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FISCHER FISCHERSCOPE X-RAY XDLM 231 Operator's Manual

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Coating Thickness
Material Analysis
FISCHERSCOPE
FISCHERSCOPE
FISCHERSCOPE
Microhardness
Material Testing
Operator's Manual
®
X-RAY XDLM
®
X-RAY XDLM
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X-RAY XDLM
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231
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232
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237

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April 24, 2025

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Summary of Contents for FISCHER FISCHERSCOPE X-RAY XDLM 231

  • Page 1 Operator’s Manual FISCHERSCOPE ® X-RAY XDLM ® FISCHERSCOPE ® X-RAY XDLM ® FISCHERSCOPE ® X-RAY XDLM ® Coating Thickness Material Analysis Microhardness Material Testing...
  • Page 2 Industriestraße 21 www.helmut-fischer.com D-71069 Sindelfingen mail@helmut-fischer.de On our home page www.helmut-fischer.com you will find the addresses of our sole agencies and subsidiary companies around the globe. Quality Assurance System of the Helmut Fischer GmbH DIN EN ISO 9001:2008 Management system certified by Germanischer Lloyd Systems...

  • Page 3: Table Of Contents

    Table of Contents Table of Contents Safety Information ..........7 Warning notices used .
  • Page 4 Table of Contents Measurement Value Field ........39 Status Bar.
  • Page 5 Correlation between mass per unit area and coating thickness... 103 14.2 Calibration standards from FISCHER ......105 14.3 Setting the density in the Def.MA .
  • Page 6 Table of Contents 15.7 Practical monitoring of the measurement devices..... 116 15.8 When and how to carry out corrections? ......118 15.9 Pre-run for determining the control limits.
  • Page 7 Table of Contents Pattern Recognition (XDLM 237) ........171 21.1 Scenarios: Pattern Recognition, XY Programming and Task Programming .
  • Page 8 Table of Contents FISCHERSCOPE ® X-RAY...

  • Page 9: Safety Information

    The specifications of the instrument and of the accessories are described in the data sheet in the Attachment to this Operators Manual. Only accessories recommended and approved by FISCHER may be connected to this instrument. Modifications, repairs, maintenance and service work on the FISCHERSCOPE X-RAY and its acces- sories must be performed by authorized FISCHER service personnel only.

  • Page 10: Safety Of The Electrical Equipment

    FISCHER for this purpose. 1.5.1 Repeat Inspection FISCHER recommends to check the instrument by an expert in intervals of no longer than five years. Observe the laws and regulations of the country where the instrument is operated.
  • Page 11 A permanently flashing LED indicates that the door is not closed properly, it will not be possible to make measurements. No Alterations to the Instrument! Only specialized service personnel, as a rule the Service of FISCHER, is authorized to carry out alterations to the measuring instrument. DANGER...

  • Page 12: Requirements For The Operating Personnel

    Only the most important facts are explained in this Operators Manual. This does not replace detailed training. The practice-oriented seminars of FISCHER are a worthwhile opportunity for obtaining the required knowledge. Several times a year, user seminars that provide insights into the physical fundamentals of x-ray fluorescence and prepare users for their work with the measuring instruments are conduct- ed at various locations.

  • Page 13: Frequently Asked Questions Concerning X-Radiation Safety

    Safety Information Frequently Asked Questions Concerning X-Radiation Safety Question Answer Is there a risk that my health will No. The X-RAY instrument is a fully protected instrument. be impaired by X-radiation due During no phase of your work at the instrument is it possi- to my work on the X-RAY instru- ble for X-radiation to escape from the measurement cham- ment?
  • Page 14 Safety Information FISCHERSCOPE ® X-RAY...

  • Page 15: Instrument Overview

    X-RAY is a high performance energy dispersive x-ray fluorescence (EDXRF) spectrometer. The WinFTM ® (Fischer Thickness Management Software for Windows ® ) software controls the in- strument and handles the evaluation of the signals supplied by the instrument. The measured values (coating thickness, material compositions, mass per unit area) are stored and displayed on the monitor.

  • Page 16: X-Ray Fluorescence

    Instrument Overview X-Ray Fluorescence The specimen is excited with the primary x-radiation. In the process electrons from the inner electron shells are knocked. Electrons from outer electron shells fill the resultant voids emitting a fluorescence radiation that is characteristic in its energy distribution for a particular material. This fluorescence radiation is evaluated by the detector.

  • Page 17: Functional Principle Of The Instrument

    Instrument Overview Functional Principle of the Instrument The following figure shows the principle structure of the instrument: X-ray tube Cathode Anode WinFTM main window Primary x-radiation Primary filter Optics Shutter Mirror Video camera Aperture (Collimator) Spectrum Detector Coating layer Base material X-ray fluorescence radiation Figure 2.2: Functional principle of the instrument Functional principle...
  • Page 18 Instrument Overview 4. A light source (not shown in Fig. 2.2) illuminates the sample. A mirror and lens direct the image of the measurement location to a color video camera. The mirror has a hole in its center for the primary radiation to pass through.

  • Page 19: Components

    Components Components 2.5.1 Cover of the Measurement Chamber The cover of the measurement chamber opens and closes in the vertical direction for easy and time- saving placement or replacement of the specimen on the measuring stage in the measurement chamber. ►...
  • Page 20 Components To select the aperture 1. In the WinFTM main window select Product > Modify…. The window Modify product appears. 2. Select the tab Application. 3. Click Collim.. 4. Select the collimator and click OK. 2.5.5 Shutter The shutter is used to keep the primary x-rays from entering the measurement chamber and the en- vironment.
  • Page 21 Components 2.5.8 Absorber The absorber consists of a thin foil made of cobalt or nickel, which is located between the specimen to be measured and the detector. The absorber eliminates undesirable components of the fluorescence spectrum. Using an absorber can make it easier to evaluate the secondary x-radiation in the computer under some circumstances.
  • Page 22 Components 2.5.10 Control Panel You can use the control panel to control certain functions of the instrument. Z-AXIS SHUTTER HV ON X-RAY ON OPEN CONTROL POWER ON Z-LIMITS FAST X/Y- LIMIT START STOP Joystick Figure 2.3: Control panel of the instrument Table 2-1: Function of the control elements Control element Function...

  • Page 23: Set Up

    Set up Set up Set-up Location DANGER Explosion hazard High voltage discharges inside the instrument can be dangerous in explosion hazard zones. ► Do not place the instrument in explosion hazard zones. The instrument is designed for the following conditions: Operation temperature 10°C –...

  • Page 24: Unpacking The Measuring System

    Set up Unpacking the Measuring System 1. Open all containers of the shipment and take out the components. ATTENTION Destruction hazard The instrument can be destroyed, if you connect the instrument to the line voltage, before all components of the measuring system are connected to one another.
  • Page 25 Set up To remove the shipping lock ► Open the cover of the measurement chamber and remove the shipping lock made of foam. Store the shipping lock at a safe place. To remove the shipping lock of the measuring stage – XDLM 237 1.

  • Page 26: Establishing Connections

    Set up Establishing Connections Check the supply voltage before connecting the instrument to the voltage supply. The nominal line voltage is shown on the name plate and is either 110 V or 230 V (AC). ATTENTION Wrong line voltage Connecting the instrument to the wrong voltage can damage the instrument. ►...
  • Page 27 Set up Characteristic USB 2 USB 3 Socket colour black blue Logo at the socket 2. Video: Connect the video output of the instrument with the video input of the PC. 3. Voltage supply of the PC 4. Voltage supply of the instrument FISCHERSCOPE ®...

  • Page 28: Switching On The Instrument

     All connections were established.  Make sure that the FISIM (Fischer Software Identification Module) is plugged into a USB port  of the computer. Make sure that the high voltage key switch is in the on-position. For that purpose open the cover ...

  • Page 29: Switching Off The Instrument

    Set up Switching off the Instrument If the instrument is not in use for a long time, switch it off. Recommendation: If you use the instrument infrequently, e.g. once or twice a week, then switch off the instrument  when you have finished with your measurements. If you use the instrument more frequently, then switch off the instrument in the evening and ...
  • Page 30 Set up FISCHERSCOPE ® X-RAY...

  • Page 31: Performing Measurements

    With these products you can perform measurements immediately. If you need new measurement tasks, you can request products from FISCHER. The products are then send to you by email or on a data carrier. Before you can use the new products, you need to import and calibrate them.

  • Page 32: Deleting Measurement Readings

    Performing Measurements Deleting Measurement Readings To delete a single measurement reading 1. Highlight the measurement reading you want to delete. 2. In the WinFTM main window select Evaluation > Delete Reading. When you delete a measurement reading, ---- appears in its place in the list of measurement data and the reading will no longer be included in the evaluation.

