasing pulse width EraseTimeList (LOG) Y1 axis: Threshold voltage VthList (LINEAR) [Test Output: List Display] Accumulated erasing pulse width EraseTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-68...
  • Page 209 DrainVwrite: Drain write pulse output level DrainLeadingTime: Drain pulse leading edge transition time DrainTrailingTime: Drain pulse trailing edge transition time TotalStressTime: Total accumulated stress time CheckNoOfTimes: Number of Vth measurement operation [Extended Test Parameters] Vs: Source voltage Agilent EasyEXPERT Application Library Reference, Edition 8 6-69...
  • Page 210 Line1: Vertical line for Y1 at Idrain=Id@Vth [Test Output: X-Y Graph] X axis: Accumulated writing pulse width WriteTimeList (LOG) Y1 axis: Threshold voltage Vth (LINEAR) [Test Output: List Display] Accumulated writing pulse width WriteTimeList Threshold voltage VthList Agilent EasyEXPERT Application Library Reference, Edition 8 6-70...
  • Page 211 MixedSignal...
  • Page 212 Id-Vd characteristics mismatch, 3-terminal (A.01.20) MIM CV Mismatch: MIM capacitor C-V characteristics mismatch (A.01.11) MOS Varactor CV Mismatch: MOS Varactor capacitance CV characteristics mismatch (A.01.11) Poly-R Mismatch: Resistor R-I characteristics mismatch, Kelvin connection (A.01.11) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 213 VcbStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] To specify the device, A or B is added to the actual variable names. Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 214 [Test Output: X-Y Graph] X axis: Collector-Emitter voltage VceList (LINEAR) Y1 axis: Collector capacitance (parallel capacitance) CpAList (LINEAR) Y2 axis: Collector capacitance (parallel capacitance) CpBList (LINEAR) Y3 axis: Differences between Cp DeltaCp (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 215 IsubsLimit: Substrate current compliance HoldTime: Hold time DelayTime: Deley time [Measurement Parameters] Device A input current Iport1 Device B input current Iport2 Device A terminal voltage Vvm1, Vvm2 Device B terminal voltage Vvm3, Vvm4 Agilent EasyEXPERT Application Library Reference, Edition 8...

  • Page 216: Table Of Contents

    Y1 axis: Device A voltage between terminals DeltaV_A (LINEAR) Y2 axis: Device B voltage between terminals DeltaV_B (LINEAR) Y3 axis: Device A resistance R_A (LINEAR) Y4 axis: Device A resistance R_B (LINEAR) Y5 axis: Rate-of-change between R_A and R_B Delta_R (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 217 Anode current IanodeA, IanodeB [User Function] Delta_Ianode=(IanodeA-IanodeB)/IanodeA*100 [X-Y Plot] X axis: Anode voltage VanodeA (LINEAR) Y1 axis: Anode current IanodeA (LINEAR) Y2 axis: Anode current IanodeB (LINEAR) Y3 axis: Differences between anode current Delta_Ianode (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 218 Anode current IanodeA, IanodeB [User Function] Delta_Ianode=(IanodeA-IanodeB)/IanodeA*100 [X-Y Plot] X axis: Anode voltage VanodeA (LINEAR) Y1 axis: Anode current IanodeA (LINEAR) Y2 axis: Anode current IanodeB (LINEAR) Y3 axis: Differences between anode current Delta_Ianode (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 219 BaseMinRng: Minimum range for the base current measurement CollectorMinRng: Minimum range for the collector current measurement [Measurement Parameters] Collector current IcollectorA Collector current IcollectorB Base current IbaseA Base current IbaseB [User Function] hfe_A=IcollectorA/IbaseA hfe_B=IcollectorB/IbaseB Delta_hfe=(hfe_A-hfe_B)/hfe_A*100 Delta_Icollector=(IcollectorA-IcollectorB)/IcollectorA*100 Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 220 Y3 axis: Collector current IcollectorB (LOG) Y4 axis: Base current IbaseB (LOG) Y5 axis: Current amplification factor hfe_A (LINEAR) Y6 axis: Current amplification factor hfe_B (LINEAR) Y7 axis: Differences of hfe Delta_hfe (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-10...
  • Page 221 BaseMinRng: Minimum range for the base current measurement CollectorrMinRng: Minimum range for the collector current measurement [Measurement Parameters] Collector current IcollectorA Collector current IcollectorB Base current IbaseA Base current IbaseB [User Function] hfe_A=IcollectorA/IbaseA hfe_B=IcollectorB/IbaseB Delta_hfe=(hfe_A-hfe_B)/hfe_A*100 Delta_Icollector=(IcollectorA-IcollectorB)/IcollectorA*100 Vbe=VbaseA [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 7-11...
  • Page 222 Y3 axis: Collector current IcollectorB (LOG) Y4 axis: Base current IbaseB (LOG) Y5 axis: Current amplification factor hfe_A (LINEAR) Y6 axis: Current amplification factor hfe_B (LINEAR) Y7 axis: Differences of hfe Delta_hfe (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-12...
  • Page 223 BaseMinRng: Minimum range for the base current measurement CollectorMinRng: Minimum range for the collector current measurement [Measurement Parameters] Collector current IcollectorA Collector current IcollectorB Base current IbaseA Base current IbaseB [User Function] hfe_A=IcollectorA/IbaseA hfe_B=IcollectorB/IbaseB Delta_hfe=(hfe_A-hfe_B)/hfe_A*100 Delta_Icollector=(IcollectorA-IcollectorB)/IcollectorA*100 Agilent EasyEXPERT Application Library Reference, Edition 8 7-13...
  • Page 224 Y3 axis: Collector current IcollectorB (LOG) Y4 axis: Base current IbaseB (LOG) Y5 axis: Current amplification factor hfe_A (LINEAR) Y6 axis: Current amplification factor hfe_B (LINEAR) Y7 axis: Differences of hfe Delta_hfe (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-14...
  • Page 225 BaseMinRng: Minimumu range for the base current measurement CollectorMinRng: Minimumu range for the collector current measurement [Measurement Parameters] Collector current IcollectorA Collector current IcollectorB Base current IbaseA Base current IbaseB [User Function] hfe_A=IcollectorA/IbaseA hfe_B=IcollectorB/IbaseB Delta_hf=(hfe_A-hfe_B)/hfe_A*100 Delta_Icollector=(IcollectorA-IcollectorB)/IcollectorA*100 Vbe=-Vemitter [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 7-15...
  • Page 226 Y3 axis: Collector current IcollectorB (LOG) Y4 axis: Base current IbaseB (LOG) Y5 axis: Current amplification factor hfe_A (LINEAR) Y6 axis: Current amplification factor hfe_B (LINEAR) Y7 axis: Differences of hfe Delta_hfe (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-16...
  • Page 227 CollectorMinRng: Minimum range for the collector current measurement [Device A: Measurement Parameters] Collector current IcollectorA [Device A: User Function] hfe_A=IcollectorA/IbaseA [Device A: X-Y Plot] X axis: Collector voltage VcollectorA (LINEAR) Y1 axis: Collector current IcollectorA (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-17...
  • Page 228 Y1 axis: Collector current IcollectorB (LINEAR) [Test Output: X-Y Graph] X axis: Collector-Emitter voltage Vce (LINEAR) Y1 axis: Collector current Icollector_A (LINEAR) Y2 axis: Collector current Icollector_B (LINEAR) Y3 axis: Differences between Ic Delta_Ic (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-18...
  • Page 229 CollectorMinRng: Minimum range for the collector current measurement [Device A: Measurement Parameters] Collector current IcollectorA [Device A: User Function] hfe_A=IcollectorA/IbaseA [Device A: X-Y Plot] X axis: Collector voltage VcollectorA (LINEAR) Y1 axis: Collector current IcollectorA (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-19...
  • Page 230 Y1 axis: Collector current IcollectorB (LINEAR) [Test Output: X-Y Graph] X axis: Collector-Emitter voltage Vce (LINEAR) Y1 axis: Collector current Icollector_A (LINEAR) Y2 axis: Collector current Icollector_B (LINEAR) Y3 axis: Differences between Ic Delta_Ic (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-20...
  • Page 231 CollectorMinRng: Minimum range for the collector current measurement [Device A: Measurement Parameters] Collector current IcollectorA Base current IbaseA [Device A: User Function] hfe_A=IcollectorA/IbaseA [Device A: X-Y Plot] X axis: Collector voltage VcollectorA (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-21...
  • Page 232 Y1 axis: Collector current IcollectorB (LINEAR) [Test Output: X-Y Graph] X axis: Collector-Emitter voltage Vce (LINEAR) Y1 axis: Collector current Icollector_A (LINEAR) Y2 axis: Collector current Icollector_B (LINEAR) Y3 axis: Differences between Ic Delta_Ic (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-22...
  • Page 233 CollectorMinRng: Minimum range for the collector current meausrement [Device A: Measurement Parameters] Collector current IcollectorA Base current IbaseA [Device A: User Function] hfe_A=IcollectorA/IbaseA [Device A: X-Y Plot] X axis: Collector voltage VcollectorA (LINEAR) Y1 axis: Collector current IcollectorA (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-23...
  • Page 234 Y1 axis: Collector current IcollectorB (LINEAR) [Test Output: X-Y Graph] X axis: Collector-Emitter voltage Vce (LINEAR) Y1 axis: Collector current Icollector_A (LINEAR) Y2 axis: Collector current Icollector_B (LINEAR) Y3 axis: Differences between Ic Delta_Ic (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-24...
  • Page 235 [Measurement Parameters] Device A Drain current IdrainA Device B Drain current IdrainB Substrate current Isubs Source current Isource [User Function] Drain conductance gds_A=diff(IdrainA,VdrainA) Drain conductance gds_B=diff(IdrainB,VdrainB) Drain resistance Rds_A=1/gds_A Drain resistance Rds_B=1/gds_B Delta_Ids=(IdrainA-IdrainB)/IdrainA*100 Agilent EasyEXPERT Application Library Reference, Edition 8 7-25...
  • Page 236 Y3 axis: Difference of Drain current Delta_Ids (LINEAR) [List Display] Drain voltage VdrainA Gate voltage Vgate Device A Drain current IdrainA Device B Drain current IdrainB Differences of Drain current Delta_Ids Substrate current Isubs Source current Isource Agilent EasyEXPERT Application Library Reference, Edition 8 7-26...
  • Page 237 Device A Drain current IdrainA Device B Drain current IdrainB [User Function] Drain conductance gds_A=diff(IdrainA,VdrainA) Drain conductance gds_B=diff(IdrainB,VdrainB) Drain resistance Rds_A=1/gds_A Drain resistance Rds_B=1/gds_B Delta_Ids=(IdrainA-IdrainB)/IdrainA*100 Delta_gds=(gds_A-gds_B)/gds_A*100 Delta_Rds=(Rds_A-Rds_B)/Rds_A*100 [X-Y Graph] X axis: Drain voltage VdrainA (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-27...
  • Page 238 Y2 axis: Device B Drain current IdrainB (LINEAR) Y3 axis: Difference of Drain current Delta_Ids (LINEAR) [List Display] Drain voltage VdrainA Gate voltage Vgate Device A Drain current IdrainA Device B Drain current IdrainB Differences of Drain current Delta_Ids Agilent EasyEXPERT Application Library Reference, Edition 8 7-28...
  • Page 239 SubsMinRng: Minimum range for the Substrate current measurement [Measurement Parameters] Device A Drain current IdrainA Device B Drain current IdrainB Gate current Igate Substrate current Isubs [User Function] gm_A=diff(IdrainA,Vgate) gm_B=diff(IdrainB,Vgate) Delta_Id=(IdrainA-IdrainB)/IdrainA*100 Delta_gm=(gm_A-gm_B)/gm_A*100 Agilent EasyEXPERT Application Library Reference, Edition 8 7-29...
  • Page 240 Y3 axis: Difference of Drain current Delta_Id (LINEAR) [List Display] Gate voltage Vgate Drain voltage VdrainA Device A Drain current IdrainA Device B Drain current IdrainB Differences of Drain current Delta_Id Gate current Igate Substrate current Isubs Agilent EasyEXPERT Application Library Reference, Edition 8 7-30...
  • Page 241 [X-Y Graph] X axis: Drain voltage VdrainA (LINEAR) Y1 axis: Device A Drain current IdrainA (LINEAR) Y2 axis: Device B Drain current IdrainB (LINEAR) Y3 axis: Difference of Drain current Delta_Ids (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-31...
  • Page 242 7 MixedSignal [List Display] Drain voltage VdrainA Gate voltage Vgate Device A Drain current IdrainA Device B Drain current IdrainB Differences of Drain current Delta_Ids Agilent EasyEXPERT Application Library Reference, Edition 8 7-32...
  • Page 243 HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] To specify the device, A or B is added to the actual variable names. PI=3.141592653589 Dval=Gval/(2*PI*FREQ*Cpval) Rpval=1/Gval Csval=(1+Dval^2)*Cpval Agilent EasyEXPERT Application Library Reference, Edition 8 7-33...
  • Page 244 [Test Output: X-Y Graph] X axis: DC bias Vport1List (LINEAR) Y1 axis: MIM capacitance (parallel capacitance) CpAList (LINEAR) Y2 axis: MIM capacitance (parallel capacitance) CpBList (LINEAR) Y3 axis: Differences between Cp DeltaCp (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-34...
  • Page 245 [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] To specify the device, A or B is added to the actual variable names. Agilent EasyEXPERT Application Library Reference, Edition 8 7-35...
  • Page 246 [Test Output: X-Y Graph] X axis: Gate voltage VgList (LINEAR) Y1 axis: Gate capacitance (parallel capacitance) CpAList (LINEAR) Y2 axis: Gate capacitance (parallel capacitance) CpBList (LINEAR) Y3 axis: Differences between Cp DeltaCp (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-36...

  • Page 247: [User Function] Deltav_A = Vvm1-Vvm2

    Device A terminal voltage Vvm1, Vvm2 Device B terminal voltage Vvm3, Vvm4 [User Function] DeltaV_A = Vvm1-Vvm2 DeltaV_B = Vvm3-Vvm4 R_A = DeltaV_A / Iport1 R_B = DeltaV_B / Iport2 Rsheet_A = R_A / (W/L) Agilent EasyEXPERT Application Library Reference, Edition 8 7-37...
  • Page 248 Y2 axis: Device B resistance R_B (LINEAR) Y3 axis: Rate-of-change between R_A and R_B Delta_R (LINEAR) Y4 axis: Device A voltage between terminals DeltaV_A (LINEAR) Y5 axis: Device B voltage between terminals DeltaV_B (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 7-38...
  • Page 249 NanoTech...
