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Dialog DA1458 Series User Manual

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User Manual
DA1458x/DA1468x Production
Line Tool
UM-B-041

Abstract

This document describes the DA1458x/DA1468x Production Line Tool (PLT). The various software
applications, as well as the PLT hardware are explained in detail. The purpose of this document is to
help users to become familiar with the tool and help them use it in a short amount of time.

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  • Page 1: Abstract

    User Manual DA1458x/DA1468x Production Line Tool UM-B-041 Abstract This document describes the DA1458x/DA1468x Production Line Tool (PLT). The various software applications, as well as the PLT hardware are explained in detail. The purpose of this document is to help users to become familiar with the tool and help them use it in a short amount of time.

  • Page 2: Table Of Contents

    Homekit Hash Setup Code .................. 55 6.11.2 Custom data CSV file format ................57 6.12 Golden Unit Scan Test ......................58 6.13 Creating PLT Firmware Files ....................60 User Manual Revision 4.3 03-Aug-2018 CFR0012 2 of 246 © 2018 Dialog Semiconductor...
  • Page 3 I2C EEPROM Memory..............103 7.2.7.4 Memory read .................. 104 7.2.8 Memory Header (DA1458x) ................105 7.2.8.1 General ..................105 7.2.8.2 BD Address ..................106 7.2.8.3 Custom Memory Data ..............107 User Manual Revision 4.3 03-Aug-2018 CFR0012 3 of 246 © 2018 Dialog Semiconductor...
  • Page 4 Using CLI Commands as Arguments ..............159 GU Upgrade Application ....................160 Example Usage .......................... 166 Appendix A Top-view of PLT PCB Version D ................173 Appendix B Electrical Schematics ....................174 User Manual Revision 4.3 03-Aug-2018 CFR0012 4 of 246 © 2018 Dialog Semiconductor...
  • Page 5 Appendix Y CSV Log File Contents ....................219 Appendix Z DUT Status Codes ...................... 232 Appendix AA Golden Unit Status Codes ..................242 Revision History ..........................245 User Manual Revision 4.3 03-Aug-2018 CFR0012 5 of 246 © 2018 Dialog Semiconductor...

  • Page 6: Figures

    Figure 56: BLE Tester General Settings - DA1458x ................85 Figure 57: BLE Tester TX Power - DA1458x ..................86 Figure 58: BLE Tester Frequency Offset - DA1458x ................87 User Manual Revision 4.3 03-Aug-2018 CFR0012 6 of 246 © 2018 Dialog Semiconductor...
  • Page 7 Figure 114: GUI PLT Main Screen ....................139 Figure 115: GUI PLT Settings ......................141 Figure 116: Barcode Scan Option in GUI PLT .................. 142 Figure 117: Barcode Scanner Controls ..................... 143 User Manual Revision 4.3 03-Aug-2018 CFR0012 7 of 246 © 2018 Dialog Semiconductor...
  • Page 8 Figure 174: Speaker Connection for Audio Test................200 Figure 175: DA14580/5 Pro Motherboard DK Wiring................ 202 Figure 176: DA14680/1/2/3 Pro Motherboard DK Wiring..............203 User Manual Revision 4.3 03-Aug-2018 CFR0012 8 of 246 © 2018 Dialog Semiconductor...
  • Page 9 Figure 179: CSV File Entries (1/4) ....................224 Figure 180: CSV File Entries (2/4) ....................225 Figure 181: CSV File Entries (3/4) ....................229 Figure 182: CSV File Entries (4/4) ....................231 User Manual Revision 4.3 03-Aug-2018 CFR0012 9 of 246 © 2018 Dialog Semiconductor...

  • Page 10: Tables

    Table 55: GPIO Connection Test - DA1458x ..................91 Table 56: Audio Test ........................... 92 Table 57: Sensor Tests - DA1458x ..................... 92 Table 58: Custom Tests - DA1458x ....................93 User Manual Revision 4.3 03-Aug-2018 CFR0012 10 of 246 © 2018 Dialog Semiconductor...
  • Page 11 Table 113: DA14580 PLT Example Usage ..................166 Table 114: RF Test RSSI Results ..................... 180 Table 115: Prerequisites ........................181 Table 116: Calibration Setup ......................182 Table 117: Procedure steps ......................184 User Manual Revision 4.3 03-Aug-2018 CFR0012 11 of 246 © 2018 Dialog Semiconductor...
  • Page 12 Table 137: CSV File Entries (3/4)...................... 229 Table 138: CSV File Entries (4/4)...................... 231 Table 139: DUT Status Codes......................232 Table 140: Golden Unit Status Codes ....................242 User Manual Revision 4.3 03-Aug-2018 CFR0012 12 of 246 © 2018 Dialog Semiconductor...

  • Page 13: Terms And Definitions

    Random Access Memory Resistor Crystal Oscillator Radio Frequency Receive SCPI Standard Commands for Programmable Instruments System on Chip Software Development Kit Serial Peripheral Interface Software Trim and Calibration Section User Manual Revision 4.3 03-Aug-2018 CFR0012 13 of 246 © 2018 Dialog Semiconductor...
  • Page 14 Transmit UART Universal Asynchronous Receiver/Transmitter User Interface Universal Serial Bus VISA Virtual Instrument Software Architecture Programming supply voltage (pin) Extensible Markup Language XTAL Crystal XML Schema Definition User Manual Revision 4.3 03-Aug-2018 CFR0012 14 of 246 © 2018 Dialog Semiconductor...

  • Page 15: References

    NI USB TC-01, http://sine.ni.com/nips/cds/view/p/lang/en/nid/208177 [10] Honeywell Xenon 1900, https://www.honeywellaidc.com/products/barcode-scanners/general- duty/xenon-1900g-1902g [11] Zebra/Motorola LS2208, https://www.zebra.com/us/en/products/scanners/general-purpose- scanners/handheld/ls2208.html [12] AN-B-020, DA14580 End product testing and programming guidelines, Application Note, Dialog Semiconductor [13] Litepoint IQXel-M, http://www.litepoint.com/test-solutions-for-manufacturing/iqxel-m/ [14] NI USB-6009 DAQ, http://sine.ni.com/nips/cds/view/p/lang/en/nid/201987 [15] Keysight 34461A, http://www.keysight.com/en/pd-2270273-pn-34461A/digital-multimeter-6-digit- 34401a-replacement-truevolt-dmm?cc=GR&lc=eng User Manual Revision 4.3...

  • Page 16: New Version Features

    DUT advertisements and reports the RSSI. This test is very similar to measuring the DUT TX power. Added PER limits in RF In all RF reception tests, Packet Error Rate limit was added. RSSI tests. User Manual Revision 4.3 03-Aug-2018 CFR0012 16 of 246 © 2018 Dialog Semiconductor...

  • Page 17: Introduction

    5. Burn the OTP header. 6. Perform Scan test. Reset the DUTs and set the GU to scan for the DUT BLE advertisements. Figure 1: Production Line Tool Hardware User Manual Revision 4.3 03-Aug-2018 CFR0012 17 of 246 © 2018 Dialog Semiconductor...

  • Page 18: Hardware

    4x URX/UTX Commands XTAL trim pulse VPP Enable CPLD VBAT Enable URX/UTX URX/UTX URX/UTX URX/UTX DUT1 DUT2 DUT3 DUT16 Figure 2: Production Line Tool Hardware Board Block Diagram User Manual Revision 4.3 03-Aug-2018 CFR0012 18 of 246 © 2018 Dialog Semiconductor...

  • Page 19: Printed Circuit Board Layout

    GU reset CPLD prog. socket Golden Unit CPLD Antenna or adjust SMA cable jumper 16x DUTs Figure 3: Top View of the PLT Hardware Board (Version C) User Manual Revision 4.3 03-Aug-2018 CFR0012 19 of 246 © 2018 Dialog Semiconductor...

  • Page 20: Plt Power Supply

    Pulse not used not used not used DUT TX Only DA14580/1/2/3 DUT RX (pinning 100 mil) DUT RX DUT TX Figure 5: Production Line Tool DUT Connections User Manual Revision 4.3 03-Aug-2018 CFR0012 20 of 246 © 2018 Dialog Semiconductor...

  • Page 21: Data Streaming

    DUT- UART x(x) l(x) u(x) DUT- Reset ‘1’ & 1 * Virtual COM-PORT t(0...3) Golden p(0/1) PC USB Unit r(xx) Figure 6: CPLD UART Data Streams User Manual Revision 4.3 03-Aug-2018 CFR0012 21 of 246 © 2018 Dialog Semiconductor...

  • Page 22: Figure 7: Cpld Xtal Trim Pulse Data Stream

    This could cause problems with the power-on reset (POR) and the product might not boot correctly. The CPLD will switch off the UART signals when the VBAT is not present. User Manual Revision 4.3 03-Aug-2018 CFR0012 22 of 246 © 2018 Dialog Semiconductor...

  • Page 23: Golden Unit

    Making pin DTR low for a short period of time will reset the GU. Every time the PLT tests start, a hardware reset is issued to the Golden Unit. Jumper J47 should be ON and J46 OFF for this reset method to operate. User Manual Revision 4.3 03-Aug-2018 CFR0012 23 of 246 © 2018 Dialog Semiconductor...

  • Page 24: Current Measurements

    This jumper sets the Golden Unit’s SPI Flash chip select (CS) pin to high. This jumper is B, C, D needed placed when the Golden Unit should NOT boot from the SPI flash. User Manual Revision 4.3 03-Aug-2018 CFR0012 24 of 246 © 2018 Dialog Semiconductor...

  • Page 25: J26 - Current Measurements

    VPP line will not operate when VBAT is not switched on. It is secured in the hardware. Figure 13: VPP Control Circuit Schematic User Manual Revision 4.3 03-Aug-2018 CFR0012 25 of 246 © 2018 Dialog Semiconductor...

  • Page 26: J47, J46 - Gu Reset

    SPI Flash, allowing the GU to load different code into its System-RAM via the JTAG connector or via UART. Figure 17 shows the circuit schematic and Figure shows the location of jumper J37 on the PLT PCB. User Manual Revision 4.3 03-Aug-2018 CFR0012 26 of 246 © 2018 Dialog Semiconductor...

  • Page 27: Figure 17: J37 - Gu Programming Jumper Schematics

    UM-B-041 DA1458x/DA1468x Production Line Tool Figure 17: J37 - GU Programming Jumper Schematics Figure 18: Location of J37 Jumper User Manual Revision 4.3 03-Aug-2018 CFR0012 27 of 246 © 2018 Dialog Semiconductor...

  • Page 28: Plt Functional Blocks

    DUT 13 DUT 14 DUT 15 12MHz DUT 16 Xtal USB UART Golden Unit Power 6.7V Vbat Vbat DUTs VDDIO VDDIO CPLD Figure 19: PLT Functional Blocks User Manual Revision 4.3 03-Aug-2018 CFR0012 28 of 246 © 2018 Dialog Semiconductor...