  • Page 33: Winftm File Structure

    WinFTM File Structure WinFTM File Structure To ensure correct measurements, a set of specific files needs to be set up. The process flow for set- ting up the files needed for measurements, is the same on all FISCHERSCOPE X-RAY instruments: Def.MA: Definition of the measurement set- tings of the application...

  • Page 34: Def.ma

    If you don’t have the knowledge, do not use the SUPER software, but request a new measurement application from FISCHER instead. FISCHER offers a professional service for the creation of custom- er’s Def.MA.
  • Page 35 WinFTM File Structure 5.3.1 Dual Function of a Product A product consists of two parts that function independent of one another: Product Product part for the cali- Product part for the specimen bration standard set The parts have the following function: The product part for the specimen is used to measure the specimens.
  • Page 36 WinFTM File Structure FISCHERSCOPE ® X-RAY...

  • Page 37: User Interface Of The Winftm Software

    User Interface of the WinFTM Software User Interface of the WinFTM Software The WinFTM ® (Fischer Thickness Management Software for Windows ® ) software controls the in- strument and handles the evaluation of the signals supplied by the instrument. The measured values (coating thickness, material compositions, mass per unit area) are stored and displayed on the monitor.
  • Page 38 User Interface of the WinFTM Software Item Function Product bar Here you can select a product by clicking the button Select. In the center the number and name of the current product are displayed, here No. 60 Au/Pd/Ni/Cu. Video window Here you can see the specimen, see Chap.

  • Page 39: Video Image

    User Interface of the WinFTM Software Video Image With the help of the video image you can position and focus the specimen exactly (see Chap. 7 on Page 51). If you don‘t see the video image, it is switched off. To switch on the video image ►...
  • Page 40 User Interface of the WinFTM Software 6.2.1 Zooming and Enlarging the Video Image You can enlarge and zoom the video image to have a better view of the specimen and the meas- urement spot and for focusing the video image. To zoom in the video image ►...

  • Page 41: Statistics Field

    User Interface of the WinFTM Software 6.2.4 Stops of the XY(Z) Measuring Stage When at instruments equipped with motor-driven measuring stage the stage is travelled to its limit, the X/Y or Z limits LED on the control panel lights. In addition, an indicator in the video image appears, see the following table: Indicator Explanation...
  • Page 42 User Interface of the WinFTM Software 6.4.1 Large Number Presentation In this display mode the current measurement value (or the last values, if several characteristics are measured) is displayed in large digits. In addition to the measurement value, the measurement un- certainty is displayed as well.
  • Page 43 User Interface of the WinFTM Software and other process parameters. Furthermore, the SPC chart presentation simplifies the monitoring of the measurement devices. Figure 6.3: SPC chart presentation, the upper image shows the mean value over time, the lower image shows the standard deviation over time 6.4.4 Changing the Measurement Value Presentation To display or hide result channels WinFTM BASIC/SUPER/PDM can process up to 24 result channels (coating thickness values or an-...

  • Page 44: Status Bar

    User Interface of the WinFTM Software To change the display resolution 1. In the WinFTM main menu, click The window Modify product appears. 2. Select the tab Product. 3. In the field Display Resolution, select a resolution. To enter tolerance limits 1.

  • Page 45: Mq Value

    User Interface of the WinFTM Software Display Explanation mq value Quality factor of the last measurement value. The mq value is a measure for the agreement of the measured spectrum with the theoretical spectrum, see Chap 6.6 on Page 43. The caps lock key of the computer keyboard was pressed.

  • Page 46: Limited Operating Mode - Short Menu

    Select in the WinFTM main menu General > short Menu. To activate the full menu 1. Select in the WinFTM main menu General > full Menu. The window Input Password appears. 2. Enter the password ?Fischer? The password is case sensitive. FISCHERSCOPE ® X-RAY...

  • Page 47: The Spectrum Window

    User Interface of the WinFTM Software The Spectrum Window X-ray fluorescence radiation is emitted from the irradiated sample. The detector receives this radi- ation, the instrument amplifies it and presents it as a spectrum. You can evaluate the measured spectrum in the spectrum window. With unknown samples you can analyse, which components comprise the sample.
  • Page 48 User Interface of the WinFTM Software To display the spectrum as colored area or colored line ► In the window Spectrum click . With this button you can toggle between both representations. To display the spectral lines of all elements of the current product ►...
  • Page 49 User Interface of the WinFTM Software This function doesn‘t delete a saved spectrum file, but removes it from the spectrum window only. You can load a saved spectrum into the spectrum window again at any time. ► In the window Spectrum select Spectrum > Delete. If you have loaded several spectra, only one spectrum is deleted with this step.
  • Page 50 User Interface of the WinFTM Software A list of radiation components of one or more elements is displayed on the left next to the spec- trum window. 3. Click in the elements list on one radiation component. The energy lines associated with this element appear as colored lines in the spectrum window. You can compare the peaks of the measured spectrum with the superimposed lines to identify the elements that comprises the sample.
  • Page 51 User Interface of the WinFTM Software Intensity: Dependency on the Measurement Distance The total intensity of the X-ray fluorescence radiation emitted by the specimen decreases with the distance D of the detector from the sample with 1/D , because the solid angle of radiation collect- ed by the detector decreases with an increase in the distance as well, while the area of the radia- tion entry window of the detector remains the same.
  • Page 52 User Interface of the WinFTM Software FISCHERSCOPE ® X-RAY...

  • Page 53: Position Specimen

    Position Specimen Position Specimen There are some basic rules for positioning specimens. For each measurement it must be ensured that the x-ray fluorescence radiation can reach the detector without obstruction. Otherwise, the measurement result may be falsified. Flat Specimens Positioning flat specimens is simple. ►...

  • Page 54: Measurements In Recesses

    If you have questions in this regard, please contact FISCHER. Information about measurements on thin wires can be obtained from your authorized dealer or from FISCHER.

  • Page 55: Positioning Of Specimen

    Position Specimen Positioning of Specimen Observe the rules for positioning different specimen in Chap. 7 on Page 51. Procedure 1. Open the door of the measurement chamber. XDLM 237: The measuring stage will automatically move out of the measurement chamber. 2.

  • Page 56: Position The Specimen By Using The Mouse (Xdlm 237)

    Position Specimen Position the Specimen by Using the Mouse (XDLM 237) XDLM 237: The instrument is equipped with a motor-driven measuring stage. You can position the specimen by using the mouse, while the measurement chamber door is closed (Point & Shoot). Before you begin You have already (roughly) positioned the specimen (see Chap.

  • Page 57: Product Administration

    Product Product Administration Product Administration Product The instrument needs certain basic information to make Product measurements. This information is contained in the product file. For this reason, an appropriate product file must be selected or set up before measurements can be made. Setting up a new product An appropriate Def.MA must already be present before a new product can be set up.

  • Page 58: Importing A Product

    (see 8.13 ‘Reference samples’, beginning on Page 60). Importing a product If you have received a new product file from FISCHER, you need to im- port it. The file name has the extension *.sav, *.sv1 or *.sv3. Procedure 1.

  • Page 59: Modifying A Product

    Modifying a product Product Administration The window Copy from/to file appears. 4. Select the tab File >>> Product. 5. Click Select. 6. The window Select file appears. 7. Select the product file and click Select. The selected path appears in the field File. 8.

  • Page 60: Assigning A New Measurement Application To A Product

    Product Administration Assigning a new measurement application to a product Assigning a new measurement application to a product A new measurement application can be assigned to an existing product only if it has the same measurement mode as the existing measurement function.

  • Page 61: Deleting A Measurement Application

    8.11 Importing a Def.MA If you have received a new Def.MA file from FISCHER, you need to im- port it. The file name has the extension *.pb0. After this you create a new measurement application and a product based on the imported Def.MA.

  • Page 62: Backing Up Product Or Def.ma Files

    Product Administration Backing up product or Def.MA files 3. In the WinFTM main window select Product > Copy to/from File…. The window Copy from/to file appears. 4. Select the tab File >>> Def.MA. 5. Click Select. The window Select file appears. 6.

  • Page 63: Base Material In Def.ma

    8.14 Base material in Def.MA Def.MA files may be created Definition of the base material either by FISCHER, from where they may be forwarded to the user  for example as email attachment - the user may copy them to WinFTM using the menus "Product ->...
  • Page 64 Product Administration Base material in Def.MA Such features are substantial for WinFTM. They characterize this program as a leading evaluation tool among other programs in the X-ray fluorescence business. Those arguments do not hold if the base material structure is defined as "composition unknown".