  • Page 250 CNT Differential I-V characteristics (A.01.20) CNT R-I Kelvin 2SMU: CNT R-I characteristics, Kelvin connection (A.01.20) CNT R-V Kelvin 2SMU: CNT R-V characteristics, Kelvin connection (A.01.20) CNT Vth gmMax: CNT FET linear region Vth (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 251 Conductance G [User Function] Differential resistance R=1/G [X-Y Plot] X axis: Port1 input voltage Vport1 (LINEAR) Y1 axis: Differential resistance R (LINEAR) [List Display] Port1 input voltage Vport1 Differential resistance R Conductance G Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 252 [Test Output: X-Y Graph] X axis: Back Gate voltage Vbackgate (LINEAR) Y1 axis: Back Gate current Ibackgate (LOG) Y2 axis: Back Gate current with pulse base voltage applied Ibackgate@LowVbg (LOG) [Test Output: List Display] Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 253 I_backgate: Back Gate current I_backgate@LowVbg: Back Gate current with pulse base voltage applied [Test Output: Parameters] V_backgate: Back Gate voltage I_backgate: Back Gate current I_backgate@LowVbg: Back Gate current with pulse base voltage applied Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 254 DrainMinRng: Minimum range for the drain current measurement [Measurement Parameters] Drain current Idrain Time ACC_TIME ACC_TIME shows total time of T1Step or T2Step and measured time. ACC_TIME = ACC_TIME + T1Step or T2Step + Measured time of Id-Vd Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 255 8 NanoTech [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 256 HoldTime: Hold time DelayTime: Delay time DrainMinRng: Minimum range for the drain current measurement [Measurement Parameters] Drain current Idrain [X-Y Plot] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 257 DrainMinRng: Minimum range for the drain current measurement [Measurement Parameters] Drain current Idrain [X-Y Plot] X axis: Backgate voltage Vbackgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain current Idrain (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 258 ACC_TIME is displayed after adding the sum of T1Step (or T2Step) and the actual measurement time. ACC_TIME = ACC_TIME + T1Step (or T2Step) + Id-Vg measurement time [User Function] ACC_TIME: Elapsed time Agilent EasyEXPERT Application Library Reference, Edition 8 8-10...
  • Page 259 X axis: Back Gate voltage Vbackgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Vbackgate: Back Gate voltage Idrain: Drain current Vsidegate: Side Gate voltage ACC_TIME: Elapsed time [Test Setup Details] Refer to "CNT Id_Vg." Agilent EasyEXPERT Application Library Reference, Edition 8 8-11...
  • Page 260 Resistor terminal voltage DeltaV=Vport1-Vport2 Resistance R=DeltaV/Iport1 [X-Y Plot] X axis: Voltage DeltaV (LINEAR) Y1 axis: Measured current Iport1 (LINEAR) Y2 axis: Resistance R (LINEAR) [List Display] DeltaV: Voltage Iport1: Measured current R: Resistance value Agilent EasyEXPERT Application Library Reference, Edition 8 8-12...
  • Page 261 [X-Y Plot] X axis: Current Iport1 (LINEAR) Y1 axis: Resistance R (LINEAR) Y2 axis: Measured voltage DeltaV (LINEAR) [List Display] Iport1: Input current R: Resistance value DeltaV: Resistor terminal voltage Rsheet: Sheet resistance Agilent EasyEXPERT Application Library Reference, Edition 8 8-13...
  • Page 262 [X-Y Plot] X axis: Voltage DeltaV (LINEAR) Y1 axis: Measured current Iport1 (LINEAR) Y2 axis: Resistance R (LINEAR) [List Display] DeltaV: Input voltage Iport1: Measured current R: Resistance value Rsheet: Sheet resistance Agilent EasyEXPERT Application Library Reference, Edition 8 8-14...
  • Page 263 [Analysis Function] gmMax=max(gm) Von=@L1X (X intercept of Line1) Vth=Von-Vd/2 Vth is given by the following formula. Vth=Vg(gmMax)-Id(gmMax)/gmMax Vd/2 is for compensation of the secondary term of Vd in the theoretical formula. Agilent EasyEXPERT Application Library Reference, Edition 8 8-15...
  • Page 264 Y3 axis: Drain current Idrain (LOG) [List Display] Vbackgate: Back Gate voltage Vsource: Source voltage Vdrain: Drain voltage Vsidegate: Side Gate voltage Idrain: Drain current gm: Transconductance [Parameters Display Area] Threshold voltage Vth Maximum transconductance value gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 8-16...
  • Page 265 Organic...
  • Page 266 9 Organic 2-terminal dual IV sweep 2-terminal dual IV sweep (A.05.03.2013.0124_2013.01.28.1 Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 267 X axis: V1: Port1 output voltage(LINEAR) Y1 axis: I1: Port1 measurement current (LINEAR) [List Display] V1: Port1 output voltage I1: Port1 measurement current [Parameters Display Area] [Auto Analysis] [Note] This measurement merges two double I/V sweep classic tests. Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 268 9 Organic Vstart voltage holes between each tests by Bias Hold function. Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 269 PwrDevice...
  • Page 270 5. Id-Vg pulse[3] PwrDevice: Id-Vg characteristics (3-terminal), SMU Pulse (A.01.20) 6. Id-Vg[3] PwrDevice: Id-Vg Characteristics (3-terminal) (A.01.20) 7. Vth Const Id[3] PwrDevice: Constant current Vth (A.01.20) 8. Vth gmMax[3] PwrDevice: Linear region Vth (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8 10-2...
  • Page 271 Source current Isource For the Source terminal, the SMU current compliance is set to Is@BVdss*1.1. [User Function] IsourcePerWg=Isource/Wg: Source current per unit gate width IdrainPerWg=Idrain/Wg: Drain current per unit gate width [Analysis Function] Agilent EasyEXPERT Application Library Reference, Edition 8 10-3...
  • Page 272 Y2 axis: Source current Isource (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Source current Isource Gate current Igate Gate voltage Vgate Source voltage Vsource [Parameters Display Area] Source-Drain breakdown voltage BVdss Agilent EasyEXPERT Application Library Reference, Edition 8 10-4...
  • Page 273 For the terminals, the SMU current compliance is set to Is@BVgso*1.1. [User Function] IgatePerGateArea=Igate/Lg/Wg: Gate current per unit gate area [Analysis Function] BVgso=@L1X (X intercept of Line1) [Auto Analysis] Line1: Vertical line for Y1 at Isource=Is@BVgso [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 10-5...
  • Page 274 Y1 axis: Source current Isource (LOG) Y2 axis: Gate current Igate (LOG) [List Display] Gate voltage Vgate Source current Isource Gate current Igate Source voltage Vsource [Parameters Display Area] Gate-Source breakdown voltage BVgso Agilent EasyEXPERT Application Library Reference, Edition 8 10-6...
  • Page 275 X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR)[List Display] Drain voltage Vdrain Drain current Idrain Source voltage Vsource Gate voltage Vgate Drain current per unit gate width IdrainPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 10-7...
  • Page 276 X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Source voltage Vsource Drain current per unit gate width IdrainPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 10-8...
  • Page 277 IgLimit: Gate current compliance HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Drain current Idrain [User Function] IdrainPerWg=Idrain/Wg: Drain current per unit gate width gm=diff(Idrain,Vgate): gm: Transconductance gmPerWg=diff(IdrainPerWg,Vgate): Transconductance per unit gate width [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 10-9...
  • Page 278 Y2 axis: Drain current Idrain (LOG) [List Display] Gate voltage Vgate Source voltage Vsource Drain voltage Vdrain Drain current Idrain Transconductance gm Drain current per unit gate width IdrainPerWg Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 10-10...
  • Page 279 IdrainPerWg=Idrain/Wg: Drain current per unit gate width gm=diff(Idrain,Vgate): gm: Transconductance gmPerWg=diff(IdrainPerWg,Vgate): Transconductance per unit gate width [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain current Idrain (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 10-11...
  • Page 280 10 PwrDevice [List Display] Gate voltage Vgate Source voltage Vsource Drain voltage Vdrain Drain current Idrain Transconductance gm Drain current per unit gate width IdrainPerWg Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 10-12...
  • Page 281 DrainMinRng: Minimum range for drain current measurement [Measurement Parameters] Drain current Idrain [User Function] gm=diff(Idrain,Vgate) [Analysis Function] Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Vertical line for Y1 at Idrain=Id@Vth [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 10-13...
  • Page 282 Y1 axis: Drain current Idrain (LINEAR) Y2 axis: Drain current Idrain (LOG) [List Display] Gate voltage Vgate Drain current Idrain Source voltage Vsource Drain voltage Vdrain Transconductance gm [Parameters Display Area] Threshold voltage Vth Agilent EasyEXPERT Application Library Reference, Edition 8 10-14...
  • Page 283 Maximum gm value for graph scale DrainMinRng: Minimum range for drain current measurement [Measurement Parameters] Drain current Idrain [User Function] gm=diff(Idrain,Vgate) [Analysis Function] gmMax=max(gm) Von=@L1X (X intercept of Line1) Vth=Von-Vd/2 Vth is given by the following formula. Agilent EasyEXPERT Application Library Reference, Edition 8 10-15...
  • Page 284 Y3 axis: Drain current Idrain (LOG) [List Display] Gate voltage Vgate Source voltage Vsource Drain voltage Vdrain Drain current Idrain Transconductance gm [Parameters Display Area] Threshold voltage Vth Maximum transconductance value gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 10-16...
  • Page 285 Reliability...
  • Page 286 Timing On-the-fly NBTI Test (A.03.11) 40. Timing On-the-fly NBTI –Mch Negative Bias Temperature Instability Test (A.05.03) 41. TZDB: TZDB Test of oxide layer (A.01.20) 42. V-Ramp: Insulator lifetime evaluation, voltage stressed (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8 11-2...
  • Page 287 [Device Under Test] Bipolar transistor, 4 terminals, 3 devices [Required Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 288 Line2: Horizontal line for Y3 at Icollector=Ic@hfe [Test Output: X-Y Graph] X axis: Accumulated stress time TimeList (LOG) Y1 axis: Collector current for device 1 Dev1_IcList (LINEAR) Y2 axis: Collector current for device 2 Dev2_IcList (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-4...
  • Page 289 Dev3_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 3 Dev1_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 1 Dev2_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 2 Dev3_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-5...
  • Page 290 [Device Under Test] Bipolar transistor, 3 terminals, 3 devices [Required Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 291 Y4 axis: Y3 accumulation data at Icollector=Ic@hfe for device 1 Dev1_hfe@IcList (LINEAR) Y5 axis: Y3 accumulation data at Icollector=Ic@hfe for device 2 Dev2_hfe@IcList (LINEAR) Y6 axis: Y3 accumulation data at Icollector=Ic@hfe for device 3 Dev3_hfe@IcList (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-7...
  • Page 292 Dev3_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 3 Dev1_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 1 Dev2_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 2 Dev3_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-8...
  • Page 293 Vc: Collector voltage [Extended Test Parameters] [Extended Test Parameters for Sampling_Stress] IeStressLimit: Emitter current compliance VbStress: Stress voltage for Base terminal VcStress: Stress voltage for Collector terminal VsubsStress: Stress voltage for Substrate terminal Agilent EasyEXPERT Application Library Reference, Edition 8 11-9...
  • Page 294 Y3 axis: Y3 accumulation data at Icollector=Ic@hfe Ihfe@IcList (LINEAR) [Test Output: List Display] Accumulated stresss time TimeList Collector current IcList Y1 accumulation data at Icollector=Ic@hfe Ib@IcList Y3 accumulation data at Icollector=Ic@hfe hfe@IcList Agilent EasyEXPERT Application Library Reference, Edition 8 11-10...
  • Page 295 VbStart: Sweep start voltage for Base terminal VbStop: Sweep stop voltage for Base terminal VbStep: Sweep step voltage for Base terminal Vc: Collector voltage [Extended Test Parameters] StoringRuntimeData: Data save during stress output, Yes or No Agilent EasyEXPERT Application Library Reference, Edition 8 11-11...
  • Page 296 Y3 axis: Current amplification factor hfe (LINEAR) [List Display] [List Display for Sampling_Stress] Stress time StressTime Elapsed time Time Emitter voltage Vemitter Emitter current Iemitter Base current Ibase [List Display for IvSweep_hfe] Emitter voltage Vemitter Agilent EasyEXPERT Application Library Reference, Edition 8 11-12...
  • Page 297 Y3 axis: Y3 accumulation data at Icollector=Ic@hfe Ihfe@IcList (LINEAR) [Test Output: List Display] Accumulated stresss time TimeList Collector current IcList Y1 accumulation data at Icollector=Ic@hfe Ib@IcList Y3 accumulation data at Icollector=Ic@hfe hfe@IcList Agilent EasyEXPERT Application Library Reference, Edition 8 11-13...
  • Page 298 IeStressLimit: Emitter current compliance VbStress: Stress voltage for Base terminal VcStress: Stress voltage for Collector terminal [Extended Test Parameters for IvSweep_hfe] HoldTime: Hold time DelayTime: Delay time BaseMinRng: Minimum range for base current measurement Agilent EasyEXPERT Application Library Reference, Edition 8 11-14...
  • Page 299 Y3 axis: Y3 accumulation data at Icollector=Ic@hfe Ihfe@IcList (LINEAR) [Test Output: List Display] Accumulated stresss time TimeList Collector current IcList Y1 accumulation data at Icollector=Ic@hfe Ib@IcList Y3 accumulation data at Icollector=Ic@hfe hfe@IcList Agilent EasyEXPERT Application Library Reference, Edition 8 11-15...
  • Page 300 VbStop: Sweep stop voltage for Base terminal VbStep: Sweep step voltage for Base terminal Vc: Collector voltage [Extended Test Parameters] StoringRuntimeData: Data save during stress output, Yes or No [Extended Test Parameters for IvSweep_hfe] Ve: Emitter voltage Agilent EasyEXPERT Application Library Reference, Edition 8 11-16...
  • Page 301 Emitter voltage Vemitter Emitter current Iemitter Base current Ibase [List Display for IvSweep_hfe] Emitter voltage Vemitter Base voltage Vbase Collector voltage Vcollector Base current Ibase Collector current Icollector Current amplification factor hfe Agilent EasyEXPERT Application Library Reference, Edition 8 11-17...
  • Page 302 Y3 axis: Y3 accumulation data at Icollector=Ic@hfe Ihfe@IcList (LINEAR) [Test Output: List Display] Accumulated stresss time TimeList Collector current IcList Y1 accumulation data at Icollector=Ic@hfe Ib@IcList Y3 accumulation data at Icollector=Ic@hfe hfe@IcList Agilent EasyEXPERT Application Library Reference, Edition 8 11-18...
  • Page 303 [Device Under Test] MOSFET, 4 terminals, 3 devices [Required Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 304 Maximum gmMax value for graph scale DrainMinRng1: Minimum range for drain current measurement on device 1 DrainMinRng2: Minimum range for drain current measurement on device 1 DrainMinRng3: Minimum range for drain current measurement on device 1 Agilent EasyEXPERT Application Library Reference, Edition 8 11-20...
  • Page 305 Dev2_VthGmList: Vth for device 2, determined by extrapolation method Dev3_VthGmList: Vth for device 3, determined by extrapolation method Dev1_GmMaxList: Maximum transconductance value for device 1 Dev2_GmMaxList: Maximum transconductance value for device 2 Dev3_GmMaxList: Maximum transconductance value for device 3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-21...
  • Page 306 [Device Under Test] MOSFET, 3 terminals, 3 devices [Required Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.
  • Page 307 DrainMinRng2: Minimum range for drain current measurement on device 2 DrainMinRng3: Minimum range for drain current measurement on device 3 [Extended Test Parameters for Sampling_Ids] Vs: Source terminal voltage, constant voltage IgLimit: Gate current compliance IdLimit: Drain current compliance Agilent EasyEXPERT Application Library Reference, Edition 8 11-23...
  • Page 308 Dev2_VthGmList: Vth for device 2, determined by extrapolation method Dev3_VthGmList: Vth for device 3, determined by extrapolation method Dev1_GmMaxList: Maximum transconductance value for device 1 Dev2_GmMaxList: Maximum transconductance value for device 2 Dev3_GmMaxList: Maximum transconductance value for device 3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-24...
  • Page 309 [Test Parameters for Sampling_Ids] Vg3: Gate terminal voltage Vd3: Drain terminal voltage [Extended Test Parameters] [Extended Test Parameters for Sampling_Stress] Vd: Drain terminal voltage, constant voltage Vs: Source terminal voltage, constant voltage Agilent EasyEXPERT Application Library Reference, Edition 8 11-25...
