Cypress S29GL01GP Manual

1 gbit, 512, 256, 128 mbit, 3 v, page flash with 90 nm mirrorbit process technology

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General Description
The Cypress S29GL01G/512/256/128P are Mirrorbit
offer a fast page access time of 25 ns with a corresponding random access time as fast as 90 ns. They feature a Write Buffer that
allows a maximum of 32 words/64 bytes to be programmed in one operation, resulting in faster effective programming time than
standard programming algorithms. This makes these devices ideal for today's embedded applications that require higher density,
better performance and lower power consumption.
Distinctive Characteristics
 Single 3V read/program/erase (2.7-3.6 V)
 Enhanced VersatileI/O™ control
– All input levels (address, control, and DQ input levels) and
outputs are determined by voltage on V
to V
CC
 90 nm MirrorBit process technology
 8-word/16-byte page read buffer
 32-word/64-byte write buffer reduces overall programming time for
multiple-word updates
 Secured Silicon Sector region
– 128-word/256-byte sector for permanent, secure identification
through an 8-word/16-byte random Electronic Serial Number
– Can be programmed and locked at the factory or by the
customer
 Uniform 64 Kword/128 Kbyte Sector Architecture
– S29GL01GP: One thousand twenty-four sectors
– S29GL512P: Five hundred twelve sectors
– S29GL256P: Two hundred fifty-six sectors
– S29GL128P: One hundred twenty-eight sectors
 100,000 erase cycles per sector typical
Performance Characteristics
Density
Voltage Range
Regulated V
128 & 256 Mb
Full V
VersatileIO V
Regulated V
512 Mb
Full V
VersatileIO V
Regulated V
1 Gb
Full V
VersatileIO V
Notes
Access times are dependent on V
1.
See
Ordering Information
Regulated V
: V
= 3.0–3.6 V.
CC
CC
Full V
: V
= V
= 2.7–3.6 V.
CC
CC
IO
VersatileIO V
: V
= 1.65–V
IO
IO
2. Contact a sales representative for availability.
Cypress Semiconductor Corporation
Document Number: 002-00886 Rev. *B
1 Gbit, 512, 256, 128 Mbit, 3 V, Page Flash
with 90 nm MirrorBit Process Technology
®
Flash products fabricated on 90 nm process technology. These devices
input. V
range is 1.65
IO
IO
Maximum Read Access Times (ns)
Random Access
(1)
Time (t
ACC
90
CC
100/110
CC
110
IO
100
CC
110
CC
120
IO
110
CC
120
CC
130
IO
and V
operating ranges.
CC
IO
page for further details.
, V
= 2.7–3.6 V.
CC
CC
198 Champion Court
 20-year data retention typical
 Offered Packages
– 56-pin TSOP
– 64-ball Fortified BGA
 Suspend and Resume commands for Program and Erase
operations
 Write operation status bits indicate program and erase operation
completion
 Unlock Bypass Program command to reduce programming time
 Support for CFI (Common Flash Interface)
 Persistent and Password methods of Advanced Sector Protection
 WP#/ACC input
– Accelerates programming time (when V
throughput during system production
– Protects first or last sector regardless of sector protection
settings
 Hardware reset input (RESET#) resets device
 Ready/Busy# output (RY/BY#) detects program or erase cycle
completion
Page Access Time
)
(t
)
PACC
25
25
25
San Jose
S29GL01GP
S29GL512P
S29GL256P
S29GL128P
is applied) for greater
HH
CE# Access Time
OE# Access Time
(t
)
CE
90
100/110
110
100
110
120
110
120
130
,
CA 95134-1709
408-943-2600
Revised May 22, 2017
(t
)
OE
25
25
25

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Summary of Contents for Cypress S29GL01GP

  • Page 1  Uniform 64 Kword/128 Kbyte Sector Architecture – Protects first or last sector regardless of sector protection – S29GL01GP: One thousand twenty-four sectors settings – S29GL512P: Five hundred twelve sectors  Hardware reset input (RESET#) resets device –...
  • Page 2 S29GL01GP S29GL512P S29GL256P S29GL128P Current Consumption (typical values) Random Access Read (f = 5 MHz) 30 mA 8-Word Page Read (f = 10 MHz) 1 mA Program/Erase 50 mA Standby 1 µA Program & Erase Times (typical values) Single Word Programming 60 µs...
  • Page 3: Table Of Contents

