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Summary of Contents for Heinz Walz US-SQS
- Page 1 US-SQS Spherical Micro Quantum Sensor Instruction Manual 3rd Edition: 12-May-11 US-SQS_Manual_3.doc © Heinz Walz GmbH, 2011 Heinz Walz GmbH • Eichenring 6 • 91090 Effeltrich • Germany Phone +49-(0)9133/7765-0 • Fax +49-(0)9133/5395 E-mail info@walz.com • Internet www.walz.com Printed in Germany...
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Page 3: Table Of Contents
4 Calibration ..................6 4.1 Calibration Procedure..............6 4.2 Calibration Certificate............... 6 5 Making Measurements .............. 10 5.1 General Information ..............10 5.2 PAM Applications..............10 5.2.1 US-SQS/L ................. 10 5.2.2 US-SQS/IB................ 10 5.2.3 US-SQS/WB ..............11 5.2.4 US-SQS/B ................. 12 5.2.4.1 Exchanging Battery............ -
Page 5: Safety Instructions
CHAPTER 1 SAFETY INSTRUCTIONS 1 Safety Instructions General Safety Instructions Read the safety instructions and the operating instructions before using the instrument. Pay attention to all the safety warnings. Keep electronic parts of the device away from water or high moisture areas. -
Page 6: Introduction
380 nm and 710 nm. The US-SQS/L basic sensor comes with a 3 m coaxial cable and a BNC connector. It is connectable to any data logger with micro- Ampere current measuring function. -
Page 7: Sensor Characterization
Spectral Response Figure 1a shows the typical response between 350 nm and 1100 nm of an US-SQS sensor. The solid line shows the ideal re- sponse of a photon fluence sensor for photosynthetically active radia- tion (PAR, defined for the 400-700 nm wavelength range; for defini- tions see chapter 7). -
Page 8: Angular Response
CHAPTER 3 SENSOR CHARACTERIZATION Angular Response The US-SQS sensor uses a plastic diffuser to obtain an angular re- sponse error of less than ± 5 % (-100°..100° angle). Figure 2 shows a typical angular response curve. Angular Response US-SQS/L -180... - Page 9 CHAPTER 3 SENSOR CHARACTERIZATION A collimated beam was directed perpendicularly upon the sensor. The response of the sensor was recorded in air and in distilled water at discrete water depths. The response in water relative to the response in air in dependence of depth was fitted with a least squares regression line and extrapo- lated to a depth of 0 mm (see Fig.
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Page 10: Calibration
03-global tilt (ISO 9845-1, 1992). As a result the reading for the PPFR value is most accurate in natural sun light. Calibration Certificate Every US-SQS is accompanied by a certificate. Figure 4 shows a typical certificate of calibration. The Calibration Multiplier given in the certificate is the value that needs to be entered into the ULM-500 for the direct reading of PPFR values in calibrated units: µmol m... - Page 11 CHAPTER 4 CALIBRATION Fig. 4a: First page of a typical calibration certificate...
- Page 12 CHAPTER 4 CALIBRATION Fig. 4b: Second page of a typical calibration certificate...
- Page 13 CHAPTER 4 CALIBRATION For a particular light source with known spectrum, the accuracy of the reading can be increased by using the supplied information for the relative sensitivity (S(λ)). For example for an LED light with a narrow spectrum peaking at 640 nm the correction can be done as follows: If the reading is 1000 µmol m divide the reading by 0.93 (see graph in Fig.
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Page 14: Making Measurements
Make sure the calibration factor is entered correctly in the data logger, when using the US-SQS/L or US-SQS/IB (see below). The US-SQS/WB and the US-SQS/B come with an amplifier. The sensor specific calibration factor is set within this amplifier during manufac- turing and can not be changed by the user (see below). -
Page 15: Sqs/Wb
PAM-2100 (Leaf Clip), Mini-PAM (Leaf Clip) The amplifier of the US-SQS/WB is adjusted to the particular calibration factor of the sensor for the use in water. Therefore the displayed values are only correct, if the sensor is submersed in water. -
Page 16: Sqs/B
PAM. The US-SQS/B connects to the AUX-INPUT port on the front side of the Power-and-Control-Unit. The amplifier of the US-SQS/B is adjusted to the particular cali- bration factor of the sensor for the use in water. Displayed values are only correct, if the sensor is submersed in water. -
Page 17: Cleaning Information
CHAPTER 5 MAKING MEASUREMENTS To remove the inner ring, unscrew the indicated screws. Afterwards use the screws to fix the upper plate to the threaded holes of the hood. The threaded holes of the hood are in a 90° position to the unthreaded holes. -
Page 18: Terminology
CHAPTER 7 TERMINOLOGY 7 Terminology PAR: Photosynthetically Active Radiation Photosynthetically active radiation is usually defined as radiation between 400 and 700 nm. Radiation can be used energy based (W) or photon event based (µmol/s). In photosynthesis most effects are de- pendent on the amount of photons rather than the energy incident on the system. - Page 19 CHAPTER 7 TERMINOLOGY PPFD: Photosynthetic Photon Flux Density. The term photon flux density is often used equivalent to photon ir- radiance (see above for exact definition, compare Björn 2008). The photosynthetic photon flux density is restricted to the range of wavebands between 400 and 700 nm. Unit: µmol m PPFD is measured with cosine corrected sensors having a plane surface (e.g.
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Page 20: Literature
CHAPTER 8 LITERATURE 8 Literature Austin R.W. (1976) Air-water radiance calibration factor. Scripps Insti- tution of Oceanography, La Jolla, CA. Tech. Memo. ML-76-004T 8 pp. Austin R.W. and Halikas G. (1976) The index of refraction of seawater. Scripps Institution of Oceanography, La Jolla, CA. SIO Reference 76-1, 64 Björn L.O. -
Page 21: Technical Data
CHAPTER 9 TECHNICAL DATA 9 Technical data Table 1 : Technical data, of the sensor itself (US-SQS/L, US- SQS/IB, US-SQS/WB, US-SQS/B) Subject to change without prior notice. - Page 22 CHAPTER 9 TECHNICAL DATA Table 2 : Technical data of the different sensor setups Subject to change without prior notice.
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Page 23: Warranty Conditions
WARRANTY CONDITIONS 10 Warranty conditions All products supplied by the Heinz Walz GmbH, Germany, are warranted by Heinz Walz GmbH, Germany to be free from defects in material and workmanship for one (1) year from the shipping date (date on invoice).
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