  • Page 29: Software

    User Interface Core DLLs mt8852b.dll ble_tester_driver.dll DA1458x & DA1468x FWs Instruments (uartboot.bin, prod_test.bin) User defined extensions IQxelM.dll flash_programmer.bin, plt_fw.bin) Figure 20: Production Line Tool Software Block Diagram User Manual Revision 4.3 03-Aug-2018 CFR0012 29 of 246 © 2018 Dialog Semiconductor...

  • Page 30: Da15101 Support

    PLT, organized in a Visual Studio Express 2015 solution. Figure 21: DA1458x/DA1468x PLT Software Package Contents gives a short description of the files and folders contained in the executables directories. Table 6 User Manual Revision 4.3 03-Aug-2018 CFR0012 30 of 246 © 2018 Dialog Semiconductor...

  • Page 31: Table 6: Executables Folder Description

    The format of the file is explained later. Contains sample batch script files. User can select batch scripts/ script files to be executed by the PLT before and after each test. User Manual Revision 4.3 03-Aug-2018 CFR0012 31 of 246 © 2018 Dialog Semiconductor...
  • Page 32 This is the FTDI DLL. Used to hard reset the Golden Unit ftd2xx.dll from the application whenever needed through an FTDI GPIO pin. This is the production test DLL that performs device p_dll.dll/.lib functional tests. User Manual Revision 4.3 03-Aug-2018 CFR0012 32 of 246 © 2018 Dialog Semiconductor...

  • Page 33: Prerequisites

    Used for instrument control, like BLE tester and DMM. NI-488.2 15.5 NI-488.2 15.5 can be downloaded from http://www.ni.com/download/ni-488.2-15.5/5859/en/ Used for optional instrument control like temperature NI-DAQmx measurements using the NI USB TC01 sensor. User Manual Revision 4.3 03-Aug-2018 CFR0012 33 of 246 © 2018 Dialog Semiconductor...

  • Page 34: System Requirements

    Special care should be taken to work with multiple PLT hardware and software. Most probably, two different BD address files should be used for each PLT hardware. User Manual Revision 4.3 03-Aug-2018 CFR0012 34 of 246 © 2018 Dialog Semiconductor...

  • Page 35: Building The Code

    Download the latest PLT software package (e.g. DA1458x_DA1468x_PLT_v_4.x.zip) Extract the software package. The following two folders should exist. Go to folder 'source\production_line_tool'. The following files and folders should exist. User Manual Revision 4.3 03-Aug-2018 CFR0012 35 of 246 © 2018 Dialog Semiconductor...
  • Page 36 Note: Some Visual Studio projects may need to be unloaded prior to building the code, as they require external libraries to be installed. Please read UM-B-040 for details. User Manual Revision 4.3 03-Aug-2018 CFR0012 36 of 246 © 2018 Dialog Semiconductor...

  • Page 37: Executing The Applications

    COM port set in the params.xml file is not valid or that the GU USB cable is not connected to the PC. Press 'OK' if the warning message appears. User Manual Revision 4.3 03-Aug-2018 CFR0012 37 of 246 © 2018 Dialog Semiconductor...
  • Page 38 Windows Device Manager that 17 new COM ports were found, 16 for the DUTs and 1 for the GU. The following picture is an example of a Device Manager COM ports for a PC that has the PLT connected. User Manual Revision 4.3 03-Aug-2018 CFR0012 38 of 246 © 2018 Dialog Semiconductor...

  • Page 39: Table 11: Da1458X_Da1468X_Gui_Plt.exe Application Execution

    See Table 10. Go to folder 'executables'. This folder should contain the following files and sub-folders. Double click on DA1458x_DA1468x_GUI_PLT.exe. User Manual Revision 4.3 03-Aug-2018 CFR0012 39 of 246 © 2018 Dialog Semiconductor...

  • Page 40: Table 12: Da1458X_Da1468X_Cli_Plt.exe Application Execution

    See Table Go to folder 'executables'. This folder should contain the following files and sub-folders. User Manual Revision 4.3 03-Aug-2018 CFR0012 40 of 246 © 2018 Dialog Semiconductor...

  • Page 41: Table 13: Gu_Fw_Upgrade.exe Application Execution

    ‘Upgrade GU Firmware’ button in the PLT Hardware Setup tab in DA1458x_DA1468x_CFG_PLT.exe. Go to folder 'executables'. This folder should contain the following files and sub-folders. User Manual Revision 4.3 03-Aug-2018 CFR0012 41 of 246 © 2018 Dialog Semiconductor...

  • Page 42: Test Sequence

    DA1458x Reset GU Golden Unit hardware reset by controlling an FT232 pin. DA1458x Initialize CPLD Set the CPLD to an initial known state. User Manual Revision 4.3 03-Aug-2018 CFR0012 42 of 246 © 2018 Dialog Semiconductor...
  • Page 43 BLE tester RSSI test using the external BLE tester instrument. If the RSSI test using the GU as transmitter is active, DA1458x GU RSSI test then perform the test. User Manual Revision 4.3 03-Aug-2018 CFR0012 43 of 246 © 2018 Dialog Semiconductor...
  • Page 44 If enabled, write the BD address into the OTP memory. DA1458x OTP BD address write If verify is enabled, the OTP BD address will be read back and compared to the original. User Manual Revision 4.3 03-Aug-2018 CFR0012 44 of 246 © 2018 Dialog Semiconductor...
  • Page 45 PLT expects to find devices in the air with the BD addresses programmed by the same tool, so it can match the BD addresses returned by the GU. User Manual Revision 4.3 03-Aug-2018 CFR0012 45 of 246 © 2018 Dialog Semiconductor...

  • Page 46: Figure 22: Da1458X Test Sequence

    Write OTP Memory Write Test Image BD Address BD Address XTAL Trim Header Scan Test Memory Programming External Single Test Multiple Tests Instrument Figure 22: DA1458x Test Sequence User Manual Revision 4.3 03-Aug-2018 CFR0012 46 of 246 © 2018 Dialog Semiconductor...

  • Page 47: Da1468X Test Sequence

    If any of the production tests is active (e.g. RF tests, Download XTAL trim, etc.) download the prod_test_68x.bin to DA1468x prod_test_68x.bin the devices. User Manual Revision 4.3 03-Aug-2018 CFR0012 47 of 246 © 2018 Dialog Semiconductor...
  • Page 48 After uartboot_68x.bin has been downloaded, Get uartboot_68x.bin commands can be sent to it. A command to get the DA1468x uartboot_68x.bin firmware version is send to the version. devices. User Manual Revision 4.3 03-Aug-2018 CFR0012 48 of 246 © 2018 Dialog Semiconductor...
  • Page 49 If enabled, the OTP header fields will be burned. Up to 10 memory read tests can be performed with up DA1468x Memory read to 256 bytes in length. User Manual Revision 4.3 03-Aug-2018 CFR0012 49 of 246 © 2018 Dialog Semiconductor...
  • Page 50 The PLT expects to find devices in the air with the BD addresses programmed by the same tool, so it can match the BD addresses returned by the GU. User Manual Revision 4.3 03-Aug-2018 CFR0012 50 of 246 © 2018 Dialog Semiconductor...

  • Page 51: Figure 23: Da1468X Test Sequence

    Read OTP Write OTP Scan Test Memory Image BD Address BD Address XTAL Trim Memory Programming Header External Single Test Multiple Tests Instrument Figure 23: DA1468x Test Sequence User Manual Revision 4.3 03-Aug-2018 CFR0012 51 of 246 © 2018 Dialog Semiconductor...

  • Page 52: 6.10 Vbat/Reset Signals Operation

    Since the DUTs will be powered through the PLT HW using the VBAT line, the Current Measurement Test for the DA14580/1/2/3/5/6 and the Current Measurement Test for the DA14681/2/3 are supported as described in the Current Measurements chapter. User Manual Revision 4.3 03-Aug-2018 CFR0012 52 of 246 © 2018 Dialog Semiconductor...

  • Page 53: Vbat On With Reset

    In this mode, the reset of the DUTs will be performed using the PLT VBAT line as shown in Figure 26. Each DUT can be reset independently using the VBAT lines. This mode has advantage over User Manual Revision 4.3 03-Aug-2018 CFR0012 53 of 246 © 2018 Dialog Semiconductor...

  • Page 54: 6.11 Custom Memory Data

    PLT test run. explains in detail the various configuration parameters of the ‘Custom Chapter Custom Memory Data Memory Data’ programming PLT feature. User Manual Revision 4.3 03-Aug-2018 CFR0012 54 of 246 © 2018 Dialog Semiconductor...

  • Page 55: Homekit Hash Setup Code

    XXXXXXXXYYYYAAZZZZZZZZZZZZ.bin. The PLT will burn this file to the DUT memory and start address that the user has configured. User Manual Revision 4.3 03-Aug-2018 CFR0012 55 of 246 © 2018 Dialog Semiconductor...

  • Page 56: Table 18: Homekit Setup Code Checksum Algorithm

    += characters[index]; else sum += characters[index] * 3; sum = sum % 36; if (sum != 0) sum = 36 - sum; check = checkCharList[sum]; return check; User Manual Revision 4.3 03-Aug-2018 CFR0012 56 of 246 © 2018 Dialog Semiconductor...

  • Page 57: Custom Data Csv File Format

    Memory type (DA14580/1/2/3/5/6 can have OTP, SPI, EEPROM and DA14681/2/3 can have OTP and QSPI), ● Start address ● Size of data in bytes ● Data to be written. User Manual Revision 4.3 03-Aug-2018 CFR0012 57 of 246 © 2018 Dialog Semiconductor...

  • Page 58: 6.12 Golden Unit Scan Test

    DUTs will be powered off. This procedure will continue until the retries have reached the Scan retries set by the user. The PLT will reset the GU after a specific number or retries, User Manual Revision 4.3 03-Aug-2018 CFR0012 58 of 246 © 2018 Dialog Semiconductor...

  • Page 59: Figure 29: Golden Unit Scan Test Example Parameters

    DUT with a 37ms time difference between them. ● Continue with another three GU scan procedures and after each scan procedure power off the found DUTs. User Manual Revision 4.3 03-Aug-2018 CFR0012 59 of 246 © 2018 Dialog Semiconductor...

  • Page 60: 6.13 Creating Plt Firmware Files

    The ‘fw_files’ folder has two main categories. Firmware targeted for the GU and for the DUTs. Under each category there is a folder indicating the IC target and the SDK used. User Manual Revision 4.3 03-Aug-2018 CFR0012 60 of 246 © 2018 Dialog Semiconductor...