  • Page 310 [Analysis Function] [Analysis Function for IvSweep_ConstId] Vth@Id=@L1X (X intercept of Line1) [Analysis Function for IvSweep_gmmax] Vth@Gm=@L1X (X intercept of Line1) [Auto Analysis] [Auto Analysis for IvSweep_ConstId] Line1: Vertical line for Y1 at Idrain=Id@Vth Agilent EasyEXPERT Application Library Reference, Edition 8 11-26...
  • Page 311 Y3 axis: Vth by extrapolation method VthGmList (LINEAR) Y4 axis: Drain current IdsList (LOG) [Test Output: List Display] Elapsed time TimeList Vth by constant current method VthIdList Vth by extrapolation method VthGmList Drain current IdsList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 11-27...
  • Page 312 VgStop2: Sweep stop voltage for Gate terminal VgStep2: Sweep step voltage for Gate terminal Vd2: Drain voltage GmStopRate: Vth_GmMax change rate to stop testing [Test Parameters for Sampling_Ids] Vg3: Gate terminal voltage Agilent EasyEXPERT Application Library Reference, Edition 8 11-28...
  • Page 313 Vsubs: Substrate terminal voltage, constant voltage DrainMinRng: Minimum range for drain current measurement [Measurement Parameters] [Measurement Parameters by Sampling_Stress] Gate current Igate [Measurement Parameters by IvSweep_ConstId] Drain current Idrain [Measurement Parameters by IvSweep_gmmax] Drain current Idrain Agilent EasyEXPERT Application Library Reference, Edition 8 11-29...
  • Page 314 Y1 axis: Drain current Idrain (LOG) [List Display] [List Display for Sampling_Stress] Stress time StressTime Elapsed time Time Gate voltage Vgate Drain voltage Vdrain Gate current Igate [List Display for IvSweep_ConstId] Gate voltage Vgate Agilent EasyEXPERT Application Library Reference, Edition 8 11-30...
  • Page 315 Y3 axis: Vth by extrapolation method VthGmList (LINEAR) Y4 axis: Drain current IdsList (LOG) [Test Output: List Display] Elapsed time TimeList Vth by constant current method VthIdList Vth by extrapolation method VthGmList Drain current IdsList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 11-31...
  • Page 316 Vg3: Gate terminal voltage Vd3: Drain terminal voltage [Extended Test Parameters] [Extended Test Parameters for Sampling_Stress] Vd: Drain terminal voltage, constant voltage Vs: Source terminal voltage, constant voltage IgLimit: Gate current compliance Agilent EasyEXPERT Application Library Reference, Edition 8 11-32...
  • Page 317 Line1: Tangent line for Y1 at gm=gmMax [Test Output: X-Y Graph] X axis: Elapsed time TimeList (LOG) Y1 axis: Maximum transconductance value gmMaxList (LINEAR) Y2 axis: Vth by constant current method VthIdList (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-33...
  • Page 318 Y3 axis: Vth by extrapolation method VthGmList (LINEAR) Y4 axis: Drain current IdsList (LOG) [Test Output: List Display] Elapsed time TimeList Vth by constant current method VthIdList Vth by extrapolation method VthGmList Drain current IdsList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 11-34...
  • Page 319 VgStop2: Sweep stop voltage for Gate terminal VgStep2: Sweep step voltage for Gate terminal Vd2: Drain voltage GmStopRate: Vth_GmMax change rate to stop testing [Test Parameters for Sampling_Ids] Vg3: Gate terminal voltage Agilent EasyEXPERT Application Library Reference, Edition 8 11-35...
  • Page 320 Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only) [User Function for IvSweep_gmmax] Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only) Transconductance gm=diff(Idrain,Vgate) Maximum transconductance value gmMax=max(gm) [Analysis Function] [Analysis Function for IvSweep_ConstId] Vth@Id=@L1X (X intercept of Line1) Agilent EasyEXPERT Application Library Reference, Edition 8 11-36...
  • Page 321 Drain current Idrain Transconductance gm [List Display for Sampling_Ids] Elapsed time Time Drain current Idrain [Test Output: X-Y Graph] X axis: Elapsed time TimeList (LOG) Y1 axis: Maximum transconductance value gmMaxList (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-37...
  • Page 322 Y3 axis: Vth by extrapolation method VthGmList (LINEAR) Y4 axis: Drain current IdsList (LOG) [Test Output: List Display] Elapsed time TimeList Vth by constant current method VthIdList Vth by extrapolation method VthGmList Drain current IdsList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 11-38...
  • Page 323 B1500A [Description] Measures the Substrate current vs Gate pulse base voltage characteristics, and extracts the interface state density (Nss). This test uses the Agilent 81110A pulse generator. [Test Setup used in this test definition] ForcePGC: Used to apply Gate pulse...
  • Page 324 IsLimit: Source current compliance [Extended Test Parameters] SubsMinRng: Minimum range for the substrate current measuremnent [Measurement Paramaters] Isubs Substrate current [X-Y Graph] X axis: Elapsed time Time (LINEAR) Y1 axis: Substrate current Isubs (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 11-40...
  • Page 325 Y1 axis: Substrate current IcpList (LOG) [Test Output: List Display] Gate pulse base voltage VbaseList Substrate current IcpList [Test Output: Parameters] Maximum substrate current IcpMax Interface state density Nss [Nss calculation] Nss=IcpMax/q*PulsePeriod/Lg/Wg Agilent EasyEXPERT Application Library Reference, Edition 8 11-41...
  • Page 326 DeltaR (%) Difference from initial resistance [X-Y Plot] X axis: Stress time TimeList (LOG) Y1 axis: Port1 terminal voltage Vport1List (LOG) Y2 axis: Resistance RList (LINEAR) Y3 axis: Difference from initial resistance DeltaRList (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-42...
  • Page 327 R Resistance of wiring device MaxTime Maximum elapsed time [X-Y Graph] X axis: Stress time Time (LOG) Y1 axis: Voltage between terminals of wiring device DeltaV (LINEAR) Y2 axis: Resistance of wiring device R (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-43...
  • Page 328 [Test Output: List Display] Accumulated stress time TimeList Voltage between terminals of wiring device DeltaVList Resistance of wiring device RList Difference from initial resistance DeltaRList [Test Output: Parameters] Time to failure FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-44...
  • Page 329 Y3 axis: Offset from initial resistance value DeltaRList [Test Output: List Display] Accumulated stresss time TimeList Port1 voltage Vport1List Wiring resistance value RList Offset from initial resistance value DeltaRList [Test Output: Parameters] FailureTime: Time to failure Agilent EasyEXPERT Application Library Reference, Edition 8 11-45...
  • Page 330 X axis: Stress time Time (LOG) Y1 axis: Port1 voltage Vport1 (LINEAR) Y2 axis: Resistance of wiring device R (LINEAR) [List Display] Stress time Time Port1 voltage Vport1 Resistance of wiring device R Agilent EasyEXPERT Application Library Reference, Edition 8 11-46...
  • Page 331 Y3 axis: Difference from initial resistance DeltaRList (LINEAR) [Test Output: List Display] Accumulated stress time TimeList Port1 voltage Vport1List Resistance of wiring device RList Difference from initial resistance DeltaRList [Test Output: Parameters] Time to failure FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-47...
  • Page 332 R_Max: Y axis maximum value for resistance [User Function] Potential difference between lines DeltaV=Vm1-Vm2 Wiring resistance value R=DeltaV/Iport1 [Test Output: X-Y Graph] X axis: Accumulated stresss time TimeList Y1 axis: Wiring resistance value RList Agilent EasyEXPERT Application Library Reference, Edition 8 11-48...
  • Page 333 Offset from initial resistance value DeltaRList Port2 current Iport2List Port3 current Iport3List Port4 current Iport4List [Test Output: Parameters] Time to failure given by rate of resistance change R_FailureTime Time to failure given by monitoring extrusion lines E_FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-49...
  • Page 334 Port4MinRng: Minimum range for Port4 current measurement R_Max: Y axis maximum value for resistance StoreOfRuntimeData: Data save during stress output, Yes or No [Measurement Parameters] Port1 voltage Vm1 Port2 voltage Vm2 Port2 current Iport2 Agilent EasyEXPERT Application Library Reference, Edition 8 11-50...
  • Page 335 Difference from initial resistance DeltaRList Port2 current Iport2List Port3 current Iport3List Port4 current Iport4List [Test Output: Parameters] Time to failure given by rate of resistance change R_FailureTime Time to failure given by monitoring extrusion lines E_FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-51...
  • Page 336 DeltaR (%) Difference from initial resistance [X-Y Plot] X axis: Stress time TimeList (LOG) Y1 axis: Port1 terminal current Iport1List (LOG) Y2 axis: Resistance RList (LINEAR) Y3 axis: Difference from initial resistance DeltaRList (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-52...
  • Page 337 [X-Y Graph] X axis: Stress time Time (LOG) Y1 axis: Port1 current Iport1 (LINEAR) Y2 axis: Voltage between terminals of wiring device DeltaV (LINEAR) Y3 axis: Resistance of wiring device R (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-53...
  • Page 338 Y3 axis: Difference from initial resistance DeltaRList (LINEAR) [Test Output: List Display] Accumulated stress time TimeList Port1 current Iport1List Resistance of wiring device RList Difference from initial resistance DeltaRList [Test Output: Parameters] Time to failure FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-54...
  • Page 339 Y3 axis: Offset from initial resistance value DeltaRList [Test Output: List Display] Accumulated stresss time TimeList Port1 current Iport1List Wiring resistance value RList Offset from initial resistance value DeltaRList [Test Output: Parameters] FailureTime: Time to failure Agilent EasyEXPERT Application Library Reference, Edition 8 11-55...
  • Page 340 X axis: Stress time Time (LOG) Y1 axis: Port1 current Iport1 (LOG) Y2 axis: Resistance of wiring device R (LINEAR) [List Display] Stress time Time Port1 current Iport1 Resistance of wiring device R Agilent EasyEXPERT Application Library Reference, Edition 8 11-56...
  • Page 341 Y3 axis: Difference from initial resistance DeltaRList (LINEAR) [Test Output: List Display] Accumulated stress time TimeList Port1 current Iport1List Resistance of wiring device RList Difference from initial resistance DeltaRList [Test Output: Parameters] Time to failure FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-57...
  • Page 342 [User Function] Potential difference between lines DeltaV=VM1-VM2 Wiring resistance value R=DeltaV/Iport1 [Test Output: X-Y Graph] X axis: Accumulated stress time TimeList Y1 axis: Wiring resistance value RList Y2 axis: Port1 current Iport1List Agilent EasyEXPERT Application Library Reference, Edition 8 11-58...
  • Page 343 Port1 current Iport1List Wiring resistance value RList Port3 current Iport3List Port4 current Iport4List Offset from initial resistance value DeltaRList [Test Output: Parameters] R_FailureTime: Time to failure (Resistance) E_FailureTime: Time to failure (Extrusion) Agilent EasyEXPERT Application Library Reference, Edition 8 11-59...
  • Page 344 Port1MinRng: Minimum range for Port1 current measurement Port3MinRng: Minimum range for Port3 current measurement Port4MinRng: Minimum range for Port4 current measurement R_Max: Y axis maximum value for resistance StoringRuntimeData: Data save during stress output, Yes or No Agilent EasyEXPERT Application Library Reference, Edition 8 11-60...
  • Page 345 Port3 current Iport3List Port4 current Iport4List Difference from initial resistance DeltaRList [Test Output: Parameters] Time to failure given by rate of resistance change R_FailureTime Time to failure given by monitoring extrusion lines E_FailureTime Agilent EasyEXPERT Application Library Reference, Edition 8 11-61...
  • Page 346 [Device Under Test] MOSFET, 4 terminals, 3 devices [Required Accessories] Agilent B2200A or B2201A switching matrix 1 unit GPIB cable Connect B2200A/B2201A to B1500A with a measuring cable and GPIB cable. Set information on B1500A SMU channel's connection to the B2200A/B2201A input port properly on the Switching Matrix tab screen of the Configuration window.

  • Page 347: [Extended Test Parameters For Ivsweep_Constid]

    DelayTime: Delay time Vsubs: Substrate terminal voltage Vs: Source terminal voltage IgLimit: Gate current compliance of devices IdLimit: Drain current compliance of devices IsubsLimit: Substrate current compliance gmMax_Min: Minimum gmMax value for graph scale Agilent EasyEXPERT Application Library Reference, Edition 8 11-63...
  • Page 348 Y5 axis: Maximum transconductance value for device 2 Dev2_gmMaxList (LINEAR) Y6 axis: Maximum transconductance value for device 3 Dev3_gmMaxList (LINEAR) [Test Output: List Display] TimeList: Elapsed time Dev1_IdsList: Drain current for device 1 Dev2_IdsList: Drain current for device 2 Agilent EasyEXPERT Application Library Reference, Edition 8 11-64...
  • Page 349 Dev2_VthGmList: Vth for device 2, determined by extrapolation method Dev3_VthGmList: Vth for device 3, determined by extrapolation method Dev1_gmMaxList: Maximum transconductance value for device 1 Dev2_gmMaxList: Maximum transconductance value for device 2 Dev3_gmMaxList: Maximum transconductance value for device 3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-65...
  • Page 350 VgStop2: Sweep stop voltage for Gate terminal VgStep2: Sweep step voltage for Gate terminal Vd2: Drain voltage [Test Parameters for Sampling_Ids] Vg3: Gate terminal voltage Vd3: Drain terminal voltage [Extended Test Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 11-66...

  • Page 351: Iglimit: Gate Current Compliance

    [Analysis Function for IvSweep_gmmax] Vth@Gm=@L1X (X intercept of Line1) [Auto Analysis] [Auto Analysis for IvSweep_ConstId] Line1: Vertical line for Y1 at Idrain=Id@Vth [Auto Analysis for IvSweep_gmmax] Line1: Tangent line for Y1 at gm=gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 11-67...

  • Page 352: [Test Output: X-Y Graph]

    Y3 axis: Vth by extrapolation method VthGmList (LINEAR) Y4 axis: Drain current IdsList (LOG) [Test Output: List Display] Elapsed time TimeList Vth by constant current method VthIdList Vth by extrapolation method VthGmList Drain current IdsList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 11-68...
  • Page 353 [Test Parameters for IvSweep_gmmax] VgStart2: Sweep start voltage for Gate terminal VgStop2: Sweep stop voltage for Gate terminal VgStep2: Sweep step voltage for Gate terminal Vd2: Drain voltage GmStopRate: Vth_GmMax change rate to stop testing Agilent EasyEXPERT Application Library Reference, Edition 8 11-69...
  • Page 354 Drain current Idrain [Measurement Parameters by IvSweep_gmmax] Drain current Idrain [Measurement Parameters by IvSweep_Ids] Drain current Idrain [User Function] [User Function for IvSweep_ConstId] Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only) Agilent EasyEXPERT Application Library Reference, Edition 8 11-70...
  • Page 355 Gate voltage Vgate Drain voltage Vdrain Drain current Idrain [List Display for IvSweep_ConstId] Gate voltage Vgate Drain voltage Vdrain Drain current Idrain [List Display for IvSweep_gmmax] Gate voltage Vgate Drain voltage Vdrain Agilent EasyEXPERT Application Library Reference, Edition 8 11-71...