    Additional Resources ..........12 5.1 Application Notes ............12 5.2 Specification Bulletins ..........12 5.3 Hardware and Software Support........12 5.4 Contacting Cypress............12 Product Overview ............13 6.1 Memory Map ..............13 Device Operations ............. 15 7.1 Device Operation Table ..........15 7.2 Word/Byte Configuration..........
  • Page 4: Ordering Information

    10 = 100 ns 11 = 110 ns 12 = 120 ns 13 = 130 ns DEVICE NUMBER/DESCRIPTION S29GL01GP, S29GL512P, S29GL256P, S29GL128P ® 3.0 Volt-only, 1024, 512, 256 and 128 Megabit Page-Mode Flash Memory, manufactured on 90 nm MirrorBit process technology Recommended Combinations Recommended Combinations list configurations planned to be supported in volume for this device.
  • Page 5 S29GL01GP S29GL512P S29GL256P S29GL128P S29GL-P Valid Combinations Base Part Packing Type (2)(3) Speed Package Temperature Model Number Number I, C R1, R2 TA (1), TF 01, 02 0, 3 V1, V2 S29GL01GP I, C R1, R2 FA (1), FF 01, 02...
  • Page 6: Input/Output Descriptions & Logic Symbol

    S29GL01GP S29GL512P S29GL256P S29GL128P 2. Input/Output Descriptions & Logic Symbol Table identifies the input and output package connections provided on the device. Input/Output Descriptions Symbol Type Description Address lines for GL01GP A24–A0 for GL512P A25–A0 Input A23–A0 for GL256P, A22–A0 for GL128P.
  • Page 7: Block Diagram

    S29GL01GP S29GL512P S29GL256P S29GL128P 3. Block Diagram Figure 3.1 S29GL-P Block Diagram DQ15–DQ0 RY/BY# Sector Switches Erase Voltage Input/Output Generator Buffers RESET# State WP#/ACC Control BYTE# Command Register PGM Voltage Generator Data Chip Enable Output Enable Y-Decoder Y-Gating Detector Timer...
  • Page 8: Physical Dimensions/Connection Diagrams

    S29GL01GP S29GL512P S29GL256P S29GL128P 4. Physical Dimensions/Connection Diagrams This section shows the I/O designations and package specifications for the S29GL-P family. Related Documents The following documents contain information relating to the S29GL-P devices. Click on the title or go to www.cypress.com...
  • Page 9: Laa064-64 Ball Fortified Ball Grid Array, 11 X 13 Mm

    S29GL01GP S29GL512P S29GL256P S29GL128P LAA064—64 ball Fortified Ball Grid Array, 11 x 13 mm Figure 4.2 LAA064—64ball Fortified Ball Grid Array (FBGA), 11 x 13 mm NOTES: PACKAGE LAA 064 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994. JEDEC 2. ALL DIMENSIONS ARE IN MILLIMETERS.
  • Page 10 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 4.3 56-pin Standard TSOP (Top View) NC on S29GL128P NC on S29GL256P NC on S29GL512P BYTE# DQ15/A-1 DQ14 DQ13 DQ12 RESET# DQ11 WP#/ACC RY/BY# DQ10 Document Number: 002-00886 Rev. *B Page 10 of 83...
  • Page 11: Ts056-56-Pin Standard Thin Small Outline Package

    S29GL01GP S29GL512P S29GL256P S29GL128P TS056—56-Pin Standard Thin Small Outline Package (TSOP) Figure 4.4 56-Pin Thin Small Outline Package (TSOP), 14 x 20 mm NOTES: PACKAGE TS 56 JEDEC MO-142 (B) EC CONTROLLING DIMENSIONS ARE IN MILLIMETERS (mm). (DIMENSIONING AND TOLERANCING CONFORMS TO ANSI Y14.5M-1982.) SYMBOL MIN.
  • Page 12: Additional Resources

    Visit www.cypress.com to obtain the following related documents: Application Notes The following is a list of application notes related to this product. All Cypress application notes are available at http:// www.cypress.com/Support/TechnicalDocuments/Pages/ApplicationNotes.aspx  Using the Operation Status Bits in AMD Devices ...
  • Page 13: Product Overview