  • Page 61: Figure 31: Folder Contents Of 'Fw_Files

    In order to re-create the exact source code of the above firmware: 1. Use a clean copy of the DA1458x_SDK_5.0.4 SDK from the customer portal. 2. Copy the contents of the ‘…\fw_files\DUT\DA14580_581_583\DA1458x_SDK_5.0.4\DA1458x_SDK\5.0.4\’ folder to the default SDK. User Manual Revision 4.3 03-Aug-2018 CFR0012 61 of 246 © 2018 Dialog Semiconductor...
  • Page 62 5. The Keil v5 project file of the prox_reporter_585.bin is the ‘prox_reporter.uvprojx’ under the folder ‘\6.0.6.427\projects\target_apps\ble_examples\prox_reporter\Keil_5\’. DA14585 Firmware for DA14585 IoT+ DK This patch contains all the changes needed to re-create the following firmware: User Manual Revision 4.3 03-Aug-2018 CFR0012 62 of 246 © 2018 Dialog Semiconductor...
  • Page 63 .cached version of the binary must be created using the ‘bin2image.exe’. Bin2Image for more details. DA14683 Firmware for 32MHz XTAL This patch contains all the changes needed to re-create the following firmware: · prod_test_683_00_XTAL32MHz.bin User Manual Revision 4.3 03-Aug-2018 CFR0012 63 of 246 © 2018 Dialog Semiconductor...
  • Page 64 Note: The pxp_reporter source code generates a .bin file. In order to write it to the QSPI Flash memory and boot from it, a .cached version of the binary must be created using the ‘bin2image.exe’. Bin2Image for more details. User Manual Revision 4.3 03-Aug-2018 CFR0012 64 of 246 © 2018 Dialog Semiconductor...

  • Page 65: Applications

    If OK is pressed, the Hardware Setup tab will be loaded with the DUT 1 checkbox in red. The displayed value will be the default value taken from the XML schema document (params.xsd). User Manual Revision 4.3 03-Aug-2018 CFR0012 65 of 246 © 2018 Dialog Semiconductor...

  • Page 66: Figure 33: Cfg Plt With Erroneous Configuration Parameter

    Saves all the options of the currently selected tab. E.g. If General settings tab is selected, then only the settings for this tab will be saved. Note: A shortcut for this button is the Ctrl+S key combination. User Manual Revision 4.3 03-Aug-2018 CFR0012 66 of 246 © 2018 Dialog Semiconductor...

  • Page 67: Xml And Xsd Files

    An example part of the XSD file is given in Figure User Manual Revision 4.3 03-Aug-2018 CFR0012 67 of 246 © 2018 Dialog Semiconductor...

  • Page 68: Figure 34: Xsd Schema File Example

    The x:info="Set the RF path .."/> will be loaded by the cfg_dll.dll API and used in the CFG PLT tooltips as shown in the bottom part of Figure User Manual Revision 4.3 03-Aug-2018 CFR0012 68 of 246 © 2018 Dialog Semiconductor...

  • Page 69: Hardware Setup

    Device IC. Table 23: Device IC Option Description Device IC The Dialog BLE chipset used in the device under test. 7.2.2.3 Active DUTs Figure 37: Active DUTs Enables or disables the testing for each DUT.

  • Page 70: Dut Com Ports

    The Golden Unit COM port can be manually selected from the list with all the available COM ports existing in the system. Additionally, it can automatically be found by pressing the Auto button. The User Manual Revision 4.3 03-Aug-2018 CFR0012 70 of 246 © 2018 Dialog Semiconductor...

  • Page 71: Vbat/Reset Mode

    VBAT On with Reset VBAT/Reset Mode ● VBAT as Reset ● VBAT and Reset VBAT/Reset Signals Operation chapter describes each mode in detail. Default setting is VBAT only. User Manual Revision 4.3 03-Aug-2018 CFR0012 71 of 246 © 2018 Dialog Semiconductor...

  • Page 72: General

    Total and Left values will be set as the difference of Next and End BD address, otherwise will be set to zero. 7.2.3.2 Test Options Figure 42: Test Options User Manual Revision 4.3 03-Aug-2018 CFR0012 72 of 246 © 2018 Dialog Semiconductor...

  • Page 73: Table 30: Test Options

    The time to wait for the script to finish. The path of file to execute when the Run script when testing is finished option is Script path enabled. User Manual Revision 4.3 03-Aug-2018 CFR0012 73 of 246 © 2018 Dialog Semiconductor...

  • Page 74: Bd Addresses

    DUT until all active DUTs have a BD address assigned to them. This assignment mode never runs out of BD addresses and it will continue assigning addresses until the Next BD address reaches FF:FF:FF:FF:FF:FF. User Manual Revision 4.3 03-Aug-2018 CFR0012 74 of 246 © 2018 Dialog Semiconductor...

  • Page 75: Figure 44: Example For Load From File Mode

    00:00:00:11:22:04 as the Next BD address to be used in the next PLT test run. Note: The BD address file should always end with a zero BD address (00:00:00:00:00:00) and a new line at the end. User Manual Revision 4.3 03-Aug-2018 CFR0012 75 of 246 © 2018 Dialog Semiconductor...

  • Page 76: Table 33: Bd Address Assignment Options - Load From File Mode

    When this option is enabled, the input data will be automatically delimited with colon Automatically split BD marks. E.g. To enter the ‘11:22:33:44:55:66’ BD address the input string should be address with ‘:’ ‘112233445566’. User Manual Revision 4.3 03-Aug-2018 CFR0012 76 of 246 © 2018 Dialog Semiconductor...

  • Page 77: Dut Hardware Setup (Da1458X)

    ● 9600 [bit/s] ● 57600 [bit/s] ● Baud Rate 115200 [bit/s] ● 1000000 [bit/s] Note: 1 Mbit/s is the fastest and safest with 0% baud rate error. User Manual Revision 4.3 03-Aug-2018 CFR0012 77 of 246 © 2018 Dialog Semiconductor...

  • Page 78: Uart Programming Gpios Setup

    Pin RX Dropdown list to select the UART RX GPIO that will be used during testing. 7.2.5.4 Sleep Clock Source Figure 48: Sleep Clock Source - DA1458x User Manual Revision 4.3 03-Aug-2018 CFR0012 78 of 246 © 2018 Dialog Semiconductor...

  • Page 79: Spi Flash Configuration

    DA1458x SPI Flash Configuration. In order to properly setup the SPI Flash configuration, refer to the datasheet of the memory to be used. User Manual Revision 4.3 03-Aug-2018 CFR0012 79 of 246 © 2018 Dialog Semiconductor...

  • Page 80: I2C Eeprom Configuration

    Jedec ID mask Sets the bitmask of the Jedec ID. Memory protection Sets the SPI Flash protection value. 7.2.5.6 I2C EEPROM Configuration Figure 50: I2C EEPROM Configuration - DA1458x User Manual Revision 4.3 03-Aug-2018 CFR0012 80 of 246 © 2018 Dialog Semiconductor...

  • Page 81: Range Extender Configuration

    Sets the GPIO to be used for the power control of the range extender. Max power GPIO Sets the GPIO to be used to indicate the maximum power of the range extender. User Manual Revision 4.3 03-Aug-2018 CFR0012 81 of 246 © 2018 Dialog Semiconductor...

  • Page 82: Test Settings (Da1458X)

    GPIO has approximately 1.5% duty cycle and 0.48Hz frequency. Test name The name assigned for this test. Select the GPIO that will be toggled. User Manual Revision 4.3 03-Aug-2018 CFR0012 82 of 246 © 2018 Dialog Semiconductor...

  • Page 83: Scan Dut Advertise Test

    Note: When adding or removing a test, all settings are refreshed with the values written to the XML file, meaning that any unsaved settings will be lost. User Manual Revision 4.3 03-Aug-2018 CFR0012 83 of 246 © 2018 Dialog Semiconductor...

  • Page 84: Figure 55: Golden Unit Rf Tests - Da1458X

    RSSI of the device, after it has received the packets transmitted from the Golden Unit, is less than the value entered here the test will fail. User Manual Revision 4.3 03-Aug-2018 CFR0012 84 of 246 © 2018 Dialog Semiconductor...

  • Page 85: Figure 56: Ble Tester General Settings - Da1458X

    Select the BLE tester DLL name. Names are shown only if a BLE tester instrument DLL Instrument exists in the project ble_tester_instr_plugins folder. Interface The interface of the instrument to be used by the driver. User Manual Revision 4.3 03-Aug-2018 CFR0012 85 of 246 © 2018 Dialog Semiconductor...

  • Page 86: Figure 57: Ble Tester Tx Power - Da1458X

    Set the average low power limit for the BLE TX output power pass/fail test criteria. Peak average Set the peak-to-average power limit for the BLE TX output power pass/fail test criteria. User Manual Revision 4.3 03-Aug-2018 CFR0012 86 of 246 © 2018 Dialog Semiconductor...

  • Page 87: Figure 58: Ble Tester Frequency Offset - Da1458X

    Set the overall packet drift in kHz for the TX drift pass/fail test criteria. Set the drift rate limit in kHz/50 s for the TX drift pass/fail test criteria. Drift rate limit User Manual Revision 4.3 03-Aug-2018 CFR0012 87 of 246 © 2018 Dialog Semiconductor...

  • Page 88: Figure 59: Ble Tester Modulation Index - Da1458X

    Set the F2 maximum limit in kHz for the TX modulation index pass/fail test criteria. Set the F1/F2 maximum average ratio limit for the TX modulation index pass/fail test F1/F2 ratio criteria. User Manual Revision 4.3 03-Aug-2018 CFR0012 88 of 246 © 2018 Dialog Semiconductor...

  • Page 89: Figure 60: Ble Tester Rx Sensitivity - Da1458X

    The RSSI limit for pass/fail criteria in the RF RX sensitivity test. If the average RSSI of RSSI limit the device after it has received the transmitted packets is less than this value, the test will be considered as failed. User Manual Revision 4.3 03-Aug-2018 CFR0012 89 of 246 © 2018 Dialog Semiconductor...

  • Page 90: Gpio/Led Test

    In these tests, a specific pulse can be given to a GPIO and any LED connected to it can be visually tested. The Pin option sets the GPIO to be used, Low and High define the duty cycle and the Retries the number of pulses. User Manual Revision 4.3 03-Aug-2018 CFR0012 90 of 246 © 2018 Dialog Semiconductor...

  • Page 91: Gpio Connection Test

    Sets the GPIO state the test awaits to see in the Get Pin. This option is disabled if the Get Pin level Set Pin mode is enabled. User Manual Revision 4.3 03-Aug-2018 CFR0012 91 of 246 © 2018 Dialog Semiconductor...

  • Page 92: Audio Test

    Table 57 describes the available options for the Sensor Tests DA1458x Options. Table 57: Sensor Tests - DA1458x Option Description Enable This option enables the specific sensor test. User Manual Revision 4.3 03-Aug-2018 CFR0012 92 of 246 © 2018 Dialog Semiconductor...

  • Page 93: Custom Test

    The name assigned to each test. The assigned name will be shown on the tab and next Test name to it an indication showing whether the specific test is enabled or not. User Manual Revision 4.3 03-Aug-2018 CFR0012 93 of 246 © 2018 Dialog Semiconductor...