  • Page 356 Y3 axis: Vth by extrapolation method VthGmList (LINEAR) Y4 axis: Drain current IdsList (LOG) [Test Output: List Display] Elapsed time TimeList Vth by constant current method VthIdList Vth by extrapolation method VthGmList Drain current IdsList Maximum transconductance value gmMaxList Agilent EasyEXPERT Application Library Reference, Edition 8 11-72...
  • Page 357 Y2 axis: Gate voltage VgateList (LINEAR) [Test Output: List Display] Time stamp TimeList Gate current IgateList Gate voltage VgateList [Test Output: Parameters] Breakdown voltage Vbd Time to breakdown Tbd Charge to breakdown Qbd Agilent EasyEXPERT Application Library Reference, Edition 8 11-73...
  • Page 358 Y1 axis: Port1 terminal voltage Vport1List (LOG) Y2 axis: Port2 terminal voltage Vport2List (LOG) Y3 axis: Port3 terminal voltage Vport3List (LOG) [Test Output: Parameters] Device1 breakdown voltage Vbd1 Device2 breakdown voltage Vbd2 Agilent EasyEXPERT Application Library Reference, Edition 8 11-74...
  • Page 359 Device3 breakdown voltage Vbd3 Device1 time to breakdown Tbd1 Device2 time to breakdown Tbd2 Device3 time to breakdown Tbd3 Device1 charge to breakdown Qbd1 Device2 charge to breakdown Qbd2 Device3 charge to breakdown Qbd3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-75...
  • Page 360 StoringRuntimeData: Data save during stress output, Yes or No [Measurement Parameters] Port1 voltage Vport1 Port2 voltage Vport2 Port3 voltage Vport3 [User Function] IPort1PerArea=Iport1/L/W IPort2PerArea=Iport2/L/W IPort3PerArea=Iport3/L/W IPort4PerArea=Iport4/L/W [X-Y Graph] X axis: Stress time Time (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 11-76...
  • Page 361 Device3 breakdown voltage Vbd3 Device1 time to breakdown Tbd1 Device2 time to breakdown Tbd2 Device3 time to breakdown Tbd3 Device1 charge to breakdown Qbd1 Device2 charge to breakdown Qbd2 Device3 charge to breakdown Qbd3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-77...
  • Page 362 Y1 axis: Port1 terminal voltage Vport1List (LINEAR) [Test Output: List Display] Stress time TimeList Port1 terminal voltage Vport1List [Test Output: Parameters] Breakdown voltage Vbd Time to breakdown Tbd Charge to breakdown Qbd [Qbd calculation] Qbd=I1Stress*Tbd/L/W Agilent EasyEXPERT Application Library Reference, Edition 8 11-78...
  • Page 363 Y1 axis: Port1 terminal voltage Vport1 (LINEAR) [List Display] Stress time Time Port1 terminal voltage Vport1 [Test Output: X-Y Graph] X axis: Stress time TimeList (LOG) Y1 axis: Port1 terminal voltage Vport1List (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 11-79...
  • Page 364 11 Reliability [Test Output: List Display] Stress time TimeList Port1 terminal voltage Vport1List [Test Output: Parameters] Breakdown voltage Vbd Time to breakdown Tbd Charge to breakdown Qbd [Qbd calculation] Qbd=I1Stress*Tbd/L/W Agilent EasyEXPERT Application Library Reference, Edition 8 11-80...
  • Page 365 Port2MinRng: Minimum range for the port2 current measurement Port3MinRng: Minimum range for the port3 current measurement Port4MinRng: Minimum range for the port4 current measurement [User Function] IPort1PerArea=Iport1/L/W IPort2PerArea=Iport2/L/W IPort3PerArea=Iport3/L/W IPort4PerArea=Iport4/L/W Qbd1val=integ(Iport1,Time)/L/W Qbd2val=integ(Iport2,Time)/L/W Qbd3val=integ(Iport3,Time)/L/W Agilent EasyEXPERT Application Library Reference, Edition 8 11-81...
  • Page 366 [Test Output: Parameters] Device1 time to breakdown Tbd1 Device2 time to breakdown Tbd2 Device3 time to breakdown Tbd3 Device1 charge to breakdown Qbd1 Device2 charge to breakdown Qbd2 Device3 charge to breakdown Qbd3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-82...
  • Page 367 Port4MinRng: Minimum range for the port4 current measurement StoringRuntimeData: Data save during stress output, Yes or No [Measurement Parameters] Port1 current Iport1 Port2 current Iport2 Port3 current Iport3 Port4 current Iport4 [User Function] IPort1PerArea=Iport1/L/W IPort2PerArea=Iport2/L/W IPort3PerArea=Iport3/L/W Qbd1val=integ(Iport1,Time)/L/W Agilent EasyEXPERT Application Library Reference, Edition 8 11-83...
  • Page 368 [Test Output: Parameters] Device1 time to breakdown Tbd1 Device2 time to breakdown Tbd2 Device3 time to breakdown Tbd3 Device1 charge to breakdown Qbd1 Device2 charge to breakdown Qbd2 Device3 charge to breakdown Qbd3 Agilent EasyEXPERT Application Library Reference, Edition 8 11-84...
  • Page 369 Y1 axis: Port1 terminal current Iport1List (LOG) [Test Output: List Display] Stress time TimeList Port1 terminal current Iport1List Charge to breakdown QbdList [Test Output: Parameters] Time to breakdown Tbd Charge to breakdown Qbd Agilent EasyEXPERT Application Library Reference, Edition 8 11-85...
  • Page 370 X axis: Stress time TimeList (LOG) Y1 axis: Port1 current Iport1List (LOG) [Test Output: List Display] Stress time TimeList Port1 current Iport1List Charge to breakdown QbdList [Test Output: Parameters] Time to breakdown Tbd Charge to breakdown Qbd Agilent EasyEXPERT Application Library Reference, Edition 8 11-86...
  • Page 371 HSADC_AvN : Set averaging of HSADC. Additional sampling is performed with 45 us interval, and averaged data is returned. [Device_ID_Override] DEVICE ID display in the Results area is made as “new_device_id @ measurement time” if this parameter is set to Y. Agilent EasyEXPERT Application Library Reference, Edition 8 11-87...
  • Page 372 Note: Recommend to use the default 50 ms. Stress_T_adj: Time (negative) for adjusting the stress time accuracy which depends on the measurement setup or a PC speed used for Desktop EasyEXPERT. Note: Stress_T_adj parameter is adjusted so as the Stree_time_at_ display in the Sampling_Ids graph becomes closer to the end value of the previous stress time.
  • Page 373 TotalStressTime can be set from 10 sec to 10,000 sec. [Limitation] - EasyEXPERT version A.02.10 or later is required to execute this application test definition. - The minimum sampling interval is 100us + (20us x #of additional Drain SMUs) if used more than one SMU is used for Id measurements.
  • Page 374 Note: Stress_T_adj parameter is adjustes so as as the "Stree_time_at_" display in the Sampling_Ids graph becomes closer to the end value of the previos stress time. Default value is tuned for the use on the B1500A EasyEXPERT and the "RecordSamplingData=ON" condition.
  • Page 375 SubsMinRng: Minimum range for the substrate current measurement [User Function] IgatePerArea=Igate/L/W IsubsPerArea=Isubs/L/W [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Gate current Igate (LOG) Y2 axis: Gate current per unit area IgatePerArea (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 11-91...
  • Page 376 Y2 axis: Gate voltage VgateList (LINEAR) [Test Output: List Display] Time stamp TimeList Gate current IgateList Gate voltage VgateList Charge to breakdown QbdList [Test Output: Parameters] Breakdown voltage Vbd Charge to breakdown Qbd Time to breakdown Tbd Agilent EasyEXPERT Application Library Reference, Edition 8 11-92...
  • Page 377 Sample...
  • Page 378 12 Sample 1. Vth gmMax and Id: Extrapolation Vth and Constant Vth (A.04.00) Agilent EasyEXPERT Application Library Reference, Edition 8 12-2...
  • Page 379 DrainMinRng: Minimum range for the drain current measurement [Measurement Parameters] Drain current Idrain [User Function] gm=diff(Idrain,Vgate) [Analysis Function] gmMax=max(gm) Von=@L1X (X intercept of Line1) Vth=Von-Vd/2 Vth@Id=@MX (X coordinate of Marker) Vth is given by the following formula. Vth=Vg(gmMax)-Id(gmMax)/gmMax Agilent EasyEXPERT Application Library Reference, Edition 8 12-3...
  • Page 380 Threshold voltage by constant current method Vth@Id [Auto Analysis] set in Vth_gmMax and Id test definition Line1: Tangent line for Y1 at gm=gmMax [Auto Analysis] set after Vth_gmMax and Id test definition Marker: Data point specified by Idrain=Id@Vth*Polarity Agilent EasyEXPERT Application Library Reference, Edition 8 12-4...
  • Page 381 Solar Cell...
  • Page 382 Solar Cell forward bias characteristics (A.05.03.2013.0124_2013.02.27.1) 7. Solar Cell IV Rev: Solar Cell reverse bias characteristics (A.05.03.2013.0124_2013.02.27.1) 8. Solar Cell Nc-W: Nc-W characteristics of Solar Cell (A.05.03.2013.0124_2013.02.27.1) 9. Solar Cell Nyquist Plot: Solar Cell Nyquist Plot (A.05.03.2013.0124_2013.02.27.1) Agilent EasyEXPERT Application Library Reference, Edition 8 13-2...
  • Page 383 CpMax: Maximum value of Cp axis for X-Y graph GMin: Minimum value of G axis for X-Y graph GMax: Maximum value of G axis for X-Y graph [Measurement Parameters] Parallel capacitance cp Conductance g [User Function] PI=3.141592653589 d=g/(2*PI*FREQ*cp) Agilent EasyEXPERT Application Library Reference, Edition 8 13-3...
  • Page 384 Dissipation factor D Parallel resistance Rp Actual DC bias voltage VC [Test Output: Parameters Display Area] Intercept of Cp-Vac characteristics C0 Slope of Cp-Vac characteristics C1 Drive-level density Ndl Depletion width W Agilent EasyEXPERT Application Library Reference, Edition 8 13-4...
  • Page 385 G_Min: Minimum value of G for axis for X-Y graph G_Max: Maximum value of G axis for X-Y graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*Freq*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*Freq*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) Agilent EasyEXPERT Application Library Reference, Edition 8 13-5...
  • Page 386 Y4 axis: Phase ThetaList (LOG) [Test Output: List Display] Frequency FreqList Bias voltage VcList Anode-Cathode capacitance (parallel capacitance) CpList Conductance GList Parallel resistance RpList Dissipation factor DList Impedance ZList Phase ThetaList [Test Output: Parameters Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 13-6...
  • Page 387 GMax: Maximum value of G axis for X-Y graph NMin: Minimum value of N axis for X-Y graph NMax: Maxmum value of N axis for X-Y graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 E0=8.854188E-14 D=G/(2*PI*FREQ*Cp) Rp=1/G Agilent EasyEXPERT Application Library Reference, Edition 8 13-7...
  • Page 388 Y5 axis: Depletion width W (LINEAR) [List Display] Anode-Cathode voltage Vdc Anode-Cathode capacitance (parallel capacitance) Cp Conductance G Parallel resistance Rp Dissipation factor D Carrier density N Depletion width W [Parameters Display Area] [Auto Analysis] Agilent EasyEXPERT Application Library Reference, Edition 8 13-8...
  • Page 389 NdlMin: Minimum value of Ndl axis for X-Y graph NdlMax: Maximum value of Ndl axis for X-Y graph WMin: Minimum value of W axis for X-Y graph WMax: Maximum value of W axis for X-Y graph [Measurement Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 13-9...
  • Page 390 Intercept of Cp-Vac characteristics C0 Slope of Cp-Vac characteristics C1 Peak-to-peak voltage VPP DC bias voltage setting VDC Actual DC bias voltage VDCACT Anode-Cathode capacitance (parallel capacitance Cp Conductance G [Test Output: Parameters Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 13-10...
  • Page 391 HoldTime: Hold time DelayTime: Delay time AnodeMinRng: Minimum range for the anode current measurement [Measurement Parameters] Ianode: Anode current of the solar cell [User Function] Power=-1*Ianode*Vanode Isolar=-1*Ianode Jsolar=-1*Ianode/Area Vsolar=Vanode [Analysis Function] [X-Y Graph] Agilent EasyEXPERT Application Library Reference, Edition 8 13-11...
  • Page 392 Anode voltage of the solar cell Vsolar Anode current of the solar cell Isolar Power of the solar cell Power Anode current density of the solar cell Jsolar [Parameters Display Area] [Auto Analysis] Agilent EasyEXPERT Application Library Reference, Edition 8 13-12...
  • Page 393 HoldTime: Hold time DelayTime: Delay time AnodeMinRng: Minimum range for the anode current measurement [Measurement Parameters] Ianode: Anode current of the solar cell [User Function] Power=-1*Ianode*Vanode Isolar=-1*Ianode Vsolar=Vanode Jsolar=-1*Ianode/Area Idiff=diff(Isolar,Vsolar) [Analysis Function] Pmax=max(Power) Agilent EasyEXPERT Application Library Reference, Edition 8 13-13...
  • Page 394 Conversion efficiency of the cell CE Shunt resistance of the cell Rsh Series resistance of the cell Rs [Auto Analysis] Line1: Tangent line for Y1 at Power=Pmax Line2: Tangent line for Y1 at Isolar=0 Agilent EasyEXPERT Application Library Reference, Edition 8 13-14...
  • Page 395 HoldTime: Hold time DelayTime: Delay time AnodeMinRng: Minimum range for the anode current measurement [Measurement Parameters] Ianode: Anode current of the solar cell [User Function] Isolar=-1*Ianode Jsolar=-1*Ianode/Area Vsolar=Vanode [Analysis Function] Rsh=-1/@L1G [X-Y Graph] Agilent EasyEXPERT Application Library Reference, Edition 8 13-15...
  • Page 396 Anode current of the solar cell Isolar Anode current density of the solar cell Jsolar [Parameters Display Area] Shunt Resistance of the cell Rsh [Auto Analysis] Line1: Tangent line for Y1 at Vsolar=V_rsh Agilent EasyEXPERT Application Library Reference, Edition 8 13-16...
  • Page 397 WMax: Maximum value of W axis for X-Y graph CpMin: Minimum value of Cp axis for X-Y graph CpMax: Maximum value of Cp axis for X-Y graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 E0=8.854188E-14 D=G/(2*PI*FREQ*Cp) Rp=1/G Agilent EasyEXPERT Application Library Reference, Edition 8 13-17...
  • Page 398 Y3 axis: Inverted value of the squared Cp (LINEAR) [List Display] Depletion width W Carrier density N Anode-Cathode voltage Vdc Anode-Cathode capacitance (parallel capacitance) Cp Conductance G Parallel resistance Rp Dissipation factor D [Parameter Display Area] [Auto Analysis] Agilent EasyEXPERT Application Library Reference, Edition 8 13-18...
  • Page 399 Z2_Max: Maximum value of Z2 axis for X-Y graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Z1=G/(G^2+(2*PI*Freq*Cp)^2) Z2=(2*PI*Freq*Cp)/(G^2+(2*PI*Freq*Cp)^2) [Analysis Function] [X-Y Graph] X axis: Frequency Freq (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 13-19...
  • Page 400 Bias voltage VcList Anode-Cathode capacitance (parallel capacitance) CpList Conductance GList Parallel resistance RpList Dissipation factor DList Real part of the impedance Z1List Imaginary part of the impedance Z2List [Test Output: Parameters Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 13-20...
  • Page 401 SPGU_PLSDIV...
