Page 1 — R E L I O N ® 670 SERIES Transformer protection RET670 Version 2.1 ANSI Commissioning manual...
Page 4 Copyright This document and parts thereof must not be reproduced or copied without written permission from ABB, and the contents thereof must not be imparted to a third party, nor used for any unauthorized purpose. The software and hardware described in this document is furnished under a license and may be used or disclosed only in accordance with the terms of such license.
Page 5 In case any errors are detected, the reader is kindly requested to notify the manufacturer. Other than under explicit contractual commitments, in no event shall ABB be responsible or liable for any loss or damage resulting from the use of this manual or the application of the equipment.
Page 6 Directive 2004/108/EC) and concerning electrical equipment for use within specified voltage limits (Low-voltage directive 2006/95/EC). This conformity is the result of tests conducted by ABB in accordance with the product standard EN 60255-26 for the EMC directive, and with the product standards EN 60255-1 and EN 60255-27 for the low voltage directive.
Page 7: Table Of Contents
Table of contents Table of contents Section 1 Introduction......................11 This manual...............................11 Intended audience...........................11 Product documentation........................12 1.3.1 Product documentation set......................12 1.3.2 Document revision history........................13 1.3.3 Related documents..........................13 Document symbols and conventions....................14 1.4.1 Symbols..............................14 1.4.2 Document conventions........................15 IEC61850 edition 1 / edition 2 mapping.....................15 Section 2 Safety information....................23...
Page 8 Table of contents 4.10.2 Binary output circuits........................48 4.11 Checking optical connections......................48 Section 5 Configuring the IED and changing settings............51 Overview..............................51 Configuring analog CT inputs......................51 Reconfiguring the IED..........................52 Section 6 Establishing connection and verifying the SPA/IEC communication..... 53 Entering settings............................
Page 9 Table of contents 9.8.2.2 Enable forcing using TESTMODE function block..............70 9.8.3 How to change binary input/output signals using forcing............70 9.8.3.1 Forcing by using LHMI........................71 9.8.3.2 Forcing by using PCM600......................72 9.8.4 How to undo forcing changes and return the IED to normal operation......... 74 9.8.4.1 Undo forcing by using TestMode component................
Page 10 Table of contents 10.4.5.1 Measuring the operating limit of set values................96 10.4.5.2 Measuring the operating time of distance protection zones..........96 10.4.6 Phase selection, quadrilateral characteristic with settable angle FRPSPDIS (21)....97 10.4.6.1 Measuring the operating limit of set values................99 10.4.6.2 Completing the test........................
Page 11 Table of contents 10.4.15 Under impedance protection for Generator ZGVPDIS..............134 10.4.15.1 Verifying the settings........................134 10.4.15.2 Completing the test........................137 10.5 Current protection..........................137 10.5.1 Instantaneous phase overcurrent protection 3-phase output PHPIOC (50)......137 10.5.1.1 Measuring the trip limit of set values..................138 10.5.1.2 Completing the test........................
Page 12 Table of contents 10.5.10.2 Completing the test........................155 10.5.11 Directional underpower protection GUPPDUP (37)..............155 10.5.11.1 Verifying the settings........................155 10.5.11.2 Completing the test........................156 10.5.12 Directional overpower protection GOPPDOP (32)..............157 10.5.12.1 Verifying the settings........................157 10.5.12.2 Completing the test........................157 10.5.13 Broken conductor check BRCPTOC (46)..................157 10.5.13.1 Measuring the trip and time limit of set values..............
Page 13 Table of contents 10.7.1 Underfrequency protection SAPTUF (81)..................176 10.7.1.1 Verifying the settings........................176 10.7.1.2 Completing the test........................177 10.7.2 Overfrequency protection SAPTOF (81)..................177 10.7.2.1 Verifying the settings........................177 10.7.2.2 Completing the test........................178 10.7.3 Rate-of-change frequency protection SAPFRC (81)..............178 10.7.3.1 Verifying the settings........................178 10.7.3.2...
Page 14 Table of contents 10.10.3.5 Check the upper and lower busbar voltage limit..............198 10.10.3.6 Check the overcurrent block function..................198 10.10.3.7 Single transformer........................198 10.10.3.8 Parallel voltage regulation......................199 10.10.3.9 Completing the test........................203 10.10.4 Single command, 16 signals SINGLECMD................... 203 10.10.5 Interlocking............................
Page 15 Table of contents 10.16 Remote communication........................216 10.16.1 Binary signal transfer BinSignReceive, BinSignTransm............216 10.17 Basic IED functions..........................217 10.17.1 Parameter setting group handling SETGRPS................217 10.17.1.1 Verifying the settings........................217 10.17.1.2 Completing the test........................218 10.18 Exit test mode............................218 Section 11 Primary injection testing..................219 11.1 Transformer Voltage Control ATCC....................
Page 16 Table of contents 14.2.4 Hardware re-configuration......................236 14.3 Repair instruction..........................237 14.4 Repair support............................238 14.5 Maintenance............................238 Section 15 Glossary.........................239 Commissioning manual...
Page 17: Introduction
1MRK 504 154-UUS B Section 1 Introduction Section 1 Introduction This manual GUID-AB423A30-13C2-46AF-B7FE-A73BB425EB5F v19 The commissioning manual contains instructions on how to commission the IED. The manual can also be used by system engineers and maintenance personnel for assistance during the testing phase.
Page 18: Product Documentation
Section 1 1MRK 504 154-UUS B Introduction Product documentation 1.3.1 Product documentation set GUID-3AA69EA6-F1D8-47C6-A8E6-562F29C67172 v15 Engineering manual Installation manual Commissioning manual Operation manual Application manual Technical manual Communication protocol manual Cyber security deployment guideline IEC07000220-4-en.vsd IEC07000220 V4 EN-US Figure 1: The intended use of manuals throughout the product lifecycle The engineering manual contains instructions on how to engineer the IEDs using the various tools available within the PCM600 software.
Page 19: Document Revision History
Document revision/date History January 2016 First Release March 2019 Maintenance Release 1.3.3 Related documents GUID-94E8A5CA-BE1B-45AF-81E7-5A41D34EE112 v4 Documents related to RET670 Document numbers Application manual 1MRK 504 152-UUS Commissioning manual 1MRK 504 154-UUS Product guide 1MRK 504 155-BEN Technical manual 1MRK 504 153-UUS...
Page 20: Document Symbols And Conventions
Section 1 1MRK 504 154-UUS B Introduction 670 series manuals Document numbers Communication protocol manual, IEC 61850 Edition 2 1MRK 511 350-UEN Point list manual, DNP3 1MRK 511 354-UUS Accessories guide 1MRK 514 012-BUS Connection and Installation components 1MRK 513 003-BEN Test system, COMBITEST 1MRK 512 001-BEN Document symbols and conventions...
Page 21: Document Conventions
1MRK 504 154-UUS B Section 1 Introduction performance leading to personal injury or death. It is important that the user fully complies with all warning and cautionary notices. 1.4.2 Document conventions GUID-96DFAB1A-98FE-4B26-8E90-F7CEB14B1AB6 v8 • Abbreviations and acronyms in this manual are spelled out in the glossary. The glossary also contains definitions of important terms.
Page 22 Section 1 1MRK 504 154-UUS B Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes BUSPTRC_B2 BUSPTRC BUSPTRC BUSPTRC_B3 BUSPTRC BUSPTRC BUSPTRC_B4 BUSPTRC BUSPTRC BUSPTRC_B5 BUSPTRC BUSPTRC BUSPTRC_B6 BUSPTRC BUSPTRC BUSPTRC_B7 BUSPTRC BUSPTRC BUSPTRC_B8 BUSPTRC BUSPTRC BUSPTRC_B9 BUSPTRC BUSPTRC BUSPTRC_B10...
Page 23 1MRK 504 154-UUS B Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes BZNTPDIF_A BZNTPDIF BZATGAPC BZATPDIF BZNTGAPC BZNTPDIF BZNTPDIF_B BZNTPDIF BZBTGAPC BZBTPDIF BZNTGAPC BZNTPDIF CBPGAPC CBPLLN0 CBPMMXU CBPMMXU CBPPTRC CBPPTRC HOLPTOV HOLPTOV HPH1PTOV HPH1PTOV PH3PTOC PH3PTUC PH3PTUC...
Page 24 Section 1 1MRK 504 154-UUS B Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes EF4PTOC EF4LLN0 EF4PTRC EF4PTRC EF4RDIR EF4RDIR GEN4PHAR GEN4PHAR PH1PTOC PH1PTOC EFPIOC EFPIOC EFPIOC EFRWPIOC EFRWPIOC EFRWPIOC ETPMMTR ETPMMTR ETPMMTR FDPSPDIS FDPSPDIS FDPSPDIS FMPSPDIS FMPSPDIS FMPSPDIS...
Page 25 1MRK 504 154-UUS B Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes LCCRPTRC LCCRPTRC LCCRPTRC LCNSPTOC LCNSPTOC LCNSPTOC LCNSPTOV LCNSPTOV LCNSPTOV LCP3PTOC LCP3PTOC LCP3PTOC LCP3PTUC LCP3PTUC LCP3PTUC LCPTTR LCPTTR LCPTTR LCZSPTOC LCZSPTOC LCZSPTOC LCZSPTOV LCZSPTOV LCZSPTOV LD0LLN0...
Page 26 Section 1 1MRK 504 154-UUS B Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes OV2PTOV GEN2LLN0 OV2PTOV OV2PTOV PH1PTRC PH1PTRC PAPGAPC PAPGAPC PAPGAPC PCFCNT PCGGIO PCFCNT PH4SPTOC GEN4PHAR GEN4PHAR OCNDLLN0 PH1BPTOC PH1BPTOC PH1PTRC PH1PTRC PHPIOC PHPIOC PHPIOC PRPSTATUS RCHLCCH...
Page 27 1MRK 504 154-UUS B Section 1 Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes SSIMG SSIMG SSIMG SSIML SSIML SSIML STBPTOC STBPTOC BBPMSS STBPTOC STEFPHIZ STEFPHIZ STEFPHIZ STTIPHIZ STTIPHIZ STTIPHIZ SXCBR SXCBR SXCBR SXSWI SXSWI SXSWI T2WPDIF T2WPDIF T2WGAPC...
Page 28 Section 1 1MRK 504 154-UUS B Introduction Function block name Edition 1 logical nodes Edition 2 logical nodes ZC1WPSCH ZPCWPSCH ZPCWPSCH ZCLCPSCH ZCLCPLAL ZCLCPSCH ZCPSCH ZCPSCH ZCPSCH ZCRWPSCH ZCRWPSCH ZCRWPSCH ZCVPSOF ZCVPSOF ZCVPSOF ZGVPDIS ZGVLLN0 PH1PTRC PH1PTRC ZGVPDIS ZGVPDIS ZGVPTUV ZGVPTUV ZMCAPDIS ZMCAPDIS...
Page 29: Safety Information
1MRK 504 154-UUS B Section 2 Safety information Section 2 Safety information Symbols on the product GUID-E48F2EC3-6AB8-4ECF-A77E-F16CE45CA5FD v2 All warnings must be observed. Read the entire manual before doing installation or any maintenance work on the product. All warnings must be observed. Class 1 Laser product.
Page 30: Caution Signs
Section 2 1MRK 504 154-UUS B Safety information M2364-2 v1 Always use suitable isolated test pins when measuring signals in open circuitry. Potentially lethal voltages and currents are present. M2370-2 v1 Never connect or disconnect a wire and/or a connector to or from a IED during normal operation.
Page 31: Note Signs
