Bruker XFlash FlatQUAD Reference Manual
Bruker XFlash FlatQUAD Reference Manual

Bruker XFlash FlatQUAD Reference Manual

Sd3 detector for energy-dispersive spectrometry

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®
XFlash
FlatQUAD
3
SD
detector for energy-dispersive spectrometry
Reference Manual

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Summary of Contents for Bruker XFlash FlatQUAD

  • Page 1 ® XFlash FlatQUAD detector for energy-dispersive spectrometry Reference Manual...
  • Page 2 Suggestions for improvement are welcome. Order no. DOC-M82-EXX028 V3. Issue: 12/01/15. © 2015, Bruker Nano GmbH, Berlin, Germany. All trademarks and registered trademarks are the sole property of their respective owners. Printed in the Federal Republic of Germany.
  • Page 3: Table Of Contents

    Contents Contents 1 Introduction ..............................5 2 Specification ..............................5 2.1 Mechanical Characteristics ......................... 5 2.2 Cooling System ........................... 6 2.3 Detector Window ..........................6 2.4 Output Signals ............................. 7 2.5 Signal Processing Considerations ...................... 7 2.6 Power Consumption ..........................7 3 Maintenance and Troubleshooting ......................
  • Page 5: Introduction

    Introduction 1 Introduction ® With the innovative XFlash FlatQUAD detector Bruker Nano GmbH provides a versatile semiconductor X-ray detector of the latest generation utilizing the novel functional principle of a side-entry silicon drift ® detector with droplet shaped sensors (SD ).
  • Page 6: Cooling System

    Specification Warning! Cooling System Beryllium is extremely fragile and toxic. ® The cooling system of the XFlash FlatQUAD Fragments of a broken detector window detector consists stages. first must not escape into the environment, thermoelectric cooler (Peltier element) is located at and must not be swallowed or inhaled.
  • Page 7: Output Signals

    Specification The polymer X-ray window is also transparent to detectors. This allows for remarkably short filter light. Therefore, the detector must only be used in times in the range of 0.1 µs to 1 µs. complete darkness. The optimum filter time depends on the application (for there is usually a compromise between Output Signals resolution and throughput).
  • Page 8: Maintenance And Troubleshooting

    Maintenance and Troubleshooting The voltages and currents mentioned above are Beware! fed via the all-in-one detector connector as stated Overloading the cooler with an in Appendix A2. The SVE 6 supplies all of the excessive current can lead to severe necessary voltages along...
  • Page 9: Electromagnetic Interference And Noise Pick-Up

    Installation 3.4 Electromagnetic Interference and Noise Try one or all of the following measures to Pick-up eliminate the issue: Because of the signal voltages being extremely  use a short detector connection cable (1.5 m) low, there is always a risk of noise pick-up from ...
  • Page 10: Connecting The Sve 6

    Appendix A2). Coarse adjustment should be made storage or transportation). A replacement cap can under direct visual control, preferably with an open be provided by Bruker Nano GmbH if the original chamber door. cap is lost. Fine adjustment should be done with SEM image 4.2 Connecting the SVE 6...
  • Page 11: Operating Considerations

    Operating Considerations 5 Operating Considerations Prior to high precision measurements or a final General Safety Advice calibration, the detector should be allowed to settle Caution! for a couple of hours. Before venting the SEM the detector Switch off the cooling circuit and allow approx. has to be warmed up (T >15 °C).
  • Page 12: Set Detector Operating Temperature

    Operating Considerations The user can switch between modes by setting Beware! either “max cooling” or “thermostat mode” in the Excessive cooler currents can lead to software. severe damage of the detector. The maximum recommended cooler current Set Detector Operating Temperature should never be exceeded by more than 20 %, not even temporarily.
  • Page 13: Measures In Case Of A Broken Detector Window

    If not otherwise possible the remains of the window Note can be disposed of by sending them (securely Because of the heat capacity of the packaged and labeled) to Bruker Nano GmbH assembly, increasing the current usually along with the damaged detector. decreases temperature initially. This effect however reverses within a few 5.7 Disposal...
  • Page 15: Appendix

    Appendix Appendix A1 Characteristics Detector Type Silicon Drift Detector (SDD) Active Area 4 x 15 mm Silicon Thickness 0.45 mm Window Window Material 12 µm Beryllium with polymer coating or 1 µm internal polymer window plus two additional windows (2 µm or 6 µm) Collimator Material Zirconium Radiation Entry...
  • Page 16: A2 Mechanical Drawing

    Appendix A2 Mechanical drawing Reference Manual...
  • Page 17: A3 Pin Assignments

    Appendix A3 Pin Assignments Detector connection Signal 2, 15 1, 14 +19 V 3, 16 -19 V 6, 7, 18 Peltier + 8, 19, 20 Peltier – (GND) Temperature signal Temp. GND HV ON 13 / 25 Signal 1 + / - 12 / 24 Signal 2 + / - 11 / 23...

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