  • Page 402 14 SPGU_PLSDIV 1. SPGU_PLSDIV: SPGU PLSDIV (A.05.03.2013.0124_2013.02.27.1) 2. SPGU PLSDIV Id-Vd: SPGU PLSDIV Id-Vd (A.05.03.2013.0124_2013.02.27.1) 3. SPGU PLSDIV Id-Vg: SPGU PLSDIV Id-Vg (A.05.03.2013.0124_2013.02.27.1) Agilent EasyEXPERT Application Library Reference, Edition 8 14-2...
  • Page 403 Performs the SPGU output setup and the measurement setup. Click the Single button to perform the SPGU output and measurement. [Reference] Easy High Power Pulsed IV Measurement Using the Agilent B1500A's HV-SPGU Module http://cp.literature.agilent.com/litweb/pdf/5990-3786EN.pdf [Test Parameters] Period: Pulse period (*Adjust the time using Period_adj)
  • Page 404 VbOption2: Select the SPGU2 base voltage will be Base2 or Peak2. (*3) (*3) If you select 'Peak' for VbOption, the pulse base voltage is same as Peak, and the output waveform will be kind of pseudo-DC bias. Agilent EasyEXPERT Application Library Reference, Edition 8 14-4...
  • Page 405 B1500A [Description] Measures the drain current vs drain voltage characteristics of MOSFET with pulsed gate and drain voltage using SPGU. [Reference] Easy High Power Pulsed IV Measurement Using the Agilent B1500A's HV-SPGU Module http://cp.literature.agilent.com/litweb/pdf/5990-3786EN.pdf [Device Under Test] MOSFET [Device Parameters]...
  • Page 406 VdBaseOption: Select the drain base voltage will be VdBase or VdPeak (*2) (*2) If you select 'VxPeak' for VxBaseOption, the pulse base voltage is same as Peak, and the output waveform will be kind of pseudo-DC bias. Agilent EasyEXPERT Application Library Reference, Edition 8 14-6...
  • Page 407 B1500A [Description] Measures the drain current vs gate voltage characteristics of MOSFET with pulsed gate and drain voltage using SPGU. [Reference] Easy High Power Pulsed IV Measurement Using the Agilent B1500A's HV-SPGU Module http://cp.literature.agilent.com/litweb/pdf/5990-3786EN.pdf [Device Under Test] MOSFET [Device Parameters]...
  • Page 408 VdBaseOption: Select the drain base voltage will be VdBase or VdPeak (*2) (*2) If you select 'VxPeak' for VxBaseOption, the pulse base voltage is same as Peak, and the output waveform will be kind of pseudo-DC bias. Agilent EasyEXPERT Application Library Reference, Edition 8 14-8...
  • Page 409 Structure...
  • Page 410 Low resistance measurement using 3458A, voltage force (A.01.20) 28. R-V kelvin: Resistor R-V characteristics, Kelvin connection (A.01.20) 29. R-V: Resistor R-V characteristics (A.01.20) 30. VanDerPauw Square: Van Der Pauw pattern sheet resistance (A.01.11) Agilent EasyEXPERT Application Library Reference, Edition 8 15-2...
  • Page 411 [Measurement Parameters] Gate current Igate Substrate current Isubs [User Function] Gate current per Gate unit area IgatePerArea=Igate/Lg/Wg Substrate current per Gate unit area IsubsPerArea=Isubs/Lg/Wg [Calculation After Measurement] Buffer=getVectorData("Vgate") V_gate=storeAt(Vgate,I,1,at(Buffer,2,1)) Buffer=getVectorData("Igate") I_gate=storeAt(Igate,I,1,at(Buffer,2,1)) I_gate@LowVg=storeAt(Igate,I,1,at(Buffer,1,1)) Agilent EasyEXPERT Application Library Reference, Edition 8 15-3...
  • Page 412 Y2 axis: Gate current at pulse base voltage I_gate@LowVg (LOG) [Test Output: List Display] Gate voltage V_gate Gate current I_gate Gate current at pulse base voltage I_gate@LowVg Gate current per Gate unit area I_gatePerArea I_gate@LowVg per Gate unit area I_gate@LowVgPerArea Agilent EasyEXPERT Application Library Reference, Edition 8 15-4...
  • Page 413 Y1 axis: Gate current Igate (LOG) Y2 axis: Gate current per Gate unit area Igate_Area (LOG) [Parameters Display Area] Gate-Substrate breakdown voltage BVgb [Auto Analysis] Line1: Vertical line through Y1 data at Igate=Ig@BVgb Agilent EasyEXPERT Application Library Reference, Edition 8 15-5...
  • Page 414 Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Frequency Frequency=Freq Dissipation factor D=G/(2*PI*Freq*Cp) Parallel resistance Rp=1/G Agilent EasyEXPERT Application Library Reference, Edition 8 15-6...
  • Page 415 [Test Output: List Display] Frequency FreqList Gate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Substrate voltage VsubsList Agilent EasyEXPERT Application Library Reference, Edition 8 15-7...
  • Page 416 VgbStart: DC bias start voltage VgbStop: DC bias stop voltage VgbStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Dissipation factor D Agilent EasyEXPERT Application Library Reference, Edition 8 15-8...
  • Page 417 Y3 axis: Gate capacitance (parallel capacitance) Cp_FREQ2 (LINEAR) [Test Output: List Display] Gate voltage VGB Gate capacitance (parallel capacitance) Cgb Gate capacitance (parallel capacitance) Cp_FREQ1 Gate capacitance (parallel capacitance) Cp_FREQ2 Dissipation factor D_FREQ1 Dissipation factor D_FREQ2 Agilent EasyEXPERT Application Library Reference, Edition 8 15-9...
  • Page 418 VgbStop: DC bias stop voltage VgbStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) Agilent EasyEXPERT Application Library Reference, Edition 8 15-10...
  • Page 419 Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Gate-Substrate capacitance per Gate unit area CpPerArea Gate-Substrate capacitance per Gate unit width CpPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 15-11...
  • Page 420 Cp_Min: Minimum capacitance value for graph Cp_Max: Maximum capacitance value for graph [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] Circular constant PI=3.141592653589 Frequency Frequency=Freq Dissipation factor D=G/(2*PI*Freq*Cp) Parallel resistance Rp=1/G Series capacitance Cs=(1+D^2)*Cp Agilent EasyEXPERT Application Library Reference, Edition 8 15-12...
  • Page 421 [Test Output: List Display] Frequency FreqList Anode voltage VaList Gate capacitance (parallel capacitance) CpList Conductance GList Series capacitance CsList Series resistance RsList Parallel resistance RpList Dissipation factor DList Reactance XList Impedance ZList Phase ThetaList Agilent EasyEXPERT Application Library Reference, Edition 8 15-13...
  • Page 422 VacStep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) Vgate=-Vsubs CpPerArea=Cp/L/W CpPerWg=Cp/W Agilent EasyEXPERT Application Library Reference, Edition 8 15-14...
  • Page 423 Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Junction capacitance per unit area CpPerArea Junction capacitance per unit width CpPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 15-15...
  • Page 424 VanodeStart: Sweep start voltage for Anode terminal VanodeStop: Sweep stop voltage for Anode terminal VanodeStep: Sweep step voltage for Anode terminal Ianode@BV: Anode current to decide the breakdown CathodeDC: SMU connected to Cathode terminal, constant voltage output Agilent EasyEXPERT Application Library Reference, Edition 8 15-16...
  • Page 425 Anode current per junction unit area Ianode_S [Breakdown Voltage Measurements: X-Y Plot] X axis: Anode voltage (LINEAR) Y1 axis: Anode current (LOG) [Breakdown Voltage Measurements: Parameters Display Area] Junction breakdown voltage BV Zero bias capacitance value Cj0 Agilent EasyEXPERT Application Library Reference, Edition 8 15-17...
  • Page 426 VanodeStart: Sweep start voltage for Anode terminal VanodeStop: Sweep stop voltage for Anode terminal VanodeStep: Sweep step voltage for Anode terminal Ianode@BV: Anode current at breakdown CathodeDC: SMU connected to Cathode terminal, constant voltage output [Extended Test Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 15-18...
  • Page 427 Anode current per junction unit area Ianode_S [Breakdown Voltage Measurements: X-Y Plot] X axis: Anode voltage (LINEAR) Y1 axis: Anode current (LOG) [Breakdown Voltage Measurements: Parameters Display Area] Junction breakdown voltage BV Zero bias capacitance value Cj0 Agilent EasyEXPERT Application Library Reference, Edition 8 15-19...
  • Page 428 [User Function] IgatePerArea: Gate current per unit gate area IgatePerArea=Igate/Lg/Wg IsubsPerArea: Substrate current per unit gate area IsubsPerArea=Isubs/Lg/Wg [X-Y Plot] X axis: Gate current Igate (LOG) Y1 axis: Gate voltage Vgate (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 15-20...
  • Page 429 IsubsPerArea: Substrate current per unit gate area IsubsPerArea=Isubs/Lg/Wg [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Gate current Igate (LOG) [List Display] Gate voltage Vgate Gate current Igate Substrate current Isubs Agilent EasyEXPERT Application Library Reference, Edition 8 15-21...
  • Page 430 Vstep: DC bias step voltage [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) CsPerLength=Cs/L CpPerLength=Cp/L [X-Y Graph] Agilent EasyEXPERT Application Library Reference, Edition 8 15-22...
  • Page 431 Interconnection capacitance (parallel capacitance) Cp Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Cs per unit length CpPerLength Cp per unit length CpPerLength Agilent EasyEXPERT Application Library Reference, Edition 8 15-23...
  • Page 432 [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Parallel capacitance Cp Conductance G [User Function] PI=3.141592653589 D=G/(2*PI*FREQ*Cp) Rp=1/G Cs=(1+D^2)*Cp X=-1/(2*PI*FREQ*Cs) Rs=D*abs(X) Z=sqrt(Rs^2+X^2) Theta=atan(X/Rs) [X-Y Graph] X axis: DC bias VmetalA (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 15-24...
  • Page 433 [List Display] Measurement frequency Freq DC bias VmetalA Film capacitance (parallel capacitance) Cp Conductance G Series capacitance Cs Series resistance Rs Parallel resistance Rp Dissipation factor D Reactance X Impedance Z Phase Theta Agilent EasyEXPERT Application Library Reference, Edition 8 15-25...
  • Page 434 [X-Y Plot] X axis: Anode voltage Vanode (LINEAR) Y1 axis: Anode current Ianode (LINEAR) Y2 axis: Anode current Ianode (LOG) Y3 axis: Cathode current Icathode (LINEAR) Y4 axis: Cathode current Icathode (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 15-26...
  • Page 435 Anode current per unit area IanodePerArea Cathode current Icathode Cathode current per unit area IcathodePerArea [Parameters Display Area] Junction breakdown voltage BV [Auto Analysis] Line1: Vertical line through Y1 data at Ianode=Ianode@BV Agilent EasyEXPERT Application Library Reference, Edition 8 15-27...
  • Page 436 AnodeMinRng: Minimum range for the anode current measurement [Measurement Parameters] Anode current Ianode Cathode current Icathode [User Function] IanodePerArea=Ianode/L/W IcathodePerArea=Icathode/L/W Vt=k*(Temp+273.15)/q N=1/Vt/(diff(log(Ianode),Vanode)) N_Min=min(N) Slope=diff(lgt(Ianode),Vanode) Is=lgt(Ianode)-Slope*Vanode IsMin=min(Is) SmplNum=abs((VanodeStop-VanodeStart)/VanodeStep)+1 I_Rs=at(Ianode,SmplNum,1) deltaV_Rs=VanodeStop-N_Min*Vt*log(I_Rs/IsMin) Rs=deltaV_Rs/I_Rs [Analysis Function] IsMin2=@L1Y (Y intercept of Line1) Agilent EasyEXPERT Application Library Reference, Edition 8 15-28...
  • Page 437 [Parameters Display Area] Slope minimum value N_Min Reverse direction saturation current minimum value IsMin Reverse direction saturation current minimum value IsMin2 Series resistance Rs [Auto Analysis] Line1: Tangent line through Y1 data at Slope=max(Slope) Agilent EasyEXPERT Application Library Reference, Edition 8 15-29...
  • Page 438 [Measurement Parameters] Anode current Ianode Cathode current Icathode [User Function] IanodePerArea=Ianode/L/W IcathodePerArea=Icathode/L/W [X-Y Plot] X axis: Anode voltage Vanode (LINEAR) Y1 axis: Anode current Ianode (LINEAR) Y2 axis: Anode current Ianode (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 15-30...
  • Page 439 [Measurement Parameters] Anode current Ianode Cathode current Icathode [User Function] IanodePerArea=Ianode/L/W IcathodePerArea=Icathode/L/W [X-Y Plot] X axis: Anode voltage Vanode (LINEAR) Y1 axis: Anode current Ianode (LOG) Y2 axis: Cathode current Icathode (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 15-31...
  • Page 440 VCompSinkSMU: Voltage compliance of SMU for QSCV smart operation Cmin: Minimum capacitance value for graph Cmax: Maximum capacitance value for graph IgMin: Minimum leakage current value for graph IgMax: Maximum leakage current value for graph Agilent EasyEXPERT Application Library Reference, Edition 8 15-32...
  • Page 441 Leakage current IgLeak [X-Y Graph] X axis: Gate Voltage Vg (LINEAR) Y1 axis: Capacitance C (LINEAR) Y2 axis: Leakage current Ig (LINEAR) [List Display] Gate voltage Vg Capacitance C Leakage current Ig Agilent EasyEXPERT Application Library Reference, Edition 8 15-33...
  • Page 442 Integ_C: Integration time for the capacitance measurement Integ_L: Integration time for the leakage current measurement HoldTime: Hold time DelayTime: Delay time [Extended Test Parameters] StepDelay: Step delay time [Measurement parameters] Capacitance C [List Display] Capacitance C Agilent EasyEXPERT Application Library Reference, Edition 8 15-34...
  • Page 443 HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Port1 measurement voltage V1 VM1 measurement voltage Vm1 VM2 measurement voltage Vm2 [User Function] Voltage between terminals DeltaV=Vm1-Vm2 Resistance R=DeltaV/I1 Sheet resistance Rsheet=R*W/L [X-Y Graph] Agilent EasyEXPERT Application Library Reference, Edition 8 15-35...
  • Page 444 Y1 axis: Resistance R (LINEAR) Y2 axis: Voltage between terminals DeltaV (LINEAR) [List Display] Port1 output current I1 Port1 measurement voltage V1 Subs output voltage Vsubs Voltage between terminals DeltaV Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-36...
  • Page 445 X axis: Port1 output current I1 (LINEAR) Y1 axis: Port1 measurement voltage V1 (LINEAR) Y2 axis: Resistance R (LINEAR) [List Display] Port1 output current I1 Port1 measurement voltage V1 Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-37...
  • Page 446 Port1MinRng: Minimum range for the port1 current measurement [Measurement Parameters] Port1 measurement current I1 VM1 measurement voltage Vm1 VM2 measurement voltage Vm2 [User Function] Voltage between terminals DeltaV=Vm1-Vm2 Resistance R=DeltaV/I1 Sheet resistance Rsheet=R*W/L Agilent EasyEXPERT Application Library Reference, Edition 8 15-38...
  • Page 447 X axis: Port1 output voltage V1 (LINEAR) Y1 axis: Port1 measurement current I1 (LINEAR) Y2 axis: Resistance R (LINEAR) [List Display] Port1 output voltage V1 Voltage between terminals DeltaV Port1 measurement current I1 Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-39...