     128 words/256 bytes of Secured Silicon area for storing customer and factory secured information. The Secured Silicon Sector is One Time Programmable. Memory Map The S29GL-P devices consist of uniform 64 Kword (128 Kbyte) sectors organized as shown in Table –Table S29GL01GP Sector & Memory Address Map Uniform Sector Size Sector Count Sector Range Address Range (16-bit)
  • Page 14 S29GL01GP S29GL512P S29GL256P S29GL128P Note This table has been condensed to show sector-related information for an entire device on a single page. Sectors and their address ranges that are not explicitly listed (such as SA001-SA254) have sector starting and ending addresses that form the same pattern as all other sectors of that size.
  • Page 15: Device Operations

    S29GL01GP S29GL512P S29GL256P S29GL128P 7. Device Operations This section describes the read, program, erase, handshaking, and reset features of the Flash devices. Operations are initiated by writing specific commands or a sequence with specific address and data patterns into the command...
  • Page 16: Word/Byte Configuration

    S29GL01GP S29GL512P S29GL256P S29GL128P Word/Byte Configuration The BYTE# pin controls whether the device data I/O pins operate in the byte or word configuration. If the BYTE# pin is set at logic ‘1’, the device is in word configuration, DQ0-DQ15 are active and controlled by CE# and OE#.
  • Page 17: Autoselect

    S29GL01GP S29GL512P S29GL256P S29GL128P Autoselect The Autoselect mode provides manufacturer ID, Device identification, and sector protection information, through identifier codes output from the internal register (separate from the memory array) on DQ7-DQ0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm (see Table ).
  • Page 18 S29GL01GP S29GL512P S29GL256P S29GL128P Autoselect Codes, (High Voltage Method) DQ8 to DQ15 x to BYTE BYTE Description CE# OE# WE# #= V # = V DQ7 to DQ0 Manufacturer ID: Cypress Product Cycle 1 Cycle 2 Cycle 3 Cycle 1...
  • Page 19 2. base = base address. The following is a C source code example of using the autoselect function to read the manufacturer ID. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 20: Program/Erase Operations

    Flash address. The data for this programming operation could be 8 or 16-bits wide. While the single word programming method is supported by most Cypress devices, in general Single Word Programming is not recommended for devices that support Write Buffer Programming. See...
  • Page 21 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 7.1 Single Word Program Write Unlock Cycles: Unlock Cycle 1 Address 555h, Data AAh Unlock Cycle 2 Address 2AAh, Data 55h Write Program Command: Setup Command Address 555h, Data A0h Program Address (PA), Program Data to Address:...
  • Page 22 S29GL256P S29GL128P The following is a C source code example of using the single word program function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines. /* Example: Program Command *( (UINT16 *)base_addr + 0x555 ) = 0x00AA;...
  • Page 23 For maximum efficiency, it is recommended that the write buffer be loaded with the highest number of words (N words) possible The following is a C source code example of using the write buffer program function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 24 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 7.2 Write Buffer Programming Operation Write Unlock Cycles: Unlock Cycle 1 Address 555h, Data AAh Unlock Cycle 2 Address 2AAh, Data 55h Issue Write Buffer Load Command: Address SA, Data 25h Load Word Count to Program Program Data to Address: wc = number of words –...
  • Page 25 Unlimited additional sectors may be selected for erase; command(s) must be written within 50 µs. The following is a C source code example of using the sector erase function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 26 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 7.3 Sector Erase Operation Write Unlock Cycles: Unlock Cycle 1 Address 555h, Data AAh Unlock Cycle 2 Address 2AAh, Data 55h Write Sector Erase Cycles: Command Cycle 1 Address 555h, Data 80h Command Cycle 2...
  • Page 27 Base + 555h 0010h The following is a C source code example of using the chip erase function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 28 Base + XXXh 00B0h The following is a C source code example of using the erase suspend function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 29 Base + XXXh 00B0h The following is a C source code example of using the program suspend function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 30 Software Functions and Sample Code The following are C source code examples of using the unlock bypass entry, program, and exit functions. Refer to the Cypress Low Level Driver User’s Guide (available soon on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 31: Write Operation Status