1MRK 504 154-UUS B Section 2 Safety information GUID-F2A7BD77-80FB-48F0-AAE5-BE73DE520CC2 v1 The IED contains components which are sensitive to electrostatic discharge. ESD precautions shall always be observed prior to touching components. M2695-2 v2 Always transport PCBs (modules) using certified conductive bags. M2696-2 v1 Do not connect live wires to the IED.
Page 33: Available Functions
= number of basic instances = option quantities 3-A03 = optional function included in packages A03 (refer to ordering details) IEC 61850 ANSI Function description Transformer Transfor RET670 (Customized) Differential protection T2WPDIF Transformer differential protection, two winding T3WPDIF Transformer differential protection, three winding...
Page 34: Back-Up Protection Functions
Section 3 1MRK 504 154-UUS B Available functions IEC 61850 ANSI Function description Transformer Transfor RET670 (Customized) ZDARDIR Additional distance protection directional function for ground faults ZSMGAPC Mho impedance supervision logic FMPSPDIS Faulty phase identification with load enchroachment ZMRPDIS, Distance protection zone, quadrilateral...
Page 35 1MRK 504 154-UUS B Section 3 Available functions IEC 61850 ANSI Function description Transformer RET670 (Customized) NS4PTOC 46I2 Four step directional negative phase sequence overcurrent protection SDEPSDE Sensitive directional residual overcurrent and power protection LCPTTR Thermal overload protection, one time 0–2...
Page 36: Control And Monitoring Functions
Available functions Control and monitoring functions GUID-E3777F16-0B76-4157-A3BF-0B6B978863DE v12 IEC 61850 ANSI Function description Transformer Transfo rmer RET670 Control SESRSYN Synchrocheck, energizing check and synchronizing APC15 Apparatus control for single bay, max 15 apparatuses (2CBs) incl. interlocking APC30 Apparatus control for up to 6 bays, max 30 apparatuses (6CBs) incl.
Page 37 1MRK 504 154-UUS B Section 3 Available functions IEC 61850 ANSI Function description Transformer Transfo rmer RET670 I103USRCMD Function commands user defined for IEC 60870-5-103 Secondary system supervision CCSSPVC Current circuit supervision FUFSPVC Fuse failure supervision VDSPVC Fuse failure supervision based on voltage...
Page 38 1MRK 504 154-UUS B Available functions IEC 61850 ANSI Function description Transformer Transfo rmer RET670 ITBGAPC Integer to Boolean 16 conversion with Logic Node representation TEIGAPC Elapsed time integrator with limit transgression and overflow supervision INTCOMP Comparator for integer inputs...
Page 39 1MRK 504 154-UUS B Section 3 Available functions IEC 61850 ANSI Function description Transformer Transfo rmer RET670 I103USRDEF Status for user defined signals for IEC 60870-5-103 L4UFCNT Event counter with limit supervision TEILGAPC Running hour-meter Metering PCFCNT Pulse-counter logic ETPMMTR...
Page 40: Communication
SRMEMORY TIMERSET VSGAPC Communication GUID-5F144B53-B9A7-4173-80CF-CD4C84579CB5 v12 IEC 61850 ANSI Function description Transformer Transfor RET670 (Customized) Station communication LONSPA, SPA SPA communication protocol LON communication protocol HORZCOMM Network variables via LON PROTOCOL Operation selection between SPA and IEC 60870-5-103 for SLM...
Page 41 1MRK 504 154-UUS B Section 3 Available functions IEC 61850 ANSI Function description Transformer Transfor RET670 (Customized) DNPFREC DNP3.0 fault records for TCP/IP and EIA-485 communication protocol IEC 61850-8-1 Parameter setting function for IEC 61850 GOOSEINTLKRCV Horizontal communication via GOOSE for...
Page 42: Basic Ied Functions
Section 3 1MRK 504 154-UUS B Available functions IEC 61850 ANSI Function description Transformer Transfor RET670 (Customized) Remote communication Binary signal transfer receive/transmit 6/36 6/36 Transmission of analog data from LDCM Receive binary status from remote LDCM 6/3/3 6/3/3 Scheme communication...
Page 43 1MRK 504 154-UUS B Section 3 Available functions IEC 61850 or function Description name 3PHSUM Summation block 3 phase ATHSTAT Authority status ATHCHCK Authority check AUTHMAN Authority management FTPACCS FTP access with password SPACOMMMAP SPA communication mapping SPATD Date and time via SPA protocol DOSFRNT Denial of service, frame rate control for front port DOSLANAB...
Page 45: Starting Up
1MRK 504 154-UUS B Section 4 Starting up Section 4 Starting up Factory and site acceptance testing GUID-38C2B5FA-9210-4D85-BA21-39CE98A1A84A v2 Testing the proper IED operation is carried out at different occasions, for example: • Acceptance testing • Commissioning testing • Maintenance testing This manual describes the workflow and the steps to carry out the commissioning testing.
Page 46: Checking The Power Supply
Section 4 1MRK 504 154-UUS B Starting up Checking the power supply M11725-2 v6 Do not insert anything else to the female connector but the corresponding male connector. Inserting anything else (such as a measurement probe) may damage the female connector and prevent a proper electrical contact between the printed circuit board and the external wiring connected to the screw terminal block.
Page 47: Setting Up Communication Between Pcm600 And The Ied
1MRK 504 154-UUS B Section 4 Starting up t (s) xx04000310-1-en.vsd IEC04000310 V2 EN-US Figure 2: Typical IED start-up sequence 1 IED energized. Green LED instantly starts flashing 2 LCD lights up and "IED startup" is displayed 3 The main menu is displayed. A steady green light indicates a successful startup. If the upper row in the window indicates ‘Fail’...
Page 48 Section 4 1MRK 504 154-UUS B Starting up address when the IED is delivered. The IP adress and the subnetwork mask might have to be reset when an additional Ethernet interface is installed or an interface is replaced. • The default IP address for the IED front port is 10.1.150.3 and the corresponding subnetwork mask is 255.255.255.0, which can be set via the local HMI path Main menu/Configuration/ Communication/Ethernet configuration/FRONT:1.
Page 49 1MRK 504 154-UUS B Section 4 Starting up IEC13000057-1-en.vsd IEC13000057 V1 EN-US Figure 4: Select: Search programs and files Type View network connections and click on the View network connections icon. Commissioning manual...
Page 50 Section 4 1MRK 504 154-UUS B Starting up IEC13000058-1-en.vsd IEC13000058 V1 EN-US Figure 5: Click View network connections Right-click and select Properties. IEC13000059-1-en.vsd IEC13000059 V1 EN-US Figure 6: Right-click Local Area Connection and select Properties Select the TCP/IPv4 protocol from the list of configured components using this connection and click Properties.
Page 51 1MRK 504 154-UUS B Section 4 Starting up IEC13000060-1-en.vsd IEC13000060 V1 EN-US Figure 7: Select the TCP/IPv4 protocol and open Properties IP address and Subnet mask if the front port is Select Use the following IP address and define IP address is not set to be obtained automatically by the IED, see used and if the Figure 8.
Page 52: Writing An Application Configuration To The Ied
Section 4 1MRK 504 154-UUS B Starting up The PC and IED must belong to the same subnetwork for this set-up to work. Setting up the PC to access the IED via a network The same method is used as for connecting to the front port. The PC and IED must belong to the same subnetwork for this set-up to work.
Page 53: Checking Vt Circuits
1MRK 504 154-UUS B Section 4 Starting up While the CT primary is energized, the secondary circuit shall never be open circuited because extremely dangerous high voltages may arise. Both the primary and the secondary sides must be disconnected from the line and the IED when plotting the excitation characteristics.
Page 54: Checking The Binary I/O Circuits
Section 4 1MRK 504 154-UUS B Starting up isolated and the IED is in test mode. Before removing the test handle, check the measured values in the IED. Not until the test handle is completely removed, the trip and alarm circuits are restored for operation.
Page 55 1MRK 504 154-UUS B Section 4 Starting up An IED equipped with optical connections has an minimum space requirement of 180 mm (7.2 inches) for plastic fiber cables and 275 mm (10.9 inches) for glass fiber cables. Check the allowed minimum bending radius from the optical cable manufacturer.
Page 57: Configuring The Ied And Changing Settings
1MRK 504 154-UUS B Section 5 Configuring the IED and changing settings Section 5 Configuring the IED and changing settings Overview M11730-2 v6 The customer specific values for each setting parameter and a configuration file have to be available before the IED can be set and configured, if the IED is not delivered with a configuration. Use the configuration tools in PCM600 to verify that the IED has the expected configuration.
Page 58: Reconfiguring The Ied
Section 5 1MRK 504 154-UUS B Configuring the IED and changing settings The primary CT data are entered via the HMI menu under Main menu/Configurations/Analog modules The following parameter shall be set for every current transformer connected to the IED: Table 8: CT configuration Parameter description...
Page 59: Establishing Connection And Verifying The Spa/Iec Communication
1MRK 504 154-UUS B Section 6 Establishing connection and verifying the SPA/IEC communication Section 6 Establishing connection and verifying the SPA/IEC communication Entering settings M11735-2 v1 If the IED is connected to a monitoring or control system via the rear SPA/IEC port, the SPA/IEC port has to be set either for SPA or IEC use.
Page 60: Verifying The Communication
Section 6 1MRK 504 154-UUS B Establishing connection and verifying the SPA/IEC communication When the setting is entered the IED restarts automatically. After the restart the selected IEC port operates as an IEC port. Set the slave number and baud rate for the rear IEC port. The slave number and baud rate can be found on the local HMI under Main menu/ Configuration/Communication/SLM configuration/Rear optical SPA-IEC-DNP port/ IEC60870–5–103...
Page 61: Optical Budget Calculation For Serial Communication With Spa/Iec
1MRK 504 154-UUS B Section 6 Establishing connection and verifying the SPA/IEC communication the PC is located in the substation) or by telephone modem through a telephone network with ITU (CCITT) characteristics. Table 9: Max distances between IEDs/nodes glass < 1000 m according to optical budget plastic <...
Page 63: Establishing Connection And Verifying The Lon Communication
1MRK 504 154-UUS B Section 7 Establishing connection and verifying the LON communication Section 7 Establishing connection and verifying the LON communication Communication via the rear ports M12196-2 v1 7.1.1 LON communication M12196-4 v4 LON communication is normally used in substation automation systems. Optical fiber is used within the substation as the physical communication link.
Page 64: The Lon Protocol
Section 7 1MRK 504 154-UUS B Establishing connection and verifying the LON communication Table 11: Specification of the fiber optic connectors Glass fiber Plastic fiber Cable connector ST-connector snap-in connector Cable diameter 62.5/125 m 1 mm Max. cable length 1000 m 10 m Wavelength 820-900 nm...