  • Page 65: Monitoring The Measurement Devices

    Monitoring the measurement devices Product Administration excitation. Any combination of substrates not allowed in this context will be rejected. In any cases where a component of a layer is secondarily excited by a component of the base material fluorescence the definition "composition unknown" must not be used but the substrate has to be defined explicitly.
  • Page 66 Product Administration Monitoring the measurement devices The source signal is the spectrum of the X-ray fluorescence. From this signal, the program computes the thickness of the respective coatings and the concentrations of the alloy elements. The user calibrates the measurement application using calibration standards and stores the data in the product file.

  • Page 67: Handling Of Measurement Data And Statistical Evaluations

    Saving / not saving measurement data Handling of Measurement Data and Statistical Evaluations Handling of Measurement Data and Statistical Evaluations Saving / not saving measurement data In general, WinFTM saves all readings automatically in blocks within product files without the need for the user to expressly instruct the instrument to do so.

  • Page 68: Overwriting Measurement Data

    Handling of Measurement Data and Statistical Evaluations Overwriting Measurement Data Overwriting Measurement Data For various reasons, it can be useful to measure a specimen again and to overwrite the old reading with the new one. To do this, click (select) a reading, even a deleted one, from the list display mode and then click the [Start] command button.
  • Page 69 Closing a Block (Order no. / Operator) Handling of Measurement Data and Statistical Evaluations To open the dialog window “Order no. / Operator” Menu command “Evaluation > Order no. / Operator”, or  The two upper entry fields “Order no.” and “Batch no.” are linked to the block and their contents are stored together with the block data.

  • Page 70: Block Evaluation (Statistics)

    Handling of Measurement Data and Statistical Evaluations Block evaluation (statistics) Only with the PDM software add-on module is it possible to subsequently change any block-related field contents in the dialog window “Block evaluation” from the sub menu “Evaluate All Blocks” (Menu “Evaluation”) You can cause the program to prompt you automatically to fill in these fields for each new block.

  • Page 71: Variable And Fixed Block Size

    Variable and fixed block size Handling of Measurement Data and Statistical Evaluations Choose the command button [Readings] to open the window “Single readings”. In this window, you can delete values by selecting the respective line with the right mouse button and clicking the command button [Delete single reading].

  • Page 72: Statistics

    Handling of Measurement Data and Statistical Evaluations Statistics As described under “Evaluate block” above, you can select and then delete a desired block. However, you can also delete a block in the list display mode: To do this, select the block title “Block no. N” (where N is the block number) and click the icon [DEL] or the command “Delete reading Del.”...

  • Page 73: Setting Up The Print Form Using Pdm

    Statistical Evaluation and Documentation Using the Supplementary Software PDM Setting Up the Print Form Using PDM Setting Up the Print Form Using PDM 10.1 Statistical Evaluation and Documentation Using the Supplementary Software PDM The optional supplementary software PDM (product data management) allows for a more convenient evaluation of the measurement data than the basic version of WinFTM.

  • Page 74: Editing Print Form Templates Using Pdm

    Setting Up the Print Form Using PDM Editing Print Form Templates Using PDM 10.2 Editing Print Form Templates Using PDM Starting the Print Form Template Editor Select from two menu commands: “Evaluation > Print Form > new”  “Evaluation > Print Form > modify” ...

  • Page 75: Inserting Variables For Print Form Templates

    Inserting Variables for Print Form Templates Setting Up the Print Form Using PDM Example of a print form template for block evaluation: 10.3 Inserting Variables for Print Form Templates How to insert variables into print form templates: 1. You will find a list of all variables that can be inserted into the print form template to the right of the editing field.
  • Page 76 Setting Up the Print Form Using PDM Variables Available for Block Evaluation Example “Dual coating measurement” Top coating thickness = 1 and intermediate coating thickness = 2 List of variables for block evaluation: @ANBOrder number of the selected block or the information that has been entered into the first entry field of the dialog window “Order No./ Operator”.
  • Page 77 Variables Available for Block Evaluation Setting Up the Print Form Using PDM @DATCurrent date for the print form Default format: DD/MM/YYYY, e.g., 24.05.1998) @DF1Density of the coating that has been entered into the current product. This applies only to coatings with a fixed composition.
  • Page 78 Setting Up the Print Form Using PDM Variables Available for Block Evaluation @NB1Number of readings present in the block that contribute to the statistical block result @NCALNumber of single readings that are taken on the calibration standard during the calibration of the current measurement application (the current meas.
  • Page 79 Variables Available for Block Evaluation Setting Up the Print Form Using PDM The standard deviation s is a measure for the distribution of Regarding the numerals 1; 2; 3 … after certain the single readings of the measurement series around their variables: common mean value.

  • Page 80: Variables Available For The Final Evaluation

    (1,2,3). Example: @VIF[40,Fischer.bmp] -> the image that is saved Example “Dual coating in the file “Fischer.bmp” appears in the print form. measurement” Top coating thickness = 1 Image height = 40 mm. Intermediate coating...
  • Page 81 Variables Available for the final Evaluation Setting Up the Print Form Using PDM @ANBOrder number of the last block of the selected blocks or the information that has been entered into the first entry field of the dialog window “Order No./ Operator”. @BM1Lot number of the last block of the selected blocks or the information that has been entered into the second entry field of the dialog window “Order No./ Operator”.
  • Page 82 Setting Up the Print Form Using PDM Variables Available for the final Evaluation of the current product. @SA1Standard deviation s_a. This standard deviation expresses the additional distribution of the mean values of fixed blocks that cannot be explained by the standard deviation s of the single readings within the blocks.

  • Page 83: Products With A Variable Or Fixed Block Size

    Products with a variable or fixed block size Setting Up the Print Form Using PDM presentation and computation of the violations of the lower limit in the selected block of the current product. @VK1Coefficient of variation of the single readings of the selected block.
  • Page 84 Setting Up the Print Form Using PDM Products with a variable or fixed block size All variables and parameters that otherwise refer to single readings refer, in this case, to the mean values of the individual blocks (except for histogram and normal probability chart, which continue to refer to single readings).

  • Page 85: Special Features For Spc Charts

    Special Features for SPC Charts Setting Up the Print Form Using PDM window “Measurement quantity selection”, the variable “@MW2” will appear in the print form template. NOTE: Note: The variables must always be entered in upper case letters! NOTE: Note: The character @ is part of the variable, i.e., it must be entered, must not be deleted and it must not be followed by space! NOTE:...

  • Page 86: Printing The Print Form Using The Supplementary Software Pdm

    Setting Up the Print Form Using PDM Printing the Print Form Using the Supplementary Software PDM (e.g., @SP1[150,90]). NOTE: Note: You can only enter numbers in these fields if the option box “Size user-defined” is checked. 10.8 Printing the Print Form Using the Supplementary Software PDM Print forms can be printed very easily when using the supplementary software PDM.

  • Page 87: Measurement Uncertainty And Measuring Ranges

    Printing the Print Form Using the Supplementary Software PDM Measurement Uncertainty and Measuring Ranges Measurement Uncertainty and Measuring Ranges The program is able to display for each measurement result a corresponding measurement uncertainty. To estimate the Measuring range In the WinFTM main menu select Calibrate > Estimate meas.

  • Page 88: Meaning Of The Measurement Uncertainty

    Measurement Uncertainty and Measuring Ranges Meaning of the measurement uncertainty Definition "Measuring range" Range, where the precision does not exceed a specified limit value. Precision: random measurement uncertainty due to distribution of the spectral channel contents of the instrument. 11.1 Meaning of the measurement uncertainty Measurement uncertainty refers to the unknown difference to the true value.

  • Page 89: Random Error

    Random Error Measurement Uncertainty and Measuring Ranges 11.2 Random Error If a measurement is repeated N times, the single readings will deviate around a mean value. The cause for this is the random distribution of the channel contents of the spectrum, whose law of formation (Poisson distribution) we know.

  • Page 90: Systematic Error

    Measurement Uncertainty and Measuring Ranges Systematic Error Calibration standard set. Input of the nominal values of the standards. The uncertainties (errors) must be entered as well. If the pre-set Zero is not changed then the program will automatically use 1% of the nominal values for coating thicknesses and area masses, and 1 mass % for concentrations as the uncertainty, referenced to k=1 (68% confidence interval).