  • Page 448 X axis: Port1 output voltage V1 (LINEAR) Y1 axis: Resistance R (LINEAR) Y2 axis: Port1 measurement current I1 (LINEAR) [List Display] Port1 output voltage V1 Port1 measurement current I1 Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-40...
  • Page 449 Vport1: Port1 voltage [Measurement Parameters for second measurement (Vneg)] Vport2: Port2 voltage [X-Y Plot] [X-Y Plot for first measurement (Vpos)] X axis: Applied current Iport1 (LINEAR) Y1 axis: Measured voltage Vport1 (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 15-41...
  • Page 450 Y3 axis: Resistance value (LINEAR) [Test Output: List Display] IsmuList: Applied current VsmuList: Measured voltage VdvmList: DVM measured voltage RList: Resistance value [Test Output: Parameters] Rav: Average resistance value of 2 measurements Agilent EasyEXPERT Application Library Reference, Edition 8 15-42...
  • Page 451 [User Function] Voltage between terminals DeltaV=Vm1-Vm2 Resistance R=DeltaV/I1 Sheet resistance Rsheet=R*W/L [X-Y Graph] X axis: Port1 output current I1 (LINEAR) Y1 axis: Resistance R (LINEAR) Y2 axis: Voltage between terminals DeltaV (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 15-43...
  • Page 452 15 Structure [List Display] Port1 output current I1 Port1 measurement voltage V1 Resistance R Voltage between terminals DeltaV Agilent EasyEXPERT Application Library Reference, Edition 8 15-44...
  • Page 453 X axis: Port1 output current I1 (LINEAR) Y1 axis: Port1 measurement voltage V1 (LINEAR) Y2 axis: Resistance R (LINEAR) [List Display] Port1 output current I1 Port1 measurement voltage V1 Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-45...
  • Page 454 Iport2: Measured current [Measurement Parameters for second measurement (Vneg)] Iport1: Measured current [X-Y Plot] [X-Y Plot for first measurement (Vpos)] X axis: Applied voltage on Port1 Vport1 (LINEAR) Y1 axis: Measured current Iport2 (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 15-46...
  • Page 455 Y2 axis: Measured current IsmuList (LINEAR) Y3 axis: Resistance value RList (LINEAR) [Test Output: List Display] VdvmList: DVM measured voltage IsmuList: Measured current RList: Resistance value [Test Output: Parameters] Rav: Average resistance value of 2 measurements Agilent EasyEXPERT Application Library Reference, Edition 8 15-47...
  • Page 456 X axis: Port1 output voltage V1 (LINEAR) Y1 axis: Resistance R (LINEAR) Y2 axis: Port1 measurement current I1 (LINEAR) [List Display] Port1 output voltage V1 Voltage between terminals DeltaV Port1 measurement current I1 Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-48...
  • Page 457 X axis: Port1 output voltage V1 (LINEAR) Y1 axis: Resistance R (LINEAR) Y2 axis: Port1 measurement current I1 (LINEAR) [List Display] Port1 output voltage V1 Port1 measurement current I1 Resistance R Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-49...
  • Page 458 X axis: Port1 output current I1 (LINEAR) Y1 axis: Voltage between terminals DeltaV (LINEAR) Y2 axis: Sheet resistance Rsheet (LINEAR) [List Display] Port1 output current I1 Voltage between terminals DeltaV Sheet resistance Rsheet Agilent EasyEXPERT Application Library Reference, Edition 8 15-50...
  • Page 460 16 TFT TFT Id-Vd: TFT Id-Vd characteristics (A.01.20) TFT Id-Vg: TFT Id-Vg characteristics (A.01.20) Agilent EasyEXPERT Application Library Reference, Edition 8 16-2...
  • Page 461 Rds: Output resistance Rds=1/gds [X-Y Graph] X axis: Drain voltage Vdrain (LINEAR) Y1 axis: Drain current Idrain (LINEAR) [List Display] Drain voltage Vdrain Gate voltage Vgate Drain current Idrain Output conductance gds Output resistance Rds Agilent EasyEXPERT Application Library Reference, Edition 8 16-3...
  • Page 462 Y2 axis: Drain current Idrain (LOG) Y3 axis: Transconductance gm (LINEAR) [List Display] Gate voltage Vgate Drain voltage Vdrain Drain current Idrain Transconductance gm Drain current per unit gate width IdrainPerWg Transconductance per unit gate width gmPerWg Agilent EasyEXPERT Application Library Reference, Edition 8 16-4...
  • Page 463 Utility...
  • Page 464 PG reset (A.01.20) 10. Subsite move: Probing next subsite (A.02.00) 11. CVSweep4284_a: C-V measurement by 4284A/E4980A (A.03.10) 12. CV Curve Parameter Calculator: Calculates CMOS transistor parameters from capacitance versus voltage sweeps. (A.01.02) Agilent EasyEXPERT Application Library Reference, Edition 8 17-2...
  • Page 465 17.1 ForcePG1: PG Output1 (A.01.20) [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Sets the Output1 of the Agilent 81110A Pulse Generator, and triggers it. [Input Parameters] Address: GPIB address of the Agilent 81110A Pulse Generator Period1: Output1 pulse period [s]...
  • Page 466 17.2 ForcePG2: PG Output2 (A.01.20) [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Sets the Output2 of the Agilent 81110A Pulse Generator, and triggers it. [Input Parameters] Address: GPIB address of the Agilent 81110A Pulse Generator Period2: Output2 pulse period [s]...
  • Page 467 [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Sets Output1 and Output2 of Agilent 81110A Pulse Generator, and triggers it. Pulse leading/trailing edge transition time can be set. Execute ResetPG to stop pulse output before the specified pulses are applied.
  • Page 468 [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Sets Output1 and Output2 of Agilent 81110A Pulse Generator, and triggers it. Pulse leading/trailing edge transition time can be set. Execute ResetPG to stop pulse output before the specified pulses are applied.
  • Page 469 [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Sets Output1 or Output2 of Agilent 81110A Pulse Generator, and triggers it. Pulse leading/trailing edge transition time can be set. Execute ResetPG to stop pulse output before the specified pulses are applied.
  • Page 470 [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Sets Output1 of Agilent 81110A Pulse Generator, and triggers continuous pulse output. Pulse leading/trailing edge transition time can be set. Execute ResetPG to stop pulse output before the specified pulses are applied.
  • Page 471 17.7 Measure Diff-V: Voltage measurement by 3458A (A.01.20) [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Performs voltage measurement between two terminals by using Agilent 3458A Digital Multimeter. Measurement data is stored to DVM_Val variable. [Required Modules and Accessories] Agilent 3458A Digital Multimeter...
  • Page 472 Integ_C: Integration time for the capacitance measurement Integ_L: Integration time for the leakage current measurement HoldTime: Hold time DelayTime: Delay time [Extended Test Parameters] StepDelay: Step delay time [Measurement parameters] Capacitance C [List Display] Capacitance C Agilent EasyEXPERT Application Library Reference, Edition 8 17-10...
  • Page 473 B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Resets Agilent 81110A Pulse Generator. [Required Modules and Accessories] Agilent 81110A Pulse Generator (2-output, PGU1 and PGU2) GPIB cable [Input Parameter] GPIB address of Agilent 81110A Pulse Generator Agilent EasyEXPERT Application Library Reference, Edition 8...
  • Page 474 CustomProber entry field to operate with a non-standard wafer prober driver. [Test Parameters] ProberType: Type of wafer prober CustomProber: Command path name for non-standard wafer probers If CustomProber is not blank, ProberType field is ignored. Agilent EasyEXPERT Application Library Reference, Edition 8 17-12...
  • Page 475 [Supported Analyzer] B1500A, B1505A, 4155B, 4155C, 4156B, 4156C [Description] Performs the capacitance vs DC bias voltage measurement by using Agilent 4284A/E4980A LCR meter. [Device Under Test] Capacitor, 2 terminals Connect the LCR meter high terminal to the DUT low terminal and the LCR meter low terminal to the DUT high terminal.

  • Page 476: B1500A Mfcmu

    X axis: Applied gate voltage (LINEAR) Y1 axis: Measured gate-to-substrate capacitance (LINEAR) [List Display] Vsweep: Applied gate voltage (Volts) Cmeas: Measured gate-to-substrate capacitance (Farads) [Parameter Display] Cox (Farads) Cmin (Farads) tox (Angstroms) ni (1/cm^3) Nsub (1/cm^3) Agilent EasyEXPERT Application Library Reference, Edition 8 17-14...
  • Page 477 Qb (Coulomb/cm^2) Vth (Volts) Note #1: Qsslq is "Qss over q". This is the only compact way to represent this variable within EasyEXPERT. Note #2: Sample QSCV and HFCV measurement data for a device is included with this application test.
  • Page 478 17 Utility Agilent EasyEXPERT Application Library Reference, Edition 8 17-16...
  • Page 479 WGFMU...
  • Page 480 Bias Temperature Instability Test, using WGFMU (A.03.20) 5. TRANSIV DC IdVd: Id-Vd characteristics, using RSU (A.03.20) 6. TRANSIV DC IdVg: Id-Vg characteristics, using RSU (A.03.20) 7. WGFMU Pattern Editor: WGFMU Pattern Editor (A.03.20) Agilent EasyEXPERT Application Library Reference, Edition 8 18-2...
  • Page 481 To open the Define vector data dialog box, click the left button in the Accumlated_Stress_Time field. Clicking the * button on the dialog box increases the entry fields. [Meas Setup] Agilent EasyEXPERT Application Library Reference, Edition 8 18-3...
  • Page 482 PatternValidateFile: Absolute path name of the file for checking WGFMU output waveform. [Extended Test Parameters] VgForceRange: Gate voltage output range VdForceRange: Drain voltage output range [Test Output: X-Y Graph] Id-AccumlatedStressTime: Drain current vs Accumulated stress time characteristics Agilent EasyEXPERT Application Library Reference, Edition 8 18-4...
  • Page 483 MeasPoints: Number of the Id measurement points IntegTime: Integration time for one measurement point TransEdge: Voltage change time between the stress voltage and the measurement voltage, for both Gate and Drain terminals Agilent EasyEXPERT Application Library Reference, Edition 8 18-5...
  • Page 484 Device_ID_Override: Y (sets the New_Device_ID value to the Device ID) or N (does not set) New_Device_ID: Device ID [Extended Test Parameters] VgForceRange: Gate voltage output range VdForceRange: Drain voltage output range [Test Output: X-Y Graph] Id-AccumlatedStressTime: Drain current vs Accumulated stress time characteristics Agilent EasyEXPERT Application Library Reference, Edition 8 18-6...
  • Page 485 To open the Define vector data dialog box, click the left button in the Accumlated_Stress_Time field. Clicking the * button on the dialog box increases the entry fields. [Meas Setup] VgStart: Sweep start voltage for Gate terminal VgStop: Sweep stop voltage for Gate terminal Agilent EasyEXPERT Application Library Reference, Edition 8 18-7...
  • Page 486 StepMargin: Time from the step measurement end to the next step output start (not available for the ramp sweep) [Test Output: X-Y Graph] Id-t: Drain current vs Time characteristics Id-Vg: Drain current vs Gate voltage characteristics Vth-AccumlatedStressTime: Threshold voltage vs Accumulated stress time characteristics Agilent EasyEXPERT Application Library Reference, Edition 8 18-8...
  • Page 487 StepRise: Step voltage change time (not available for the ramp sweep) Sweep: Step (step sweep) or Ramp (ramp sweep) Slope: Single (VgStart to VgStop) or Dual (VgStart to VgStop to VgStart) VdMeas: Drain voltage for the Id-Vg measurement Agilent EasyEXPERT Application Library Reference, Edition 8 18-9...
  • Page 488 StepMargin: Time from the step measurement end to the next step output start (not available for the ramp sweep) [Test Output: X-Y Graph] Id-t: Drain current vs Time characteristics Id-Vg: Drain current vs Gate voltage characteristics Vth-AccumlatedStressTime: Threshold voltage vs Accumulated stress time characteristics Agilent EasyEXPERT Application Library Reference, Edition 8 18-10...
  • Page 489 [X-Y Plot] X axis: Gate voltage Vd (LINEAR) Y1 axis: Drain current Id (LINEAR) [List Display] Gate voltage Vg Drain voltage Vd Drain current Id Drain current per unit gate width IdPerW Agilent EasyEXPERT Application Library Reference, Edition 8 18-11...
  • Page 490 [X-Y Plot] X axis: Gate voltage Vg (LINEAR) Y1 axis: Drain current Id (LINEAR) [List Display] Gate voltage Vg Drain voltage Vd Drain current Id Drain current per unit gate width IdPerW Agilent EasyEXPERT Application Library Reference, Edition 8 18-12...
  • Page 491 1: 1uA, 2: 10uA, 3: 100uA, 4: 1mA, 5: 10mA To set the range event only without the measurement event, enter 0 to the column 2 and set the column 5 and 6. Agilent EasyEXPERT Application Library Reference, Edition 8 18-13...
  • Page 492 IForceRange1: Current measurement range when the sampling measurement is started 1uA, 10uA, 100uA, 1mA, or 10mA This value is effective until the range is changed by the range event. Result_Update_Interval_s: Interval of updating the measurement result. 2 to 100 seconds. Agilent EasyEXPERT Application Library Reference, Edition 8 18-14...
  • Page 493 WGFMU_IV...
  • Page 494 WGFMU Id-Vd (DC) (A.05.03.2013.0124_2013.03.26.1) 3. WGFMU Id-Vd pulse: WGFMU Id-Vd pulse (A.05.03.2013.0124_2013.03.26.1) 4. WGFMU Id-Vg (DC): WGFMU Id-Vg (DC) (A.05.03.2013.0124_2013.03.26.1) 5. WGFMU Id-Vg pulse: WGFMU Id-Vg pulse (A.05.03.2013.0124_2013.03.26.1) 6. WGFMU PLSDIV: WGFMU PLSDIV (A.05.03.2013.0124_2013.03.26.1) Agilent EasyEXPERT Application Library Reference, Edition 8 19-2...
  • Page 495 Disable (does not display PatternValidation data during measurement) Enable_Waveform_MeasTiming (displays Waveform and MeasTiming during measurement) ExecutionMode: Execution mode Run Vector: Performs the waveform output and measurement Pattern Validation: Displays the waveform and measurement setup, for debugging Agilent EasyEXPERT Application Library Reference, Edition 8 19-3...
  • Page 496 Run Vector: Performs the waveform output and measurement Pattern Validation: Displays the waveform and measurement [Measurement Parameters] Id: Drain current [X-Y Plot] X axis: Vd, Drain voltage (LINEAR) Y1 axis: Id, Drain current (LINEAR) [List Display] Vd, Drain voltage Agilent EasyEXPERT Application Library Reference, Edition 8 19-4...
  • Page 497 19 WGFMU_IV Id, Drain current Vg, gate voltage Agilent EasyEXPERT Application Library Reference, Edition 8 19-5...
  • Page 498 Disable (does not display PatternValidation data during measurement) Enable_Waveform_MeasTiming (displays Waveform and MeasTiming during measurement) ExecutionMode: Execution mode Run Vector: Performs the waveform output and measurement Pattern Validation: Displays the waveform and measurement Agilent EasyEXPERT Application Library Reference, Edition 8 19-6...
  • Page 499 19 WGFMU_IV [Measurement Parameters] Id: Drain current [X-Y Plot] X axis: Vd, Drain voltage (LINEAR) Y1 axis: Id, Drain current (LINEAR) [List Display] Vd, Drain voltage Id, Drain current Vg, gate voltage Agilent EasyEXPERT Application Library Reference, Edition 8 19-7...