    S29GL01GP S29GL512P S29GL256P S29GL128P Unlock Bypass Program (LLD Function = lld_UnlockBypassProgramCmd) Cycle Description Operation Byte Address Word Address Data Program Setup Write Base + XXXh Base + XXXh 00A0h Program Command Write Program Address Program Address Program Data /* Example: Unlock Bypass Program Command /* Do while in Unlock Bypass Entry Mode! *( (UINT16 *)base_addr ) = 0x00A0;...
  • Page 32 S29GL01GP S29GL512P S29GL256P S29GL128P Just prior to the completion of an Embedded Program or Erase operation, DQ7 may change asynchronously with DQ6-DQ0 while Output Enable (OE#) is asserted low. That is, the device may change from providing status information to valid data on DQ7.
  • Page 33 S29GL01GP S29GL512P S29GL256P S29GL128P 7.8.2 DQ6: Toggle Bit I Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out.
  • Page 34 S29GL01GP S29GL512P S29GL256P S29GL128P 7.8.5 DQ5: Exceeded Timing Limits DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions DQ5 produces a “1,” indicating that the program or erase cycle was not successfully completed. The device does not output a 1 on DQ5 if the system tries to program a 1 to a location that was previously programmed to 0.
  • Page 35: Writing Commands/Command Sequences

    S29GL01GP S29GL512P S29GL256P S29GL128P Write Operation Status Status (Note 2) (Note 1) (Note 2) Embedded Program Algorithm DQ7# Toggle No toggle Standard Mode Embedded Erase Algorithm Toggle Toggle Program-Suspended Invalid (not allowed) Program Program- Sector Suspend Suspend Non-Program Mode Read...
  • Page 36 Note Base = Base Address. The following is a C source code example of using the reset function. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 37: Advanced Sector Protection/Unprotection

    S29GL01GP S29GL512P S29GL256P S29GL128P Advanced Sector Protection/Unprotection The Advanced Sector Protection/Unprotection feature disables or enables programming or erase operations in any or all sectors and can be implemented through software and/or hardware methods, which are independent of each other. This section describes the various methods of protecting data stored in the memory array.
  • Page 38: Lock Register

    S29GL01GP S29GL512P S29GL256P S29GL128P Lock Register As shipped from the factory, all devices default to the persistent mode when power is applied, and all sectors are unprotected, unless otherwise chosen through the DYB ordering option (see Ordering Information on page 4).
  • Page 39 S29GL01GP S29GL512P S29GL256P S29GL128P 9. Exit command must be issued after the execution which resets the device to read mode and re-enables reads and writes for Sector 0. 10. The programming state of the PPB for a given sector can be verified by writing a PPB Status Read Command to the...
  • Page 40: Persistent Protection Bit Lock Bit

    S29GL01GP S29GL512P S29GL256P S29GL128P 8.2.1 Dynamic Protection Bits Dynamic Protection Bits are volatile and unique for each sector and can be individually modified. DYBs only control the protection scheme for unprotected sectors that have their PPBs cleared (erased to “1”). By issuing the DYB Set or Clear command sequences, the DYBs are set (programmed to “0”) or cleared (erased to “1”), thus placing each sector in the protected or unprotected state...
  • Page 41 S29GL01GP S29GL512P S29GL256P S29GL128P 7. The Password Mode Lock Bit is not erasable. 8. The lower two address bits (A1–A0) are valid during the Password Read, Password Program, and Password Unlock. 9. The exact password must be entered in order for the unlocking function to occur.
  • Page 42 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 8.3 Lock Register Program Algorithm Write Unlock Cycles: Unlock Cycle 1 Address 555h, Data AAh Unlock Cycle 2 Address 2AAh, Data 55h Write Enter Lock Register Command: Address 555h, Data 40h XXXh = Address don’t care...
  • Page 43: Advanced Sector Protection Software Examples

    S29GL01GP S29GL512P S29GL256P S29GL128P Advanced Sector Protection Software Examples Sector Protection Schemes: DYB, PPB and PPB Lock Bit Combinations Unique Device PPB Lock Bit Sector PPB Sector DYB 0 = locked 0 = protected 0 = protected 1 = unlocked...
  • Page 44: Power Conservation Modes

    S29GL01GP S29GL512P S29GL256P S29GL128P 8.6.3 Write Pulse “Glitch Protection” Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle. 8.6.4 Power-Up Write Inhibit If WE# = CE# = RESET# = V and OE# = V during power up, the device does not accept commands on the rising edge of WE#.
  • Page 45: Secured Silicon Sector Flash Memory Region