  • Page 91: Display Of The Measurement Uncertainty

    Display of the measurement uncertainty Measurement Uncertainty and Measuring Ranges standard set, cf. figure below. For the confidence interval, the general provision according to Section 1 applies here as well. For program-technology reasons, the systematic portion of the error is available only via On-line-Export. Setting of the error display for screen output and export in the "Calibration standard set".
  • Page 92 Measurement Uncertainty and Measuring Ranges Display of the measurement uncertainty Systematic portion Computed from the Uses the error value of random error of the the last measurement calibration measure- of the block ment and the uncer- tainties of the nominal values of the stan- dards, according to the input in the "Calibra-...
  • Page 93 Display of the measurement uncertainty Measurement Uncertainty and Measuring Ranges Example for the export of single readings and block results Online export to text file. Export template "Single reading" por- @NBR. @VA1 +/- @ER1@CRX@LFX@END tion: "Block evaluation" por- Evaluation Block No. @BLK @ANB @PRF tion: @LOT@CRX@LFX@MW1+/- @VB1 s=@S_1 (N=@NM1)@CRX@LFX@CRX@LFX@END...

  • Page 94: Task Programming

    Task programming Starting a Task Task programming A Task is a sequence of predefined commands which can be used for programming WinFTM procedures. 12.1 Starting a Task The menu command “Task > Task start” starts a task. Use the F3 function key to interrupt the program run. 12.2 Programming Tool The commands are similar (or in some cases equal to) the import commands.

  • Page 95: Getting Started With Task Programming

    Getting started with task programming Task programming 12.3 Getting started with task programming There are some predefined examples which are helpful for testing. The user should start his task programming by a modification of these examples. The "Save as .." option can be used to create new task files.
  • Page 96 Task programming List of Task Commands f10 X Loads - from current directory - product no. X f11 A,XLoads - from of directory A - product no. X f12 B Loads - from current directory - product with designation B f13 A,BLoads - from directory A - product with designation B f15 N Loads Stabi Test product no.
  • Page 97 List of Task Commands Task programming command. The program cycle is then continued at a different place, that is, at the jump address. Only one jump address with the same name may be entered in the Task. A loop in the program cycle is created if the jump address points to a program step that is ahead of the jump command more towards the beginning of the program.

  • Page 98: Example Specification Limit Commands

    Task programming Example Specification Limit Commands In case of TRUE (the respective relationship is fulfilled), the task will jump to label L. S Meaning (“i” represents the number of the measurement data column) > KiReading no. i (i=1,2,3) > USL <...
  • Page 99 Example Specification Limit Commands Task programming 2 Cr = 0.73 μm Ni = 4.12 μm Cu = 6.27 μm 3 Cr = 0.78 μm Ni = 4.21 μm Cu = 6.20 μm Solution: The values below from the third line (where n=3) were sought: Here, reading 1 is the reading for Cr, i.e., 0.78 μm Reading 2 is the reading for Ni, i.e., 4.21 μm...

  • Page 100: Data Back-Up

    Data back-up Extent of the data back-up Data back-up Protect your data - back Regularly back-up at least the following folders or files in order to them up! be able to return to the previous status in case of a hard disk crash or accidental erasure of important files: Folder “Data”...

  • Page 101: Back-Up Cycle

    Back-up cycle Data back-up 13.3 Back-up cycle You can set the back-up cycle, that is, the waiting time until the Data back-up prompt prompt for the data back-up appears in the entry box “Waiting time …”. The actual operating time of the instrument is counted in days. If you enter “0”, the prompt for data back-up will occur after about 1 min.
  • Page 102 Data back-up Back-up cycle Use the menu command “Product > copy from … to…” from within the WinFTM Software to copy individual product files, for example, onto a diskette and transfer them, for example, to an instrument of the same type. FISCHERSCOPE ®...

  • Page 103: Mass Per Unit Area And Geometric Coating Thickness

    Back-up cycle Mass per unit area and geometric coating thickness Mass per unit area and geometric coating thickness The natural unit of measurement for X-ray fluorescence is mass per unit area. Definition "Mass per unit area": Mass per area The number of atoms or the mass per unit area can be determined from the fluorescence spectrum.
  • Page 104 Mass per unit area and geometric coating thickness Back-up cycle of the characteristic radiation of the coating material is determined from the number of atoms within the excited sample volume. The intensity of this radiation is higher as more atoms of the sample volume are excited by the primary radiation and emit their radiation to the detector.

  • Page 105: Correlation Between Mass Per Unit Area And Coating Thickness

    Correlation between mass per unit area and coating thickness Mass per unit area and geometric coating thickness Essentially, the measurement of the x-ray fluorescence is an indirect count of the excited atoms under a surface with a precisely defined size, the so-called “measurement spot”. 14.1 Correlation between mass per unit area and coating thickness If a coating is comprised of several elements, the instrument initially...
  • Page 106 Mass per unit area and geometric coating thickness Correlation between mass per unit area and coating thickness Correspondingly, the density is greater than the one shown in Figure 1. The XRF method can provide the correct (geometric) coating thickness if the measurement application that is used in process 1 uses a lower density for converting the mass per unit area into coating thickness according to equation 1 than the one of process 2.

  • Page 107: Calibration Standards From Fischer

    No data have been obtained using the cross-cut method. By default, WinFTM uses the density values of the Heräus table. The calibration lab of FISCHER has been accredited by the Deutsche Akkreditierungsrat [German Accrediting Council] for the measurement unit “mass per area unit”.
  • Page 108 Mass per unit area and geometric coating thickness Setting the density in the Def.MA If you wish to work in a different mode, select the respective mode command to operate the dialog window “Def.MA” in the desired mode. Dialog window “Definition of elements“. The density of the current element can be entered or edited in the entry box “g/cmˆ3”.

  • Page 109: Measurement Device Monitoring For The Fischerscope X-Ray

    According to quality management guidelines, all measuring instruments are subject to measurement device monitoring. FISCHER, as a manufacturer of measurement instruments, accounts for this and sees to it that customers who require advice and support are able to properly use their measurement instruments.
  • Page 110 (documentation is required; see Fischer Application Report vr 9812). Strictly speaking, a ”correct” measurement is secure only for such samples that correspond to the calibration standards in their coating structure and composition.

  • Page 111: Why Monitor Measurement Devices

    Why monitor measurement devices? Measurement device monitoring for the Fischerscope X-RAY 15.2 Why monitor measurement devices? In the course of time, each coating thickness measuring instrument Stability changes due to wear and drift. Long-term, this also changes the measurement applications and calibrations, and thus, the measurement readings.

  • Page 112: Variation Of Measurement Readings

    Measurement device monitoring for the Fischerscope X-RAY Variation of measurement readings 15.3 Variation of measurement readings Repeatability The displayed value of any measuring instrument will not be exactly Conditions the same when repeating a measurement, instead it will vary, even under otherwise equal measurement conditions (repeatability conditions), due to random influences of the instrument.

  • Page 113: Trueness Of Measurement Readings

    Trueness of measurement readings Measurement device monitoring for the Fischerscope X-RAY The variations of an X-ray fluorescence instrument depend on the Variations measurement parameters measurement time, distance between the detector and the specimen, intensity of the primary beam and other characteristics of the instrument as well as on the physics of the X-ray fluorescence with regard to the measurement application.

  • Page 114: Random And Systematic Deviations

    Measurement device monitoring for the Fischerscope X-RAY Random and systematic deviations Please note that we expressly speak of the trueness as a property of the measurement readings. However, many believe the trueness to be a property of the instrument! Unprofessionally, this is expressed in the question for the ”accuracy of the instrument”.
  • Page 115 Random and systematic deviations Measurement device monitoring for the Fischerscope X-RAY standard: In such a case, the user need not be surprised by the deviation. Statistics teaches: Only when a mean value of a test series of at least 7 single readings misses the nominal value of a calibration standard by more than one standard deviation can one assert that the deviation is a systematic one.

  • Page 116: Trueness And Precision

    Measurement device monitoring for the Fischerscope X-RAY Trueness and precision explained by the lacking precision of the instruments involved and does not need to cause a dispute. In such cases, one can no longer speak of different measurement results. However, if one wishes to prove that the difference is systematic, then the precision of the involved instruments must be increased (e.g., by increasing the measurement time or by decreasing the measurement distance or...
  • Page 117 Trueness and precision Measurement device monitoring for the Fischerscope X-RAY This can be observed, for example, with round robin tests on the same sample with a marked reference area, even if each instrument is correctly calibrated and checked. The reasons are the random deviations of each single reading, and thus of each mean value of a test series, the random deviations at each calibration, and also the fact that each calibration standard is labeled with a...

