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Related Manuals for SPECS PHOIBOS Series
Summary of Contents for SPECS PHOIBOS Series
- Page 1 PHOIBOS Hemispherical Energy Analyzer Series PHOIBOS 100 / PHOIBOS 150...
- Page 2 All rights reserved. No part of this manual may be reproduced without the prior permission of SPECS GmbH. User manual for the Hemispherical Energy Analyzer Series PHOIBOS 100/150. Version revised 19 November 2008. SPECS order number for this manual: 78 000 101.
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Page 3: Table Of Contents
Chapter Table of Contents Introduction Overview ..................1 Components Connections System Description, Package Contents ........5 Electrical Connections ..............6 Spectrometer The Lens System ................12 Hemispherical Analyzer (HSA) ..........18 Magnetic Shielding ..............20 μ 3.3.1 Magnetic Coupling for -Metal Chambers ...........21 3.3.2 Trim Coil ....................21 Slit Orbit Mechanism ..............22... - Page 4 Table of Contents Alignment .................40 4.4.1 Analyzer Alignment ................40 Vacuum Installation ..............41 Baking Out ................43 Electronic Units Installation .............44 SpecsLab Hardware and Software Installation .......44 Unit Operation First Operation ................47 Quick Start .................47 Detailed Operation ..............48 5.3.1 Slit Setting ....................48 5.3.2 Detector Operation ................48...
- Page 5 Table of Contents Deflector Settings Preamplifier ................75 9.1.1 Discriminator ..................75 9.1.2 Amplifier Check ..................76 Detector Voltage ..............76 Noise ..................77 9.3.1 Suppress a Noisy Channel ..............77 9.3.2 Switch off Certain Channels ..............77 9.3.2.1 Mask example for MCD9 ..............78 9.3.2.2 Mask example for MCD5 ..............79 Spare Parts 10.1 Cu Gasket...
- Page 6 Table of Contents PHOIBOS...
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Page 7: Introduction
(electrons) and positive particles (ions) in the kinetic energy range from 0 eV to 3.5 keV. The PHOIBOS series of hemispherical analyzers are hemispherical deflectors available in two sizes, 100mm or 150 mm mean radii. The input lens is designed to accommodate a wide range of applications. - Page 8 100 μm as well as large area investigations associ- ated with different lens acceptance angles. All units are completely controlled by SPECS software. Operation of the software will be described in a separate manual.
- Page 9 Overview Safety Information Before any electric or electronic operations please consult “SPECS Safety Instructions” and follow them strictly. Some adjustments that have to be performed in this manual are dangerous. At each point these are indicated by a warning label: Warning! Tests to be performed on the electronic unit are with its cover removed.
- Page 10 Introduction PHOIBOS...
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Page 11: Components And Connections
Chapter Components and Connections 2.1 System Description, Package Contents The contents of your system should include the components listed below. Please refer to figure 1 for photos of these. PHOIBOS analyzer ● The PHOIBOS analyzer consists of the following internal parts: analyzer housing, ▪... -
Page 12: Electrical Connections
Components and Connections 19. Analyzer box with filter unit (cube or cylinder shape) , fixed cable 20. SHV-cable ChannelBase 21. SHV-cable ChannelHV 22. SpecsLab2 Installation CD 23. Specification (Test Report) 24. Pair of DN40CF copper gaskets 25. Pair of DN16CF copper gaskets 26. -
Page 13: Figure 2: Connection Scheme
Electrical Connections Figure 2: Connection Scheme PHOIBOS... -
Page 14: Figure 3: Analyzer Housing (Phoibos100)