  • Page 500 Run Vector: Performs the waveform output and measurement Pattern Validation: Displays the waveform and measurement [Measurement Parameters] Id: Drain current [X-Y Plot] X axis: Vg, Gate voltage (LINEAR) Y1 axis: Id, Drain current (LINEAR) [List Display] Vg, gate voltage Agilent EasyEXPERT Application Library Reference, Edition 8 19-8...
  • Page 501 19 WGFMU_IV Id, Drain current Vd, Drain voltage Agilent EasyEXPERT Application Library Reference, Edition 8 19-9...
  • Page 502 Disable (does not display PatternValidation data during measurement) Enable_Waveform_MeasTiming (displays Waveform and MeasTiming during measurement) ExecutionMode: Execution mode Run Vector: Performs the waveform output and measurement Pattern Validation: Displays the waveform and measurement Agilent EasyEXPERT Application Library Reference, Edition 8 19-10...
  • Page 503 19 WGFMU_IV [Measurement Parameters] Id: Drain current [X-Y Plot] X axis: Vg, Gate voltage (LINEAR) Y1 axis: Id, Drain current (LINEAR) [List Display] Vg, gate voltage Id, Drain current Vd, Drain voltage Agilent EasyEXPERT Application Library Reference, Edition 8 19-11...
  • Page 504 Disable (does not display PatternValidation data during measurement) Enable_Waveform_MeasTiming (displays Waveform and MeasTiming during measurement) ExecutionMode: Execution mode Run Vector: Performs the waveform output and measurement Pattern Validation: Displays the waveform and measurement setup, for debugging Agilent EasyEXPERT Application Library Reference, Edition 8 19-12...
  • Page 505 GaN Diode...
  • Page 506 20 GaN Diode Diode Current Collapse IV-t Sampling: GaN Diode Current Collapse characteristics (using N1267A) (A.05.02) Diode Current Collapse Signal Monitor: GaN Diode Current Collapse characteristics (using N1267A) (A.05.03) Agilent EasyEXPERT Application Library Reference, Edition 8 20-2...
  • Page 507 V_HCSMU: Voltage measured by HCSMU I_HCSMU: Current measured by HCSMU V_HVSMU: Voltage measured by HVSMU I_HVSMU: Current measured by HVSMU V_SwitchControl: Voltage measured by Switch Control MCSMU I_SwitchControl: Current measured by Switch Control MCSMU Agilent EasyEXPERT Application Library Reference, Edition 8 20-3...
  • Page 508 R: Resistance (= V / I) Ta: Temperature (= Temp) [X-Y Plot] X axis: Time Y1 axis: R Y2 axis: V Y3 axis: I [List Display] Time V_HCSMU I_HCSMU V_HVSMU I_HVSMU V_SwitchControl I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 20-4...
  • Page 509 V_HCSMU: Voltage measured by HCSMU I_HCSMU: Current measured by HCSMU V: Voltage measured by HVSMU I_HVSMU: Current measured by HVSMU Vsw: Voltage measured by Switch Control MCSMU I_SwitchControl: Current measured by Switch Control MCSMU [User Function] Agilent EasyEXPERT Application Library Reference, Edition 8 20-5...
  • Page 510 R: Drain-Source resistance (= V / I) Ta: Temperature (= Temp) [X-Y Plot] X axis: Time Y1 axis: R Y2 axis: V Y3 axis: I Y4 axis: Vsw [List Display] Time V_HCSMU I_HCSMU I_HVSMU I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 20-6...
  • Page 511 GaN FET...
  • Page 512 GaN FET Current Collapse characteristics (using N1267A) (A.05.03) FET Current Collapse Signal Monitor: GaN FET Current Collapse characteristics (using N1267A) (A.05.03) Id-Vds Current Collapse: GaN FET Current Collapse characteristics (using N1267A) (A.05.02) Agilent EasyEXPERT Application Library Reference, Edition 8 21-2...
  • Page 513 IdOffLimit: Drain current compliance for off state（AUTO: 8mA for VdOff up to 1500V, 4mA for VdOff above 3kV） DischargingSwitchControl: Option for discharging by N1267A internal switch (for the case of on state current less than IdOffLimit) VerboseDataStore: Option for saving data of the embedded classic test setup Agilent EasyEXPERT Application Library Reference, Edition 8 21-3...
  • Page 514 Ig: Gate current (= I_Gate) Ta: Temperature (= Temp) [X-Y Plot] X axis: Time Y1 axis: Rds Y2 axis: Vds Y3 axis: Id [List Display] Time V_HCSMU I_HCSMU V_HVSMU I_HVSMU V_SwitchControl I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 21-4...
  • Page 515 3kV） DischargingSwitchControl: Option for discharging by N1267A internal switch (for the case of on state current less than IdOffLimit) VerboseDataStore: Option for saving data of the embedded classic test setup [Measurement Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 21-5...
  • Page 516 Ig: Gate current (= I_Gate) Ta: Temperature (= Temp) [X-Y Plot] X axis: Time Y1 axis: Rds Y2 axis: Vds Y3 axis: Id [List Display] Time V_HCSMU I_HCSMU V_HVSMU I_HVSMU V_SwitchControl I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 21-6...
  • Page 517 (effective in case of DischargingSwitchControl On) VOnHoldTime: Hold time of VOn output by HCSMU before turning DUT on TimeAxisScale: Option for scale of X axis (Time) VerboseDataStore: Option for saving data of the embedded classic test setup Agilent EasyEXPERT Application Library Reference, Edition 8 21-7...
  • Page 518 Ta: Temperature (= Temp) [X-Y Plot] X axis: Time Y1 axis: Rds Y2 axis: Vds Y3 axis: Id Y4 axis: Vgs [List Display] Time V_HCSMU I_HCSMU I_HVSMU V_SwitchControl I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 21-8...
  • Page 519 VOnHoldTime: Hold time of VOn output by HCSMU before turning DUT on TimeAxisScale: Option for scale of X axis (Time) VerboseDataStore: Option for saving data of the embedded classic test setup [Measurement Parameters] Agilent EasyEXPERT Application Library Reference, Edition 8 21-9...
  • Page 520 Ta: Temperature (= Temp) [X-Y Plot] X axis: Time Y1 axis: Rds Y2 axis: Vds Y3 axis: Id Y4 axis: Vgs [List Display] Time V_HCSMU I_HCSMU I_HVSMU V_SwitchControl I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 21-10...
  • Page 521 IdOffMonitor: Option for measurement of drain current in off state VerboseDataStore: Option for saving data of the embedded classic test setup [Measurement Parameters] V_HCSMU: Voltage measured by HCSMU I_HCSMU: Current measured by HCSMU Agilent EasyEXPERT Application Library Reference, Edition 8 21-11...
  • Page 522 Vgs: Gate-Source voltage (= V_Gate) Ig: Gate current (= I_Gate) Ta: Temperature (= Temp) [X-Y Plot] X axis: Vds Y1 axis: Id [List Display] V_HCSMU I_HCSMU V_HVSMU I_HVSMU V_SwitchControl I_SwitchControl [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 21-12...
  • Page 523 IGBT...
  • Page 524 9. Vce(sat): IGBT Vce(sat) characteristics, SMU Pulse (A.04.00) 10. Vth Vge(off): IGBT Vth or Vge(off) measurement (A.04.00) 11. Ic-Vge for Expanders: Ic-Vge for Expanders (A.05.01.2012.07.31) 12. Vce-Vge: IGBT Vce-Vge characteristics, SMU Pulse (A.05.00) Agilent EasyEXPERT Application Library Reference, Edition 8 22-2...
  • Page 525 [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
  • Page 526 For Scale=LOG10, LOG25, or LOG50: X axis: Collector voltage Vcollector (LOG) Y1 axis: Collector-Emitter capacitance Cce (LOG) [List Display] Collector voltage Vdrain Collector-Emitter capacitance Cce Collector-Emitter current Ice [Parameters Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-4...
  • Page 527 [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
  • Page 528 For Scale=LOG10, LOG25, or LOG50: X axis: Collector voltage Vcollector (LOG) Y1 axis: Gate-Collector capacitance Cgc (LOG) [List Display] Collector voltage Vcollector Gate-Collecotr capacitance Cgc Collector current Icollector [Parameters Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-6...
  • Page 529 [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
  • Page 530 For Scale=LOG10, LOG25, or LOG50: X axis: Collector voltage Vcollector (LOG) Y1 axis: Gate-Emitter capacitance Cge (LOG) [List Display] Collector voltage Vcollector Gate-Emitter capacitance Cge Collector-Emitter current Ice [Parameters Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-8...
  • Page 531 [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Gate-Emitter capacitance Cge Gate-Emitter conductance Gge [User Function] Ta: Temperature Ta=Temp [Analysis Function] Cge0=@MY (Y coordinate of Marker) [Auto Analysis] Marker: Vgate=Vg@Cge0 Agilent EasyEXPERT Application Library Reference, Edition 8 22-9...
  • Page 532 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Gate-Emitter capacitance Cge (LINEAR) [List Display] Gate voltage Vgate Gate-Emitter capacitance Cge Gate-Emitter conductance Gge [Parameter Display Area] Gate-Emitter capacitance for zero bias Cge0 Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-10...
  • Page 533 [Measurement Parameters] Collector current Icollector Gate current Igate [User Function] Ta: Temperature Ta=Temp [Analysis Function] BVces=@MX (X coordinate of Marker) Ices=@L1Y (Y intercept of Line1) [Auto Analysis] Marker: Icollector=Ic@BVces Line1: Vcollector=Vc@Ices [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 22-11...
  • Page 534 Y2 axis: Collector current Icollector (LOG) [List Display] Collector voltage Vcollector Collector current Icollector Gate voltage Vgate Gate current Igate [Parameter Display Area] Collector-Emitter breakdown voltage BVces Collector-Emitter cutoff current Ices Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-12...
  • Page 535 MeasurementTime: Actural measurement time for a pulse period [Measurement Parameters] Collector current Icollector Gate current Igate [User Function] Ta: Temperature Ta=Temp [X-Y Plot] For Scale=LINEAR: X axis: Collector voltage Vcollector (LINEAR) Y axis: Collector current Icollector (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 22-13...
  • Page 536 For Scale=LOG10, LOG25, or LOG50: X axis: Collector voltage Vcollector (LOG) Y axis: Collector current Icollector (LOG) [List Display] Collector voltage Vcollector Collector current Icollector Gate voltage Vgate Gate current Igate [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-14...
  • Page 537 Gate current Igate [User Function] gfe: Forward transconductance gfe=diff(Icollector,Vgate) Ta: Temperature Ta=Temp [Analysis Function] gfeMax=max(gfe) Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Tangent for Y2 data at the point of gfe=gfeMax Agilent EasyEXPERT Application Library Reference, Edition 8 22-15...
  • Page 538 Y2 axis: Collector current Icollector (LINEAR) [List Display] Collector voltage Vcollector Collector current Icollector Gate voltage Vgate Gate current Igate Forward transconductance gfe [Parameter Display] Temperature Ta Maximum value of forward transconductance gfeMax Threshold voltage Vth Agilent EasyEXPERT Application Library Reference, Edition 8 22-16...
  • Page 539 DN: Number of data DN=dim1Size(Index) [X-Y Plot] X axis: Stress time Time (LOG) Y axis: Stress current IStress (LOG) [List Display] Stress time Time Stress current IStress Stress voltage ConstantV [Parameter Display] Temperature Ta Agilent EasyEXPERT Application Library Reference, Edition 8 22-17...
  • Page 540 Y axis: Stress current IStressList (LOG) [Test Output: List Display] Stress time TimeList Stress current IStressList Charge for device failure QbdList [Parameter Display Area] Device failure time Timebd Device failure charge Qbd Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-18...
  • Page 541 [X-Y Plot] For Scale=LINEAR: X axis: Collector current Icollector (LINEAR) Y axis: Collector voltage Vcollector (LINEAR) For Scale=LOG10, LOG25, or LOG50: X axis: Collector current Icollector (LOG) Y axis: Collector voltage Vcollector (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 22-19...
  • Page 542 22 IGBT [List Display] Collector current Icollector Collector voltage Vcollector Gate voltage Vgate Gate current IGate [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 22-20...
  • Page 543 Gate current Igate [User Function] Ta: Temperature Ta=Temp [Analysis Function] In case of Vth measurement, Vth=@MX (X coordinate of Marker) In case of Vge(off) measurement, Vgeoff=@MX (X coordinate of Marker) [Auto Analysis] Marker: Icollector=Ic@Vth_Vgeoff Agilent EasyEXPERT Application Library Reference, Edition 8 22-21...
  • Page 544 Y2 axis: Collector current Icollector (LOG) [List Display] Collector voltage Vcollector Collector current Icollector Gate voltage Vgate Gate current Igate [Parameter Display Area] Temperature Ta=Temp For MeasMode=Vth: Threshold voltage Vth For MeasMode=Vgeoff: Cutoff voltage Vgeoff Agilent EasyEXPERT Application Library Reference, Edition 8 22-22...
  • Page 545 VSrchOffset: Offset voltage to start searching VSrchRange: Minimum search range of collector voltage VSrchPoint: Search step count VSrchLimit: Limit of output voltage during a search Debug: Turn on/off debug mode LoopMax: Maximum loop count for repetitive search Agilent EasyEXPERT Application Library Reference, Edition 8 22-23...
  • Page 546 SearchStat: Status of search termination. 1: Search target is found. -1: Outout voltage over its limit. -2: Measured voltage over its limit. -3: Measured current over its limit. -4: Oscillation or ohter abnormal status is detected. -5: Search loop count over its limit. [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 22-24...
  • Page 547 VceZero: Log scale minimum value for Vce [Measurement Parameters] Collector voltage Vce Gate current Ig [User Function] Ta: Temperature Ta=Temp [X-Y Plot] X axis: Gate voltage Vge (LINEAR) Y1 axis: Collector voltage Vce (LINEAR/LOG) [List Display] Agilent EasyEXPERT Application Library Reference, Edition 8 22-25...
  • Page 548 22 IGBT Collector current Ic Collector voltage Vce Gate voltage Vge Gate current Ig [Parameter Display] Temperature Ta Agilent EasyEXPERT Application Library Reference, Edition 8 22-26...
  • Page 549 Interconnection...
  • Page 550 23 Interconnection Residual R: R-I characteristics of interconnection residual resistance, SMU Pulse (A.04.00) Agilent EasyEXPERT Application Library Reference, Edition 8 23-2...
  • Page 551 For Scale=LINEAR: X axis: Force current If (LINEAR) Y axis: Residual resistance ResidualR (LINEAR) For Scale=LOG10, LOG25, or LOG50: X axis: Force current If (LOG) Y axis: Residual resistance ResidualR (LOG) [List Display] Agilent EasyEXPERT Application Library Reference, Edition 8 23-3...
  • Page 552 23 Interconnection Force current If Measure voltage Vm Residual resistance ResidualR [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 23-4...
  • Page 553 MISCAP...
  • Page 554 24 MISCAP 1. BV: MISCAP Gate-Body breakdown voltage measurement (A.04.00) 2. C(MISCAP): MISCAP C-V characteristics (A.04.00) 3. Ileak-V: MISCAP I-V characteristics (A.04.00) 4. TDDB Constant V: Constant voltage TDDB (A.04.00) Agilent EasyEXPERT Application Library Reference, Edition 8 24-2...
  • Page 555 Marker: Igate=Ileak@BV [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y axis: Gate current Igate (LINEAR) [List Display] Gate current Igate Gate voltage Vgate [Parameter Display Area] Gate-Body breakdown voltage BV Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 24-3...