  • Page 118: Practical Monitoring Of The Measurement Devices

    Measurement device monitoring for the Fischerscope X-RAY Practical monitoring of the measurement devices reading differences. It is not without reason that the X-ray fluorescence method is considered the most accurate measurement method for coating thicknesses due to its high comparative precision. Because the most common and grave deviations are of a systematic nature, they must be found and corrected.
  • Page 119 Practical monitoring of the measurement devices Measurement device monitoring for the Fischerscope X-RAY samples can also be used to compare the measurement results of two parties (e.g., supplier and customer) when calibration standards are not available at one of the parties and one tries to avoid shipping of relatively expensive calibration standards.

  • Page 120: When And How To Carry Out Corrections

    Measurement device monitoring for the Fischerscope X-RAY When and how to carry out corrections? performs a calibration service, for example, because no calibration standards are available, the user only has the option to monitor the measurement device using reference standards. Thus, establishing reference samples is an obligatory consequence of using a calibration service, because continued access to standards by the user is not possible.

  • Page 121: Pre-Run For Determining The Control Limits

    Pre-run for determining the control limits Measurement device monitoring for the Fischerscope X-RAY With a Fischerscope XRAY with WinFTM software, the spectra of the ”pure elements” are not measured anew during the normalization but instead are accepted from the spectra library that contains their spectra when the switch ”Measure elements”...
  • Page 122 Measurement device monitoring for the Fischerscope X-RAY Pre-run for determining the control limits measurement distance, collimator, etc.) typically used for the measurement application and should be concluded within a short period for the instrument to remain stable during this time. Systematic changes during this period are then negligible.
  • Page 123 Pre-run for determining the control limits Measurement device monitoring for the Fischerscope X-RAY The two limit values UCL(x) (upper control limit for the mean value x.) and LCL(x) (lower control limit for the mean value x.) are the product of the nominal value x_est and the standard deviation s with: UCL (x) = x_est + 3 ·...
  • Page 124 (mean values Ni. and Cu. per group, standard deviation s per group), the final result, the control limits as well as the control charts for the nickel coating and for the copper coating: Helmut Fischer GmbH Office West Danziger Straße 1050374 Erftstadt Tel.: 02235 41447Fax: 02235 922990 Fischerscope ®...
  • Page 125 Pre-run for determining the control limits Measurement device monitoring for the Fischerscope X-RAY Mean value x.. 7.449 μm 7.681 μm Standard deviation s 0.125 μm 0.133 μm Confidence mean value 0.051 μm 0.066 μm Range R(x.) 0.321 μm 0.327 μm Lower control limit (x) 7.26 μm 7.46 μm...

  • Page 126: Long-Term Monitoring

    In such cases, the user should entrust his problem and help to the support and service personnel of FISCHER. FISCHERSCOPE ® X-RAY...
  • Page 127 Long-term monitoring Measurement device monitoring for the Fischerscope X-RAY FISCHERSCOPE ® X-RAY...
  • Page 128 Measurement device monitoring for the Fischerscope X-RAY Long-term monitoring FISCHERSCOPE ® X-RAY...

  • Page 129: Def.ma

    The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and the functionality of the instrument. Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a professional service for the creation of customer’s Def.MA.

  • Page 130: Creating A New Def.ma

    Def.MA Mode Application Component mode For the analysis of specimens, which are not only composed of pure ele- ments, but also contain chemical compounds (e. g. oxides). WinFTM offers a list of components, which can be used like elements. The result display shows the measurement readings of the complete compo- nents, not only the elements the components are composed of.

  • Page 131: Entering Compensation Spectra

    Def.MA In case of a complex layer (mixture of materials or alloy) enter more elements and their percent- ages. 9. Click Elem.+ to transfer the values to the display field. The values of the entered layer appear in the large display field. 10.Repeat steps 8 to 9 for each element of the current layer.
  • Page 132 Def.MA • Compensation Spectrum If a suitable compensation spectrum is available, you can activate the option yes in the in the area Compensation Spectrum and enter a name for the spectrum, e. g. glass or plastics. At a later moment during the calibration you will be prompted to position the compensation spectrum.

  • Page 133: Display The Measurement Mode

    Def.MA 16.4 Display the Measurement Mode In the window Def.MA there is a field that displays the measurement mode. Depending on the used Def.MA mode (see Table 16-1 on Page 127), this field has the name Mode, Analysis Mode, Thickness Mode, Mass per unit area (relative/absolute), Components‘s Mode or Solution Analysis.
  • Page 134 Def.MA FISCHERSCOPE ® X-RAY...

  • Page 135: Programming Coordinates For Automatic Measurements (Xdlm 237)

    Programming Coordinates for Automatic Measurements (XDLM 237) Programming Coordinates for Automatic Measurements (XDLM 237) The instrument XDLM 237 is equipped with a motor-driven measuring stage. You can program co- ordinates for measurement points in order to let the instrument measure automatically at various locations on the specimen.

  • Page 136: Point & Shoot

    Programming Coordinates for Automatic Measurements (XDLM 237) 17.1 Point & Shoot Using the Point & Shoot method, you can travel very quickly to the desired measurement location on the specimen. Procedure 1. On the video image, position the mouse pointer at the desired measurement location. 2.

  • Page 137: Traveling To Any Desired Position

    Programming Coordinates for Automatic Measurements (XDLM 237) 17.4 Traveling to any Desired Position Using the window Go to XY(Z) position, you can control the measuring stage from the screen. Opening the XY position window ► To open the window, choose XY(Z)-Axis > Move to Position. The window remains open even if you perform other functions or enter other commands.

  • Page 138: Opening And Closing The Window Xy(Z) Coordinates

    Programming Coordinates for Automatic Measurements (XDLM 237) 17.5 Opening and Closing the Window XY(Z) coordinates To open the window XY(Z) coordinates 1. Select from the menu bar XY(Z)-Axis > Programming. The window XY(Z) coordinates appears: Figure 17.1:Window for coordinates programming (XYZ coordinates) Element Function Video field...

  • Page 139: Deleting Programmed Coordinates

    Programming Coordinates for Automatic Measurements (XDLM 237) Element Function Measuring Here, the programmed points on the measuring stage are shown. stage field Table field Here, the coordinates are displayed. To close the window XY(Z) coordinates: When you close the window, you can decide if the programmed values shall be stored or not. ►...

  • Page 140: Programming Individual Points

    Programming Coordinates for Automatic Measurements (XDLM 237) 17.7 Programming Individual Points You can program any desired points on the XY(Z) stage, travel to each individual point and then store its coordinates. Before you start 1. Open the window XY(Z) coordinates, ref. Chap. 17.5 on Page 136. 2.

  • Page 141: Programming An Array

    Programming Coordinates for Automatic Measurements (XDLM 237) What you can do next You can now travel to all programmed points (ref. Chap. 17.13 on Page 143) or program one or two datum points (ref. Chap. 17.12 on Page 142). 17.9 Programming an Array To program an array, define the upper left and the lower right point of the array as well as the points that shall be contained in the array.
  • Page 142 Programming Coordinates for Automatic Measurements (XDLM 237) Procedure 1. From the programming field select the options Points + Pattern. The following Figure shows a section of the window for coordinates programming. Pattern Individual Points Upper table field; the relative coordi- nates of the points of the pattern are dis- played here Lower table field;...

  • Page 143: Circular Coordinates

    Programming Coordinates for Automatic Measurements (XDLM 237) What you can do next You can now travel to all programmed points (ref. Chap. 17.13 on Page 143) or program one or two datum points (ref. Chap. 17.12 on Page 142). 17.11 Circular Coordinates You define a center of a circle, the number of measurement points on the circumference of the circle and the starting point.

  • Page 144: Programming Datum Points

    Programming Coordinates for Automatic Measurements (XDLM 237) 17.12 Programming Datum Points In addition to the measurement points (individual points, lines, arrays or circular coordinates), you can also program one or two datum points. You can then change parts, or place parts anew and ensure that always the correct coordinates are visited, even if the specimen is not positioned 100% at the same place.

  • Page 145: Traveling To All Programmed Points

    Programming Coordinates for Automatic Measurements (XDLM 237) 6. Click Dat.2. The second datum point is stored. What you can do next You can now travel to all programmed points (ref. Chap. 17.13 on Page 143). 17.13 Traveling to All Programmed Points Procedure 1.
  • Page 146 Programming Coordinates for Automatic Measurements (XDLM 237) FISCHERSCOPE ® X-RAY...

  • Page 147: Calibration, Base Correction And Reference Measurement

    Calibration, Base Correction and Reference Measurement Calibration, Base Correction and Reference Measurement 18.1 Base Correction (Substrate Material Correction) 18.1.1 Purpose of the Base Correction A base correction (also referred to as substrate material correction) is only possible, if the base is an alloy.