Components and Connections Figure 3: Analyzer Housing (PHOIBOS100) PHOIBOS... -
Page 15: Figure 4: Analyzer Housing (Phoibos150)
Electrical Connections Figure 4: Analyzer Housing (PHOIBOS150) PHOIBOS... -
Page 16: Figure 5: Analyzer Main Components And Voltage Principle
Components and Connections Figure 5: Analyzer Main Components and Voltage Principle main retardation voltage numerically equal to - kinetic energy (Ekin) +pass energy (Ep) + workfunction (WF) UChannel HV / Base anode / cathode potential for the channeltrons UHV - UBase detector voltage UChannelBase - U0 conversion voltage... -
Page 17: Spectrometer
Chapter Spectrometer The PHOIBOS spectrometer consists of a vacuum housing and four major internal com- ponents, which are shown in figures 3 - 5. All the parts must be contained within an Ul- tra High Vacuum (UHV) environment, as particles emitted from the sample surface can collide with the gas molecules changing their energy and momentum. -
Page 18: The Lens System
The preamplifiers are read out by the Multi Channel Detector (MCD) counter interface of the SPECS data acquisition software. 3.1 The Lens System The multi-element, two-stage transfer lens was designed to yield ultimate transmission and well-defined optical properties. -
Page 19: Figure 6: High Point Transmission Mode
The Lens System If S1 has the dimension D1, then by theory the imaged area of the sample has the dimension DS with DS = D1 / M The magnification of the lens stage is selectable (see table 2 on page 16). The magnific- ation is changed electrically by connecting appropriate voltages to the lens electrodes. -
Page 20: Figure 7: Medium Area Mode
Spectrometer Figure 7: Medium Area Mode High Magnification is (see Figure 8: High Magnification Mode page 15) particularly suit- able for spatially resolved studies. The image plane of the sample is in coincidence with the entrance plane of the analyzer. The user can define the acceptance area of the ana- lyzer with the entrance slit. -
Page 21: Figure 8: High Magnification Mode
The Lens System Figure 8: High Magnification Mode Acceptance Iris Angle Diameter ±1° 3.5mm ±2° ±3° 10mm ±4° 13mm ±5° 15.5mm ±6° 17.5mm Table 1: Acceptance Angle vs. Iris Diameter for a Point Source In the novel, angle-resolved Medium Area mode, electrons leaving the sample within a given angular range are focused onto the same location of the analyzer entrance inde- pendent of their position on the sample. -
Page 22: Table 2: Overview Of The Lens Modes
Spectrometer the analyzer without restricting the acceptance angle; this mode is the ideal choice for angular dependent studies. Magnification and angular aperture are selectable with PHOIBOS. There are many dif- ferent combinations available. The lens settings can be combined with the different possible slit combinations, resulting in “lens settings”... -
Page 23: Figure 9: Typical Intensity-Position Profile With Iris Aperture
The Lens System Slit Size Iris Diameter 7 x 20 mm 30 – 40 mm ∅ 7 20 – 30 mm ∅ 3 10 – 20 mm ∅ 1 2.5 – 10 mm Table 3: Recommended Iris Values for Spatially Resolved Measurements Figure 9: Typical Intensity-Position Profile with Iris Aperture The low tail intensity forms a disc. -
Page 24: Hemispherical Analyzer (Hsa)
Spectrometer suppressed. 3.2 Hemispherical Analyzer (HSA) The PHOIBOS Hemispherical Analyzer (HSA) with a mean radius R (100mm/150mm) measures the energy of charged particles. Charged particles entering the HSA through the entrance slit S are deflected into elliptical trajectories by the radial electrical field between the inner hemisphere R and the outer hemisphere R . - Page 25 Hemispherical Analyzer (HSA) natural line width of the characteristic radiation used for excitation ∆E (e.g. photo ● Mg, Kα, Al Kα). The observed total FWHM is given by the convolution of the single FWHMs, e.g for total gaussian line widths. 1 /2 FWHM =...