  • Page 556 [Measurement Parameters] Gate-Body capacitance C Gate-Body conductance G [User Function] Ta: Temperature Ta=Temp [X-Y Plot] X axis: Gate voltage Vgate (LINEAR) Y1 axis: Gate-Body capacitance C (LINEAR) Y2 axis: Gate-Body conductance G (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 24-4...
  • Page 557 24 MISCAP [List Display] Gate voltage Vgate Gate-Body capacitance C Gate-Body conductance G [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 24-5...
  • Page 558 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Gate current Igate (LINEAR) Y2 axis: Gate current Igate (LOG) [List Display] Gate voltage Vgate Gate current Igate [Parameter Display Area] Gate-Body breakdown voltage BV Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 24-6...
  • Page 559 DN: Number of data DN=dim1Size(Index) [X-Y Plot] X axis: Stress time Time (LOG) Y axis: Stress current IStress (LOG) [List Display] Stress time Time Stress current IStress Stress voltage ConstantV [Parameter Display] Temperature Ta Agilent EasyEXPERT Application Library Reference, Edition 8 24-7...
  • Page 560 Y axis: Stress current IStressList (LOG) [Test Output: List Display] Stress time TimeList Stress current IStressList Charge for device failure QbdList [Parameter Display Area] Device failure time Timebd Device failure charge Qbd Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 24-8...
  • Page 561 PowerBJT...
  • Page 562 Ic-Vceo characteristics (A.04.10) 4. Ic-Vces: Ic-Vces characteristics (A.04.10) 5. Ie-Vebo: Ie-Vebo characteristics (A.04.10) 6. Vce(sat)-Ic: Vce(sat)-Ic characteristics (A.05.00) 7. G-Plot for Expanders: G-Plot for Expanders (A.05.03) 8. Ic-Ib for Expanders: Ic-Ib for Expanders (A.05.03) Agilent EasyEXPERT Application Library Reference, Edition 8 25-2...
  • Page 563 X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Y2 axis: Collector current Icollector (LOG) [List Display] Collector voltage Vcollector Collector current Icollector [Parameter Display Area] Collector-Base breakdown voltage BVcbo Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-3...
  • Page 564 IbPulseDelayTime: Delay time of Base current pulse MeasurementTime: Actural measurement time for a pulse period [Measurement Parameters] Collector voltage Vcollector Collector current Icollector Base voltage Vbase Base current Ibase [User Function] Ta: Temperature Ta=Temp [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 25-4...
  • Page 565 25 PowerBJT X axis: Collector voltage Vcollector (LINEAR) Y axis: Collector current Icollector (LINEAR) [List Display] Collector voltage Vcollector Collector current Icollector Base voltage Vbase Base current Ibase [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-5...
  • Page 566 X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Y2 axis: Collector current Icollector (LOG) [List Display] Collector voltage Vcollector Collector current Icollector [Parameter Display Area] Collector-Emitter breakdown voltage BVceo Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-6...
  • Page 567 Ta: Temperature Ta=Temp [Analysis Function] BVces=@MX (X coordinate of Marker) [Auto Analysis] Marker: Icollector=Ic@BVces [X-Y Plot] X axis: Collector voltage Vcollector (LINEAR) Y1 axis: Collector current Icollector (LINEAR) Y2 axis: Collector current Icollector (LOG) Agilent EasyEXPERT Application Library Reference, Edition 8 25-7...
  • Page 568 25 PowerBJT [List Display] Collector voltage Vcollector Collector current Icollector Base voltage Vbase Base current Ibase [Parameter Display Area] Collector-Emitter breakdown voltage BVces Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-8...
  • Page 569 X axis: Emitter voltage Vemitter (LINEAR) Y1 axis: Emitter current Iemitter (LINEAR) Y2 axis: Emitter current Iemitter (LOG) [List Display] Emitter voltage Vemitter Emitter current Iemitter [Parameter Display Area] Emitter-Base breakdown voltage BVebo Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-9...
  • Page 570 VbZero: Y2 axis (Vbase) minimum value MeasurementTime: Actural measurement time for a pulse period [Measurement Parameters] Collector voltage Vcollector Collector current Icollector Base voltage Vbase Base current Ibase [User Function] Ta: Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-10...
  • Page 571 X axis: Collector current Icollector (LOG) Y1 axis: Collector voltage Vcollector (LOG) Y2 axis: Base voltage Vbase (LOG) [List Display] Collector voltage Vcollector Collector current Icollector Base voltage Vbase Base current Ibase [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 25-11...
  • Page 572 VSrchOffset: Offset voltage to start searching VSrchRange: Minimum search range of collector voltage VSrchPoint: Search step count VSrchLimit: Limit of output voltage during a search Debug: Turn on/off debug mode LoopMax: Maximu loop count for repetitive search Agilent EasyEXPERT Application Library Reference, Edition 8 25-12...
  • Page 573 SearchStat: Status of search termination. 1: Search target is found. -1: Outout voltage over its limit. -2: Measured voltage over its limit. -3: Measured current over its limit. -4: Oscillation or ohter abnormal status is detected. -5: Search loop count over its limit. [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 25-13...
  • Page 574 VSrchOffset: Offset voltage to start searching VSrchRange: Minimum search range of collector voltage VSrchPoint: Search step count VSrchLimit: Limit of output voltage during a search Debug: Turn on/off debug mode LoopMax: Maximu loop count for repetitive search Agilent EasyEXPERT Application Library Reference, Edition 8 25-14...
  • Page 575 SearchStat: Status of search termination. 1: Search target is found. -1: Outout voltage over its limit. -2: Measured voltage over its limit. -3: Measured current over its limit. -4: Oscillation or ohter abnormal status is detected. -5: Search loop count over its limit. [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 25-15...
  • Page 576 25 PowerBJT Agilent EasyEXPERT Application Library Reference, Edition 8 25-16...
  • Page 577 PowerDiode...
  • Page 578 26 PowerDiode Cj-Vr: Junction capacitance Cj-Vr characteristics (A.05.50) If-Vf: Diode forward bias characteristics, SMU voltage pulse (A.05.00) Ir-Vr: Diode reverse bias characteristics (A.05.00) Diode forward bias characteristics, SMU current pulse (A.05.00) Agilent EasyEXPERT Application Library Reference, Edition 8 26-2...
  • Page 579 Or, connect Cathode and Anode to the Test Fixture MFCMU High and MFCMU Low respectively. [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Temp: Temperature...
  • Page 580 Y1 axis: Junction capacitance Cj (LINEAR) Y2 axis: Junction capacitance Cj (LOG) Y3 axis: Reverse current Ir (LOG) [List Display] Reverse bias Vr Junction Capacitance Cj Reverse current Ir [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 26-4...
  • Page 581 For Scale=LOG10, LOG25, or LOG50: X axis: Forward voltage Vf (LOG) Y1 axis: Forward current If (LINEAR) Y2 axis: Forward current If (LOG) [List Display] Forward voltage Vf Forward current If [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 26-5...
  • Page 582 Marker: Vr=VrSpec@Ir [X-Y Plot] X axis: Reverse voltage Vr (LINEAR) Y axis: Reverse current Ir (LINEAR) [List Display] Reverse voltage Vr Reverse current Ir [Parameter Display Area] Reverse current Ir@VrSpec Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 26-6...
  • Page 583 [Analysis Function] Vf@IfSpec=@MX (X coordinate of Marker) [Auto Analysis] Marker: If=IfSpec@Vf [X-Y Plot] X axis: Forward voltage Vf (LINEAR) Y axis: Forward current If (LINEAR) [List Display] Forward Current If Forward Voltage Vf Agilent EasyEXPERT Application Library Reference, Edition 8 26-7...
  • Page 584 26 PowerDiode [Parameter Display Area] Forward voltage Vf@IfSpec Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 26-8...
  • Page 585 PowerMOSFET, PMIC, SiC...
  • Page 586 9. TDDB Constant V: Constant voltage TDDB (A.04.10) 10. Vth Vgs(off): Vth or Vgs(off) measurement (A.05.00) 11. Ic-Vge for Expanders: Ic-Vge for Expanders (A.05.01) 12. Vds-Vgs: Vds-Vgs characteristics, Rds-Vgs characteristics, SMU Pulse (A.05.00) Agilent EasyEXPERT Application Library Reference, Edition 8 27-2...
  • Page 587 [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
  • Page 588 For Scale=LOG10, LOG25, or LOG50: X axis: Drain voltage Vdrain (LOG) Y1 axis: Drain-Source capacitance Cds (LOG) [List Display] Drain voltage Vdrain Drain-Source capacitance Cds Drain-Source current Ids [Parameters Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-4...
  • Page 589 [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
  • Page 590 For Scale=LOG10, LOG25, or LOG50: X axis: Drain voltage Vdrain (LOG) Y1 axis: Gate-Drain capacitance Cgd (LOG) [List Display] Drain voltage Vdrain Gate-Drain capacitance Cgd Drain current Idrain [Parameters Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-6...
  • Page 591 [Required Modules and Accessories] Agilent B1520A MFCMU 1 unit Agilent N1260A High Voltage Bias-T or Agilent N1259A Test Fixture with the option N1259A-020 [Device Parameters] Polarity: Nch (SMU forces the specified value) or Pch (SMU forces the negative specified value).
  • Page 592 For Scale=LOG10, LOG25, or LOG50: X axis: Drain voltage Vdrain (LOG) Y1 axis: Gate-Source capacitance Cgs (LOG) [List Display] Drain voltage Vdrain Gate-Source capacitance Cgs Drain-Source current Ids [Parameters Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-8...
  • Page 593 [Extended Test Parameters] HoldTime: Hold time DelayTime: Delay time [Measurement Parameters] Gate-Source capacitance Cgs Gate-Source conductance Ggs [User Function] Ta: Temperature Ta=Temp [Analysis Function] Cgs0=@MY (Y coordinate of Marker) [Auto Analysis] Marker: Vgate=Vg@Cgs0 Agilent EasyEXPERT Application Library Reference, Edition 8 27-9...
  • Page 594 X axis: Gate voltage Vgate (LINEAR) Y1 axis: Gate-Source capacitance Cgs (LINEAR) [List Display] Gate voltage Vgate Gate-Source capacitance Cgs Gate-Source conductance Ggs [Parameter Display Area] Gate-Source capacitance at zero bias Cgs0 Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-10...
  • Page 595 [Measurement Parameters] Drain current Idrain Gate current Igate [User Function] Ta: Temperature Ta=Temp [Analysis Function] BVdss=@MX (X coordinate of Marker) Idss=@L1Y (Y intercept of Line1) [Auto Analysis] Marker: Idrain=Id@BVdss Line1: Vdrain=Vd@Idss [X-Y Plot] Agilent EasyEXPERT Application Library Reference, Edition 8 27-11...
  • Page 596 Y2 axis: Drain current Idrain (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Gate current Igate [Parameter Display Area] Drain-Source breakdown voltage BVdss Drain-Source cutoff current Idss Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-12...
  • Page 597 MeasurementTime: Actural measurement time for a pulse period [Measurement Parameters] Drain current Idrain Gate current Igate [User Function] Ta: Temperature Ta=Temp [X-Y Plot] For Scale=LINEAR: X axis: Drain voltage Vdrain (LINEAR) Y axis: Drain current Idrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 27-13...
  • Page 598 For Scale=LOG10, LOG25, or LOG50: X axis: Drain voltage Vdrain (LOG) Y axis: Drain current Idrain (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Gate current Igate [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-14...
  • Page 599 Gate current Igate [User Function] gfs: Forward transconductance gfs=diff(Idrain,Vgate) Ta: Temperature Ta=Temp [Analysis Function] gfsMax=max(gfs) Vth=@L1X (X intercept of Line1) [Auto Analysis] Line1: Tangent for Y2 data at the point of gfs=gfsMax Agilent EasyEXPERT Application Library Reference, Edition 8 27-15...
  • Page 600 Y2 axis: Drain current Idrain (LINEAR) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Gate current Igate Forward transconductance gfs [Parameter Display Area] Temperature Ta=Temp Maximum value of forward transconductance gfsMax Threshold voltage Vth Agilent EasyEXPERT Application Library Reference, Edition 8 27-16...
  • Page 601 MeasurementTime: Actural measurement time for a pulse period [Measurement Parameters] Drain voltage Vdrain Gate current Igate Drain-Source resistance Rds [User Function] Ta: Temperature Ta=Temp Rds: Drain-Source resistance Rds=Vdrain/Idrain [X-Y Plot] For Scale=LINEAR: X axis: Drain current Idrain (LINEAR) Agilent EasyEXPERT Application Library Reference, Edition 8 27-17...
  • Page 602 X axis: Drain current Idrain (LOG) Y axis: Drain-Source resistance Rds (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Gate current IGate Drain-Source resistance Rds [Parameter Display Area] Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-18...
  • Page 603 DN: Number of data DN=dim1Size(Index) [X-Y Plot] X axis: Stress time Time (LOG) Y axis: Stress current IStress (LOG) [List Display] Stress time Time Stress current IStress Stress voltage ConstantV [Parameter Display] Temperature Ta Agilent EasyEXPERT Application Library Reference, Edition 8 27-19...
  • Page 604 Y axis: Stress current IStressList (LOG) [Test Output: List Display] Stress time TimeList Stress current IStressList Charge for device failure QbdList [Parameter Display Area] Device failure time Timebd Device failure charge Qbd Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-20...
  • Page 605 [Measurement Parameters] Drain current Idrain Gate current Igate [User Function] Ta: Temperature Ta=Temp [Analysis Function] For MeasMode=Vth: Vth=@MX (X coordinate of Marker) For MeasMode=Vgsoff: Vgsoff=@MX (X coordinate of Marker) [Auto Analysis] Marker: Idrain=Id@Vth_Vgsoff Agilent EasyEXPERT Application Library Reference, Edition 8 27-21...
  • Page 606 Y2 axis: Drain current Idrain (LOG) [List Display] Drain voltage Vdrain Drain current Idrain Gate voltage Vgate Gate current Igate [Parameter Display Area] Temperature Ta=Temp For MeasMode=Vth: Threshold voltage Vth For MeasMode=Vgsoff: Cutoff voltage Vgsoff Agilent EasyEXPERT Application Library Reference, Edition 8 27-22...
  • Page 607 VSrchOffset: Offset voltage to start searching VSrchRange: Minimum search range of collector voltage VSrchPoint: Search step count VSrchLimit: Limit of output voltage during a search Debug: Turn on/off debug mode LoopMax: Maximum loop count for repetitive search Agilent EasyEXPERT Application Library Reference, Edition 8 27-23...
  • Page 608 SearchStat: Status of search termination. 1: Search target is found. -1: Outout voltage over its limit. -2: Measured voltage over its limit. -3: Measured current over its limit. -4: Oscillation or ohter abnormal status is detected. -5: Search loop count over its limit. [Parameter Display Area] Agilent EasyEXPERT Application Library Reference, Edition 8 27-24...
  • Page 609 RdsScale: Graph scale option for Rds RdsZero: Log scale minimum value for Rds RdsMax: Scale maximum value for Rds [Measurement Parameters] Drain voltage Vds Gate current Ig Drain-Source resistance Rds [User Function] Ta: Temperature Ta=Temp Agilent EasyEXPERT Application Library Reference, Edition 8 27-25...
  • Page 610 Y1 axis: Drain voltage Vds (LINEAR/LOG) Y2 axis: Drain-Source resistance Rds (LINEAR/LOG) [List Display] Drain current Id Drain voltage Vds Drain-Source resistance Rds Gate voltage Vgs Gate current Ig [Parameter Display] Temperature Ta Agilent EasyEXPERT Application Library Reference, Edition 8 27-26...

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