  • Page 148: Calibration

    If you have any questions, please contact FISCHER via the website www.hel- mut-fischer.com. FISCHER can carry out a calibration service for you. In this case, you will receive a corresponding sheet with calculations and implications for evaluating the calibration.
  • Page 149 Materials to measure the Required only in special cases. spectra background FISCHER can supply the following calibration standards: Calibration standard set Consists of a calibration standard set with several calibration (Cal-NS) standards of a specific coating/base material combination.
  • Page 150 Calibration, Base Correction and Reference Measurement Procedure 1. In the WinFTM main window select Calibrate > Calibration Standard Set…. An empty window will appear, if the measuring application has not yet been calibrated. If the measuring application has already been cali- brated, check the values in the window.
  • Page 151 Calibration, Base Correction and Reference Measurement 6. Once you have entered all values of a calibration standard, click OK. 7. To enter additional calibration standards, repeat steps 3 to 6 for every calibration standard. Before you enter an additional calibration standard, make sure that no line is selected in the window Input Calibr.
  • Page 152 Calibration, Base Correction and Reference Measurement Depending on the measuring application, different prompts will appear that have the following meaning: Scatt A scatter spectrum shall be measured. As a rule, it is already  saved in the software and can be opened automatically from the menu General >...
  • Page 153 Calibration, Base Correction and Reference Measurement After the last measurement, the window Input of the cali- bration standard set will appear. 14.Ensure that the following conditions are met: The values in columns (3) Corr. (corrected values) are consistent with the values in columns ...

  • Page 154: Reference Measurement

    Calibration, Base Correction and Reference Measurement Nominal value x measured s measured min. value max. value Evaluation Cr 1.5 μm 1.51 μm 0.03 μm 1.45 μm 1.57 μm Cr 0.77 μm 0.75 μm 0.02 μm 0.68 μm 0.79 μm Not OK The calibration was successful if all re-measurements are within the respective ranges and you are able to use the measuring application.
  • Page 155 Calibration, Base Correction and Reference Measurement Click Stop Click Exit Procedure with automatic positioning 1. Position the pure element silver (Ag) and close the measuring chamber. 2. Adjust the focus. 3. In the WinFTM main window select General > Reference Measurement. The window Reference Measurement appears.
  • Page 156 Calibration, Base Correction and Reference Measurement Procedure with manual positioning 1. Position the pure element silver (Ag) and close the measuring chamber. 2. Adjust the focus. 3. In the WinFTM main window select General > Reference Measurement. The window Reference Measurement appears.

  • Page 157: Solution Analysis

    Solution Analysis Solution Analysis For the solution analysis you need a measuring cell. You fill the measuring cell with the solution to be analyzed, position the measuring cell and perform the measurement. The measuring cells are available with different reference plates. When selecting the measuring cell, note that the characteristic x-ray lines of the sample to be measured may not be too close to the x-ray lines of the reference plate material.

  • Page 158: Filling The Measuring Cell

    Solution Analysis 19.2 Filling the Measuring Cell WARNING Corrosive Liquids The solution to be analyzed can be corrosive and can cause chemical burns. ► Avoid contact of the solution with skin or eyes. ► After skin or eye contact immediately rinse with plenty of water and consult a physician.

  • Page 159: Positioning The Measuring Cell

    Solution Analysis 5. Place the clamping ring over the foil-covered measuring cell and press it down carefully until the foil is taught. Avoid: • Tearing the foil • Air bubbles Overflowing liquid is caught in the drip groove. 19.3 Positioning the Measuring Cell Before you start Before you position the measuring cell you need to fill it, see Chap.

  • Page 160: Cleaning The Measuring Cell After Use

    Usually you obtain either a product file or a Def.MA file for the solution analysis from FISCHER. If you obtain a product file from FISCHER, you need to import the product file (see Chap. 19.5.1 on Page 159). The product file contains all relevant settings.
  • Page 161 Solution Analysis 19.5.1 Importing a Product If you have received a new product file from FISCHER, you need to import it. The file name has the extension *.sav, *.sv1 or *.sv3. Procedure 1. If you have received the product file by e-mail as a file attachment, save the file in a directory that does not belong to WinFTM, e.g.
  • Page 162 Solution Analysis 7. Click Start copy. The file will be copied. After this the report The Def.MA was copied successfully appears. 8. Click OK. 9. To close the window, click cancel. What you can do next You can now create a new product based on the imported Def.MA. 19.5.3 Setting up a Product File for the Solution Analysis Before you start Before you can set up a product for the solution analysis, a Def.MA file for your solution analysis...
  • Page 163  such as scatt or similar. The spectrum background is included with the shipment as a file. Other typical brief designations of the background spectrum for a FISCHER Def.MA may be streu or wasserdummy, for example. The Def.MA window for the Solution Analysis There is a special Def.MA window that is particularly suited for setting up Def.MAs for the solution...
  • Page 164 Solution Analysis You cannot switch to the calibration standard set of the product and cannot modify it.  A maximum of 22 elements can be written into the analysis task (excluding the material of the  reference plate and oxygen). NOTE: You can set up more complex Def.MAs for solution analyses using the standard Def.MA window.

  • Page 165: Measurement Data Export

    Measurement Data Export Measurement Data Export You can export the measured values, their XYZ coordinates, statistical evaluations and other data to other applications like spreadsheets, statistical evaluation tools or process control systems. All settings for the measurement data export are assigned to one product. For each product, you can define different settings for the data export.

  • Page 166: Export Settings

    Measurement Data Export 2. In the window Exporting data select the following options: Do not check Online-Export ON. Press the button Select…, which is located besides the fields Template: and No.. Select the export template, e. g. default. Click overwrite file. Press the button Select…, which is located besides the fields Destination file:.
  • Page 167 Measurement Data Export Table 20-2: Explanation of the controls of the Exporting data window Control Explanation Online-Export ON The measurement data is exported continuously when measurement data is acquired by the instrument. The reading is exported directly after a measurement is made. ...

  • Page 168: Setting Up An Export Template

    Measurement Data Export Control Explanation to Excel The data will be directly sent to an Excel file. A new Excel workbook (Workbook 1) opens with the first exported value. Even if Excel is already opened, a new workbook will open with the first exported value.
  • Page 169 Measurement Data Export The window Definition of Export Template appears. The three sub-windows on the left define the different sections of data to be exported: single read- ings, block statistics and header info. With the check boxes in the area Export Mode you can ac- tivate or deactivate the sections.
  • Page 170 Measurement Data Export To add a variable to your template: 1. Set the cursor to the position in your template, where the variable shall be inserted. 2. Highlight the variable in the window at the right. 3. Click 20.3.1 The Syntax of the Default Template To explain the general principle for setting up an export template and the effect of the variables, the syntax of the default export template is described in this section.
  • Page 171 Measurement Data Export Template for block statistics Syntax: Block #@TAB@BLK@TAB@ANB@TAB@LOT@TAB@BM1@TAB@BM2@CRX@LFX x = @TAB@TAB@MW1@TAB@MW2@TAB@MW3 … MW20@CRX@LFX s = @TAB@TAB@S_1@TAB@S_2@TAB@S_3 … S_20@LFX@LFX@END For more clarity the syntax is shown here in two lines. In the window Definition of Export Template the template must be written in one line to avoid unwanted carriage returns and line feeds.
  • Page 172 Measurement Data Export Header export mask Syntax: @CAL@TAB#@TAB@PRN@CRX@LFX@LFX #@TABOperator@TAB@EL1 @DM1@TAB@EL2 @DM2@TAB@EL3 @DM3 … @EL20 @DM20@LFX@LFX@END For more clarity the syntax is shown here in two lines. In the window Definition of Export Template the template must be written in one line to avoid unwanted carriage returns and line feeds.

  • Page 173: Pattern Recognition (Xdlm 237)

     To use the pattern recognition function, the WinFTM extension SUPER must be activated. Videos with pattern recognition applications can be found on the following website: www.helmut-fischer.com/pattern-recognition 21.1 Scenarios: Pattern Recognition, XY Programming and Task Programming You can combine the pattern recognition with XY programming and task programming. The two following typical scenarios are explained in this chapter: The coating thickness on the contact pads of SMD components is to be determined.