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Page 26: Magnetic Shielding
Spectrometer (10) pass In this mode all particles are decelerated with this same fixed factor. Therefore the pass energy is proportional to the kinetic energy. The intensity increases with kinetic energy: I ~ E (11) while the energy resolution decreases. and ∆E b) Fixed Analyzer Transmission (FAT), E in equation 5 are adjustable... -
Page 27: Magnetic Coupling For -Metal Chambers Μ
The insertion depth of the analyzer shielding has to be modified if the shield- ing is too far inside the chamber (normally by a non-magnetic lens protection cap ad- μ ded to the lens shielding). Please contact SPECS for advice regarding the -metal shield ing. 3.3.2 Trim Coil The PHOIBOS analyzer can be equipped with a trim coil around the outer hemisphere of the analyzer. -
Page 28: Slit Orbit Mechanism
Spectrometer n ⋅ I B = ⋅ (15) Figure 11: Magnetic Field of the Trim Coil For the PHOIBOS 150 analyzer B[μT] = 0.017 x I[mA] and for the PHOIBOS 100 analyzer B[μT] = 0.026 x I[mA]. In the case of an earth magnetic field of about 50 μT with the lens axis nearly parallel to the field one needs about 85 mA or -85 mA to compensate the residual magnetic field within the hemispheres. -
Page 29: Table 4: Standard Slit Configuration
Slit Orbit Mechanism should be selected. This enables the highest possible count rate for these parameters and thereby a short measurement time and a good signal-to-noise ratio. The entrance ring can be positioned directly by rotating the dial (see figure 13, “En- trance and exit slit rings (slit combination 4-B),”... -
Page 30: Figure 12: External Rotary Dial For Positioning
Spectrometer Figure 12: External Rotary Dial for Positioning The indicators on the rotary dial are used for positioning, but it must be taken into ac- count that the rotary dial has some backlash. The correct slit positions are defined by spring loaded indexing balls. -
Page 31: Single And Multichannel Detector (Scd) / (Mcd)
Slit Orbit Mechanism Figure 14: Exit Slit Selection 3.5 Single and Multichannel Detector (SCD) / (MCD) The detector consists of the following parts: an arrangement of Channel Electron Multipliers (CEMs), 1 for SCD, 5 or 9 for ● MCD, consisting of discrete collectors, specially screened against external HF-sig- nals for maximum noise rejection;... -
Page 32: Coherence Of Epass And Step
Spectrometer D =2⋅ R (17) The experimentally determined dispersion value can be slightly different, mainly due to fringing fields at the edges of the analyzer. Multichannel detection is performed by appropriately arranging 5 or 9 CEM‘s as collect- ors with 5 or 9 exit slits on concentric circles in the exit plane. The radial distance between neighbouring exit slits ∆R is selected to meet the requirement of a constant kinetic energy difference between neighbouring channels ∆E . -
Page 33: Electron Multiplication
Single and Multichannel Detector (SCD) / (MCD) 3.5.3 Electron Multiplication A Channel Electron Multiplier (channeltron or CEM) is a high gain device for detecting energetic particles such as electrons and ions, or radiation. The CEM consists of a small, curved glass tube. The inside wall is coated with a high resistance material. The resistive material becomes a continuous dynode when a potential is applied between the ends of the tube. - Page 34 Spectrometer Please choose a moderate end value of the detector voltage scan to prevent rapid aging of the detector! The optimum operating point is about 50 - 100 V beyond the plateau of the curve (fig- ure 15, page 29). As the multiplier ages, the knee moves to the right and the voltage must be increased.
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Page 35: Extended Cem
Single and Multichannel Detector (SCD) / (MCD) Figure 15: Detector Sweep, Count rate vs. Voltage The pulse output depends largely on the applied voltage and, in practice the gain is an increasing function of the applied voltage until the gain reaches about 10 : after which point increasing the voltage further will cause the eventual breakdown of the CEM. -
Page 36: Linearity Of The Cem's
Spectrometer surface of the channel. The gain is governed by the detector voltage and the condition of the emissive layer. The condition of this layer changes with usage and to compensate for a drop in emissive quality of the surface, an increased detector voltage can be ap- plied keeping the overall gain constant. -
Page 37: Figure 17: Linearity Plot For The New Extended Range Cem
Single and Multichannel Detector (SCD) / (MCD) / N ' = A 1− A ×× N ' (21) Therefore, from a spectral ratio plot the dead time can be determined. The detection efficiency N’1 / N1 can now be calculated = N ' / N ' ×1−... -
Page 38: Conversion Energy
Spectrometer Figure 18: Efficiency Plot for the new Extended Range CEM From a spectral ratio plot of two spectra measured at different beam currents the de- tector efficiency N’ / N was calculated. With increasing count rate the mean gain of the pulse height distribution will decrease. -
Page 39: Spectrometer Voltage U0
Single and Multichannel Detector (SCD) / (MCD) Figure 19: Detection Efficiency for Electrons and Ions The BIAS voltage produced in the HSA3500 determines the conversion energy =− q U E (23) conv BIAS pass of the charged particles impinging on the CEM. The proper conversion voltage has two requirements which must be simultaneously fulfilled: the particles energy should be suitable for maximum yield of secondary electron ●... -
Page 40: Work Function
Spectrometer for electrons: U = - 895.5 V ● for ions: U = + 895.5 V ● 3.6 Work Function The basic energetic properties are shown in figure 20 for the example of the measure- ment of photoelectrons. Figure 20: Energy Scheme – Photoelectron Spectroscopy The spectrometer and the sample are connected to ensure that the Fermi-energies are at the same reference level. - Page 41 Work Function the SpecsLab2 program. Adjust the desired voltage ranges separately (select the voltage range in the analyzer settings before the measurement). Please take note of section 7.4 “Work Function Calibration with UPS” on page 61. PHOIBOS...