  • Page 94: External 32Khz Test

    When enabled, the PLT software will verify the correct operation of the External 32kHz crystal on each DUT. Table 59: External 32kHz Test - DA1458x Option Description Enable This option enables the External 32kHz test. User Manual Revision 4.3 03-Aug-2018 CFR0012 94 of 246 © 2018 Dialog Semiconductor...

  • Page 95: Current Measurement Test

    DLL, Table 61 describes the settings used for each of the peripheral current measurement tests and Table 62 describes the current measurement options for each sleep state. User Manual Revision 4.3 03-Aug-2018 CFR0012 95 of 246 © 2018 Dialog Semiconductor...

  • Page 96: Table 60: Current Measurement Test - Instrument Settings - Da1458X

    A SCPI command to be passed to the ammeter instrument just before the SCPI cmd measurement is taken. Supports multiple commands separated with a column. Up to 256 characters are supported. User Manual Revision 4.3 03-Aug-2018 CFR0012 96 of 246 © 2018 Dialog Semiconductor...

  • Page 97: Table 62: Current Measurement Test - Sleep Current Measurement - Da1458X

    An SCPI command to be passed to the ammeter instrument just before the SCPI cmd measurement is taken. Supports multiple commands separated with a column. Up to 256 characters are supported. User Manual Revision 4.3 03-Aug-2018 CFR0012 97 of 246 © 2018 Dialog Semiconductor...

  • Page 98: Temperature Measurement Test

    The interface of the instrument to be used by the driver. 7.2.6.13 Scan Test Figure 70: Scan Test - DA1458x Table 64 describes the available options for the DA1458x Scan Test. User Manual Revision 4.3 03-Aug-2018 CFR0012 98 of 246 © 2018 Dialog Semiconductor...

  • Page 99: Table 64: Scan Test Da1458X Options

    By enabling this option, a new image will be downloaded to all active DUTs before Firmware load enable scanning for BLE advertising devices. Firmware path The path of the binary file to download to the devices for the scan test. User Manual Revision 4.3 03-Aug-2018 CFR0012 99 of 246 © 2018 Dialog Semiconductor...

  • Page 100: Memory Functions (Da1458X)

    DUTs 1, 5 and 10 then img_01.bin, img_05.bin and img_10.bin binary files should exist in the selected OTP image path as shown in Figure Range of numbers is img_01.bin … img_16.bin. User Manual Revision 4.3 03-Aug-2018 CFR0012 100 of 246 © 2018 Dialog Semiconductor...

  • Page 101: Spi Flash Memory

    SPI Flash Erase operation. Table 66: SPI Flash Erase - DA1458x Option Description Erase enable This option will enable the SPI flash erase operation. User Manual Revision 4.3 03-Aug-2018 CFR0012 101 of 246 © 2018 Dialog Semiconductor...

  • Page 102: Table 67: Spi Flash Image Write - Da1458X

    ‘X’ denotes the DUT number. For example, if the user has activated DUTs 1, 5 and 10 then img_01.img, img_05.img and img_10.img binary files should exist in the selected SPI image path, as shown in Figure User Manual Revision 4.3 03-Aug-2018 CFR0012 102 of 246 © 2018 Dialog Semiconductor...

  • Page 103: I2C Eeprom Memory

    ‘X’ denotes the DUT number. For example, if the user has activated DUTs 1, 5 and 10 then img_01.img, img_05.img and img_10.img binary files should exist in the selected image path, as shown in Figure User Manual Revision 4.3 03-Aug-2018 CFR0012 103 of 246 © 2018 Dialog Semiconductor...

  • Page 104: Memory Read

    The type of memory to read the data from. Available options are OTP, SPI FLASH, and I2C EEPROM. Memory type Note: For the SPI FLASH and EEPROM memories, the pin configurations are taken from the SPI Flash Configuration I2C EEPROM Configuration sections. User Manual Revision 4.3 03-Aug-2018 CFR0012 104 of 246 © 2018 Dialog Semiconductor...

  • Page 105: Memory Header (Da1458X)

    XTAL calibration process and Burn to OTP in XTAL Trim XTAL 16 MHz trim value disabled and XTAL trim calibration flag is enabled (only for DA14580/1/2/3). User Manual Revision 4.3 03-Aug-2018 CFR0012 105 of 246 © 2018 Dialog Semiconductor...

  • Page 106: Bd Address

    The BD address can be written independently from the rest of the OTP header fields described before. Table 71 describes the available options for the BD Address programming. User Manual Revision 4.3 03-Aug-2018 CFR0012 106 of 246 © 2018 Dialog Semiconductor...

  • Page 107: Custom Memory Data

    DA1458x devices, such as OTP, SPI flash and EEPROM. Data input modes can be a Barcode Scanner, a CSV file or data entered manually. User Manual Revision 4.3 03-Aug-2018 CFR0012 107 of 246 © 2018 Dialog Semiconductor...

  • Page 108: Table 72: Custom Memory Data - Da1458X

    The size of the memory data to burn. In barcode scanner, the data size is the number Data size of scanned ASCII characters. In manual data, data size is the number of bytes. User Manual Revision 4.3 03-Aug-2018 CFR0012 108 of 246 © 2018 Dialog Semiconductor...

  • Page 109: Dut Hardware Setup (Da1468X)

    Note that this is happening only during memory programming where uartboot_68x.bin is used. During tests (RF tests, XTAL trimming, etc.), where the production test firmware is used, the baud rate is fixed to 115200 bit/s. User Manual Revision 4.3 03-Aug-2018 CFR0012 109 of 246 © 2018 Dialog Semiconductor...

  • Page 110: Clock Source

    500ms, generated by the PLT hardware. Table 75: Clock Source - DA14682/3-00 Only Option Description XTAL 16MHz / XTAL 32MHz Select the XTAL frequency used on the DUTs. User Manual Revision 4.3 03-Aug-2018 CFR0012 110 of 246 © 2018 Dialog Semiconductor...

  • Page 111: Test Settings (Da1468X)

    After the uartboot_68x firmware is downloaded, the watchdog pin will be pulsed. Test name The name assigned for this test. Select the GPIO that will be toggled. GPIO power level Sets the power level of the GPIOs. User Manual Revision 4.3 03-Aug-2018 CFR0012 111 of 246 © 2018 Dialog Semiconductor...

  • Page 112: Scan Dut Advertise Test

    Figure 86: Golden Unit RF Tests - DA1468x Table 79 describes the available options for the DA1468x RF RX test using the Golden Unit as a transmitter. User Manual Revision 4.3 03-Aug-2018 CFR0012 112 of 246 © 2018 Dialog Semiconductor...

  • Page 113: Figure 87: Ble Tester General Settings - Da1468X

    Description This option enables all of the BLE Tester tests, which include: ● BLE Tester TX Power ● Enable Frequency Offset ● Modulation Index ● RX Sensitivity User Manual Revision 4.3 03-Aug-2018 CFR0012 113 of 246 © 2018 Dialog Semiconductor...

  • Page 114: Figure 88: Ble Tester Tx Power - Da1468X

    Set the average low power limit for the BLE TX output power pass/fail test criteria. Peak average Set the peak-to-average power limit for the BLE TX output power pass/fail test criteria. User Manual Revision 4.3 03-Aug-2018 CFR0012 114 of 246 © 2018 Dialog Semiconductor...

  • Page 115: Figure 89: Ble Tester Frequency Offset - Da1468X

    Set the overall packet drift in kHz for the TX drift pass/fail test criteria. Set the drift rate limit in kHz/50 s for the TX drift pass/fail test criteria. Drift rate limit User Manual Revision 4.3 03-Aug-2018 CFR0012 115 of 246 © 2018 Dialog Semiconductor...

  • Page 116: Figure 90: Ble Tester Modulation Index - Da1468X

    Set the F2 maximum limit in kHz for the TX modulation index pass/fail test criteria. Set the F1/F2 maximum average ratio limit for the TX modulation index pass/fail test F1/F2 ratio criteria. User Manual Revision 4.3 03-Aug-2018 CFR0012 116 of 246 © 2018 Dialog Semiconductor...

  • Page 117: Figure 91: Ble Tester Rx Sensitivity - Da1468X

    This configures the PER limit for pass/fail criteria. If the percentage of the correct Packet error limit packets received is less than the value entered here, the test will fail. User Manual Revision 4.3 03-Aug-2018 CFR0012 117 of 246 © 2018 Dialog Semiconductor...

  • Page 118: Gpio/Led Test

    In these tests, a specific pulse can be given to a GPIO and any LED connected to it can be visually tested. The Pin option sets the GPIO to be used, Low and High define the duty cycle and the Retries the number of pulses. User Manual Revision 4.3 03-Aug-2018 CFR0012 118 of 246 © 2018 Dialog Semiconductor...

  • Page 119: Gpio Connection Test

    Sets the GPIO state the test awaits to see in the Get Pin. This option will be disabled if Get Pin level the Set Pin mode is enabled. User Manual Revision 4.3 03-Aug-2018 CFR0012 119 of 246 © 2018 Dialog Semiconductor...

  • Page 120: Sensor Test

    Select the GPIO to be used as a sensor interrupt. GPIO power level Sets the power level of the GPIOs. Expected data The received sensor byte that will be expected on a successful operation. User Manual Revision 4.3 03-Aug-2018 CFR0012 120 of 246 © 2018 Dialog Semiconductor...

  • Page 121: Adc Calibration (Da14681-00 Only)

    Enable the writing of the ADC calibration value to OTP. Write to OTP - Verify Verify the writing of the ADC calibration value to OTP. 7.2.10.9 Custom Test Figure 97: Custom Test - DA1468x User Manual Revision 4.3 03-Aug-2018 CFR0012 121 of 246 © 2018 Dialog Semiconductor...

  • Page 122: External 32Khz Test

    DA1468x External 32kHz Tests. Table 91: External 32kHz Tests DA1468x Options Option Description Enable This option enables the external 32kHz low power clock test. User Manual Revision 4.3 03-Aug-2018 CFR0012 122 of 246 © 2018 Dialog Semiconductor...

  • Page 123: Current Measurement Test

    During measurement, PLT will control the instrument using the ammeter_driver DLL [1]. Table 92 describes the instrument selection settings found by the ammeter_driver DLL, Table 93 describes User Manual Revision 4.3 03-Aug-2018 CFR0012 123 of 246 © 2018 Dialog Semiconductor...

  • Page 124: Table 92: Current Measurement Tests - Da1468X

    An SCPI command to be passed to the ammeter instrument just before the SCPI cmd measurement is taken. Supports multiple commands separated with a column. Up to 256 characters are supported. User Manual Revision 4.3 03-Aug-2018 CFR0012 124 of 246 © 2018 Dialog Semiconductor...