  • Page 174: Settings And Their Meaning

    Pattern Recognition (XDLM 237) 21.2 Settings and their Meaning All settings for the pattern recognition are valid for one product. You can assign every product its own settings for pattern recognition. The settings apply to the current image number, i.e. you can make separate settings for each image.
  • Page 175 Pattern Recognition (XDLM 237) Setting/parameter Meaning Replay at Pos.No. If the specimen has repetitive structures (e.g. a panel with sev- eral individual printed circuit boards), then you can use this to define the position at which the pattern recognition is to start again from the beginning.

  • Page 176: Pattern Recognition: Contact Pads Of Smd Components

    Pattern Recognition (XDLM 237) 21.3 Pattern Recognition: Contact Pads of SMD Components In the following, the pattern recognition is explained using contact pads of SMD components as an example. The clever arrangement of the search item and the search area produces an automatic feed.
  • Page 177 Pattern Recognition (XDLM 237) Measuring position Search item Figure 21.1: Pattern recognition window: The hatched rectangle shows the search item, and the cross shows the measuring position 6. In the Pattern definition area, click Show search item. If the Total video area option is activated, deactivate it.
  • Page 178 Pattern Recognition (XDLM 237) 8. Define the measuring position by clicking on the measuring position with the right mouse button. The measuring position can be inside or outside of the search item rectangle. 9. Set the parameters according to the following table: Parameter Value On measure, find automatically...
  • Page 179 Pattern Recognition (XDLM 237) 11.Define the search area: Position of the search area: Place the cursor in the rectangle, keep the left mouse button  pressed and move the rectangle. Size of the search area: Place the cursor on one of the eight black points, keep the left ...

  • Page 180: Pattern Recognition: Measurements On Printed Circuit Boards

    Pattern Recognition (XDLM 237) 21.4 Pattern Recognition: Measurements on Printed Circuit Boards In the following, the pattern recognition is explained using contact pads of SMD components as an example, see Fig. 21.3. Datum point 1 Panel Individual printed circuit board Datum point 2 Figure 21.3: Printed circuit board panel with several individual printed circuit boards, datum points 1 and 2 serve as positioning aids...
  • Page 181 Pattern Recognition (XDLM 237) 6. Click Take new picture. The video image appears in the pattern recognition window. 7. In the Pattern definition area, click Show search item. If the Total video area option is activated, deactivate it. A hatched rectangle appears. This rectangle marks the search item, i.e. the area of the image that is to be found again.
  • Page 182 Pattern Recognition (XDLM 237) 9. Define the measuring position by clicking on the measuring position with the right mouse button. The measuring position can be inside or outside of the search item rectangle. 10.Set the parameters according to the following table: Parameter Value With progr.
  • Page 183 Pattern Recognition (XDLM 237) 12.Define the search area: Position of the search area: Place the cursor in the rectangle, keep the left mouse button  pressed and move the rectangle. Size of the search area: Place the cursor on one of the eight black points, keep the left ...
  • Page 184 Pattern Recognition (XDLM 237) 19.To transfer the search images programmed for the first individual printed circuit board to the other individual printed circuit boards, enter 10 in the Replay at Pos.No. field. 21.4.1 Automation of the measurement with a task To avoid having to define the search images and search areas for all individual printed circuit boards, you can automate the measurement with a task.
  • Page 185 Pattern Recognition (XDLM 237) |f58 1 ;Picture No. Patternrecognition |f01 ;Start measurement |f38 ;Test coordinates, no para = next pos., or use pos.no.# |f58 7 ;Picture No. Patternrecognition |f01 ;Start measurement |f38 ;Test coordinates, no para = next pos., or use pos.no.# |f58 8 ;Picture No.
  • Page 186 Pattern Recognition (XDLM 237) FISCHERSCOPE ® X-RAY...

  • Page 187: Cleaning And Maintenance

    Cleaning and Maintenance Cleaning and Maintenance 22.1 Cleaning the Instrument DANGER Line voltage Contact to line voltage can lead to death or serious injuries. ► Disconnect the instrument from the line voltage, before you start to clean the instrument. ATTENTION Destruction hazard The instrument can be destroyed, if you clean the instrument improperly or with aggressive cleaning agents or if the instrument is exposed to fluids.

  • Page 188: Replacing The Line Fuse

    Cleaning and Maintenance 22.3 Replacing the Line Fuse DANGER Line voltage Contact to line voltage can lead to death or serious injuries. ► Disconnect the instrument from the line voltage, before you start to clean the instrument. Before you begin To replace the line fuse you need: A new 2 A (250 V) slow blow fuse ...

  • Page 189: Preparing The Instrument For Transport

    2. XDLM 237: Re-install the shipping lock of the measuring stage. Attach the red shipping lock with the measuring stage by fastening the four hex socket screws. If you no longer have access to the original shipping lock, order a new kit from FISCHER. The part number is 523-713.

  • Page 190: Troubleshooting

    Cleaning and Maintenance 22.5 Troubleshooting Error Possible cause Solution No display on the monitor Screen saver active Move the mouse. This will turn the screen saver off. The computer is not turned Turn the computer on. The monitor is not turned on. Turn the monitor on.
  • Page 191 Cleaning and Maintenance Error Possible cause Solution Instead of a measurement The communication between Enable the communication be- reading, the window Open instrument and WinFTM is tween instrument and WinFTM appears after a measure- disabled. (see Chap. 3.7 on Page 27). ment has been started Communication between in- The instrument is not correct-...
  • Page 192 Cleaning and Maintenance FISCHERSCOPE ® X-RAY...

  • Page 193: Addendum

    Addendum Addendum 23.1 Description of the Characteristic Statistical Parameters 23.1.1 Block Result Parameter Description Equation Mean value Mean value of the single readings, called arithmetic mean value The arithmetic mean value is the summation of all single readings of a measurement series (block/ ...
  • Page 194 Addendum Parameter Description Equation Coefficient of Ratio of the standard deviation to --100 variation the mean value V [%] Standard deviation Mean value of the block For sufficiently large samples it can be said:  -- -   Standard deviation ...
  • Page 195 Addendum 23.1.2 Final Result – Fixed Block Definition Automatic block creation (Block definition fix) is enabled for the product. Parameter Description Equation Mean value Mean value of the block mean values. is the summation of all  ------- - block mean values of a measurement series, divided by the number of blocks...
  • Page 196 Addendum Parameter Description Equation Mean range Mean range of the block ranges  ------- - : Ranges of the blocks : Number of blocks Mean range Mean range referring to the mean value ---100 : Mean range of the block ranges : Mean value of the block mean values...
  • Page 197 Addendum Parameter Description Equation Process capability index   Min C Computed and displayed only if specification limits are enabled – ------------------ - 3 ˆ USL – ------------------- - 3 ˆ USL:Upper specification limit LSL:Lower specification limit  ˆ : Estimated value for the mean standard deviation s ...
  • Page 198 Addendum 23.1.3 Final Result – Variable Block Definition Manual block creation (Block definition variable) is enabled for the product. Parameter Description Equation Mean value Arithmetic mean value of the single readings  -- - : Single readings of the selected blocks Number of measurements of the selected blocks...
  • Page 199 Addendum Parameter Description Equation Range R Difference between the highest and – the lowest reading of the selected blocks :Highest reading of the selected blocks :Lowest reading of the selected blocks Range R Range relating to the mean value ---100 Range Mean value of the single read- ings of the selected blocks...
  • Page 200 Addendum Parameter Description Equation n (> USL) Number of measurements that are above the upper specification limit USL n (> USL) [%] Number of measurements that are above the upper specification limit USL in percent Displayed only if specification limits are enabled n (<...

  • Page 201: Periodic Table Of The Elements With X-Ray Properties

    Addendum 23.2 Periodic Table of the Elements with X-Ray Properties FISCHERSCOPE ® X-RAY...
  • Page 202 Addendum FISCHERSCOPE ® X-RAY...

  • Page 203: Data Sheet Fischerscope ® X-Ray Xdlm

    DATA SHEET ® ® FISCHERSCOPE X-RAY XDLM ® ® FISCHERSCOPE X-RAY XDLM ® ® FISCHERSCOPE X-RAY XDLM X-Ray Fluorescence Measuring Instrument for Manual or Automated Coating Thickness Measurements and Analyses on PC-Boards, Electronics Components and Mass-Produced Parts, even on small Structures Coating Thickness Material Analysis Microhardness...
  • Page 204 Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE X-RAY systems. The necessity of recalibration is considerably reduced, saving time and effort. The fundamental parameter method by FISCHER allows for the analysis of solid and liquid specimens as well as coating systems without calibration. Design The FISCHERSCOPE X-RAY XDLM instruments are modularly designed as user-friendly bench-top instruments.
  • Page 205 General Specification Intended use Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys Element range Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with option WinFTM ® BASIC Design Bench top unit with upwards opening hood Measuring direction Top down X-Ray Source...
  • Page 206 ® ®, ® FISCHERSCOPE , XDLM , WinFTM are registered trademarks of Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfingen - Germany. ® Windows is a registered trademark of Microsoft Corporation in the United States and other countries. www.helmut-fischer.com...