Page 65 1MRK 504 154-UUS B Section 7 Establishing connection and verifying the LON communication The communication speed of the LON bus is set to the default of 1.25 Mbit/s. This can be changed by LNT. M11888-3 v4 The setting parameters for the LON communication are set via the local HMI. Refer to the technical manual for setting parameters specifications.
Page 66: Optical Budget Calculation For Serial Communication With Lon
Section 7 1MRK 504 154-UUS B Establishing connection and verifying the LON communication Path in the local HMI under Main menu/Configuration/Communication/SLM configuration/Rear optical LON port Table 15: LON commands Command Command description ServicePinMsg Command with confirmation. Transfers the node address to the LON Network Tool. Optical budget calculation for serial communication with M11737-4 v2 Table 16:...
Page 67: Establishing Connection And Verifying The Iec 61850 Communication
1MRK 504 154-UUS B Section 8 Establishing connection and verifying the IEC 61850 communication Section 8 Establishing connection and verifying the IEC 61850 communication Overview SEMOD172103-4 v6 The rear OEM ports are used for: • process bus (IEC 61850-9-2LE) communication •...
Page 68: Verifying The Communication
Section 8 1MRK 504 154-UUS B Establishing connection and verifying the IEC 61850 communication 2.1. Enable redundant communication. Navigate to: Main menu/Configuration/Communication/Ethernet configuration/ PRP:1 Operation , IPAddress and IPMask . Operation must be set to Enabled . Set values for The IED will restart after confirmation.
Page 69: Testing Ied Operation
1MRK 504 154-UUS B Section 9 Testing IED operation Section 9 Testing IED operation Preparing for test IP336-1 v1 9.1.1 Requirements M11740-2 v8 IED test requirements: • Calculated settings • Application configuration diagram • Signal matrix (SMT) configuration • Terminal connection diagram •...
Page 70: Preparing The Ied To Verify Settings
Section 9 1MRK 504 154-UUS B Testing IED operation All setting groups that are used should be tested. This IED is designed for a maximum continuous current of four times the rated current. All references to CT and VT must be interpreted as analog values received from merging units (MU) via IEC 61850-9-2LE communication protocol, analog values received from the transformer input module, or analog values received from the LDCM.
Page 71: Activating The Test Mode
The IED can be equipped with a test switch of type RTXP8, RTXP18 or RTXP24 or FT. The test switch and its associated test plug handles are a part of the COMBITEST or FT system of ABB, which provides secure and convenient testing of the IED.
Page 72: Connecting The Test Equipment To The Ied
Section 9 1MRK 504 154-UUS B Testing IED operation When using the COMBITEST, preparations for testing are automatically carried out in the proper sequence, that is, for example, blocking of tripping circuits, short circuiting of CTs, opening of voltage circuits, making IED terminals available for secondary injection. Terminals 1 and 8, 1 and 18 as well as 1 and 12 of the test switches RTXP8, RTXP18 and RTXP24 respectively are not disconnected as they supply DC power to the protection IED.
Page 73: Releasing The Function To Be Tested
1MRK 504 154-UUS B Section 9 Testing IED operation IN (I4,I5) VN (U4,U5) TRIP A TRIP B TRIP C IEC 61850 ANSI09000652-1-en.vsd ANSI09000652 V1 EN-US Figure 10: Connection example of the test equipment to the IED when test equipment is connected to the transformer input module Releasing the function to be tested M11413-2 v6...
Page 74: Verifying Analog Primary And Secondary Measurement
Section 9 1MRK 504 154-UUS B Testing IED operation Click the Function test modes menu. The Function test modes menu is located in the local HMI under Main menu/Test/Function test modes. Browse to the function instance that needs to be released. Blocked for the selected function to No .
Page 75: Testing The Protection Functionality
1MRK 504 154-UUS B Section 9 Testing IED operation IEC10000032-1-en.vsd IEC10000032 V1 EN-US Figure 11: PCM600 report tool display after communication interruption Testing the protection functionality GUID-125B6F28-D3E5-4535-9CD6-6C056B79F496 v2 Each protection function must be tested individually by secondary injection. • Verify operating levels (trip) and timers. •...
Page 76: How To Enable Forcing
Section 9 1MRK 504 154-UUS B Testing IED operation Be observant that forcing of binary inputs and outputs on an IED, with inappropriate setup, can result in potential danger. 9.8.2 How to enable forcing GUID-50280F59-A98C-4E48-AB6D-2B4C138943DD v1 To enable forcing, the IED must first be put into IED test mode. While the IED is not in test mode, the LHMI/PCM600 menus that relate to forcing will not have any effect on the input/output status due to safety reasons.
Page 77: Forcing By Using Lhmi
1MRK 504 154-UUS B Section 9 Testing IED operation 9.8.3.1 Forcing by using LHMI GUID-D885671F-79E5-4B75-8777-B59E44F6FCFC v1 Editing a signal value directly GUID-E0C115BE-3AD1-48C7-BA2D-29857CD3D3ED v1 • Edit the input/output value directly to select the desired logical level, by doing following: Select the value line of the desired signal, see figure 12. Press the Enter key to edit the value.
Page 78: Forcing By Using Pcm600
Section 9 1MRK 504 154-UUS B Testing IED operation It is possible to power-cycle the IED in this state without losing the forcing states and values. This means that once a signal is forced, and the IED remains in IED test mode, the input or output will appear “frozen”...
Page 79 1MRK 504 154-UUS B Section 9 Testing IED operation IEC15000024 V1 EN-US The Signal Monitoring menu changes and indicates the forcing values that can be edited. IEC15000025 V1 EN-US Select and edit the values. Acknowledge and send . Click IEC15000026 V1 EN-US This commits the values to the IED and exits the editing session.
Page 80: How To Undo Forcing Changes And Return The Ied To Normal Operation
Section 9 1MRK 504 154-UUS B Testing IED operation 9.8.4 How to undo forcing changes and return the IED to normal operation GUID-00E2BAD8-A29E-4B9D-80E6-E12F59E019BD v1 Regardless of which input/output signals have been forced, all forced signals will return to their normal states immediately when the IED is taken out of test mode. When the forcing is removed by exiting from IED test mode, both input and output signals may change values.
Page 81 1MRK 504 154-UUS B Section 9 Testing IED operation This may change both binary input values and output relay states and will undo any forcing done by using the LHMI. If the IED is left in test mode, then it is still possible to perform new forcing operations, both from LHMI and from PCM600 Commissioning manual...
Page 83: Section 10 Testing Functionality By Secondary Injection
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Section 10 Testing functionality by secondary injection 10.1 Testing disturbance report 10.1.1 Introduction M17101-2 v6 The following sub-functions are included in the disturbance report function: • Disturbance recorder • Event list •...
Page 84: Event Recorder (Er) And Event List (El)
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Execute manual Trig in the window Available recordings in IED . 2.1. Right-click and select 2.2. Read the required recordings from the IED. Recordings and select a recording. 2.3. Refresh the window Create Report or Open With to export the recordings to any 2.4.
Page 85: Differential Protection
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.3 Differential protection IP10805-1 v1 10.3.1 Transformer differential protection T2WPDIF and T3WPDIF(87T) SEMOD54284-49 v7 Prepare the IED for verification of settings outlined in section "Requirements" and section "Preparing for test" in this chapter. 10.3.1.1 Verifying the settings SEMOD54284-51 v10...
Page 86: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.3.1.2 Completing the test SEMOD54284-86 v5 TestMode setting to Disabled . Continue to test another function or end the test by changing the Restore connections and settings to their original values, if they were changed for testing purposes.
Page 87: Restricted Earth-Fault Protection, Low Impedance Refpdif (87N)
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.3.3 Restricted earth-fault protection, low impedance REFPDIF (87N) SEMOD55252-82 v7 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter. 10.3.3.1 Verifying the settings SEMOD55252-86 v10...
Page 88 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Pick Up ICV . No signal Increase the injected current in phase A slowly by more than the set shall be activated. Decrease the injected current in phase A to half the rated current. Pick Up ICV .
Page 89: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Connect a trip output contact to a timer. Decrease the injected current stepwise to 50 % of the trip level and check the time delay. Repeat steps 3 – 6 for phases B and C. 10.3.4.2 Completing the test GUID-BE74F565-7465-4300-B2A6-D99CE8844147 v2...
Page 90 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 120° (O/phase) 20° 40% of RLdFwd 80% of RLdFwd 0.5 x RFPP ANSI05000368-1-en.vsd ANSI05000368 V1 EN-US Figure 14: Distance protection characteristic with test points for phase-to-phase measurements Table 17: Test points for phase-to-phase loops L1-L2 (Ohm/Loop) Test point Reach...
Page 91 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Test point Reach Set value Comments 0.5 x X1 Exact –0.5 x R1 x tan(ArgNegRes=30°) –0.23 x X1 0.8 x X1 Exact –0.5 x R1 x tan(ArgNegRes=30°) –0.37 x X1 0.5 x X1 0.5 x R1 Only used when RLdFw >...
Page 92: Measuring The Operating Limit Of Set Values
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Test point Reach Value Comments 0.5 x (2 x X1 + R0 0.5 x (2 x R1 )/3 + RFPE 0.85 x RFPE x tan(ArgLdset) ArgLd = angle for the maximal load transfer 0.85 x RFPE RLdFwset x tan(ArgLdSet) RLdFw...
Page 93: Measuring The Operating Time Of Distance Protection Zones
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Test points 8, 9. 10 and 11 are intended to test the directional lines of impedance protection. Since directionality is a common function for all 5 measuring zones, it is only necessary to test points 8, 9. 10 and 11 once in the forward direction in order to test the accuracy of directionality (directional angles).
Page 94 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection loop ArgNegRes loop 50% of RLdFwd RFltFwdPG ANSI09000734-2-en.vsd ANSI09000734 V2 EN-US Figure 16: Operating characteristic for phase selection function, forward direction single- phase faults Table 19: Test points for phase-to-ground loop CG (Ohm/loop) Test point Reach Value...
Page 95 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection phase LdAngle ArgNegRes 60° phase ArgDir 50% RLdFwd 0.5·RFltFwdPP ANSI09000735-1-en.vsd ANSI09000735 V1 EN-US Figure 17: Operating characteristic for phase selection function, forward direction phase- to-phase faults Table 20: Test points for phase-to-phase loops A-B (Ohm/phase) Test point Reach Value...
