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No
AEC-Q200 Test Item
14 Thermal Shock
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
No marking defects
Within ±2.5% or ±0.25pF
Capacitance
Change
(Whichever is larger)
Q/D.F.
30pFmin. : Q≧1000
30pFmax.: Q ≧400+20C
More than 10,000MΩ or 500Ω・F
I.R.
(Whichever is smaller)
15 ESD
Appearance
No marking defects
Capacitance
Within the specified tolerance
Change
Q/D.F.
30pFmin. : Q≧1000
30pFmax.: Q ≧400+20C
More than 10,000MΩ or 500Ω・F
I.R.
(Whichever is smaller)
95% of the terminations is to be soldered evenly and continuously.
16 Solderability
17 Electrical
Appearance
No defects or abnormalities
Chatacteri-
Capacitance
Within the specified tolerance
zation
Change
30pFmin. : Q≧1000
Q/D.F.
30pFmax.: Q ≧400+20C
More than 100,000MΩ or 1000Ω・F
I.R. 25℃
(Whichever is smaller)
More than 10,000MΩ or 100Ω・F
I.R. 125℃
(Whichever is smaller)
More than 10,000MΩ or 100Ω・F
I.R. 150℃
(Whichever is smaller)
No failure
Dielectric
Strength
JEMCGS-0363S
Specification.
Temperature
Compensating Type
R7/L8/R9: Within ±10.0%
R7/L8 : W.V.: 25Vmin.: 0.025 max.*
*0.05max:GCM188R71E/1H563 to 104
C: Nominal Capacitance(pF)
R9 : 0.05max
R7/L8 : W.V.: 25Vmin.: 0.025 max.
C: Nominal Capacitance(pF)
R9 : 0.05max.
R7/L8 : W.V.: 25Vmin.: 0.025 max.
C: Nominal Capacitance(pF)
R9 : 0.05max.
More than 10,000MΩ or 500Ω・F
(Whichever is smaller)
More than 1,000MΩ or 10Ω・F
(Whichever is smaller)
More than 1,000MΩ or 1Ω・F
(Whichever is smaller)
■AEC-Q200 Murata Standard Specification and Test Methods
High Dielectric Type
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (19). Perform the 300 cycles according to
the two heat treatments listed in the following table(Maximum
transfer time is 20 seconds). Set for 24±2 hours at room
temperature, then measure
W.V.: 16V/10V : 0.035 max.
・ Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
Per AEC-Q200-002
W.V.: 16V/10V :0.035 max.
(a) Preheat at 155℃ for 4 hours. After preheating, immerse the
capacitor in a solution of ethanol(JIS-K-8101) and rosin (JIS-K-
5902) (25% rosin in weight propotion). Immerse in
eutectic solder solution for 5+0/-0.5 seconds at 235±5℃.
(b) should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in weight
propotion). Immerse in eutectic solder solution for 5+0/-0.5
seconds at 235±5℃.
(c) should be placed into steam aging for 8 hours±15 minutes.
After preheating, immerse the capacitor in a solution of
ethanol(JIS-K-8101) and rosin (JIS-K-5902) (25% rosin in weight
propotion). Immerse in eutectic solder solution for 120±5
seconds at 260±5℃.
Visual inspection.
The capacitance/Q/D.F. should be measured at 25℃ at the
frequency and voltage shown in the table.
W.V.: 16V/10V : 0.035 max.
The insulation resistance should be measured with a DC voltage not
exceeding the rated voltage at 25℃ and 125℃(for Δ C/R7)/ 150℃
（for 5G/L8/R9）within 2 minutes of charging.
No failure should be observed when 250% of the rated voltage is
applied between the terminations for 1 to 5 seconds, provided the
charge/ discharge current is less than 50mA.
4
AEC-Q200 Test Method
Step
1
125+3/-0(forΔC/R7)
Temp.(℃）
-55+0/-3
150+3/-0（for 5G/L8/R9）
Time
15±3
(min.）
Char.
ΔC,5G
(1000 pF and below)
Item
Frequency
1±0.1MHz
Voltage
0.5 to 5Vrms
2
15±3
ΔC,5G
(more than 1000pF)
R7,R9,L8(C≦10μF)
1±0.1kHz
1±0.2Vrms
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