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AEC-Q200 Test Item
Pre-and Post-Stress
1
Electrical Test
2 High Temperature
The measured and observed characteristics should satisfy the
Exposure (Storage)
specifications in the following table.
Appearance
No marking defects
Capacitance
Within ±2.5% or ±0.25pF
Change
(Whichever is larger)
30pFmin. : Q≧1000
Q/D.F.
30pFmax.: Q ≧400+20C
More than 10,000MΩ or 500Ω ・F
I.R.
(Whichever is smaller)
R9 : More than 150Ω ・F
3 Temperature Cycling
The measured and observed characteristics should satisfy the
specifications in the following table.
No marking defects
Appearance
Capacitance
Within ±2.5% or ±0.25pF
Change
(Whichever is larger)
30pFmin. : Q≧1000
Q/D.F.
30pFmax.: Q ≧400+20C
More than 10,000MΩ or 500Ω ・F
I.R.
(Whichever is smaller)
4 Destructive
No defects or abnormalities
Phisical Analysis
5 Moisture Resistance
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
No marking defects
Capacitance
Within ±3.0% or ±0.30pF
Change
(Whichever is larger)
Q/D.F.
30pFmin. : Q≧350
10pF and over, 30pF and below:
10pFmax.: Q ≧200+10C
I.R.
More than 10,000MΩ or 500Ω ・F
(Whichever is smaller)
R9 : More than 150Ω ・F
6 Biased Humidity
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
No marking defects
Within ±3.0% or ±0.30pF
Capacitance
Change
(Whichever is larger)
Q/D.F.
30pF and over: Q≧200
30pF and below: Q≧100+10C/3
C: Nominal Capacitance(pF)
I.R.
More than 1,000MΩ or 50Ω ・F
(Whichever is smaller)
JEMCGS-0363S
Specification.
Temperature
Compensating Type
R7/L8/R9: Within ±10.0%
R7/L8 W.V.: 25Vmin.: 0.03 max.
C: Nominal Capacitance(pF)
R9 : 0.075max.
R7/L8/R9: Within ±10.0%
R7/L8 W.V.: 25Vmin.: 0.03 max.
C: Nominal Capacitance(pF)
R9 : 0.05max.
R7/L8/R9: Within ±12.5%
R7/L8 : W.V.: 25Vmin.: 0.03 max.
Q≧275+5C/2
R9 : 0.075max.
C: Nominal Capacitance(pF)
R7/L8/R9: Within ±12.5%
R7/L8 W.V.: 25Vmin.: 0.035 max.
R9 : 0.075max.
■AEC-Q200 Murata Standard Specification and Test Methods
High Dielectric Type
-
Set the capacitor for 1000±12 hours at 150±3℃. Set for
24±2 hours at room temperature, then measure.
W.V.: 16V/10V : 0.05 max.
Fix the capacitor to the supporting jig in the same manner and under
the same conditions as (19). Perform cycle test according to the four
heat treatments listed in the following table. Set for 24±2 hours at
room temperature, then measure
W.V.: 16V/10V : 0.05 max.
・ Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
for 24±2 hours at room temperature.
Perform the initial measurement.
Per EIA-469.
Apply the 24-hour heat (25 to 65℃) and humidity (80 to 98%)
treatment shown below, 10 consecutive times.
Set for 24±2 hours at room temperature, then measure.
Temperature
(℃)
70
65
60
W.V.: 16V/10V : 0.05 max.
55
50
45
40
35
30
25
20
15
10
5
0
-5
-10
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)
at 85±3℃ and 80 to 85% humidity for 1000±12 hours.
Remove and set for 24±2 hours at room temprature, then measure.
The charge/discharge current is less than 50mA.
W.V.: 16V/10V : 0.05 max.
2
AEC-Q200 Test Method
Step
Time(min)
1000(for ΔC/R7)
1
15±3
-55℃+0/-3
2
1
Room
3
15±3
125℃+3/-0
4
1
Room
Humidity
80～98%
Humidity
Humidity
90～98%
90～98%
+10
- 2 ℃
Initial measuremt
One cycle 24hours
0
1 2
3
4 5
6
7
8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Hours
Cycles
300(for 5G/L8/R9)
-55℃+0/-3
Room
150℃+3/-0
Room
Humidity
80～98%
Humidity
90～98%
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