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Page 43: Installation
All analyzers and associated electronics are carefully packed before leaving the factory. Carefully examine all packages for damage, especially the shock and tilt sensors inside and outside the transport container. If damage is suspected please contact SPECS imme- diately for further instructions on what to do next. -
Page 44: Figure 21: Removal Of The Transportation Locks
Installation Figure 21: Removal of the Transportation Locks Release the four M8 screws, vent the detector with N , and pull it carefully out of the storage housing. If one looks into the opened detector flange of the analyzer from the bottom side, you can locate the 'alignment hole' for the detector. -
Page 45: Achieve The Maximum Lifetime Of A Channel Elec- Tron Multiplier
Mounting the Detector Figure 22: Corresponding Hole in the Ground Plate 4.3 Achieve the Maximum Lifetime of a Channel Elec- tron Multiplier To achieve the maximum lifetime of a channel electron multiplier the rules listed below should be strictly followed. After a bakeout, the analyzer needs 2-3 days to cool down. -
Page 46: Alignment
Use the iris aperture to locate the real center posi- tion of the lens system in respect to the desired acceptance area on the sample. Please contact SPECS if you see a visible offset between this two positions. PHOIBOS... -
Page 47: Vacuum Installation
Note that the analyzer was adjusted to the mounting flange axis during specification. 4.5 Vacuum Installation 1. Open the transport box carefully. 2. Check the shock and tilt sensors. If any sensor is discolored, please inform SPECS immediately and await further instructions. 3. Remove the shipping frame. -
Page 48: Figure 23: Mounting Tips
5. Keep the analyzer in a stable position, if possible keep the same orientation as in the transport box (soft lie down is allowed). 6. The analyzer is evacuated. Vent via valve at the protection housing. SPECS re- commends using a dry dust free venting gas like nitrogen to avoid particle or water intrusion. -
Page 49: Baking Out
Vacuum Installation throughs are fixed with the locking screw during transport. Make sure to unlock them before using the rotary feedthroughs and lock them again afterwards. 13. Adjust the analyzer at the vacuum chamber flange (Check section 4.4 “Align- ment” on page 40). 14. -
Page 50: Electronic Units Installation
You will find the manuals and other instructions in pdf-format on the installation CD as well. Please do not hesitate to contact SPECS for more detailed information. support@specs.de or phone +49 (30) 467 824 - 0 or - 88) - Page 51 SpecsLab Hardware and Software Installation PHOIBOS...
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Page 53: Unit Operation
Chapter Unit Operation 5.1 First Operation If the system is baked (see section 4.6, “Baking Out” on page 43) the vacuum should be checked. The base pressure should be lower than 10 mbar (for more details please see section 5.3.3, “Functional Test” on page 49). Check the electrical connections (see sec- tion 4.7, “Electronic Units Installation”... -
Page 54: Detailed Operation
Unit Operation 5.3 Detailed Operation 5.3.1 Slit Setting There are different settings available with the PHOIBOS Slit Orbit mechanism. To under- stand the possible slit combination for this analyzer please see section 3.4, “Slit Orbit Mechanism” on page 22. The optimum setting is reached when entrance slits are aligned along the lens axis, i.e. when the particle number passing through the lens stages and impinging on the hemi- spherical capacitor entrance slit S1 is a maximum. -
Page 55: Functional Test
Detailed Operation For optimal lifetime, operate the detector at the minimum voltage necessary to ● obtain an usable signal (see section 3.5.3, “Electron Multiplication” on page 27). Microchannel plates and Channeltron detectors can be degraded by exposure to ● various types of hydrocarbon materials which raise the work function of the sur- face, causing gain degradation. -
Page 56: Iss Operation
Unit Operation 5.3.3.2 ISS Operation Please read these instructions carefully. Damage of channeltrons and ampli- fier are possible if the following is done incorrectly! Set the detector voltage to the value corresponding to the Specification Report of the analyzer or check the actual value (“The Working Point of the CEM’s” on page 27). The conversion voltage (BIAS) in the Analyzer Settings window is default set to 2000 (see section 3.5.4, “Conversion Energy”... -