Page 96: Measuring The Operating Limit Of Set Values
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.4.2.1 Measuring the operating limit of set values M13906-73 v6 Procedure: Supply the IED with healthy conditions for at least two seconds. Apply the fault condition and slowly decrease the measured impedance to find the operate value for of the phase-to-ground loop ECG, test point 1, according to figure 16.
Page 97: Phase-To-Phase Faults
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.4.3.1 Phase-to-phase faults M14944-292 v8 ZAngPP Ohm/phase IEC07000009-4-en.vsd IEC07000009 V4 EN-US Figure 18: Proposed test points for phase-to-phase fault Table 21: Test points for phase-to-phase (ohms / phase) Test reach Value Comments...
Page 98: Faulty Phase Identification With Load Encroachment Fmpspdis (21)
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection ZAngPG Ohm/loop ANSI07000010-1-en.vsd ANSI07000010 V1 EN-US Figure 19: Proposed test points for phase-to-ground faults Table 22: Test points for phase-to-ground loops A-B (Ohm/Loop) Test Reach Value Comments points ZPG · sin(ZAngPG) ZPG ·...
Page 99 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Measure operating characteristics during constant current conditions. Keep the measured current as close as possible to its rated value or lower. But make sure it is higher than 30% of the rated current.
Page 100 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 120° 20° 40% of RLdFwd 80% of RLdFwd alt. 80% of RFPG RFPG (Load encroachment) ANSI05000369-2-en.vsd ANSI05000369 V2 EN-US Figure 21: Distance protection characteristic with test points for phase-to-ground measurements Table is used in conjunction with figure 21.
Page 101 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Test point Reach Set value Comments 0.5 x X1 Exact –0.5 x R1 x tan(ArgNegRes-90) –0.23 x X1 0.8 x X1 Exact –0.5 x R1 x tan(ArgNegRes-90) –0.37 x X1 0.5 x X1 0.5 x R1 Only used when...
Page 102: Measuring The Operating Limit Of Set Values
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Test point Reach Value Comments 0.5 x (2 x X1 + X0 0.5 x (2 x R1 + R0 RFPG 10.4.5.1 Measuring the operating limit of set values GUID-02EE80DB-CE52-49F0-99C4-14FD84766009 v3 Procedure: Subject the IED to healthy normal load conditions for at least two seconds.
Page 103: Phase Selection, Quadrilateral Characteristic With Settable Angle Frpspdis (21)
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.4.6 Phase selection, quadrilateral characteristic with settable angle FRPSPDIS (21) GUID-701C863B-40C6-42D7-A0C8-ECEB084B1165 v4 Prepare the IED for verification of settings as outlined in section "Preparing for test" in this chapter. The phase selectors operate on the same measuring principles as the impedance measuring zones.
Page 104 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection phase LdAngle ArgNegRes 60° phase ArgDir 50% RLdFwd 0.5·RFltFwdPP ANSI09000735-1-en.vsd ANSI09000735 V1 EN-US Figure 23: Operating characteristic for phase selection function, forward direction phase- to-phase faults Table 25: Test points for phase-to-ground loop CG (Ohm/loop) Test point Value Comments...
Page 105: Measuring The Operating Limit Of Set Values
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Table 26: Test points for phase-to-phase loops A-B Test point Value Comments RLdFwd 0.85·X1 R=0.491·X1+0.5 RFLdFwdPP 0.85·X1·1/tan(60°)+0.5 RFLdFwdPP 0.85·X1 -0.85·X1·tan (AngNegRes-90°) 0.5·RFLdFwdPP·tan (ArgLd) 0.5·RFLdFwdPP -0.5·RLdFwd·tan (ArgDir) 0.5·RLdFwd The table showing test points for phase-to-phase loops is used together with figure 23. 10.4.6.1 Measuring the operating limit of set values GUID-B1B7DEB6-7BC3-4A90-8D8F-E4E69B434AFA v3...
Page 106: High Speed Distance Protection Zones, Quadrilateral And Mho Characteristic Zmfpdis (21)
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.4.7 High speed distance protection zones, quadrilateral and mho characteristic ZMFPDIS (21) GUID-DF1650F4-EC3E-402B-BE26-EF2EF1034237 v5 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter.
Page 107 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 120° (O/phase) 20° 40% of RLdFwd 80% of RLdFwd 0.5 x RFPP ANSI05000368-1-en.vsd ANSI05000368 V1 EN-US Figure 24: Distance protection characteristic with test points for phase-to-phase measurements Table 27: Test points for phase-to-phase loops A-B (Ohm/Loop) Test point Reach...
Page 108 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Test point Reach Set value Comments 0.5 x X1 Exact –0.5 x R1 x tan(ArgNegRes=30°) –0.23 x X1 0.8 x X1 Exact –0.5 x R1 x tan(ArgNegRes=30°) –0.37 x X1 0.5 x X1 0.5 x R1 0.5 x RFPP...
Page 109: Measuring The Operating Limit Of Set Values
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Test point Reach Value Comments 0.5 x (2 x X1 + R0 0.5 x (2 x R1 )/3 + RFPG 0.85 x RFPG x tan(LdAngleset) LdAngle = angle for the maximal load transfer 0.85 x RFPG RLdFwdset x tan(LdAngleSet) RLdFwd...
Page 110: Measuring The Operating Time Of Distance Protection Zones
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Test points 8, 9, 10 and 11 are intended to test the directional lines of impedance protection. Since directionality is a common function for all six measuring zones, it is only necessary to test 8, 9, 10 and 11 once, in the forward direction in order to test the accuracy of directionality (directional angles).
Page 111 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection • One phase-to-phase fault • One phase-to-ground fault The shape of the operating characteristic depends on the values of the setting parameters. The figures illustrating the characteristic for the distance protection function can be used for settings with and without load encroachment.
Page 112 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Test point Reach Set value Comments LdAngle = angle for the maximal load transfer 0.85 x RFPP x tan (LdAngle) 0.85 x RFPP RLdFwd x tan (LdAngle) RLdFwd RLdFwd x tan (LdAngle) –0.2143 x RFPP/2 Exact: 0.8 x RFPP/2 (ArgDir=20°) 0.8 x RFPP/2...
Page 113: Measuring The Operating Limit Of Set Values
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Table 30: Test points for phase-to-ground C-G (Ohm/Loop) Test point Reach Value Comments (2 x X1 (2 x X1 + X0 2 x R1 + R0 0.8 x (2 x X1 + X0 0.8 x (2 x R1 + R0...
Page 114: Measuring The Operating Time Of Distance Protection Zones
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Observe that the zones that are not tested have to be blocked and the zone that is tested has to be released. Repeat steps to find the operating value for the phase-to-ground fault C-G according to figure and table 30.
Page 115: Verifying The Settings
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection The test is mainly divided into two parts, one which aim is to verify that the settings are in accordance to the selectivity plan and a second part to verify the operation of ZMRPSB (68). The proposed test points for validation of the settings are numbered according to figure Test of the interactions or combinations that are not configured are not considered in this instruction.
Page 116: Testing The Power Swing Detection Function Zmrpsb (68)
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Keep the measured current as close as possible to its rated value or lower. Keep it constant during the test, but ensure that it is higher than the set minimum operating current. Ensure that the maximum continuous current to the IED does not exceed four times its rated value, if the measurement of the operating characteristics runs under constant voltage conditions.
Page 117: Testing The Block Input, Interaction Between Fdpspdis (21) Or Frpspdis (21) And Zmrpsb (78)
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.4.9.4 Testing the block input, interaction between FDPSPDIS (21) or FRPSPDIS (21) and ZMRPSB (78) M13888-73 v7 Precondition The BLOCK input is configured and connected to PHG_FLT output on the FDPSPDIS (21) or FRPSPDIS (21) function.
Page 118: Testing The Influence Of The Residual Overcurrent Protection
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection tCS . Also add the usual trip time for the underreaching zone carrier send security timer (approximately 30ms). • The TRIP signal appears after the time delay, which is equal to the sum of set time tnPP or tnPG (dependent on the type of fault) and delays for the underreaching zone tTrip .
Page 119: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection No delayed operation of zone 1 must be observed. Configure the PUPSD functional input to connect to the PICKUP functional output and repeat the previous fault. Fast trip, caused by the operation of zone 1 must appear with a time delay, which is equal to tZL plus zone 1 normal otrip time.
Page 120 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Now the signals TRIP1 and TRIP should be activated. VBase the current amplitude and angle With reduced amplitude of the injected voltage to 0.8 IBase and 180° between the is changed via ZC + (ZA –...
Page 121: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Imin > 0.10 IBase Vmax < 0.92 VBase PICKUP 0.2 £ f(Ucos) £ 8Hz d ³ PickupAngle ZONE1 Z cross line ZA - ZC ZONE2 Z cross line ZC - ZB Counter b a ³...
Page 122: Verifying The Settings
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection generators, with stator windings split into two groups per phase, when each group is equipped with current transformers. The protection function performs a simple summation of the currents of the two channels I3P1 and I3P2. 10.4.12.1 Verifying the settings GUID-708C4033-3111-481F-9868-FF207C18C9F9 v1...
Page 123 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 9000 36000 ≤ × = × ovrl p ovrl (Equation 2) EQUATION14042 V1 EN-US Reference is made to the numerical values of the example, explained in the “Setting guidelines” of Application Manual .
Page 124 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection ReverseR 0 29 ZBase 0 9522 0 003 × × Ω RvsR (Equation 10) EQUATION14050 V1 EN-US ReverseR 29 6 ZBase 0 9522 0 282 × × Ω RvsX (Equation 11) EQUATION14051 V1 EN-US and the voltages that are related to them:...
Page 125 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection • the point RE (R FwdR FwdX ReachZ1 (boundary between zone 1 and zone 2) • a point which is related to the parameter • the point SE (R RvsR RvsX The phase angle of the test voltages is equal to:...
Page 126 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Check the Application Configuration: verify that hardware voltage and current channels of the IED are properly connected to SMAI function blocks, and that the proper analog outputs of SMAI’s are connected to the analog inputs of the function block OOSPPAM. Connect three-phase voltage channels of the test set to the appropriate IED terminals.
Page 127 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection • VOLTAGE = 13.12 kV • CURRENT = 20918 A • R = 9.01% • X = 65.27% • ROTORANG = 0.04 rad Note that these values identify a point outside the lens characteristic, even if it is close to the point RE.