    Customers may opt to have their code programmed through the Cypress programming services. Cypress programs the customer's code, with or without the random ESN. The devices are then shipped from the Cypress factory with the Secured Silicon Sector permanently locked. Contact your local representative for details on using Cypress programming services.
  • Page 46: Customer Lockable Secured Silicon Sector

    The following are C functions and source code examples of using the Secured Silicon Sector Entry, Program, and exit commands. Refer to the Cypress Low Level Driver User’s Guide (available soon on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 47 S29GL01GP S29GL512P S29GL256P S29GL128P Secured Silicon Sector Program (LLD Function = lld_ProgramCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 555h Base + 2AAh...
  • Page 48: Electrical Specifications

    S29GL01GP S29GL512P S29GL256P S29GL128P 11. Electrical Specifications 11.1 Absolute Maximum Ratings Description Rating Storage Temperature, Plastic Packages –65°C to +150°C Ambient Temperature with Power Applied –65°C to +125°C All Inputs and I/Os except as noted below (Note –0.5 V to V + 0.5 V...
  • Page 49: Operating Ranges

    S29GL01GP S29GL512P S29GL256P S29GL128P 11.2 Operating Ranges Specifications Range Ambient Temperature (TA), Industrial (I) Device –40°C to +85°C Ambient Temperature (TA), Commercial (C) Device 0°C to +85°C +2.7 V to 3.6 V or Supply Voltages +3.0 V to 3.6 V Supply Voltages +1.65 V to V...
  • Page 50: Key To Switching Waveforms

    S29GL01GP S29GL512P S29GL256P S29GL128P 11.4 Key to Switching Waveforms Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 11.5...
  • Page 51: Dc Characteristics