Page 57: Troubleshooting
Chapter Troubleshooting In the section “Possible Problems” (below), a list of possible problems or anomalies and suggestions for their removal is given. It is assumed that the system was calibrated properly and was working according to specifications before one of the following prob- lems occurred. -
Page 58: Table 5: No Spectrum
Cable connection faulty check cable connections Preamplifier box defective check preamp box section 9.1.2 → Counter device or control unit defective contact SPECS No energy sweep voltage check energy sweep section and . → Spectrometer voltages incorrect check spectrometer voltages section →... -
Page 59: Table 6: Low Intensity
Possible Problems spheres shifted, MCD shifted. improper adjustment of check proper adjustment section 3.4 Slit Orbit mechanism Table 6: Low Intensity possible cause perform check, test, or troubleshooting procedure no. → chemical peak broadening sputter cleaning / replace anode lateral inhomogeneous charging of the use charge compensation by means of elec- sample tron flood gun... -
Page 60: Table 8: Peaks Shifted Equally
Troubleshooting voltage Table 8: Peaks Shifted Equally possible cause perform check, test, or troubleshooting proced- ure no. → incorrect amplification factor check U HSA3500 section 8.2 , section 8.1 , → section Table 9: Peaks Shifted Differently possible cause perform check, test, or troubleshooting proced- ure no. -
Page 61: Table 12: Noisy Spectrum
Possible Problems procedure no. → incorrect detector preamplifier section 9.1.1 and section 3.5.3 → threshold high noise of the primary source use a second excitation source, electric interference monitor mains voltage, check ground connec- tions section → Table 12: Noisy Spectrum possible cause perform check, test, or troubleshooting procedure no. -
Page 63: Calibration
Chapter Calibration Adjustment and calibration of the power supplies has been performed at the factory. Normally no additional work is necessary after installation. The procedures described in this chapter are only necessary for service and fine adjustment. The typical accuracy of the energy scale depends on the voltage range used (Table , on page ). -
Page 64: Complete Calibration Procedure
Please contact SPECS and send some spectra to assist in diagnosis. 3. the estimation of the analyzer workfunction (see section 7.4 on page 61) and... -
Page 65: Recalibrate The Dac Precision
Complete Calibration Procedure 4. Gain calibration with XPS. A calibration check for the gain of the 1500V and 3500V modules see section 7.7 on page 64 5. and in section 8.2.2 , "Check Peak Position" on page 66, verify that the peak po- sition in an XPS fit to the modifications of offset and gain performed in the se- lected range. -
Page 66: Mcd Calibration
/ slit combination. For the most common lens / slit combinations, the values defined by SPECS and implemented in the software give a good approximation. Nevertheless, the most commonly used lens / slit combina- tions should be calibrated by the customer again to prevent loss of performance. -
Page 67: Work Function Calibration With Ups
MCD Calibration 6. Check to see if the differences and the peak position are reasonable. If the calculation failed; check that the peak position can be calculated for all regions. Mostly, regions with low count rates (low pass energies) fail. Move this region into another group and try again (Drag and drop of the region via mouse in the Files window). -
Page 68: Work Function Calibration With Xps
Figure 29: Fermi Edge Operation Note the advice given in section 7.2 , "Recalibrate the DAC Precision" on page 59 For more detailed information please contact SPECS support. 7.5 Work Function Calibration with XPS Please note the comments given in section 3.6, “Work Function” on page 34 and in the description in section 7.4. -
Page 69: Figure 30: Fermi Edge Operation
Offset Calibration with UPS Note the voltage range used while measuring. For adjustment, the desired range should be selected according to the used method : i.e. 40V, 400V, 1500V or 3500V in the active method row of Analyzer settings (see SpecsLab2 menu ’Analyzer/Settings’). 1. -
Page 70: Gain Calibration With Xps