Page 128 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10459 1 162 × × 9000 (Equation 26) EQUATION14062 V1 EN-US ∠ = 180º frequency of = 49.5 Hz Expected result: the protection function does not issue either start or trip. The trajectory of the impedance traverses the lens characteristic in zone 2 GUID-9F0FE404-6D83-4308-9FE4-13259CE7D07A v1 Preliminary steady state test at 50 Hz...
Page 129 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Note that these values identify a point inside the lens characteristic, in the zone 2, that is close to the point RE. The START is issued, but no TRIP is performed. Execution of the dynamic test GUID-028D7D67-B61A-4A7F-9978-4A0A41231B04 v1 The test may be performed by using two states of a sequence tool that is a basic feature of test...
Page 130 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Expected result: start of the protection function and trip in zone 2, when trip conditions are fulfilled. 10.4.12.3 Test of the boundary between zone 1 and zone 2, which is defined by the ReachZ1 parameter GUID-BE180E07-7D4B-4842-81FB-244DE8897430 v1...
Page 131 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Execution of the dynamic test GUID-53964189-42E4-4C4B-BFCD-64888BA938EF v1 The test may be performed by using two states of a sequence tool that is a basic feature of test sets. • State 1: pre-test condition.
Page 132 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection The trajectory of the impedance traverses the lens characteristic in zone 1 GUID-12F82DD8-A4CE-48C9-944B-0CF3B3F6C9F9 v1 Preliminary steady state test at 50 Hz GUID-AA953F5F-2389-4F05-8BBD-D8DC9AF3B0E4 v1 • Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/ OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block OOSPPAM.
Page 133 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection VT s 0 9 1435 9 36 × × × × t RZ 13 8 VT p (Equation 51) EQUATION14066 V1 EN-US ForwardX 59 33     arctan arctan 82.
Page 134 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.4.12.4 Test of the point SE (R RvsR RvsX GUID-335F54E6-52DE-4BF1-A34B-0C2DB8059CC1 v1 The trajectory of the impedance traverses the lens characteristic in zone 1 GUID-2DD20D2E-6188-4631-A584-5E68B212E011 v1 Preliminary steady state test at 50 Hz GUID-7BCF3D7B-1B84-46D4-B9E3-066894A878E8 v1 •...
Page 135 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Steady voltage and current are applied in order to get a steady high impedance, that is a point in the plane R-X which is far away from the lens characteristic. Define the following three- phase symmetrical quantities (the phase angle is related to phase L1): VT s 0 9 5899...
Page 136 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection The trajectory of the impedance does not enter the lens characteristic GUID-189FECED-12A7-4A41-BCCF-D93C0FF9FA41 v1 Preliminary steady state test at 50 Hz GUID-448D5357-6CC2-438E-83CA-25FD381B7DFF v1 • Go to Main menu/Test/Function status/Impedance protection/OutOfStep(78,Ucos)/ OOSPPAM(78,Ucos):1/Outputs to check the available service values of the function block OOSPPAM.
Page 137 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection VT s 1 1 5899 47 02 × × × × t RvsZ 13 8 VT p (Equation 71) EQUATION14069 V1 EN-US æ ö æ ö ReverseX 29.60 Ð ç...
Page 138: Automatic Switch Onto Fault Logic Zcvpsof
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection COMMON TRIP COMMAND (trip) TRIPZ1 (tripZone1) TRIPZ2 (tripZone2) START (start) GENMODE (generatorMode) MOTMODE (motorMode) time in seconds → IEC10000142-1-en.vsd IEC10000142 V1 EN-US Figure 32: Boolean output signals for the injected current with two components: a 50 Hz current component and a 49.5 Hz current component 10.4.13 Automatic switch onto fault logic ZCVPSOF...
Page 139: Initiating Zcvpsof Automatically And Setting Mode To Impedance
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection The ZACC input is activated. Check that the TRIP output, external signals and indication are obtained. 10.4.13.2 Initiating ZCVPSOF automatically and setting mode to impedance M13850-27 v7 Deactivate the switch onto fault BC input. IphPickup and UVPickup for at least one Set the current and voltage inputs to lower than second.
Page 140: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Connect the test set for injection of voltage and current. Inject voltages and currents corresponding to a phase-to-phase to ground fault within zone 1 of the distance protection function. In the test one of the current inputs (one of the faulted phases) is disconnected.
Page 141 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection To verify the zone 1 mho characteristic, at least two points must be tested. Z1Fwd LineAngle Z1Rev IEC11000312-2-en.vsd IEC11000312 V2 EN-US Figure 33: Proposed four test points for phase-to-phase fault Where, Z1Fwd is the forward positive sequence impedance setting for zone 1...
Page 142 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection ZxFwd LineAngle ZxRev IEC11000313-1-en.vsd IEC11000313 V2 EN-US Figure 34: Proposed four test points for phase-to-earth fault Where, ZxFwd is the forward positive sequence impedance setting for zone x (where, x is 2- 3 depending on the zone selected) ZxRev is the reverse positive sequence impedance setting for zone x (where x is 2- 3 depending...
Page 143: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection current conditions. Keep the injected current as close as possible to the rated value of its associated input transformer or lower. Ensure, however, that it is higher than 30% of the rated current.
Page 144: Measuring The Trip Limit Of Set Values
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Ensure that the maximum continuous current, supplied from the current source used for the test of the IED, does not exceed four times the rated current value of the IED. 10.5.1.1 Measuring the trip limit of set values M11754-11 v6...
Page 145: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 3 out of 3 currents for operation is chosen: Connect the symmetrical three-phase injection current into phases A, B and C. Connect the test set for the appropriate three-phase voltage injection to the IED phases A, B and C.
Page 146: Measuring The Trip Limit Of Set Values
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Ensure that the maximum continuous current, supplied from the current source used for the test of the IED, does not exceed four times the rated current value of the IED. 10.5.3.1 Measuring the trip limit of set values SEMOD52967-11 v8...
Page 147: Four Step Non-Directional Ground Fault Protection
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Check that the protection does not trip when the polarizing voltage is zero. Repeat the above described tests for the higher set steps. Finally, check that pickup and trip information is stored in the event menu. 10.5.4.2 Four step non-directional ground fault protection SEMOD53296-202 v4...
Page 148: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection For inverse time curves, check the trip time at a current equal to 110% of the trip current in txmin . order to test parameter Check that all trip and pickup contacts trip according to the configuration (signal matrixes) Reverse the direction of the injected current and check that the step does not trip.
Page 149 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Operation mode 3I · cosφ SEMOD175060-34 v9 Procedure VNRelPU and set the phase angle between voltage and Set the polarizing voltage to 1.2 · current to the set characteristic angle ( RCADir ).
Page 150 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection  0 RCADir Trip area    3   ROADir ANSI06000650-3-en.vsd ANSI06000650 V3 EN-US Figure 36: Characteristic with ROADir restriction Commissioning manual...
Page 151 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection RCADir = 0º Trip area Instrument transformer  angle error RCAcomp Characteristic after angle compensation (to prot) (prim) ANSI06000651-2-en.vsd ANSI06000651 V2 EN-US Figure 37: Explanation of RCAcomp Operation mode 3I ·...
Page 152 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Tinv TDSN SRef 3 cos ϕ ⋅ ⋅ ⋅ test test (Equation 78) ANSIEQUATION2403 V2 EN-US Compare the result with the expected value. The expected value depends on whether definite or inverse time was selected. Disabled .
Page 153: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection RCA = 0º ROA = 80º Operate area =-3V ANSI06000652-2-en.vsd ANSI06000652 V2 EN-US Figure 38: Example characteristic Non-directional ground fault current protection SEMOD175060-117 v10 Procedure INNonDirPU setting. Measure that the trip current is equal to the The function activates the PICKUP and PUDIRIN output.
Page 154: Thermal Overload Protection, One Time Constant, Fahrenheit/Celsius Lfpttr Lcpttr (26)
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.5.7 Thermal overload protection, one time constant, Fahrenheit/ Celsius LFPTTR/LCPTTR (26) M14950-2 v7 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter.
Page 155: Thermal Overload Protection, Two Time Constants Trpttr (49)
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.5.8 Thermal overload protection, two time constants TRPTTR (49) SEMOD53632-3 v5 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter. 10.5.8.1 Checking trip and reset values SEMOD53632-11 v7...
Page 156: Breaker Failure Protection, Phase Segregated Activation And Output Ccrbrf (50Bf)
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.5.9 Breaker failure protection, phase segregated activation and output CCRBRF (50BF) M12104-2 v11 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter.
Page 157: Verifying The Re-Trip Mode
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection FunctionMode = Current and RetripMode = Choose the applicable function and trip mode, such as CB Pos Check . Apply the fault condition, including initiation of CCRBRF (50BF), well above the set current value.
Page 158: Verifying Instantaneous Back-Up Trip At Cb Faulty Condition
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Checking that back-up tripping is not achieved at normal CB tripping M12104-150 v7 Use the actual tripping modes. The case below applies to re-trip with current check. Apply the fault condition, including initiation of CCRBRF (50BF), with phase current well Pickup_PH .
Page 159 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Repeat the check of back-up trip time. Disconnect current and input signals. Activate the input 52FAIL. The output CBALARM (CB faulty alarm) should appear after set tCBAlarm . Keep the input activated. time Apply the fault condition, including initiation of CCRBRF (50BF), with current above set current value.
Page 160: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Apply the fault and the initiation again. The value of current should be below the set value Pickup_BlkCont . t2 . It simulates Arrange disconnection of BC closed signal(s) well before set back-up trip time a correct CB tripping.