  • Page 125: Table 94: Current Measurement Test - Sleep Current Measurement - Da1468X

    Resolution The ammeter instrument resolution value in Ampere units. The number of samples that the ammeter instrument will read and average. 1 to 1000 is Samples supported. User Manual Revision 4.3 03-Aug-2018 CFR0012 125 of 246 © 2018 Dialog Semiconductor...

  • Page 126: Temperature Measurement Test

    The interface of the instrument to be used by the driver. 7.2.10.13 Scan Test Figure 101: Scan Test - DA1468x Table 96 describes the available options for the DA1468x Scan Test. User Manual Revision 4.3 03-Aug-2018 CFR0012 126 of 246 © 2018 Dialog Semiconductor...

  • Page 127: Table 96: Scan Test Da1468X Options

    DUT reboot time The time the VBAT will remain low during the device reboot. This value is time in ms*100 (e.g. 15 is 1500ms). User Manual Revision 4.3 03-Aug-2018 CFR0012 127 of 246 © 2018 Dialog Semiconductor...

  • Page 128: Memory Functions (Da1468X)

    If this option is selected, a different image per DUT can be burned into the OTP. The image name must be specific for each DUT, as described below. User Manual Revision 4.3 03-Aug-2018 CFR0012 128 of 246 © 2018 Dialog Semiconductor...

  • Page 129: Qspi Flash Memory

    This option is only available for the Erase enable option. When this checkbox is Entire memory selected, the entire memory can be erased. Otherwise, the user can give a start address and a specific number of bytes to be erased. User Manual Revision 4.3 03-Aug-2018 CFR0012 129 of 246 © 2018 Dialog Semiconductor...

  • Page 130: Memory Read

    QSPI. An example of how the data appears on the log file is shown in Figure 105. Figure 105: Memory Read Test Example Log File - DA1468x User Manual Revision 4.3 03-Aug-2018 CFR0012 130 of 246 © 2018 Dialog Semiconductor...

  • Page 131: Memory Header (Da1468X)

    This section describes the Memory Header programming settings (OTP and QSPI), available in DA1468x devices. 7.2.12.1 OTP Header Figure 106: OTP Header - DA1468x Table 101 describes the available options for the DA1468x OTP Header programming. User Manual Revision 4.3 03-Aug-2018 CFR0012 131 of 246 © 2018 Dialog Semiconductor...

  • Page 132: Table 101: General - Otp Header Da1468X Options

    Enable the writing of the loader file for the QSPI Flash Initialization Section. Loader path The file containing the data that will be burned in the QFIS loader. JTAG enable Enable the JTAG support. User Manual Revision 4.3 03-Aug-2018 CFR0012 132 of 246 © 2018 Dialog Semiconductor...

  • Page 133: Otp Header - Bd Address

    OTP Header - XTAL Trim Figure 108: OTP Header XTAL Trim - DA1468x Table 103 describes the available options for the DA1468x OTP Header XTAL Trim programming operation. User Manual Revision 4.3 03-Aug-2018 CFR0012 133 of 246 © 2018 Dialog Semiconductor...

  • Page 134: Qspi Header - Bd Address

    XTAL Trim programming into the QSPI Header. Table 105: QSPI Header XTAL Trim Option Description Write Enable burning a crystal oscillator calibration value, common to all devices. User Manual Revision 4.3 03-Aug-2018 CFR0012 134 of 246 © 2018 Dialog Semiconductor...

  • Page 135: Custom Memory Data

    Note: Barcode scanner mode is only available with GUI PLT Application. ● Barcode scanner PLT Application does NOT support this feature. ● CSV file Custom data input options: User Manual Revision 4.3 03-Aug-2018 CFR0012 135 of 246 © 2018 Dialog Semiconductor...
  • Page 136 If enabled the input memory data from the barcode scanner will be applied as (available with Barcode input to the Dialog Homekit setup code binary generator. PLT will automatically scanner mode) call the setup code binary generator and burn the files created.

  • Page 137: Debug Settings

    Select the file that the debug messages will be saved. The file should exist; otherwise, it File path should be created manually. Used only when the option Output - File is selected. 7.2.14 Security Figure 113: Security User Manual Revision 4.3 03-Aug-2018 CFR0012 137 of 246 © 2018 Dialog Semiconductor...

  • Page 138: Gui Plt Application

    Note: If a change is made to the XML file from the CFG PLT, then the GUI PLT settings should be refreshed as described in Table 109. Figure 114 shows the initial screen of the GUI PLT, which is described in Table 109. User Manual Revision 4.3 03-Aug-2018 CFR0012 138 of 246 © 2018 Dialog Semiconductor...

  • Page 139: Figure 114: Gui Plt Main Screen

    Range mode is enabled. Statistics This field holds statistics for each PLT session. Table 29 describes the Statistics field. The selected IC of the PLT. User Manual Revision 4.3 03-Aug-2018 CFR0012 139 of 246 © 2018 Dialog Semiconductor...
  • Page 140 This timer starts counting when the START button is pressed and runs until the PLT returns to its idle state, showing the approximate duration of the tests. User Manual Revision 4.3 03-Aug-2018 CFR0012 140 of 246 © 2018 Dialog Semiconductor...

  • Page 141: Gui Plt Settings

    This option will show a message asking to do a re-test in case any DUT Ask to retry failed. If this option is disabled, the re-testing will be done automatically. User Manual Revision 4.3 03-Aug-2018 CFR0012 141 of 246 © 2018 Dialog Semiconductor...

  • Page 142: Barcode Scanner Mode

    117. If the scanned BD address was successfully assigned, the PLT will automatically select the next active DUT and wait for a new BD address to be scanned. User Manual Revision 4.3 03-Aug-2018 CFR0012 142 of 246 © 2018 Dialog Semiconductor...

  • Page 143: Homekit Setup Code Scan Example

    PLT such that to perform XTAL trim test, RF test and homekit setup code scanning and programming. Table 111: Homekit Setup Code Scan Example Action Copy PLT software DA1458x_DA1468x_PLT_v_4.x.x.x under C:\ directory. User Manual Revision 4.3 03-Aug-2018 CFR0012 143 of 246 © 2018 Dialog Semiconductor...
  • Page 144 These settings will enable the XTAL trim calibration test. The result of the XTAL trim calibration will be saved into QSPI flash. Dialog SDK firmware is able to read the value from this specific QSPI address (0x8F000) and apply it to the appropriate chipset XTAL trim register.
  • Page 145 Change the Scanner Interface COM port according to the COM port assigned to the barcode scanner in step 9. Press the Save* button. Close DA1458x_DA1468x_CFG_PLT.exe and open DA1458x_DA1468x_GUI_PLT.exe. User Manual Revision 4.3 03-Aug-2018 CFR0012 145 of 246 © 2018 Dialog Semiconductor...
  • Page 146 Use the barcode scanner instrument to scan four different homekit setup codes with specific format as this was described in Table 17. Four different example codes are given next. User Manual Revision 4.3 03-Aug-2018 CFR0012 146 of 246 © 2018 Dialog Semiconductor...
  • Page 147 Press the Space keyboard key to start the PLT tests. The PLT process will proceed. PLT will get the barcode scanned data for each DUT and call the SetupCode_Generator_680.exe to create four different binaries. The binaries will reside inside DA1458x_DA1468x_PLT_v_4.x.x.x\executables\binaries. User Manual Revision 4.3 03-Aug-2018 CFR0012 147 of 246 © 2018 Dialog Semiconductor...

  • Page 148: Running The Gui Plt And Executing Tests

    Figure 119: GUI PLT - Erroneous Messages in “run scripts before testing starts” If any OTP burning test is scheduled, a pop-up message will inform the user and prompt for continuing (Figure 120). User Manual Revision 4.3 03-Aug-2018 CFR0012 148 of 246 © 2018 Dialog Semiconductor...

  • Page 149: Figure 120: Gui Plt Otp Burn Warning Message

    DUT Log File to get more details about the parameters used, calculated values and the reason of failure in the case of an error. User Manual Revision 4.3 03-Aug-2018 CFR0012 149 of 246 © 2018 Dialog Semiconductor...

  • Page 150: Figure 122: Gui Plt Testing (2 Of 2)

    (including the BD addresses) remain the same and only the tests that failed are retested. At this time, the CSV File and all the DUT Log Files will be updated. Figure 123: GUI PLT Tests Finished User Manual Revision 4.3 03-Aug-2018 CFR0012 150 of 246 © 2018 Dialog Semiconductor...

  • Page 151: Debug Console

    Debug Console. Depending on the type of the message, a different color is used: DEBUG messages are light blue, INFO messages are white and ERROR messages are red. Figure 125: Debug Console User Manual Revision 4.3 03-Aug-2018 CFR0012 151 of 246 © 2018 Dialog Semiconductor...

  • Page 152: Dut Log File

    DUT and a timestamp of the event. After the tests finish the header is updated with the end time of the test and the firmware versions, which were retrieved during testing. User Manual Revision 4.3 03-Aug-2018 CFR0012 152 of 246 © 2018 Dialog Semiconductor...

  • Page 153: Csv File

    DUT information. The CSV file keeps information about all the production tests of a single day. A new CSV file will be created every day. User Manual Revision 4.3 03-Aug-2018 CFR0012 153 of 246 © 2018 Dialog Semiconductor...

  • Page 154: Cli Plt Application

    Example: “t 580”. ● 681-01 ● 683-00 ● 15101 Initializes the PLT with the parameters found in the params.xml file. Path to XML configuration file. Example: “i params\params.xml”. User Manual Revision 4.3 03-Aug-2018 CFR0012 154 of 246 © 2018 Dialog Semiconductor...
  • Page 155 This command is used only for PLT evaluation. It starts multiple Number of tests to run. tests. These are executed one after the other without user intervention. User Manual Revision 4.3 03-Aug-2018 CFR0012 155 of 246 © 2018 Dialog Semiconductor...

  • Page 156: Running The Cli And Executing Tests

    To Reset the XML parameters in the configuration file to their defaults use the ‘z’ command. Example: >z ● To reload the configuration file or to load another one use the ‘i’ command. User Manual Revision 4.3 03-Aug-2018 CFR0012 156 of 246 © 2018 Dialog Semiconductor...

  • Page 157: Figure 130: Cli Plt Dut Com Port Enumeration ('P' Command)

    The following example will read the BD address from the QSPI memory header and compare it with the one currently assigned to the DUTs. Example: >v qspi User Manual Revision 4.3 03-Aug-2018 CFR0012 157 of 246 © 2018 Dialog Semiconductor...

  • Page 158: Figure 131: Cli Plt Read And Compare Bd Address In Qspi ('V' Command)

    DUTs to use, with DUT 1 being the LSB. In the following example, the PLT hardware will be reset and DUTs 1, 2, 15 and 16 will be used. Example: >m 1C003 User Manual Revision 4.3 03-Aug-2018 CFR0012 158 of 246 © 2018 Dialog Semiconductor...