    S29GL01GP S29GL512P S29GL256P S29GL128P 11.6 DC Characteristics S29GL-P DC Characteristics (CMOS Compatible) Parameter Parameter Description Symbol (Notes) Test Conditions Unit WP/ACC ±5.0 µA to V Input Load Current Others ±2.0 CC max A9 Input Load Current ; A9 = 12.5 V µA...
  • Page 52 S29GL01GP S29GL512P S29GL256P S29GL128P 11.7 AC Characteristics 11.7.1 S29GL-P Read Operations S29GL-P Read Operations Parameter Speed Options Description JEDEC Std. (Notes) Test Setup 130 Unit = 2.7 V – – = 1.65 V to V Read Cycle Time – –...
  • Page 53 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 11.5 Read Operation Timings Addresses Stable Addresses HIGH Z HIGH Z Outputs Output Valid RESET# RY/BY# Note Figure 11.5, parameters t and t are specific to a read cycle following a flash write operation. Figure 11.6 Page Read Timings...
  • Page 54 S29GL01GP S29GL512P S29GL256P S29GL128P 11.7.2 S29GL-P Hardware Reset (RESET#) Operation Hardware Reset (RESET#) Parameter JEDEC Std. Description Speed Unit RESET# Pin Low (During Embedded Algorithms) to µs Ready Read Mode or Write mode RESET# Pin Low (NOT During Embedded µs...
  • Page 55 S29GL01GP S29GL512P S29GL256P S29GL128P Power-up Sequence Timings Parameter Description Speed Unit Reset Low Time from rising edge of V (or last Reset pulse) to µs rising edge of RESET# Reset Low Time from rising edge of V (or last Reset pulse) to rising µs...
  • Page 56 S29GL01GP S29GL512P S29GL256P S29GL128P 11.7.3 S29GL-P Erase and Program Operations S29GL-P Erase and Program Operations Parameter Speed Options JEDEC Std. Unit Description Write Cycle Time (Note 1) AVAV Address Setup Time AVWL Address Setup Time to OE# low during toggle bit polling...
  • Page 57 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 11.9 Program Operation Timings Program Command Sequence (last two cycles) Read Status Data (last two cycles) 555h Addresses WHWH1 Status Data BUSY RY/BY# Notes 1. PA = program address, PD = program data, D is the true data at the program address.
  • Page 58 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 11.11 Chip/Sector Erase Operation Timings Erase Command Sequence (last two cycles) Read Status Data Addresses 2AAh 555h for chip erase WHWH2 Data Complete Progress 10 for Chip Erase BUSY RY/BY# Notes 1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see Write Operation Status on page 32.)
  • Page 59 S29GL01GP S29GL512P S29GL256P S29GL128P Notes 1. VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. 2. t for data polling is 45 ns when V = 1.65 to 2.7 V and is 35 ns when V = 2.7 to 3.6 V...
  • Page 60 S29GL01GP S29GL512P S29GL256P S29GL128P 11.7.4 S29GL-P Alternate CE# Controlled Erase and Program Operations S29GL-P Alternate CE# Controlled Erase and Program Operations Parameter Speed Options Description JEDEC Std. 120 130 Unit (Notes) Write Cycle Time (Note 1) 120 130 AVAV Address Setup Time...
  • Page 61 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 11.15 Alternate CE# Controlled Write (Erase/Program) Operation Timings 555 for program PA for program 2AA for erase SA for sector erase 555 for chip erase Data# Polling Addresses GHEL WHWH1 or 2 BUSY DQ7# Data...
  • Page 62 S29GL01GP S29GL512P S29GL256P S29GL128P 11.7.5 Erase And Programming Performance Erase And Programming Performance (Note 1) (Note 2) Parameter Unit Comments Sector Erase Time S29GL128P Excludes 00h programming S29GL256P prior to erasure (Note 4) Chip Erase Time S29GL512P 1024 S29GL01GP 2048...
  • Page 63 This section contains information relating to software control or interfacing with the Flash device. For additional information and assistance regarding software, see Section 5. For the latest information, explore the Cypress web site at www.cypress.com. 12.1 Command Definitions Writing specific address and data commands or sequences into the command register initiates device operations. Tables – define the valid register command sequences.
  • Page 64 S29GL01GP S29GL512P S29GL256P S29GL128P S29GL-P Memory Array Command Definitions, x16 Bus Cycles (Notes 1–5) First Second Third Fourth Fifth Sixth Command (Notes) Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Read Reset Manufacturer ID Device ID...
  • Page 65 S29GL01GP S29GL512P S29GL256P S29GL128P egend X = Don’t care RA = Address of the memory to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE# or CE# pulse, whichever happens later.
  • Page 66 S29GL01GP S29GL512P S29GL256P S29GL128P S29GL-P Sector Protection Command Definitions, x16 Bus Cycles (Notes 1–5) First/ Seventh Second Third Fourth Fifth Sixth Command (Notes) Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Command Set Entry Program DATA...
  • Page 67 S29GL01GP S29GL512P S29GL256P S29GL128P Legend X = Don’t care RD(0) = Read data. SA = Sector Address. Address bits A –A16 uniquely select any sector. PWD = Password = Password word0, word1, word2, and word3. Data = Lock Register Contents: PD(0) = Secured Silicon Sector Protection Bit, PD(1) = Persistent Protection Mode Lock Bit, PD(2) = Password Protection Mode Lock Bit.
  • Page 68 S29GL01GP S29GL512P S29GL256P S29GL128P S29GL-P Memory Array Command Definitions, x8 Bus Cycles (Notes 1–5) First Second Third Fourth Fifth Sixth Command (Notes) Addr Data Data Data Addr Data Data Data Read Reset Manufacturer ID Device ID [SA]X0 Sector Protect Verify...
  • Page 69 S29GL01GP S29GL512P S29GL256P S29GL128P egend X = Don’t care RA = Address of the memory to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE# or CE# pulse, whichever happens later.
  • Page 70 S29GL01GP S29GL512P S29GL256P S29GL128P S29GL-P Sector Protection Command Definitions, x8 Bus Cycles (Notes 1–5) First/ Second/ Seventh Eighth Third Fourth Fifth Sixth Command (Notes) Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Command Set Entry Bits Program...
  • Page 71 S29GL01GP S29GL512P S29GL256P S29GL128P Legend X = Don’t care RD(0) = Read data. SA = Sector Address. Address bits A –A16 uniquely select any sector. PWD = Password = Password word0, word1, word2, and word3. Data = Lock Register Contents: PD(0) = Secured Silicon Sector Protection Bit, PD(1) = Persistent Protection Mode Lock Bit, PD(2) = Password Protection Mode Lock Bit.
  • Page 72 The following is a C source code example of using the CFI Entry and Exit functions. Refer to the Cypress Low Level Driver User’s Guide (available on www.cypress.com) for general information on Cypress Flash memory software development guidelines.
  • Page 73 S29GL01GP S29GL512P S29GL256P S29GL128P System Interface String Addresses (x16) Addresses (x8) Data Description 0027h Min. (write/erase) D7–D4: volt, D3–D0: 100 mV 0036h Max. (write/erase) D7–D4: volt, D3–D0: 100 mV 0000h Min. voltage (00h = no V pin present) 0000h Max. voltage (00h = no V...
  • Page 74 S29GL01GP S29GL512P S29GL256P S29GL128P Device Geometry Definition Addresses (x16) Addresses (x8) Data Description 001Bh Device Size = 2 byte 001Ah 0019h 1B = 1 Gb, 1A= 512 Mb, 19 = 256 Mb, 18 = 128 Mb 0018h 0002h Flash Device Interface description (refer to CFI publication 100)
  • Page 75 S29GL01GP S29GL512P S29GL256P S29GL128P Primary Vendor-Specific Extended Query Addresses (x16) Addresses (x8) Data Description 0050h 0052h Query-unique ASCII string “PRI” 0049h 0031h Major version number, ASCII 0033h Minor version number, ASCII Address Sensitive Unlock (Bits 1-0) 0 = Required, 1 = Not Required...
  • Page 76: Advance Information On S29Gl-S Eclipse 65 Nm Mirrorbit Power-On And Warm Reset Timing