  • Page 207: Winftm ® Features

    Features WinFTM ® Software for FISCHERSCOPE ® X-RAY Fluorescence Measuring Instruments Coating Thickness Material Analysis Microhardness Material Testing...
  • Page 208 Contents Overview ........... . 207 WinFTM Versions: BASIC and LIGHT.

  • Page 209: Overview

    The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and the functionality of the instrument. Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a professional service for the creation of customer’s Def.MA.

  • Page 210: Fisim

    Overview FISIM The different versions and extensions of WinFTM are activated by different FISIMs (Fischer Software Identification Module). A FISIM is a dongle, which is plugged into the computer’s USB socket, be- fore WinFTM is started. Look at the data sheet of your instrument to find out, which WinFTM version and extension is running on your system by default.

  • Page 211: Features Of Winftm Basic And Light

    Features of WinFTM BASIC and LIGHT Features of WinFTM BASIC and LIGHT The following section describes the features of the software versions BASIC and LIGHT. If there are restrictions in the LIGHT version, they are indicated in the text. Integrated Technology Coating thickness measurement and material analysis can be performed in one run.

  • Page 212: Material Analysis

    Features of WinFTM BASIC and LIGHT Material Analysis Quantitative material analysis of complex layers. Individual layers may consist of several  elements. The total number of measured quantities amounts up to 24 with WinFTM BASIC and 4 with WinFTM LIGHT. Quantitative analysis of solid, powder or paste materials as well as solutions for up to 24 ...

  • Page 213: Automated Material Identification (Class Of Materials)

    Features of WinFTM BASIC and LIGHT Automated Material Identification (Class of Materials) You can easily sort specimens with different compositions and/or coating thicknesses in different classes of materials. You don’t need to perform reference measurements for each composition or coating thickness. Each class of materials covers a range of composition and/or coating thickness. Example: You need to sort the following specimens: 5 –...

  • Page 214: Optical Functions

    Features of WinFTM BASIC and LIGHT Optical Functions Function Description Video image of the speci- The specimen is shown in the video window inside the WinFTM main window. Scaled crosshairs Scaled crosshairs are electronically inserted into the video image. They show the real size and position of the measurement spot on the surface of the specimen.

  • Page 215: Further Features Of Winftm

    Features of WinFTM BASIC and LIGHT Further Features of WinFTM Function Description Standard Windows ® user Users with basic knowledge of Windows ® will very quickly be fa- interface miliar with the program’s user interface. Product functions You can set up, select, delete, edit and copy products. Additionally, you can search for products, using different search criteria.
  • Page 216 Features of WinFTM BASIC and LIGHT Function Description Calculating the random The measurement uncertainty, which is based on natural count sta- measurement uncertainty u tistics, is an important quantity in measurement technology. of a measured quantity The measurement uncertainty u of the current single reading ...
  • Page 217 Features of WinFTM BASIC and LIGHT Function Description Programmed measurement You can simply program routinely repeating measurement se- sequences (Tasks) quences and execute them automatically. Even very complex measurement sequences can be simplified.  Dialogs for operators can be shown on the screen (e.g. infor- ...

  • Page 218: Measurement Data Management

    Features of WinFTM BASIC and LIGHT 2.10 Measurement Data Management Function Description Block function A block is a concluded series of measurements. Measurement data is stored and evaluated as blocks, including the date and time of the measurement, a notepad, the continuous number of the block as well as block-related data.
  • Page 219 Features of WinFTM BASIC and LIGHT Function Description Specification limits: Graph- BASIC: You can define specification limits for each of max. 24 re- ical distinction (in color) for sult channels. exceeding or falling short LIGHT: You can define specification limits for each of max. 3 result channels.

  • Page 220: Presentation Of Readings

    Features of WinFTM BASIC and LIGHT 2.12 Presentation of Readings You can control, how the measurement readings are presented. Display mode Description Thickness mode The measurement result shows: Coating thickness readings in the common length dimensions  e.g. in mils Analysis results in percent ...
  • Page 221 Features of WinFTM BASIC and LIGHT Function Description Calibration standard set Input and storing of nominal values of the used calibration stand- ards is performed in the Calibration standard set in the measure- ment application of the product. After the calibration has been performed, the Calibration standard set contains, in addition to the nominal values, the calculated actual values including the correc- tion.

  • Page 222: Display And Evaluation Of Spectra

    Features of WinFTM BASIC and LIGHT 2.14 Display and Evaluation of Spectra Function Description Clear display of the sum For the evaluation of measured spectra you can overlay the  spectra with colored ele- spectrum lines of up to 24 elements in different colours. ment spectra You can compare spectra in order to identify materials, e.g., ...
  • Page 223 Features of WinFTM BASIC and LIGHT Function Description Joystick at measuring head You can easily control the XY(Z) stage with the joystick at the meas- uring head. In addition, you can control the XY(Z) stage with the mouse. Measurement point over- The measurement point overview windows offer you a full over- view view of all programmed points of the current measurement coordi-...

  • Page 224: Winftm Pdm: Expanded Product Data Administration And Result Documentation222

    WinFTM PDM: Expanded Product Data Administration and Result Documentation WinFTM PDM: Expanded Product Data Administration and Result Documentation PDM (Product Data Management) is a supplementary software module to WinFTM BASIC or LIGHT. The PDM software features the following functions: Function Description Setting up new products A measurement application may be linked to any number of...
  • Page 225 WinFTM PDM: Expanded Product Data Administration and Result Documentation Function Description Result documentation You can assign individual print form templates to each product  for block and final evaluation. You can evaluate the measurement readings of several or even  all products of a measurement application simultaneously in one template.

  • Page 226: Comparative Overview With/Without Winftm Pdm

    WinFTM PDM: Expanded Product Data Administration and Result Documentation Comparative Overview with/without WinFTM PDM WinFTM PDM (Product Data Management) as a supplemental software is suitable for both WinFTM BASIC and for WinFTM LIGHT. In both cases, the functional scope of WinFTM PDM is identical. The following table presents an overview of the available functions with and without PDM.

  • Page 227: Winftm Super: For The Experienced X-Ray User

    The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and the functionality of the instrument. Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a professional service for the creation of customer’s Def.MA.
  • Page 228 WinFTM SUPER: For the Experienced X-RAY User FISCHERSCOPE ® X-RAY...
  • Page 229 FISCHERSCOPE ® X-RAY...
  • Page 230 Coating Thickness Material Analysis Microhardness Material Testing...

  • Page 231: Ec Declaration Of Conformity

    HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK EC DECLARATION OF CONFORMITY Serial Number and Type We declare herewith for the following described product: ® ® FISCHERSCOPE X-RAY XDLM 231 (604-345) ® ® FISCHERSCOPE X-RAY XDLM 232 (604-346) ® ®...
  • Page 233 ® FISCHERSCOPE X-RAY with WinFTM ® Instrument model: WinFTM Version: Serial No.: Customer: Supplier: ............HELMUT FISCHER GMBH Institut für Elektronik und Messtechnik ............Industriestraße 21 71069 Sindelfingen, Germany ............Instructor: Participants: Topics executed Installation and connection of the instrument...
  • Page 234 ® Structure of WinFTM Product Application with Calibration standard set Def MA Product Creation via Copy or New Directory structure Product settings via Info XY-table programming Video image Control elements Travel measurement location Video settings Creating overview image (XY-table) Product video Printing Settings Definition Order No./Operator...
  • Page 235 Index Index Absorber 19 EN ISO 3497 7 Aperture 17 Enable the communication 27 Argon absorber 19 Energy 48 Array 133 event marks 216 ASTM B568 7 File Structure 31 back-up 98 final evaluation 84 Base Correction 145 FISIM 26, 208 BASIC 207 Fluorescence 14 block 216...
  • Page 236 Index Readings, deleting 30 -Lighting 18 Uncertainty 40 position of 51 Value field 39 Spectrum Window 45 Monitoring 63 Statistics Field 39 mq Value 43 Status bar 42 Storage temperature 21 Substrate Material Correction 145 SUPER 207 Normalization 145 Switch Box 26 Switching off the instrument 27 Switching on the instrument 26 Operation temperature 21...

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Fischerscope x-ray xdlm 232Fischerscope x-ray xdlm 237

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