  • Page 159: Using Cli Commands As Arguments

    7. '-v qspi': Read only the BD address written in the QSPI header and compare it with the one assigned to the DUT1. These are the same. User Manual Revision 4.3 03-Aug-2018 CFR0012 159 of 246 © 2018 Dialog Semiconductor...

  • Page 160: Gu Upgrade Application

    X button from the windows bar at the top. Figure 135: GU Upgrade - Introduction page User Manual Revision 4.3 03-Aug-2018 CFR0012 160 of 246 © 2018 Dialog Semiconductor...

  • Page 161: Figure 136: Gu Upgrade - Exit Message

    As noted before PLT hardware version A is not supported by this tool. Figure 137: GU Upgrade - Hardware Version Figure 138: GU Upgrade - Hardware Version Compatibility User Manual Revision 4.3 03-Aug-2018 CFR0012 161 of 246 © 2018 Dialog Semiconductor...

  • Page 162: Figure 139: Gu Upgrade - Power Supply

    If the manual mode is selected, the user will be prompt any time the Golden Unit must be reset, to press the reset button located next to the Golden Unit on top of the PLT hardware. User Manual Revision 4.3 03-Aug-2018 CFR0012 162 of 246 © 2018 Dialog Semiconductor...

  • Page 163: Figure 141: Gu Upgrade - Golden Unit Reset

    Find. GU COM port can be also verified using the Check button. Selected GU COM port will be shown on the left bottom corner of the tool. User Manual Revision 4.3 03-Aug-2018 CFR0012 163 of 246 © 2018 Dialog Semiconductor...

  • Page 164: Figure 143: Gu Upgrade - Gu Com Port

    Figure 144: GU Upgrade - Burn Firmware User Manual Revision 4.3 03-Aug-2018 CFR0012 164 of 246 © 2018 Dialog Semiconductor...

  • Page 165: Figure 145: Gu Upgrade - Burn Firmware Pop-Up Message

    After the SPI flash program procedure is finished, a pop-up message will appear with the result of the programming procedure. If the SPI flash was programmed successfully, the pop-up message will also show the version of the new Golden Unit firmware (Figure 145). User Manual Revision 4.3 03-Aug-2018 CFR0012 165 of 246 © 2018 Dialog Semiconductor...

  • Page 166: Example Usage

    POR. Since the DUTs will be powered from the PLT VBAT/Reset hardware and the Reset Mode signal will not be used, use the VBAT only option. General User Manual Revision 4.3 03-Aug-2018 CFR0012 166 of 246 © 2018 Dialog Semiconductor...
  • Page 167 ● Check Enable RF Tests - ● Select 2424 MHz as Golden Unit frequency ● Set the RSSI limit to -70 ● Set Packet error limit to User Manual Revision 4.3 03-Aug-2018 CFR0012 167 of 246 © 2018 Dialog Semiconductor...
  • Page 168 Check Bootable image Write 1 test Make sure prox_reporter_580.bin is selected. OTP Header General Disable all options BD address Disable all options GUI PLT Open GUI PLT. User Manual Revision 4.3 03-Aug-2018 CFR0012 168 of 246 © 2018 Dialog Semiconductor...
  • Page 169 The firmware download (prod_test_580.bin) begins. From the log file, the test lasted for about 4.3 s, which can be verified from the logic analyzer capture. PLT begins the operation to get the version of the prod_test_580.bin firmware. User Manual Revision 4.3 03-Aug-2018 CFR0012 169 of 246 © 2018 Dialog Semiconductor...
  • Page 170 The blocks of data after the SPI check empty and before the SPI image write are SPI traffic on P0_5, which is the UART RX and the SPI MISO pin at the same time. User Manual Revision 4.3 03-Aug-2018 CFR0012 170 of 246 © 2018 Dialog Semiconductor...
  • Page 171 15 s. This is verified from both the log files and the CSV file. Both files are shown below. User Manual Revision 4.3 03-Aug-2018 CFR0012 171 of 246 © 2018 Dialog Semiconductor...
  • Page 172 UM-B-041 DA1458x/DA1468x Production Line Tool Step Description cont. User Manual Revision 4.3 03-Aug-2018 CFR0012 172 of 246 © 2018 Dialog Semiconductor...

  • Page 173: Appendix A Top-View Of Plt Pcb Version D

    UM-B-041 DA1458x/DA1468x Production Line Tool Appendix A Top-view of PLT PCB Version D Figure 147: Top-view of PLT PCB Version D User Manual Revision 4.3 03-Aug-2018 CFR0012 173 of 246 © 2018 Dialog Semiconductor...

  • Page 174: Appendix B Electrical Schematics

    UM-B-041 DA1458x/DA1468x Production Line Tool Appendix B Electrical Schematics Figure 148: VBAT and VPP Control from CPLD Figure 149: CPLD DUT UART Connections User Manual Revision 4.3 03-Aug-2018 CFR0012 174 of 246 © 2018 Dialog Semiconductor...

  • Page 175: Figure 150: Cpld Ftdi And Gu Control Connections

    UM-B-041 DA1458x/DA1468x Production Line Tool Figure 150: CPLD FTDI and GU Control Connections Figure 151: FTDI Chip for USB UART to DUTs 1, 2, 3 and 4 User Manual Revision 4.3 03-Aug-2018 CFR0012 175 of 246 © 2018 Dialog Semiconductor...

  • Page 176: Figure 152: Quad Usb Hub

    USB HUB: provides 5V input for the 3.3V LDO and USB input-signals to the four Quad FTDI chips. Figure 152: Quad USB HUB Figure 153: Golden Unit - Dedicated USB Port and FTDI Chip User Manual Revision 4.3 03-Aug-2018 CFR0012 176 of 246 © 2018 Dialog Semiconductor...

  • Page 177: Figure 154: Golden Unit - Gu Led And Spi Flash Memory

    The Golden Unit SW (prod_test_GU.bin) is located in the SPI Flash memory mounted on the PLT hardware and is loaded into the GU’s system RAM when powered on. Figure 155: VBAT_DUT and VDDIO Supplies Figure 156: GU Supply and VPP Generation User Manual Revision 4.3 03-Aug-2018 CFR0012 177 of 246 © 2018 Dialog Semiconductor...

  • Page 178: Appendix C Hardware Modifications Plt Version D

    Figure 158: Jumper J47 Added Next to Golden Unit Socket Figure 159: R365 (10 k) Added Next to Reset Button Figure 160: R365, J47 and RESET Shown in Electrical Schematic User Manual Revision 4.3 03-Aug-2018 CFR0012 178 of 246 © 2018 Dialog Semiconductor...

  • Page 179: Appendix D Suggestions About Hardware And Cabling

    A vertical GU antenna has different characteristics from a horizontal one. See Figure 161. Antenna Vertical Antenna Horizontal Figure 162: Possible Solution of Antenna on Cable and DUTs Put in Line User Manual Revision 4.3 03-Aug-2018 CFR0012 179 of 246 © 2018 Dialog Semiconductor...

  • Page 180: Figure 163: Example Locations And Rssi Readouts Of Horizontal Antenna

    16 MHz crystal oscillator not working well. Received packets ~ 0. Golden Unit output power = 0 dBm For more details on the RF setup, refer to [12] Appendix User Manual Revision 4.3 03-Aug-2018 CFR0012 180 of 246 © 2018 Dialog Semiconductor...

  • Page 181: Appendix E Rf Path Losses Calibration

    Flexible cable 6/50 D (ECO230) P/N: C291 326 490 A fixture to be placed inside the shielded box to easily connect the PCBAs to the 5 DUT fixture PLT. User Manual Revision 4.3 03-Aug-2018 CFR0012 181 of 246 © 2018 Dialog Semiconductor...

  • Page 182: Setup

    RF path from DUT to the RF antenna. Shielded box The shielded box must be big enough to fit the PCBA and the fixture and the PLT if it is inside. User Manual Revision 4.3 03-Aug-2018 CFR0012 182 of 246 © 2018 Dialog Semiconductor...
  • Page 183 The fixture position should be fixed compared to the RF antenna. The fixture should not move in any way in order to keep the distance between the DUTs and the RF antenna fixed. User Manual Revision 4.3 03-Aug-2018 CFR0012 183 of 246 © 2018 Dialog Semiconductor...

  • Page 184: Procedure

    70dBm) as shown below. Ideally we want the limits to be set to a value that all RF one Golden Unit tests PASS. RF test at middle band at 2440MHz. User Manual Revision 4.3 03-Aug-2018 CFR0012 184 of 246 © 2018 Dialog Semiconductor...
  • Page 185 Doing so, a new CSV file will be created at the next PLT test run. Place the 1 PCBA Place the 1 PCBA into the fixture inside the shielded box. Open DA1458x_DA1468 x_GUI_PLT.exe User Manual Revision 4.3 03-Aug-2018 CFR0012 185 of 246 © 2018 Dialog Semiconductor...
  • Page 186 Go to DA1458x_DA1468x_PLT_v_4.2.3.198\executables\logs and back up the CSV PCBA. For example if the today’s CSV file is file file for the 1 Test_station_1_20180306_csv_results.csv rename it to Test_station_1_20180306_csv_results_PCBA_1.csv. User Manual Revision 4.3 03-Aug-2018 CFR0012 186 of 246 © 2018 Dialog Semiconductor...
  • Page 187 DUT 10 =SUMIF($C$2:$C$321,10,$N$2:$N$321)/20 -36.607 DUT 11 =SUMIF($C$2:$C$321,11,$N$2:$N$321)/20 -34.19 DUT 12 =SUMIF($C$2:$C$321,12,$N$2:$N$321)/20 -26.7745 DUT 13 =SUMIF($C$2:$C$321,13,$N$2:$N$321)/20 -32.0095 DUT 14 =SUMIF($C$2:$C$321,14,$N$2:$N$321)/20 -23.784 DUT 15 =SUMIF($C$2:$C$321,15,$N$2:$N$321)/20 -24.71 DUT 16 =SUMIF($C$2:$C$321,16,$N$2:$N$321)/20 -29.168 User Manual Revision 4.3 03-Aug-2018 CFR0012 187 of 246 © 2018 Dialog Semiconductor...
  • Page 188 DUT 8 -39.64 DUT 9 -27.71 DUT 10 -37.18 DUT 11 -35.26 DUT 12 -27.06 DUT 13 -33.02 DUT 14 -24.20 DUT 15 -25.53 DUT 16 -30.20 User Manual Revision 4.3 03-Aug-2018 CFR0012 188 of 246 © 2018 Dialog Semiconductor...
  • Page 189 Repeat steps 10 to 13 with the 10 PCBAs. Check the GU RX RSSI results in the 10 CSV files. The results should be very close to -10dBm. User Manual Revision 4.3 03-Aug-2018 CFR0012 189 of 246 © 2018 Dialog Semiconductor...