Page 161: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection NO TRIP signal should appear due to symmetrical condition. Deactivate the CLOSECMD. Decrease one current with 120% of the current unsymmetrical level compared to the other two phases. Activate CLOSECMD and measure the operating time of the CCPDSC (52PD) protection.
Page 162: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Mode Set value: Formula used for complex power calculation × (Equation 83) EQUATION2058-ANSI V1 EN-US × (Equation 84) EQUATION2059-ANSI V1 EN-US × (Equation 85) EQUATION2060-ANSI V1 EN-US = × ×...
Page 163: Directional Overpower Protection Goppdop (32)
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.5.12 Directional overpower protection GOPPDOP (32) SEMOD175058-3 v5 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter. 10.5.12.1 Verifying the settings SEMOD175058-7 v6 The overpower protection shall be set to values according to the real set values to be used.
Page 164: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Check that the input logical signal BLOCK to the BRCPTOC (46) function block is logical zero and note on the local HMI that the output signal TRIP from the BRCPTOC (46) function block is equal to the logical 0.
Page 165: Verifying The Settings And Operation Of The Function
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.5.14.1 Verifying the settings and operation of the function GUID-81B167DE-7A86-4CBA-86E7-560A6B3EA665 v1 Reconnection inhibit feature GUID-C3E7B2EA-FF69-4D2B-BBDF-A135A97E4862 v2 Inject SCB rated current (that is, 0.587A at 50Hz for this SCB) in at least one phase (preferably perform this test with three phase injection).
Page 166 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection If any of these signals are used for tripping, signaling and/or local/remote indication check that all relevant contacts and LEDs have operated and that all relevant GOOSE messages have been sent. Check that service value from the function for current in phase A, on the local HMI under Main menu/Test is approximately 185A (that is, 0.370A ·...
Page 167 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Note that during testing the harmonic voltage overload feature the reactive power overload feature or overcurrent feature may also give pickup and trip signals depending on their actual settings. Therefore it is recommended to switch them off during this test.
Page 168: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Note that it is recommended to test IDMT operating times by injected current with the rated frequency. Above procedure can also be used to test definite time step. Pay attention that IDMT step can also trip during such injection.
Page 169: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Connect a trip output contact to a timer. Set the current to 200 % of the pickup level of the step 1, switch on the current and check the definite time delay for trip signals TRST1 and TRIP.
Page 170: Verifying The Settings
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.5.16.1 Verifying the settings GUID-3A2B7FF5-330E-4A0D-AB74-EBAE6258C176 v1 Verifying settings by secondary injection GUID-39632D30-A8D8-417D-985C-8F886106783E v4 Connect the test set for three-phase current injection and three-phase voltage injection to the appropriate IED terminals. Go to Main menu/Settings/IED Settings/Current protection/VoltageRestOverCurr ( 51V,2(I>/V<))/VRPVOC (51V,2(I>/V<)):1/General and make sure that the function is Operation is set to Enabled .
Page 171 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection VDepMode = Slope , the minimum measured phase-to-phase voltage is lower than VBase ; if VDepMode = Step , the minimum measured phase-to-phase voltage is lower 0,25* VHighLimit /100* VBase : than •...
Page 172 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection This means that if the measured phase current jumps from 0 to 2 times the set trip level and time multiplier k is set to 1.0 s (default value), then the TROC and TRIP signals will trip after a time delay equal to 13.5 s ±...
Page 173: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.5.16.2 Completing the test GUID-8A33AACE-7B89-4981-A872-78044BB1FD0D v2 TestMode setting to Disabled . Continue to test another function or end the test by changing the Restore connections and settings to their original values, if they were changed for testing purposes.
Page 174: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection æ ö ç ÷ < Vpickup è ø (Equation 98) ANSIEQUATION2428 V1 EN-US where: t(s) Trip time in seconds Settable time multiplier of the function for step 1 Measured voltage Vpickup<...
Page 175: Extended Testing
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection > Vpickup VBase ´ ´ VTprim (Equation 99) ANSIEQUATION2426 V1 EN-US For phase-to-phase measurement: > Vpickup ´ ´ VBase VTprim (Equation 100) ANSIEQUATION2427 V1 EN-US Decrease the voltage slowly and note the reset value. Set and apply about 20% higher voltage than the measured trip value for one phase.
Page 176: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection   −   >   (Equation 101) IECEQUATION2429 V1 EN-US æ ö ç ÷ > Vpickup è ø (Equation 102) ANSIEQUATION2429 V1 EN-US where: t(s) Trip time in seconds Settable time multiplier of the function for step 1 Measured voltage Vpickup>...
Page 177: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection t_MinTripDelay Connect a trip output contact to the timer and temporarily set the time delay to 0.5s. Pickup2 operate value Increase the voltage and note the Reduce the voltage slowly and note the reset value. Set the time delay to the correct value according to the setting plan and check the time delay t_MinTripDelay , injecting a voltage corresponding to 1.2 ·...
Page 178 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection ANSI07000106-1-en.vsd ANSI07000106 V2 EN-US Figure 39: Connection of the test set to the IED for test of V1 block level where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Decrease slowly the voltage in phase VA of the test set until the PICKUP signal resets.
Page 179: Check Of Voltage Differential Trip And Alarm Levels
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection ANSI07000107-1-en.vsd ANSI07000107 V2 EN-US Figure 40: Connection of the test set to the IED for test of V2 block level where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) VDTrip , V1Low and V2Low to the V1 three- Apply voltage higher than the highest set value of phase inputs and to one phase of the V2 inputs according to figure 40.
Page 180: Check Of Trip And Trip Reset Timers
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection ANSI07000108-1-en.vsd ANSI07000108 V2 EN-US Figure 41: Connection of the test set to the IED for test of alarm levels, trip levels and trip timer where: is three-phase voltage group1 (V1) is three-phase voltage group2 (V2) Apply 1.2 ·...
Page 181: Final Adjustment Of Compensation For Vt Ratio Differences
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Connect voltages to the IED according to valid connection diagram and figure 41. Set Vn (rated voltage) to the V1 inputs and increase V2 voltage until differential voltage is 1.5 · VDTrip ).
Page 182: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Note that TRIP at this time is a pulse signal, duration should be according to tPulse . Inject the measured voltages at rated values for at least set tRestore time. Activate the CBOPEN binary input.
Page 183: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Extended testing M16289-31 v5 The test above can be repeated to check the time to reset. The tests above can be repeated to test the frequency dependent inverse time characteristic. Verification of the low voltage magnitude blocking M16289-39 v7 PUFrequency , VMin , and the...
Page 184: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection PUFrequency , VMin , and Check that the settings in the IED are appropriate, for example the tDelay . Supply the IED with three-phase voltages at their rated values. Slowly decrease the magnitude of the applied voltage, until the BLKDMAGN signal appears.
Page 185: Multipurpose Protection
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.8 Multipurpose protection SEMOD53552-1 v1 10.8.1 General current and voltage protection CVGAPC SEMOD56488-3 v3 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter.
Page 186: Overcurrent Feature With Current Restraint
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.8.1.2 Overcurrent feature with current restraint SEMOD56488-35 v3 The current restraining value has also to be measured or calculated and the influence on the operation has to be calculated when the testing of the trip value is done. Procedure Trip value measurement The current restraining value has also to be measured or calculated and the influence on the...
Page 187: Over/Undervoltage Feature
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection CTWYEpoint configuration parameter is set to If reverse directional feature is selected or FromObject , the angle between current and polarizing voltage shall be set equal to rca-dir +180°. Overall check in principal as above (non-directional overcurrent feature) Reverse the direction of the injection current and check that the protection does not trip.
Page 188: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.9.1.2 Completing the test M12917-43 v4 TestMode setting to Disabled . Continue to test another function or end the test by changing the Restore connections and settings to their original values, if they were changed for testing purposes.
Page 189: Measuring The Trip Value For The Zero-Sequence Function
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Simulate normal operating conditions with the three-phase currents in phase with their corresponding phase voltages and with all of them equal to their rated values. Slowly decrease the measured voltage in one phase until the BLKV signal appears. Record the measured voltage and calculate the corresponding negative-sequence voltage according to the equation (observe that the voltages in the equation are phasors): ×...
Page 190: Checking The Operation Of The Dv/Dt And Di/Dt Based Function
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection × (Equation 109) EQUATION1819-ANSI V1 EN-US Where: are the measured phase voltages EQUATION1820-ANSI V1 EN-US Compare the result with the set value of the zero-sequence tripping voltage (consider that 3V0Pickup is in percentage of the base voltage.) the set value Repeat steps...
Page 191: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection • The BLKV and BLKZ signals appear without any time delay. The BLKZ signal will be activated only if the internal deadline detection is not activated at the same time. •...
Page 192: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Checking the operation of MAINFUF and PILOTFUF Simulate normal operation conditions with three-phase voltage on the main fuse group and the pilot fuse group. Ensure the values are equal to their rated values. Decrease one of the three-phase voltages on main fuse group or pilot fuse group.