(use clean samples, sputtered). Measure the distance between the peak maxima of gold and copper. If the value found differs strongly from 848.66 eV please inform SPECS. You can correct the gain (default value = 1) by distance... -
Page 71: Analyzer Checks
Because of the large number of slit and lens combinations, the energy calibration of the analyzer was not done for each slit combination. SPECS delivers the analyzer with the correct parameters for the common slit combinations. To check the independence of... -
Page 72: Energy Scale Tests With Xps
Analyzer Checks a broad illuminating X-ray source, additional “MCD Calibration” for the point source may be required. 8.2 Energy Scale Tests with XPS 8.2.1 Check Kinetic Energy Scale Transfer a gold/copper sample into the system. Clean carefully by ion sputtering. With this sample the main peaks are separated far enough for calibration purposes. -
Page 73: Specification Check
Energy Scale Tests with XPS Cu L 334.94 ± 0.01 567.96 ± 0.02 Table 14: Calibration Binding Energies for non-monochromated Mg Kα X-rays 8.3 Specification Check 8.3.1 Survey Spectrum of Silver The XPS performance of an energy analyzer is usually determined using a silver sample. A clean silver sample is introduced into the vacuum chamber and cleaned by ion sput- tering. -
Page 74: Intensity And Resolution
Analyzer Checks Figure 31: XPS on Silver, Wide Scan (PHOIBOS 150 MCD9) Parameters for the survey spectrum in figure 33: Lens mode: Medium Area Slit: entrance: largest slit / exit: open Sample current: 160 nA at 300W Mg K α 8.3.2 Intensity and Resolution Use the same settings as in the Ag spectra enclosed with the Specification Report on the analyzer. - Page 75 Specification Check The signal (net intensity, i.e. peak count above background) of the Ag 3d peak is about 85-200 kcps/channel depending on the sample to X-ray source distance. The back- ground in this case is defined as a straight line between the two neighbouring valleys on both sides of the peak.
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Page 76: Connection Check Of The Analyzer Electrodes
Analyzer Checks Figure 32: XPS on Silver, Ag 3d (PHOIBOS 150 MCD9) Parameter for the Ag 3d spectrum in figure 34: Lens mode: Medium Area Slit: 2:7 x 20 mm / 2:open Sample current: 160 nA 300W Mg K α Detector voltage: 1950 V If no spectrum but a straight line appears after the control unit has been started, either... -
Page 77: Capacitance Check For Electrodes
If the measured capacitances differ substantially from the nominal values please contact SPECS. If the capacitances have nearly the right values, no short circuit inside the spec- trometer is likely. If the measured capacitances have the correct values, a missing con- tact from the HSA 3500 to the analyzer may be the reason for a faulty spectrum (see section 8.4.2 , "... -
Page 78: Figure 33: Schematics Of The 12-Pin Analyzer Feedthrough
Analyzer Checks Figure 33: Schematics of the 12-pin Analyzer Feedthrough PHOIBOS... -
Page 79: Check All Analyzer Voltages
Connection Check of the Analyzer Electrodes Figure 34: Schematics of the 12 pin Detector Feedthrough 8.5 Check all analyzer voltages This section has been moved to the HSA3500 Manual. PHOIBOS... -
Page 81: Deflector Settings
Chapter Deflector Settings 9.1 Preamplifier 9.1.1 Discriminator Check the discriminator threshold using the noise of the signal within one spectrum. The square root of the signal (counts! not counts/second) should be equal to the RMS (root mean square) of the noise at this energy (i.e. the value mean signal +/- 3 x RMS should include nearly all data points). -
Page 82: Amplifier Check
Deflector Settings 9.1.2 Amplifier Check Figure 35: PCU Amplifier Test Caution Set the detector voltage to zero and disconnect both HV cables CHANNEL HV and CHANNEL BASE! ! Mind the safety information given at the beginning of this manual! Disconnect the detector box (preamplifier is inside) from the detector flange. Run a spectrum. -
Page 83: Noise
HSA3500Analyzer key. For a 150R5c type of analyzer the entry "CounterChannelMask" is located at "HKEY_LOCAL_MACHINE\SOFTWARE\Specs\Hsa3500Analyzer\Phoibos-Hsa3500\150 R5c" The necessary type is “binary”. Create such a binary entry if it does not exist (Figure 36: CounterChannelMask for MCD9, 1+2+8+9 off, page 78). Please also refer to the descrip- tion about the registry entries in the SpecsLab2 manual. -
Page 84: Mask Example For Mcd9