  • Page 190: Appendix F Hex2Bin

    4. The binary file (blinky_1.bin) will be produced in the same directory. Figure 165 shows the directory and the files used in this example. Figure 165: Hex2Bin Example Directory with Files Figure 166: Hex2Bin.exe Example User Manual Revision 4.3 03-Aug-2018 CFR0012 190 of 246 © 2018 Dialog Semiconductor...

  • Page 191: Appendix G Bin2Image

    The file bin2image.exe must be put in the same directory as the file to be converted. Figure 167 shows the directory and the files used in this example. Figure 167: Bin2Image Example Directory with Files Figure 168: Bin2Image Example User Manual Revision 4.3 03-Aug-2018 CFR0012 191 of 246 © 2018 Dialog Semiconductor...

  • Page 192: Appendix H Automatic Gu Com Port Find

    Select 'Devices > Scan and Parse. A single 'FT232' device should be found. Select 'USB String Descriptors'. Uncheck the 'Auto Generate Serial No:'. Edit ‘Serial Number’ to "DialogSemi" as shown below. User Manual Revision 4.3 03-Aug-2018 CFR0012 192 of 246 © 2018 Dialog Semiconductor...
  • Page 193 Press ‘Close’. Unplug and reconnect the GU USB cable to the PC. Verify the Serial Number change by running FT_Prog.exe again and reading the Serial Number value. User Manual Revision 4.3 03-Aug-2018 CFR0012 193 of 246 © 2018 Dialog Semiconductor...

  • Page 194: Appendix I Improving Cabling Between Plt And Duts

    ‘Twisted Pair’ cables VBAT Pulse not used not used not used DUT TX DUT RX (pinning 100 mil) UART RX UART TX Figure 170: Location of Pull-Down Resistors User Manual Revision 4.3 03-Aug-2018 CFR0012 194 of 246 © 2018 Dialog Semiconductor...

  • Page 195: Figure 171: Anti-Ringing Solution

    ‘Twisted Pair’ cables VBAT Pulse not used not used not used DUT TX DUT RX (pinning 100 mil) UART RX UART TX 2 * 100R Figure 171: Anti-Ringing Solution User Manual Revision 4.3 03-Aug-2018 CFR0012 195 of 246 © 2018 Dialog Semiconductor...

  • Page 196: Appendix J Da14583 Internal Spi Flash Memory

    Table 119: DA14583 Internal SPI Flash Connections DA14583 Pin SPI Function Description P2_0 SPI_CLK SPI Clock P2_4 SPI_DI (in) MISO P2_9 SPI_DO (out) MOSI P2_3 SPI_EN SPI Chip Select User Manual Revision 4.3 03-Aug-2018 CFR0012 196 of 246 © 2018 Dialog Semiconductor...

  • Page 197: Appendix K Da14586 Internal Spi Flash Memory

    Table 120: DA14586 Internal SPI Flash Connections DA14586 Pin SPI Function Description P2_0 SPI_CLK SPI Clock P2_4 SPI_DI (in) MISO P2_9 SPI_DO (out) MOSI P2_3 SPI_EN SPI Chip Select User Manual Revision 4.3 03-Aug-2018 CFR0012 197 of 246 © 2018 Dialog Semiconductor...

  • Page 198: Appendix L Honeywell Xenon 1900 Barcode Scanner Setup

    2. Scan Restore factory defaults at page 198 (Resetting the Factory Defaults) 3. Program the USB to Serial Interface. Scan code at Page 32 (TRMUSB130) 4. Download Xenon USB to Serial drivers HSM USB Serial Driver version 3.5.5.zip User Manual Revision 4.3 03-Aug-2018 CFR0012 198 of 246 © 2018 Dialog Semiconductor...

  • Page 199: Appendix M Golden Unit Upgrade Using Smart Snippets Toolbox

    10. Remove the JTAG from the PLT hardware and then manually reset the Golden Unit using the reset button next to it. The Golden Unit has now booted with the new firmware. User Manual Revision 4.3 03-Aug-2018 CFR0012 199 of 246 © 2018 Dialog Semiconductor...

  • Page 200: Appendix N Connecting A Speaker To The Golden Unit For Audio Test

    Test. A speaker can be connected to the Golden Unit using GPIOs P1_0 (AL4) and P1_1 (AL5) as shown in Figure 174 to generate the 4 kHz tone. Figure 174: Speaker Connection for Audio Test. User Manual Revision 4.3 03-Aug-2018 CFR0012 200 of 246 © 2018 Dialog Semiconductor...

  • Page 201: Appendix O Ftdi Driver Removal And Installation

    3. Check in the Windows Device manager that the driver versions of the 17 PLT COM Ports->USB Serial Ports are the latest. FTDI driver versions v2.12.24, v2.12.26 and 2.12.28 have been tested. User Manual Revision 4.3 03-Aug-2018 CFR0012 201 of 246 © 2018 Dialog Semiconductor...

  • Page 202: Appendix P Da1458X Dk Pro Motherboard Connection

    PCB print (left of J5). A special jumper must be used to connect the P0_5 (J5 – pin13) with the SPI MISO (J6 – pin2) and the PLT UART-Rx pin (on DUT connector – pin9). Figure 175: DA14580/5 Pro Motherboard DK Wiring. User Manual Revision 4.3 03-Aug-2018 CFR0012 202 of 246 © 2018 Dialog Semiconductor...

  • Page 203: Appendix Q Da1468X Dk Pro Motherboard Connection

    DUT connector pin10 <-> Solder to Reset button (K2) (Optional). All board jumpers must be removed. Power supply will be provided from the PLT HW (VBAT line). Figure 176: DA14680/1/2/3 Pro Motherboard DK Wiring. User Manual Revision 4.3 03-Aug-2018 CFR0012 203 of 246 © 2018 Dialog Semiconductor...

  • Page 204: Appendix R Connecting Da1468X Dk Pro Motherboard For Current Measurements

    Jumpers J9 should be removed from the DA1468x DK Pro motherboard. It is mandatory to have a common ground between the two boards. One possible ground connection is shown with the purple line. Figure 177: DA1468x PRO DK Ammeter Connection with PLT User Manual Revision 4.3 03-Aug-2018 CFR0012 204 of 246 © 2018 Dialog Semiconductor...

  • Page 205: Figure 178: Da1468X Dk Pro Current Measurement Settings

    (DA1468x) test settings panel. The interface should be set to the second FTDI COM port enumerated in Windows, as shown in Figure 178. Figure 178: DA1468x DK PRO Current Measurement Settings User Manual Revision 4.3 03-Aug-2018 CFR0012 205 of 246 © 2018 Dialog Semiconductor...

  • Page 206: Appendix S Connecting Dut With Battery Supply

    In order to have the least possible wiring connections, UART Rx line can also be used as input GPIO for the pulse used during the XTAL Trim procedure as described in XTAL Trim XTAL Trim. User Manual Revision 4.3 03-Aug-2018 CFR0012 206 of 246 © 2018 Dialog Semiconductor...

  • Page 207: Appendix T User Interfaces Shortcut Keys

    It is used to select the ‘Start’ button to start testing. GUI PLT Application It is the equivalent of pressing the ‘Finished’ button with the left mouse- click. User Manual Revision 4.3 03-Aug-2018 CFR0012 207 of 246 © 2018 Dialog Semiconductor...

  • Page 208: Appendix U Da1458X Supported Spi Flash\Eeprom Memories

    Product number W25X10 Windbond W25X20 W25X40 AT25Dx011 Adesto AT25XE021 AT25XE041 MX25V1006E MX25R1035F SPI Flash MX25R2035F memory MX25R4035F MX25R8035F Macronix MX25R1635F MX25V1035F MX25V2035F MX25V4035F MX25V8035F MX25V1635F M24M02 I2C EEPROM User Manual Revision 4.3 03-Aug-2018 CFR0012 208 of 246 © 2018 Dialog Semiconductor...

  • Page 209: Appendix V Da1468X Supported Qspi Flash Memories

    Table 123: DA1468x Supported QSPI Flash Memories Memory vendor Product number Windbond W25Q80EW Gigadevice GD25LQ80B Macronix MX25U51245 ISSI IS25LP128 User Manual Revision 4.3 03-Aug-2018 CFR0012 209 of 246 © 2018 Dialog Semiconductor...

  • Page 210: Appendix W Ble Tester Measurement Results

    -14.25 Test peak to average power in dBm floating point 0.10 Number of failed packets integer Number of tested packets integer Pass/fail result PASS | FAIL PASS User Manual Revision 4.3 03-Aug-2018 CFR0012 210 of 246 © 2018 Dialog Semiconductor...

  • Page 211: Table 126: Mt8852B - Ble Carrier Frequency Offset And Drift Test Results

    (Delta f1 max Failed limit for BLR8) Delta f2 max count integer (Delta f1 max count for BLR8) Packets failed integer Packets tested integer Pass/fail result PASS | FAIL FAIL User Manual Revision 4.3 03-Aug-2018 CFR0012 211 of 246 © 2018 Dialog Semiconductor...

  • Page 212: Table 128: Mt8852B - Error List

    Note: Setting of the DSP No payload status code will not set the DDE bit of the event Auto ranging register Incorrect packet Incorrect packet type Over range User Manual Revision 4.3 03-Aug-2018 CFR0012 212 of 246 © 2018 Dialog Semiconductor...
  • Page 213 EUT core error text (variable length) Last GPIB command that caused a Command error NNNNNNN (variable length) Last GPIB command that caused an Execution error OOOOOOO (variable length) User Manual Revision 4.3 03-Aug-2018 CFR0012 213 of 246 © 2018 Dialog Semiconductor...

  • Page 214: Appendix X Memory Programming

    If the OTP part to be written contains all-zero values, then the write operation will not be performed. This also applies for writing default values in the OTP header. User Manual Revision 4.3 03-Aug-2018 CFR0012 214 of 246 © 2018 Dialog Semiconductor...

  • Page 215: Table 130: Da1458X Memory Programming - Spi Flash

    If the Verify option is selected, PLT will read the memory contents Manual and compare them to the ones written before. Note 1 Applies for all available memories simultaneously. User Manual Revision 4.3 03-Aug-2018 CFR0012 215 of 246 © 2018 Dialog Semiconductor...

  • Page 216: Table 131: Da1458X Memory Programming - Eeprom Memory

    If the Verify option is selected, PLT will read the Manual memory contents and compare them to the ones written before. Note 1 Applies for all available memories simultaneously. User Manual Revision 4.3 03-Aug-2018 CFR0012 216 of 246 © 2018 Dialog Semiconductor...

  • Page 217: Da1468X Memory Programming Operation

    If the OTP part to be written contains all-zero values, then the write operation will be omitted. This also applies for writing default values in the OTP header. User Manual Revision 4.3 03-Aug-2018 CFR0012 217 of 246 © 2018 Dialog Semiconductor...