Page 193 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection The description below applies for a system with a nominal frequency of 60 Hz but can be directly applicable to 50 Hz. SESRSYN (25) can be set to use different phases, phase to ground or phase to phase.
Page 194: Testing The Synchronizing Function
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection ANSI05000481-4-en.vsd ANSI05000481 V4 EN-US Figure 43: General test connection for a breaker-and-a-half diameter with one-phase voltage connected to the line side 10.10.1.1 Testing the synchronizing function M2377-21 v8 The voltage inputs used are: V3PL1 VA, VB or VC line 1 voltage inputs on the IED V3PBB1...
Page 195: Testing The Synchrocheck Check
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection = Line frequency Line tBreaker = Set closing time of the breaker Repeat with VBaseBus and f-bus = 60.25 Hz, to verify that the function does not trip 3.1. V-Bus = 100% when frequency difference is above limit.
Page 196: Testing The Energizing Check
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection V-Bus No operation V-Line operation V-Bus en05000551_ansi.vsd ANSI05000551 V1 EN-US Figure 44: Test of phase difference Change the phase angle between +dφ and -dφ and verify that the two outputs are activated for phase differences between these values but not for phase differences outside, see figure 44.
Page 197 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection V-Line VA, VB or VC line1 voltage inputs on the IED V-Bus Bus voltage input on the IED General M2377-271 v6 When testing the energizing check function for the applicable bus, arrangement shall be done for the energizing check functions.
Page 198: Testing The Voltage Selection
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Testing the dead bus dead line (DBDL) M2377-323 v8 The test should verify that the energizing check function trips for a low voltage on both the V-Bus and the V-Line, that is, closing of the breaker in a non-energized system. Test is valid only when this function is used.
Page 199 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection selected by activation of different inputs in the voltage selection logic as shown in table figure 45. Table 33: Voltage selection logic SESRSYN CBConfig Section to Activated Activated Activated Activated Indication setting...
Page 200: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Bus 1 Bus 2 CB1 52 CB3 352 (SESRSYN 1) (SESRSYN 3) CB2 252 (SESRSYN 2) LN1 989 LN2 989 Line 1 Line 2 ANSI11000274.en.v1 ANSI11000274 V1 EN-US Figure 45: Objects used in the voltage selection logic 10.10.1.5 Completing the test M2377-1042 v5...
Page 201 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection The automatic voltage control for tap changer, single control TR1ATCC (90) is based on a transformer configuration that consists of one tap changer on a single two-winding power transformer. The automatic voltage control for tap changer, parallel control TR8ATCC (90), if installed, may be set to operate in Master Follower (MF) mode, or Minimise Circulating Current (MCC) mode.
Page 202: Secondary Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection During the installation and commissioning, the behavior of the voltage control functions for different tests may be governed by a parameter group, available on the local HMI under Main menu/Settings/IED Settings/Control/ TransformerVoltageControl(ATCC,90)/TR1ATCC:x/TR8ATCC:x.
Page 203: Check The Normal Voltage Regulation Function
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Transformer Tap Control = Enable and Transformer Voltage Control = Enable Confirm • Direct tap change control Main menu/Settings/IED Settings/Control/TransformerTapChanger(YLTC,84)/ TCMYLTC:x/TCLYLTC:x/Operation • Automatic transformer voltage control Main menu/Settings/IED Settings/Control/TransformerVoltageControl(ATCC,90)/ TR1ATCC:x/TR8ATCC:x/General/Operation •...
Page 204: Check The Upper And Lower Busbar Voltage Limit
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection alarm, total or automatic block of the voltage control function to be displayed on the local HMI. Vblock and confirm the response of the voltage control Apply a voltage slightly below function.
Page 205: Parallel Voltage Regulation
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection = VB - (Rline + jXline) . I (Equation 113) EQUATION2081-ANSI V2 EN-US where: = Re(I ) + jlm(I ) are complex phase quantities When all secondary phase-to-ground voltages are available, use the positive-sequence components of voltage and current.
Page 206 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Master follower voltage regulation SEMOD175185-716 v6 OperationPAR is set to For the transformers connected in the parallel group, confirm that MF . For parallel operation, it is also recommended to confirm for parallel group membership, defined by setting TnRXOP in the local HMI under Main menu/Settings/Setting group N/ Control/TransformerVoltageControl(ATCC,90)/TR8ATCC:x/ParCtrl...
Page 207 1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection T1RXOP shall be set to Enabled in instance 2 of TR8ATCC (90), and • T2RXOP shall be set to Enabled in instance 1 of TR8ATCC (90). • T1 - T3 are available, •...
Page 208 Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection > Vdi V (Equation 119) EQUATION2093-ANSI V1 EN-US VB Vset (for the purposes of this test procedure) (Equation 120) EQUATION2095-ANSI V1 EN-US Therfore: × × > Ci Icc i Xi V Vset (Equation 121) EQUATION2097-ANSI V1 EN-US...
Page 209: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection VSet for each transformer. Inject a voltage V equal to I2Base and a load Inject a load current for Transformer 1 that is equal to rated load current I2Base – ( I2Base · CircCurrLimit)) current for Transformer 2 that is 1% less than ( Confirm that the automatic voltage control for tap changer, for parallel control function TR8ATCC (90) responds in accordance with the setting for...
Page 210: Scheme Communication
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.11 Scheme communication SEMOD53569-1 v1 10.11.1 Scheme communication logic for residual overcurrent protection ECPSCH (85) M13926-2 v5 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test"...
Page 211: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Permissive scheme M13926-42 v7 VBase (EF4PTOC, 51N67N) where the current Inject the polarizing voltage 3V0, which is 5% of is lagging the voltage by 65°. Inject current (65° lagging the voltage) into one phase at about 110% of the set operating current, and switch the current off with the switch.
Page 212: Testing The Current Reversal Logic
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.11.2.1 Testing the current reversal logic M13936-9 v7 VBase and the phase angle between voltage and Inject the polarizing voltage 3V0 to 5% of current to 155°, the current leads the voltage. Inject current ( 180°...
Page 213: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 3V0PU ) operating voltage. Inject the polarizing voltage 3V0 to about 90% of the setting ( Activate the CRL binary input. No ECHO, CS and TRWEI outputs should appear. 3V0PU ) operating voltage.
Page 214: Logic
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.12 Logic SEMOD53577-1 v1 10.12.1 Tripping logic, common 3-phase output SMPPTRC (94) SEMOD54375-102 v8 Prepare the IED for verification of settings as outlined in section "Requirements" section "Preparing for test" in this chapter.
Page 215: Ph/2Ph/3Ph Operating Mode
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 2.0s) and shorter than the dead-time of SMBRREC (79), when included in the protection scheme. Check that the second trip is a three-pole trip and that a three-phase autoreclosing attempt is given after the three-phase dead time.
Page 216: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection Activate shortly thereafter, the reset lockout (RSTLKOUT) signal in the IED. Check that the circuit breaker lockout (CLLKOUT) signal is reset. Initiate a three-phase fault. A three- trip should occur and all trip outputs TR_A, TR_B, TR_C should be activated. Functional outputs TRIP and TR3P should be active at each fault.
Page 217: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection 10.13.1.2 Completing the test GUID-DD08C598-A35C-4300-9555-A0877F7DC511 v1 TestMode setting to Off . Continue to test another function or end the test by changing the Restore connections and settings to their original values, if they were changed for testing purposes.
Page 218: Verifying The Settings
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.13.3.1 Verifying the settings GUID-962A344D-5F8D-49A6-B3AC-29C7FEED0A3D v4 Connect the test set for the injection of a three-phase current to the appropriate current terminals of the IED. If current need to be injected for a particular test, it should be done in the phase selected by PhSel parameter.
Page 219: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection OperAlmLevel and OperLOLevel . 8.1. Test the actual set values defined by 8.2. The operation counter, NOOPER is updated for every close-open sequence of the POSCLOSE and POSOPEN . breaker by changing the position of auxiliary contacts OperAlmLevel value.
Page 220: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.13.5.1 Completing the test GUID-325F040B-BADC-4281-B965-9B7D6BFA3E15 v1 Off . Continue to test another function or end the test by changing the Test mode setting to Restore connections and settings to their original values, if they were changed for testing purposes.
Page 221: Completing The Test
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection Repeat the above test steps 1 to 2. tEnergy setting as 1 minute and supply the IED with three phase currents and voltages at their rated value till 1 minute. Check the MAXPAFD and MAXPRFD outputs after 1 minute and compare it with last 1 minute average power values.
Page 222: Remote Communication
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.16 Remote communication SEMOD53601-1 v1 10.16.1 Binary signal transfer BinSignReceive, BinSignTransm M14951-2 v5 Prepare the IED for verification of settings as outlined in section "Preparing the IED to verify settings".
Page 223: Basic Ied Functions
1MRK 504 154-UUS B Section 10 Testing functionality by secondary injection ANSI07000188 V1 EN-US Figure 46: Test of RTC with I/O 10.17 Basic IED functions SEMOD52026-1 v1 10.17.1 Parameter setting group handling SETGRPS M11369-2 v3 Prepare the IED for verification of settings as outlined in section "Requirements"...
Page 224: Completing The Test
Section 10 1MRK 504 154-UUS B Testing functionality by secondary injection 10.17.1.2 Completing the test M11369-39 v4 TestMode setting to Disabled . Continue to test another function or end the test by changing the Restore connections and settings to their original values, if they were changed for testing purposes.