1 and the last to the right is channel 9 or 5 respectively. Therfore all channels means [HKEY_LOCAL_MACHINE\SOFTWARE\Specs\Hsa3500Analyzer\Phoibos-Hsa3500\150 R5c]" CounterChannelMask"=’01 ff’ To achieve that a 9 channel detector only use 5 channels you have to change to 00000000 01111100 or ’00 7C’. -
Page 85: Mask Example For Mcd5
Please note that the first ’1’ from the left is channel number 1 and the last digit on the right side is channel 5 respectively. Therfore all channel means [HKEY_LOCAL_MACHINE\SOFTWARE\Specs\Hsa3500Analyzer\Phoibos-Hsa3500\100 R5c] "CounterChannelMask"=’01 1F’ To achieve that a 5 channel detector only use channels #1,2 and 4 you have to change to 0000000 00011010 or ’... -
Page 87: Spare Parts
Spare Parts 10.1 Cu Gasket All CF gaskets are custom made by SPECS. In case you need a replacement please con- tact SPECS, because it depends on the release of the analyzer. The serial number of the analyzer is marked on the lens flange. -
Page 88: Operation Of The Multiplier
Spare Parts The channeltrons should be protected from exposure to particle contamination. ● Particles which become affixed to the plate can be removed by using a single- hair brush and an ionized dry nitrogen gun. 10.2.1.2 Operation of the Multiplier Microchannel plates and Channeltron detectors can be degraded by exposure to various types of hydrocarbon materials which raise the work function of the surface, causing gain degradation. -
Page 89: Mounting The Detector Flange
Multiplier Disconnect the cables. ● Note the orientation and alignment of the defective channeltrons. ● Release the screws which are fixing the ceramic rods. Release only one of the ● adjustment screws. Do not change the other screws, this fixes the position for the channeltrons with respect to the body when rebuilding the assembly(figure 37, page 83). - Page 90 Spare Parts Looking into the opened detector flange from the bottom side you can locate a ● 'alignment hole' which corresponds to the part at the detector assembly (figure 39). Align the pin with the hole in the ground plate. Be sure that the detector is ●...
- Page 91 Chapter List of Figures Figure 1: Package Contents........................6 Figure 2: Connection Scheme........................7 Figure 3: Analyzer Housing (PHOIBOS100)....................8 Figure 4: Analyzer Housing (PHOIBOS150)....................9 Figure 5: Analyzer Main Components and Voltage Principle..............10 Figure 6: High Point Transmission Mode....................13 Figure 7: Medium Area Mode........................14 Figure 8: High Magnification Mode......................15 Figure 9: Typical Intensity-Position Profile with Iris Aperture..............17 Figure 10: PHOIBOS µ-Metal Shielding....................21...
- Page 92 List of Figures Figure 39: Alignment Pin.........................84 PHOIBOS...
- Page 93 List of Figures PHOIBOS...
- Page 95 Chapter List of Tables Table 1: Acceptance Angle vs. Iris Diameter for a Point Source............15 Table 2: Overview of the Lens Modes.....................16 Table 3: Recommended Iris Values for Spatially Resolved Measurements..........17 Table 4: Standard Slit Configuration.......................23 Table 5: No Spectrum..........................52 Table 6: Low Intensity..........................53 Table 7: Low Energy Resolution......................53 Table 8: Peaks Shifted Equally.........................54...
- Page 97 Chapter Index Electron Multiplication...27 Peaks Shifted......54 Exit Slit........24 Amplifier Check..3, 14, 16, 23, Extended CEM......29 27p., 30, 35, 37, 43p., 47pp., 55, Quick Start.......47 58pp., 65p., 70p., 77 Analyzer Alignment....40 First Operation......47 Replacing Channeltrons..82 Analyzer Checks......65 Functional Test......49 Analyzer Feedthrough..22, 72 Safety....3, 5, , 44, 71, 76 Hemispherical Analyzer..18 sample distance....40, 52...
- Page 98 Index PHOIBOS...
- Page 99 Health and Safety Declaration for used Vacuum Equipment and Components The repair and/or service of vacuum equipment/components can only be carried out if a correctly completed declaration has been submitted for every component. 1.______________________________________________Description components Type: __________________________________________Serial No:_____________________ 2. Reasons for return____________________________________________________________ 3.
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