  • Page 218: Table 133: Memory Programming - Qspi Memory

    If the Verify option is selected, PLT will read the Manual memory contents and compare them to the ones written before. Note 1 Applies for all available memories simultaneously. User Manual Revision 4.3 03-Aug-2018 CFR0012 218 of 246 © 2018 Dialog Semiconductor...

  • Page 219: Appendix Y Csv Log File Contents

    The second column shows the calculated value Scan HCI Adv RSSI [CH37-9\All] measured for this in decimal. device. Current measurement test – sleep tests. Extended\Deep sleep current test PASS\FAIL User Manual Revision 4.3 03-Aug-2018 CFR0012 219 of 246 © 2018 Dialog Semiconductor...
  • Page 220 GPIO/LED test ‘X’ [‘Test Name’] PASS\FAIL GPIO\LED tests GPIO connection test ‘X’ [Test PASS\FAIL GPIO connection tests Name] Audio test PASS\FAIL Audio test. User Manual Revision 4.3 03-Aug-2018 CFR0012 220 of 246 © 2018 Dialog Semiconductor...
  • Page 221 The second columns shows whether the data or “xx…” are given from a CSV file or the contents written. ‘SPI\OTP\EEPROM\QSPI’ Memory PASS\FAIL Read any part of any available memory. read ‘X’ [‘Test Name’] User Manual Revision 4.3 03-Aug-2018 CFR0012 221 of 246 © 2018 Dialog Semiconductor...
  • Page 222 OTP header burn PASS\FAIL OTP Header area burn. OTP write ADC calibration PASS\FAIL Write ADC calibration value to OTP. Scan PASS\FAIL Scan test with the DUTs booting and advertising. User Manual Revision 4.3 03-Aug-2018 CFR0012 222 of 246 © 2018 Dialog Semiconductor...
  • Page 223 32kHz test. The CSV results of the tests are split into four main categories explained in detailed in the following chapters. User Manual Revision 4.3 03-Aug-2018 CFR0012 223 of 246 © 2018 Dialog Semiconductor...

  • Page 224: Figure 179: Csv File Entries (1/4)

    The BD address assigned to each device. 80:80:80:00:00:0C PASS Overall status FAIL The overall final result for each device. FAIL COM port The Windows assigned COM port to each device. User Manual Revision 4.3 03-Aug-2018 CFR0012 224 of 246 © 2018 Dialog Semiconductor...

  • Page 225: Figure 180: Csv File Entries (2/4)

    Table 136: CSV File Entries (2/4). Header Value Description FW download 1 PASS Production test firmware downloaded successfully to all devices. Selected firmware C:\DA1458x_DA1468x_PLT_v_4.x\executables\binaries\prod_te is C:\DA1458x_DA1468x_PLT_v_4.x\executables\binaries\prod_test_580.bin. FW path 1 st_580.bin User Manual Revision 4.3 03-Aug-2018 CFR0012 225 of 246 © 2018 Dialog Semiconductor...
  • Page 226 Transmission modulation index test using external BLE Tester finished successfully. PASS test 1 [Mod Idx 1] In addition, header has the name assigned to the test and the BLE tester values are User Manual Revision 4.3 03-Aug-2018 CFR0012 226 of 246 © 2018 Dialog Semiconductor...
  • Page 227 In addition, header has the name assigned to the test and the RSSI and packet GU RX RSSI 2 error rate for each device are shown. -15.66 [GU_RSSI_2] -15.66 User Manual Revision 4.3 03-Aug-2018 CFR0012 227 of 246 © 2018 Dialog Semiconductor...
  • Page 228 These values are for all active devices, in HL=[0.0400000000A]. Extended sleep this case for two devices, devices 1 and 2. current RES=[0.001338430A]. LL=[0.0000340000A]. HL=[0.0400000000A]. User Manual Revision 4.3 03-Aug-2018 CFR0012 228 of 246 © 2018 Dialog Semiconductor...

  • Page 229: Figure 181: Csv File Entries (3/4)

    In addition, header has the name assigned to the test. SPI burn 1 [SPI WR PASS Production test firmware downloaded successfully to all devices. Selected firmware User Manual Revision 4.3 03-Aug-2018 CFR0012 229 of 246 © 2018 Dialog Semiconductor...
  • Page 230 Data read back were 1122334455. The memory and address are the as those in Custom memory write, resulting to same contents. In addition, header has the SPI Memory read 1122334455 name assigned to the test. data 1 [SPI @8000] User Manual Revision 4.3 03-Aug-2018 CFR0012 230 of 246 © 2018 Dialog Semiconductor...

  • Page 231: Figure 182: Csv File Entries (4/4)

    Table 138. Figure 182: CSV File Entries (4/4) Table 138: CSV File Entries (4/4). Header Value Description Scan PASS Scan test for device 1 has finished successfully. User Manual Revision 4.3 03-Aug-2018 CFR0012 231 of 246 © 2018 Dialog Semiconductor...

  • Page 232: Appendix Z Dut Status Codes

    HCI error. Production test - COM port DUT_PDLL_COM_PORT_INIT PDLL Device COM port open initialized. DUT_PDLL_COM_PORT_START PDLL Device COM port open started. DUT_PDLL_COM_PORT_OK PDLL Device COM port opened successfully. User Manual Revision 4.3 03-Aug-2018 232 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 233 Production test – External 32 kHz DUT_PDLL_EXT32KHz_TEST_INIT External 32kHz test operation initialized. DUT_PDLL_EXT32KHz_TEST_START External 32kHz test operation started. DUT_PDLL_EXT32KHz_TEST_OK External 32kHz test operation ended successfully. DUT_PDLL_EXT32KHz_TEST_FAILED External 32kHz test operation failed. User Manual Revision 4.3 03-Aug-2018 233 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 234 RF RX packet test with statistics stop failed. Production test - BLE tester Tx power measurement DUT_BLE_TESTER_TX_PWR_PASSED BLE tester TX power test passed. DUT_BLE_TESTER_TX_PWR_FAILED BLE tester TX power test failed. User Manual Revision 4.3 03-Aug-2018 234 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 235 Range extender test enable error. DUT_PDLL_RANGE_EXT_EN_OK Range extender test enable ended successfully. DUT_PDLL_RANGE_EXT_EN_FAILED Range extender test enable failed. Production test - GPIO/LED test DUT_PDLL_GPIO_TOGGLE_INIT GPIO-LED test operation initialized. User Manual Revision 4.3 03-Aug-2018 235 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 236 Sensor test action failed. DUT_PDLL_SENSOR_TEST_DATA_MATCH_OK Sensor test action data matched. DUT_PDLL_SENSOR_TEST_DATA_MATCH_FAILED Sensor test action data match failure. Production test - Custom action test DUT_PDLL_CUSTOM_ACTION_INIT Custom test action initialized. User Manual Revision 4.3 03-Aug-2018 236 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 237 DUT_UDLL_UART_WRITE_ERROR UDLL UART write returned error. DUT_UDLL_UART_READ_ERROR UDLL UART read returned error. DUT_UDLL_INTERNAL_ERROR UDLL internal error. DUT_UDLL_COM_PORT_INIT_ERROR UDLL COM port initialization error. DUT_UDLL_COM_PORT_ERROR UDLL COM port error. User Manual Revision 4.3 03-Aug-2018 237 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 238 Memory programming - BD address write to OTP memory DUT_UDLL_OTP_BDA_WR_INIT OTP BD address write operation initialized. DUT_UDLL_OTP_BDA_WR_STARTED OTP BD address write operation started. DUT_UDLL_OTP_BDA_WR_OK OTP BD address write operation ended successfully. User Manual Revision 4.3 03-Aug-2018 238 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 239 DUT_UDLL_SPI_INIT_STARTED SPI initialization operation started. DUT_UDLL_SPI_INIT_OK SPI initialization operation ended successfully. DUT_UDLL_SPI_INIT_FAILED SPI initialization operation failed. Memory programming - SPI memory erase DUT_UDLL_SPI_ERASE_INIT SPI erase operation initialized. User Manual Revision 4.3 03-Aug-2018 239 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 240 QSPI check if empty operation initialized. DUT_UDLL_QSPI_CHECK_EMPTY_STARTED QSPI check if empty operation started. DUT_UDLL_QSPI_CHECK_EMPTY_OK QSPI check if empty operation ended successfully. DUT_UDLL_QSPI_CHECK_EMPTY_FAILED QSPI check if empty operation failed. User Manual Revision 4.3 03-Aug-2018 240 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 241 Memory programming - memory read operation DUT_UDLL_MEM_RD_INIT Memory read operation initialized. DUT_UDLL_MEM_RD_STARTED Memory read operation started. DUT_UDLL_MEM_RD_OK Memory read operation ended successfully. DUT_UDLL_MEM_RD_FAILED Memory read operation failed. User Manual Revision 4.3 03-Aug-2018 241 of 246 CFR0012 © 2017 Dialog Semiconductor...

  • Page 242: Appendix Aa Golden Unit Status Codes

    GU_PDLL_FW_VERSION_GET_FAILED Golden Unit PDLL firmware version acquisition FAILED. GU_PDLL_FW_VERSION_VALID The Golden Unit firmware version is valid. GU_PDLL_FW_VERSION_NOT_VALID The Golden Unit firmware version is not valid. An upgrade User Manual Revision 4.3 03-Aug-2018 242 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 243 PLT HW tester XTAL trim pulse in GATE pin success. GU_PDLL_RDTESTER_XTAL_PULSE_FAILED PLT HW tester XTAL trim pulse in GATE pin failed. GU_PDLL_RDTESTER_PULSE_WIDTH_INIT PLT HW tester pulse width initialized. User Manual Revision 4.3 03-Aug-2018 243 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 244 Golden Unit BLE advertising scan test GU_PDLL_BLE_SCAN_INIT Golden Unit scan operation initialized. GU_PDLL_BLE_SCAN_START Golden Unit scan operation started. GU_PDLL_BLE_SCAN_OK Golden Unit scan operation completed successfully. GU_PDLL_BLE_SCAN_FAILED Golden Unit scan operation failed. User Manual Revision 4.3 03-Aug-2018 244 of 246 CFR0012 © 2017 Dialog Semiconductor...

  • Page 245: Revision History

    Adding changes for the DA1468x 22-Dec-2016 Updated for DA1458x_DA1468x_PLT_v4.0 software release 06-Oct-2017 Updated for DA1458x_DA1468x_PLT_v4.1 software release 10-Oct-2017 Updated for DA1458x_DA1468x_PLT_v4.2 software release 03-Aug-2018 Updated for DA1458x_DA1468x_PLT_v4.3 software release User Manual Revision 4.3 03-Aug-2018 245 of 246 CFR0012 © 2017 Dialog Semiconductor...
  • Page 246 Terms and Conditions of Sale, available on the company website (www.dialog-semiconductor.com) unless otherwise stated. Dialog and the Dialog logo are trademarks of Dialog Semiconductor plc or its subsidiaries. All other product or service names are the property of their respective owners.

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