    S29GL01GP S29GL512P S29GL256P S29GL128P 13. Advance Information on S29GL-S Eclipse 65 nm MirrorBit Power-On and Warm Reset Timing At power on, the flash requires additional time in the reset state to self configure than it does during a warm reset.
  • Page 77 S29GL01GP S29GL512P S29GL256P S29GL128P Figure 13.2 Warm Reset Timing Note: The sum of t and t must be equal to or greater than t RPH. The differences in power-on timing should not present a migration challenge for most applications where the flash interfaces directly with a Host that requires oscillator and PLL lock prior to initiating the first boot read access to the flash.
  • Page 78 S29GL01GP S29GL512P S29GL256P S29GL128P 14. Document History Document Title:S29GL01GP, S29GL512P, S29GL256P, S29GL128P 1 Gbit, 512, 256, 128 Mbit, 3 V, Page Flash with 90 nm MirrorBit Process Technology Document Number: 002-00886 Orig. of Submission Rev. ECN No. Description of Change...
  • Page 79 S29GL01GP S29GL512P S29GL256P S29GL128P Document Title:S29GL01GP, S29GL512P, S29GL256P, S29GL128P 1 Gbit, 512, 256, 128 Mbit, 3 V, Page Flash with 90 nm MirrorBit Process Technology Document Number: 002-00886 Orig. of Submission Rev. ECN No. Description of Change Change Date 10/23/2007 A6:Performance Characteristics Changed speed options for S29GL512P Ordering Information Corrected samples OPN valid combinations;...
  • Page 80 S29GL01GP S29GL512P S29GL256P S29GL128P Document Title:S29GL01GP, S29GL512P, S29GL256P, S29GL128P 1 Gbit, 512, 256, 128 Mbit, 3 V, Page Flash with 90 nm MirrorBit Process Technology Document Number: 002-00886 Orig. of Submission Rev. ECN No. Description of Change Change Date 11/20/2009 A12:Table Input/Output Descriptions Removed RFU description...
  • Page 81 S29GL01GP S29GL512P S29GL256P S29GL128P Document Title:S29GL01GP, S29GL512P, S29GL256P, S29GL128P 1 Gbit, 512, 256, 128 Mbit, 3 V, Page Flash with 90 nm MirrorBit Process Technology Document Number: 002-00886 Orig. of Submission Rev. ECN No. Description of Change Change Date 11/20/2008 Table S29GL-P Memory Array Command Definitions, x16...
  • Page 82 ("Unintended Uses"). A critical component is any component of a device or system whose failure to perform can be reasonably expected to cause the failure of the device or system, or to affect its safety or effectiveness. Cypress is not liable, in whole or in part, and you shall and hereby do release Cypress from any claim, Document Number: 002-00886 Rev.*B...

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