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4. Safety
4.1 Intended Use
The EMC-Basic 1 set contains modules for demonstrating immunity and emission phenomena.
The EMC-Basic 1 set is powered by the supplied power supply.
4.2 Reasonably Foreseeable Misapplication
Incorrect application of the EMC-Basic 1 set may result in danger to the user, damage to the product
and/or connected devices.
Examples of incorrect applications that can lead to danger:
- Safety devices are bypassed or disabled.
- The devices are not in a proper technical condition during operation.
- The EMC-Basic 1 set is not operated within the specified technical parameters.
- The scope of application is changed by modifying the design.
There are no claims due to misuse of the EMC-Basic 1 set!
4.3 Personnel Requirements
Only qualified personnel with knowledge and experience in the field of EMC are allowed to operate
the EMC-Basic 1 set.
4.4 Safety Instructions
If you use a Langer EMV-Technik GmbH product, please observe the following safety instructions to
protect yourself against electric shock or the risk of injury.
–
Before each start-up, all connected devices must be checked externally for damage.
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The EMC-Basic 1 set may only be operated under supervision.
–
Damaged or defective devices must not be used.
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The operating and safety instructions for all devices included in the measurement set-up must be
observed.
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Langer EMV-Technik GmbH
5. Test Procedure
5.1 SF 11 - Demo Board B-Field Immunity
During immunity tests, interference pulses are often fed into the devices or assemblies to be tested
via cables. This results in interference currents within the assemblies, which are always associated
with magnetic fields (Fig. 1). Depending on the layout of the assembly, these fields can induce
voltages in signal conductor loops and thus generate functional errors.
Figure 1: SF11 with interference current and magnetic field with two cables connected
In order to find the causes of functional errors, it is important to determine where sensitive signal
conductor loops are located on the module. The P11 pulser is used for this purpose.
It generates a small-scale magnetic field at its tip. This is used to simulate the magnetic field
generated during an immunity test according to the standard in a very small area. To do this, the
switched-on pulser is moved by hand over the assembly (Fig. 2). If there is a sensitive signal
conductor loop below the pulse tip, the DUT generates the same functional fault as in the immunity
test according to the standard.
Figure 2: P11 pulser is guided over the SF11 demo board
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