Page 225: Section 11 Primary Injection Testing
1MRK 504 154-UUS B Section 11 Primary injection testing Section 11 Primary injection testing IP10812-1 v1 SEMOD65857-3 v3 Whenever it becomes necessary to work on primary equipment, it is essential that all the necessary switching, locking, grounding and safety procedures are observed and obeyed in a rigid and formalized manner.
Page 226: Voltage Control Of Parallel Transformers
Section 11 1MRK 504 154-UUS B Primary injection testing IEC13000251-1-en.vsd In this view, check the following settings: 3.1. Check that Control Mode is set to Manual . Load Voltage corresponds to the Voltage Set 3.2. Operate the tap changer so that the Point .
Page 227: Minimum Circulating Current (Mcc) Method
1MRK 504 154-UUS B Section 11 Primary injection testing tested to enable data exchange between IEDs or between instances of voltage control in the same IED. For parallel operation, it is also recommended to confirm the setting for the general parallel arrangement of transformers in Main menu/Settings/Setting group N/Control/ TransformerVoltageControl(ATCC,90)/TR8ATCC:x/ParCtrl.
Page 228: Master Follower (Mf) Method
Section 11 1MRK 504 154-UUS B Primary injection testing Open the test display for Transformer Voltage Control on the LHMI in Main menu/Test/ Function status/Control/TransformerVoltageControl(ATCC,90). Manually execute Raise commands to step up the tap changer for transformer T1 to two steps above the setting for the other transformers in the parallel group.
Page 229: Completing The Test
1MRK 504 154-UUS B Section 11 Primary injection testing Connect all transformers in the parallel group to the same busbar on both the primary and secondary sides. Manual for each transformer in the parallel control group Set the control mode to Open the test display for Transformer Voltage Control on the LHMI in Main menu/Test/ Function status/Control/TransformerVoltageControl (ATCC, 90).
Page 231: Section 12 Checking The Directionality
1MRK 504 154-UUS B Section 12 Checking the directionality Section 12 Checking the directionality 12.1 Overview GUID-7E504488-F341-477A-953A-EB0B262911EB v2 Before starting this process, all individual devices that are involved in the fault clearance process of the protected object must have been individually tested and must be set in operation. The circuit breaker must be ready for an open-close-open cycle.
Page 232 Section 12 1MRK 504 154-UUS B Checking the directionality available under the HMI menu: Main menu/Test/Function status/Impedance protection/ DirectionalImpedance The following will be shown if the load current flows in forward (exporting) direction: • L1Dir = Forward • L2Dir = Forward •...
Page 233: Section 13 Commissioning And Maintenance Of The Fault Clearing System
The periodicity of all tests depends on several factors, for example the importance of the installation, environmental conditions, simple or complex equipment, static or electromechanical IEDs, and so on. The normal maintenance practices of the user should be followed. However, ABB's recommendation is as follows: Every second to third year •...
Page 234: Visual Inspection
ABB protection IEDs are preferably tested by aid of components from the COMBITEST testing system or FT test systems described in information B03-9510 E. Main components are RTXP 8/18/24 test switch usually located to the left in each protection IED and RTXH 8/18/24 test handle, which is inserted in test switch at secondary testing.
Page 235: Recording
1MRK 504 154-UUS B Section 13 Commissioning and maintenance of the fault clearing system 13.2.2.2 Recording SEMOD56528-14 v2 It is of utmost importance to carefully record the test results. Special test sheets covering the frequency of test, date of test and achieved test values should be used. IED setting list and protocols from previous tests should be available and all results should be compared for differences.
Page 236: Measurement Of Service Currents
Section 13 1MRK 504 154-UUS B Commissioning and maintenance of the fault clearing system Please observe that the test system does not provide built-in security during this test. If the instrument should be set on Amp instead of Volts, the circuit breaker naturally is tripped, therefore, great care is necessary.
Page 237: Section 14 Troubleshooting
No problem detected. None. Time synch Fail No time Check the synchronization source for problems. synchronization. If the problem persists, contact your ABB representative for service. Real time clock Ready No problem detected. None. Real time clock Fail The real time clock has Set the clock.
Page 238: Fault Tracing
Ready (I/O module name) I/O modules has failed. Check that the I/O module has been configured and Fail connected to the IOP1- block. If the problem persists, contact your ABB representative for service. 14.2 Fault tracing IP8765-1 v1 14.2.1 Internal fault indications...
Page 239: Using Front-Connected Pc
1MRK 504 154-UUS B Section 14 Troubleshooting HMI Signal Name: Status Description Time Sync READY / FAIL This signal will be active when the source of the time synchronization is lost, or when the time system has to make a time reset. Application READY / FAIL This signal will be active if one or...
Page 240 Section 14 1MRK 504 154-UUS B Troubleshooting The list of internal events provides valuable information, which can be used during commissioning and fault tracing. The internal events are time tagged with a resolution of 1ms and stored in a list. The list can store up to 40 events.
Page 241: Diagnosing The Ied Status Via The Lhmi Hint Menu
1MRK 504 154-UUS B Section 14 Troubleshooting 14.2.3 Diagnosing the IED status via the LHMI hint menu GUID-7E8503E9-441B-487A-9CD7-B43463D1CAE5 v3 In order to help the user, there is an LHMI page labeled ‘Hints’. This page is located under Main menu/Diagnostics/IED status/Hints. For each activated hint there is a headline. From the headline view, an explanation page can be entered, giving the user more information and hints about the particular topic.
Page 242: Hardware Re-Configuration
Corresponding hardware(s) is set to fail. Please restart IED and consider Reconfigure HW modules to get updated hardware list. Non ABB vendor SFP detected Non ABB vendor SFP detected. Corresponding hardware(s) is set to fail. Please use ABB approved SFP’s.
Page 243: Repair Instruction
1MRK 504 154-UUS B Section 14 Troubleshooting Switch the IED off and insert the new module. Switch the IED on, wait for it to start, and then perform a HW reconfig. Perform a license update in PCM600. The new module is now available in PCM600 and is ready to be configured. Removing a module from an IED Procedure: Remove all existing configuration for the module in PCM, and write that configuration to the...
Page 244: Repair Support
Troubleshooting M11764-10 v1 An alternative is to open the IED and send only the faulty circuit board to ABB for repair. When a printed circuit board is sent to ABB, it must always be placed in a metallic, ESD-proof, protection bag.
Page 245: Section 15 Glossary
1MRK 504 154-UUS B Section 15 Glossary Section 15 Glossary M14893-1 v18 Alternating current Actual channel Application configuration tool within PCM600 A/D converter Analog-to-digital converter ADBS Amplitude deadband supervision Analog digital conversion module, with time synchronization Analog input ANSI American National Standards Institute Autoreclosing ASCT Auxiliary summation current transformer...
Page 246 Section 15 1MRK 504 154-UUS B Glossary Class C Protection Current Transformer class as per IEEE/ ANSI CMPPS Combined megapulses per second Communication Management tool in PCM600 CO cycle Close-open cycle Codirectional Way of transmitting G.703 over a balanced line. Involves two twisted pairs making it possible to transmit information in both directions Command COMTRADE...
Page 247 1MRK 504 154-UUS B Section 15 Glossary Ethernet configuration tool EHV network Extra high voltage network Electronic Industries Association Electromagnetic compatibility Electromotive force Electromagnetic interference EnFP End fault protection Enhanced performance architecture Electrostatic discharge F-SMA Type of optical fiber connector Fault number Flow control bit;...
Page 248 Section 15 1MRK 504 154-UUS B Glossary IDBS Integrating deadband supervision International Electrical Committee IEC 60044-6 IEC Standard, Instrument transformers – Part 6: Requirements for protective current transformers for transient performance IEC 60870-5-103 Communication standard for protection equipment. A serial master/slave protocol for point-to-point communication IEC 61850 Substation automation communication standard...
Page 249 1MRK 504 154-UUS B Section 15 Glossary LIB 520 High-voltage software module Liquid crystal display LDCM Line data communication module Local detection device Light-emitting diode LON network tool Local operating network Miniature circuit breaker Mezzanine carrier module Milli-ampere module Main processing module MVAL Value of measurement Multifunction vehicle bus.
Page 250 Section 15 1MRK 504 154-UUS B Glossary Power supply module Parameter setting tool within PCM600 Precision time protocol PT ratio Potential transformer or voltage transformer ratio PUTT Permissive underreach transfer trip RASC Synchrocheck relay, COMBIFLEX Relay characteristic angle RISC Reduced instruction set computer RMS value Root mean square value RS422...
Page 251 1MRK 504 154-UUS B Section 15 Glossary Starpoint Neutral/Wye point of transformer or generator Static VAr compensation Trip coil Trip circuit supervision Transmission control protocol. The most common transport layer protocol used on Ethernet and the Internet. TCP/IP Transmission control protocol over Internet Protocol. The de facto standard Ethernet protocols incorporated into 4.2BSD Unix.
Page 252 Section 15 1MRK 504 154-UUS B Glossary Three times zero-sequence current.Often referred to as the residual or the ground-fault current Three times the zero sequence voltage. Often referred to as the residual voltage or the neutral point voltage Commissioning manual...
Page 254 ABB AB Substation Automation Products SE-721 59 Västerås, Sweden Phone +46 (0) 21 32 50 00 Scan this QR code to visit our website www.abb.com/substationautomation © Copyright 2016 ABB. All rights reserved.

This manual is also suitable for:

Relion 670 series

ABB RET670 Commissioning Manual

Introduction

Safety Information

Available Functions

Starting up

Configuring the IED and Changing Settings

Establishing Connection and Verifying the SPA/IEC Communication

Establishing Connection and Verifying the LON Communication

Establishing Connection and Verifying the IEC 61850 Communication

Testing IED Operation

Section 10 Testing Functionality by Secondary Injection

Section 11 Primary Injection Testing

Section 12 Checking the Directionality

Section 13 Commissioning and Maintenance of the Fault Clearing System

Section 14 Troubleshooting

Quick Links

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Summary of Contents for ABB RET670