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Summary of Contents for LANGER EMV-Technik P1401
- Page 1 User Manual P1401/P1501 set RF field coupling up to 1 GHz P1402/P1502 set RF field coupling up to 3 GHz Copyright © Juni 2014 LANGER EMV-Technik GmbH - Translation of the original user manual - 2018.03.22 User Manual P1400 P1500 Final.docx...
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Page 2: Table Of Contents
Measuring devices Test board Calibration of the measurement set-up Measurement set-up Measurement Warranty Technical Parameters P1401/P1501 P1402/P1502 EPM 02 / BPM 02 field meters Scope of delivery of the P1401/P1501 set Scope of delivery of the P1402/P1502 set - 2 -... -
Page 3: Safety Instructions
Attention! Functional interference emissions (near fields and far fields) may occur when the field sources from the P1401/P1501 set or P1402/P1502 set are operated. The user is responsible for taking appropriate measures to protect all electronic devices used in the course of the tests. - Page 4 LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com Attention! Make sure that internal functional faults are visible from outside. The test IC may be destroyed due to an increase in the injection intensity if the faults are not visible from outside.
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Page 5: Description Of The System
(ICs) to magnetic and electric fields in the frequency range of up to 1 GHz and 3 GHz, respectively. The P1401 or P1402 field source is used to generate a magnetic test field and the P1501 or P1502 field source to generate an electric test field. The respective field source is positioned above the test IC by using a spacer ring and its test field is then applied to the IC to measure its immunity to disturbances. - Page 6 An oscilloscope and PC are needed to monitor the equipment under test and/or control the measurement set-up. The voltage present on the electrode (P1501/P1502) and/or the current flowing through the electric conductor (P1401/P1402) can be monitored via the field sources’ measurement output.
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Page 7: P1401 And P1402 Field Sources
P1401 and P1402 field sources Figure 2 and Figure 3 show the P1401 and P1402 field source which generate a magnetic test field. Both field sources have two plug connectors, an RF power input (N type) to power the field source and a measurement output (SMB type) at the top. - Page 8 EMV-Technik www.langer-emv.com Figure 4 Principle of the immunity measurement using the P1401 or P1402 field source (magnetic field) Figure 4 shows the basic measurement principle. The field source, the spacer ring and the ground surface with the test board form a field chamber. This field chamber limits and shields the generated magnetic field.
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Page 9: P1501 And P1502 Field Sources
LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com P1501 and P1502 field sources Figure 6 and Figure 7 show the P1501 and P1502 field source which generate an electric test field. Both field sources have two plug connectors, an RF power input (N type) to power the field source and a measurement output (SMB type) at the top. - Page 10 LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com Figure 8 Principle of the immunity measurement using the P1501 or P1502 field source (electric field) On the inside of the field source, the RF power input is connected to the electrode located at the bottom of the field source.
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Page 11: Measurement Outputs Of The Field Sources
D70 h10 and D70 h03 spacer rings The D70 h10 and D70 h03 spacer rings are part of the P1401/P1501 and P1402/P1502 IC test systems. The spacer rings have an inner diameter d = 70 mm and a height h = 10 mm or h = 3 mm. -
Page 12: Epm 02 And Bpm 02 Field Meter
LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com EPM 02 and BPM 02 field meters The magnetic or electric field strength generated by the field sources at the position of the test IC can be measured with the BPM 02 and EPM 02 field meters. To do so, a field meter has to be inserted in the GND 25 ground plane using the GNDA 02 ground adapter. -
Page 13: Orientation Of The Field Sources
LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com Orientation of the field sources Electric field: The electric field is orthogonal to the ground surface (surface of the test IC) in the area of the test IC (cf. Figure 13). Turning the field source on the spacer ring has no significant impact on the direction and the intensity of the electric field. -
Page 14: Start-Up And Measurement
3 Start-up and measurement The P1401/P1501 or P1402/P1502 IC test system can be used to measure the immunity of integrated circuits (ICs) to magnetic and electric fields in the frequency range of up to 1 GHz and 3 GHz, respectively. The immunity to electric fields and magnetic fields is measured separately. -
Page 15: Calibration Of The Measurement Set-Up
The EPM 02 is used to check the P1501 or P1502 field source. The BPM 02 is used to check the P1401 or P1402 field source. Figure 15 Calibration of P1501/P1502 Figure 16 Calibration of P1401/P1402 The basic measurement set-up corresponds to . -
Page 16: Measurement Set-Up
EMV-Technik www.langer-emv.com Measurement set-up shows the basic set-up for immunity measurements with the P1401/P1501 IC test system Figure 1 and the ICE1 test environment. The test board together with the test IC is initially inserted into the GND 25 ground plane and connected to the CB 0708 connection board. -
Page 17: Measurement
LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com Measurement The basic measurement can be carried out in accordance with IEC 62132-2:2010, for example: Table 4 Flow chart showing the basic measurement procedure - 17 -... -
Page 18: Warranty
EMV-Technik www.langer-emv.com 4 Warranty Langer EMV-Technik GmbH will remedy any fault caused by defective materials or defective manufacture during the statutory warranty period, either by repair or replacement. This warranty is only granted on condition that: - the information and instructions in the user manual have been observed. -
Page 19: Technical Parameters
D70 h10 spacer ring, height h = 10 mm B in µT 11.1 15.7 24.8 35.1 Table 6 P1401 field source – Magnetic flux density generated depending on the forward power �� probe current �� Bandwidth 1 GHz Measurement error approx. 10 % →... - Page 20 LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com P1501 field source – Electric field strength E in W in V 14.1 31.6 44.7 63.2 141.4 D70 h03 spacer ring, height h = 3 mm E in V/cm 14.9 33.3...
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Page 21: P1402/P1502
D70 h10 spacer, height h = 10 mm B in µT 11.1 17.5 24.8 Table 11 P1401 field source – Magnetic flux density generated depending on the forward power �� probe current �� Bandwidth 3 GHz Measurement error approx. 10 % →... - Page 22 LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com P1502 field source – Electric field strength �� in W �� in V 22.3 31.6 44.7 70.7 D70 h03 spacer, height h = 3 mm E in V /cm 10.5 23.6...
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Page 23: Epm 02 / Bpm 02 Field Meters
LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com EPM 02 / BPM 02 field meters BPM 02 dB/dt field meter Frequency range 500 kHz - 3 GHz B ̇ = K ∙ u Magnetic flux density B calculated based on the voltage u K = 122 dB ( V ∙... -
Page 24: Scope Of Delivery Of The P1401/P1501 Set
LANGER DE-01728 Bannewitz mail@langer-emv.de P1401/P1501 and P1402/P1502 set EMV-Technik www.langer-emv.com 6 Scope of delivery of the P1401/P1501 set Item Designation Type Qty. 1 RF Magnetic Field Source P1401 2 RF E-Field Source P1501 3 Spacer Ring, 3 mm D70 h03... -
Page 25: Scope Of Delivery Of The P1402/P1502 Set
This document may not be copied, reproduced or electronically processed, either in full or in part, without the prior written permission of Langer EMV-Technik GmbH. The management of Langer EMV-Technik GmbH assumes no liability for damage that may arise from using this printed information.
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